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Johan Debayle
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Documents
Identifiants chercheurs
- johan-debayle
- 0000-0002-9593-0467
- Google Scholar : https://scholar.google.com/citations?user=b9L6ZoEAAAAJ&hl=en
- IdRef : 095250441
Présentation
Academic Position
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- **Professor** at the Ecole Nationale Supérieure des Mines, Saint-Etienne (MINES Saint-Etienne), France
- **Head of the Department PMMG** of the Centre SPIN, ARMINES / MINES Saint-Etienne.
- **Head of the Department PMDM** of the Laboratory LGF, UMR CNRS 5307.
- **Deputy Director** of the MORPHEA CNRS GDR 2021 Research Group
- **Associate Editor** for Image Analysis and Stereology (IAS), ISSIA.
- **Associate Editor** for Journal of Electronic Imaging (JEI), SPIE.
- **Associate Editor** for Pattern Analysis and Applications (PAA), Springer.
- **Vice-President Membership** for the IEEE France Section.
- **Head of the Master of Science** in Mathematical Imaging and Spatial Pattern Analysis (MISPA) at the Ecole des Mines de Saint-Etienne, France.
Publications
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Automatic classification of skin lesions using color mathematical morphology-based texture descriptorsTwelfth International Conference on Quality Control by Artificial Vision, Le2i - Laboratoire Electronique, Informatique et Image, Jun 2015, Le Creusot, France. pp.[9534-3] ; doi:10.1117/12.2182592
Communication dans un congrès
emse-01163688v1
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Automatic classification of skin lesions using geometrical measurements of adaptive neighborhoods and local binary patternsICIP 2015 IEEE International Conference on Image Processing, IEEE Signal Processing Society, Sep 2015, Québec City, Canada. pp.1722 à 1726, ⟨10.1109/ICIP.2015.7351095⟩
Communication dans un congrès
emse-01226873v1
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Automatic classification of skin lesions using geometrical measurements of adaptive neighborhoods and local binary patternsICIP 2015 IEEE International Conference on Image Processing, Sep 2015, Québec City, Canada. IEEE Xplore, IEEE Signal Processing Letters
Poster de conférence
emse-01228085v1
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