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JD

Johan Debayle

3
Documents
Identifiants chercheurs

Présentation

Academic Position ----------------- - **Professor** at the Ecole Nationale Supérieure des Mines, Saint-Etienne (MINES Saint-Etienne), France - **Head of the Department PMMG** of the Centre SPIN, ARMINES / MINES Saint-Etienne. - **Head of the Department PMDM** of the Laboratory LGF, UMR CNRS 5307. - **Deputy Director** of the MORPHEA CNRS GDR 2021 Research Group - **Associate Editor** for Image Analysis and Stereology (IAS), ISSIA. - **Associate Editor** for Journal of Electronic Imaging (JEI), SPIE. - **Associate Editor** for Pattern Analysis and Applications (PAA), Springer. - **Vice-President Membership** for the IEEE France Section. - **Head of the Master of Science** in Mathematical Imaging and Spatial Pattern Analysis (MISPA) at the Ecole des Mines de Saint-Etienne, France.

Publications

967066
Image document

Automatic classification of skin lesions using color mathematical morphology-based texture descriptors

Victor Gonzalez-Castro , Johan Debayle , Yanal Wazaefi , Mehdi Rahim , Caroline Gaudy-Marqueste
Twelfth International Conference on Quality Control by Artificial Vision, Le2i - Laboratoire Electronique, Informatique et Image, Jun 2015, Le Creusot, France. pp.[9534-3] ; doi:10.1117/12.2182592
Communication dans un congrès emse-01163688v1
Image document

Automatic classification of skin lesions using geometrical measurements of adaptive neighborhoods and local binary patterns

Victor González-Castro , Johan Debayle , Yanal Wazaefi , Mehdi Rahim , Caroline Gaudy
ICIP 2015 IEEE International Conference on Image Processing, IEEE Signal Processing Society, Sep 2015, Québec City, Canada. pp.1722 à 1726, ⟨10.1109/ICIP.2015.7351095⟩
Communication dans un congrès emse-01226873v1
Image document

Automatic classification of skin lesions using geometrical measurements of adaptive neighborhoods and local binary patterns

Victor González-Castro , Johan Debayle , Yanal Wazaefi , Mehdi Rahim , Caroline Gaudy
ICIP 2015 IEEE International Conference on Image Processing, Sep 2015, Québec City, Canada. IEEE Xplore, IEEE Signal Processing Letters
Poster de conférence emse-01228085v1