Recherche - Archive ouverte HAL Accéder directement au contenu

Filtrer vos résultats

29 résultats

How to play on the fabrication process of HfZrO2 ferroelectric thin film to enhance its physical properties

Jordan Bouaziz , Greta Segantini , Benoit Manchon , Rabei Barhoumi , Ingrid Cañero Infante , et al.
EMRS 2022 Spring Meeting - Symposium N: Synthesis, processing and characterization of nanoscale multi functional oxide films VIII and 6th E-MRS & MRS-J bilateral symposium, European Materials Research Society, May 2022, Strasbourg, France
Communication dans un congrès hal-03682220v1

Tracking polarization loss and imprint during electrical tests in sputtered TiN/HZO/TiN capacitors

Bertrand Vilquin , Jordan Bouaziz , Nicolas Baboux , Pedro Rojo Romeo
Novel high-k workshop applications, NamLab, Apr 2021, Dresden, Germany
Communication dans un congrès hal-03273116v1

A Thorough Study of Ferroelectric Sputtered (Hf, Zr)O2 Solid Solutions

Jordan Bouaziz , Pedro Rojo Romeo , Nicolas Baboux , Brice Gautier , Bertrand Vilquin
International Symposium on the Application of Ferroelectrics, Jul 2019, Lausanne, Switzerland.
Poster de conférence hal-02461347v1
Image document

Impact of the channel length on molybdenum disulfide field effect transistors with hafnia-based high- k dielectric gate

Yanxiao Sun , Gang Niu , Wei Ren , Jinyan Zhao , Yankun Wang , et al.
AIP Advances, 2021, 11 (6), pp.065229. ⟨10.1063/5.0055574⟩
Article dans une revue hal-03269195v1

Deposition of hafnium/zirconium oxides solid solution by reactive magnetron sputtering for fast and low power ferroelectric devices

Jordan Bouaziz , Bertrand Vilquin , Pédro Rojo Romeo , Nicolas Baboux , Bruno Masenelli
Journée de la matière condensée 2018, Aug 2018, Grenoble, France
Communication dans un congrès hal-02506592v1

Elaboration and imprint consideration in HfZrO2 ferroelectric capacitors

Jordan Bouaziz , Greta Segantini , Benoît Manchon , Ingrid Cañero Infante , Nicolas Baboux , et al.
High k Workshop 2023, NamLab, May 2023, Dresden, Germany
Communication dans un congrès hal-04136940v1

Influence of the electrode interface on the properties of ferroelectric HfZrO2

Jordan Bouaziz , Greta Segantini , Benoît Manchon , Rabei Barhoumi , Ingrid Cañero Infante , et al.
High k Workshop 2022, NamLab, Sep 2022, Dresden, Germany
Communication dans un congrès hal-03775873v1

Ferroelectric hafnium/zirconium oxide solid solutions deposited by RF magnetron sputtering with a single target

Jordan Bouaziz , Pédro Rojo Romeo , Bertrand Vilquin , Nicolas Baboux
E-MRS Spring Meeting 2019, May 2019, Nice, France
Communication dans un congrès hal-02506544v1

Fabrication de dispositifs ferroélectriques à partir de HfO2 dopé et les problèmes en suspens

Bertrand Vilquin , Jordan Bouaziz , Nicolas Baboux , Pédro Rojo Romeo
Réunion thématique du GDR OXYFUN « Couches minces d'oxydes fonctionnels et applications en électronique et photonique », GDR OXYFUN, Oct 2019, Caen, France
Communication dans un congrès hal-02310135v1

Half Hetch Slot waveguides for Low-Cost Integration of CMOS compatible low refractive index active materials in Silicon Photonics

R. Orobtchouk , Ali Belarouci , Bertrand Vilquin , Pedro Rojo Romeo , Jordan Bouaziz
Photonics North, Jun 2018, Montréal, Canada
Communication dans un congrès hal-02400084v1
Image document

Deposition of doped and undoped HfO2 for fast and low energy consumption ferroelectric devices

Jordan Bouaziz , Bertrand Vilquin , Pedro Rojo Romeo , Nicolas Baboux , Bruno Masenelli
6th International Conference SENSO Workshop, Jun 2018, Gardanne, France
Poster de conférence hal-02506625v1

Ferroelectric HfO2 based devices fabrication and remaining issues

Bertrand Vilquin , Jordan Bouaziz , Nicolas Baboux , Pedro Rojo Romeo
IUMRS-ICA 2019, Sep 2019, Perth, Australia
Communication dans un congrès hal-02310137v1
Image document

Huge Reduction of the Wake-Up Effect in Ferroelectric HZO Thin Films

Jordan Bouaziz , Pedro Rojo Romeo , Nicolas Baboux , Bertrand Vilquin
ACS Applied Electronic Materials, 2019, 1 (9), pp.1740-1745. ⟨10.1021/acsaelm.9b00367⟩
Article dans une revue hal-02303151v1
Image document

Dramatic impact of pressure and annealing temperature on the properties of sputtered ferroelectric HZO layers

Jordan Bouaziz , Pédro Rojo Romeo , Nicolas Baboux , Raluca Negrea , Lucian Pintilie , et al.
APL Materials, 2019, 7 (8), pp.081109. ⟨10.1063/1.5110894⟩
Article dans une revue hal-02273286v1

Engineering the nano and micro structures of sputtered HfZrO2 thin films

Jordan Bouaziz , Greta Segantini , Benoît Manchon , Rabei Barhoumi , Ingrid Cañero Infante , et al.
15th International Meeting on Ferroelectricity - IMF 2023, Mar 2023, Tel Aviv, Israel
Communication dans un congrès hal-04053582v1

Nanostructuration effect on the properties of ferroelectric HfZrO2

Bertrand Vilquin , Jordan Bouaziz , Pédro Rojo Romeo , Nicolas Baboux
6th edition of the International Workshop of Materials Physics, The National Institute of Materials Physics (NIMP), Sep 2021, Bucarest, Romania
Communication dans un congrès hal-03351080v1

The discovery of ferroelectricity in HfO2

Bertrand Vilquin , Nicolas Baboux , Pedro Rojo Romeo , Jordan Bouaziz
6th Conference of Bangladesh Crystallographic Association, Bangladesh Crystallographic Association, Jan 2021, Dhaka, Bangladesh
Communication dans un congrès hal-03111364v1
Image document

Imprint issue during retention tests for HfO2 -based FRAM: An industrial challenge?

Jordan Bouaziz , Pedro Rojo Romeo , N. Baboux , Bertrand Vilquin
Applied Physics Letters, 2021, 118 (8), pp.082901. ⟨10.1063/5.0035687⟩
Article dans une revue hal-03177059v1

Huge working pressure effect on the ferroelectric properties of RF sputtered hafnia/zirconia layers

Bertrand Vilquin , Jordan Bouaziz , Nicolas Baboux , Pédro Rojo Romeo , Lucian Pintilie , et al.
High-k Workshop 2019, NamLab, Jun 2019, Dresden, Germany
Communication dans un congrès hal-02281215v1

Ferroelectric HfO2 based devices fabrication and remaining issues

Bertrand Vilquin , Jordan Bouaziz , Pédro Rojo Romeo , Nicolas Baboux
IEEE 39th International Conference on ELECTRONICS AND NANOTECHNOLOGY ELNANO-2019, IEEE, Apr 2019, Kyiv, Ukraine
Communication dans un congrès hal-02281214v1

Elaboration and imprint consideration in HfZrO2 ferroelectric capacitors

Jordan Bouaziz , Bertrand Vilquin
High-k Workshop 2023, NamLab, May 2023, Dresden, Germany, Germany
Communication dans un congrès hal-04232584v1

Wake-Up Effect and Retention Evolutions of Hf0.5Zr0.5O2 Capacitor by Nanostructuration Engineering

Jordan Bouaziz , Greta Segantini , Benoit Manchon , Rabei Barhoumi , Infante Ingrid C. , et al.
ISAF-PFM-ECAPD 2022, IEEE UFFC, Jun 2022, Tours, France
Communication dans un congrès hal-03715010v1

Huge reduction of wake-up effect in ferroelectric HfZrO2 nanostructures

Bertrand Vilquin , Nicolas Baboux , Pedro Rojo Romeo , Jordan Bouaziz
EMRS 2021 Fall Meeting, European Materials Research Society, Sep 2021, Warsaw, Poland
Communication dans un congrès hal-03351082v1
Image document

Characterization of ferroelectric hafnium/zirconium oxide solid solutions deposited by reactive magnetron sputtering

Jordan Bouaziz , Pedro Rojo Romeo , Nicolas Baboux , Bertrand Vilquin
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, 2019, 37 (2), pp.021203. ⟨10.1116/1.5060643⟩
Article dans une revue hal-02062583v1
Image document

Reduction of HfZrO2 capacitor wake-up effect

Jordan Bouaziz , Nicolas Baboux , Pedro Rojo Romeo , Bertrand Vilquin
Materials Challenges for Memory, Apr 2021, New York, United States.
Poster de conférence hal-03273119v1

Sputtered ferroelectric hafnium/zirconium oxide solid solutions from a single target

Jordan Bouaziz , Nicolas Baboux , Pédro Rojo Romeo , Lucian Pintilie , Raluca Negrea , et al.
EMRS Spring Meeting 2019, Jul 2019, Nice, France
Communication dans un congrès hal-02506563v1
Image document

Comparison between Sputtering and Atomic Layer Deposition of ferroelectric doped and undoped HfO2

Jordan Bouaziz , Bertrand Vilquin , Pedro Rojo Romeo , Nicolas Baboux , Bruno Masenelli
EMRS Spring Meeting 2017, May 2017, Strasbourg, France
Poster de conférence hal-02506676v1

How ALD deposition analysis can help PVD deposition process!

Bertrand Vilquin , Damien Deleruyelle , Jordan Bouaziz , Martine Le Berre , Céline Chevalier , et al.
9ème Workshop RAFALD, GDR RAFALD, Nov 2023, Lille (France), France
Communication dans un congrès hal-04308002v1

Ferroelectric HfZrO2 thin films for IoT applications

Bertrand Vilquin , Jordan Bouaziz , Nicolas Baboux , Pedro Rojo Romeo
Rencontre RENATECH "Croissance Cristalline", Nov 2019, Grenoble, France
Communication dans un congrès hal-02392443v1