Nombre de documents

65

CV de Joel Chevrier


Article dans une revue43 documents

  • Luca Costa, Mario S. Rodrigues, Núria Benseny-Cases, Véronique Mayeux, Joel Chevrier, et al.. Spectroscopic investigation of local mechanical impedance of living cells. PLoS ONE, Public Library of Science, 2014, 9 (7), pp.e101687. <10.1371/journal.pone.0101687>. <hal-01341193>
  • Mario S. Rodriguès, Luca Costa, Joël Chevrier, Fabio Comin. System analysis of force feedback microscopy. Journal of Applied Physics, American Institute of Physics, 2014, 115, pp.054309. <10.1063/1.4864127>. <hal-01001324>
  • Jean-Baptiste Decombe, Jean-François Bryche, Jean-François Motte, Joël Chevrier, Serge Huant, et al.. Transmission and reflection characteristics of metal-coated optical fiber tip pairs. Applied optics, Optical Society of America, 2013, 52 (26), pp.6620. <10.1364/AO.52.006620>. <hal-00859686>
  • Luca Costa, Mario S. Rodriguès, E. Newman, Chloe Zubieta, Joël Chevrier, et al.. Imaging material properties of biological samples with a force feedback microscope. Journal of Molecular Recognition, Wiley, 2013, 26, pp.689. <10.1002/jmr.2328>. <hal-01001679>
  • Joël Chevrier, Laya Madani, Simon Ledenmat, A. Bsiesy. Teaching classical mechanics using smartphones. Physics Teacher, American Association of Physics Teachers, 2013, 51, pp.376. <hal-01001376>
  • Mario S. Rodriguès, Luca Costa, Joël Chevrier, Fabio Comin. Why do atomic force microscopy force curves still exhibit jump to contact?. Applied Physics Letters, American Institute of Physics, 2012, 101, pp.203105. <10.1063/1.4766172>. <hal-01001416>
  • Pieter Van Zwol, Laurent Ranno, Joël Chevrier. Emissivity measurements with an atomic force microscope. Journal of Applied Physics, American Institute of Physics, 2012, 111, pp.063110. <10.1063/1.3697673>. <hal-01001440>
  • Pieter Van Zwol, Stefan Thiele, Claire Berger, W. A. De Heer, Joel Chevrier. Nanoscale radiative heat flow due to surface plasmons in graphene and doped silicon. Physical Review Letters, American Physical Society, 2012, 109, pp.264301. <hal-00911216>
  • V.B. Stetovoy, Pieter Van Zwol, Joël Chevrier. Plasmon enhanced near-field radiative heat transfer for graphene covered dielectrics. Physical Review B : Condensed matter and materials physics, American Physical Society, 2012, 85, pp.155418. <10.1103/PhysRevB.85.155418>. <hal-01001179>
  • Justine Laurent, Hermann Sellier, Alexis Mosset, Serge Huant, Joël Chevrier. Casimir force measurements in Au-Au and Au-Si cavities at low temperature. Physical Review B : Condensed matter and materials physics, American Physical Society, 2012, 85, pp.035426. <10.1103/PHYSREVB.85.035426>. <hal-00709527>
  • Pieter Van Zwol, Laurent Ranno, Joël Chevrier. Tuning Near Field Radiative Heat Flux through Surface Excitations with a Metal Insulator Transition. Physical Review Letters, American Physical Society, 2012, 108, pp.234301. <10.1103/PhysRevLett.108.234301>. <hal-01001135>
  • Jean-Baptiste Decombe, Wilfrid Schwartz, Catherine Villard, Hervé Guillou, Joël Chevrier, et al.. Living cell imaging by far-field fibered interference scanning optical microscopy. Optic Express, 2011, 19 (3), pp.2702--2710. <10.1364/OE.19.002702>. <hal-00561363>
  • Florence Marchi, Julien Castet, Sylvain Marlière, Nicolas Castagné, Joël Chevrier, et al.. Le concept du NanoLearner : Les mains dans le Nanomonde de l'Université vers le grand public. Journal sur l'enseignement des sciences et technologies de l'information et des systèmes, EDP Sciences, 2011, 9, pp.0014. <10.1051/j3ea/2010017>. <hal-00809823>
  • Joël Chevrier. Presence of electromagnetic fluctuations in micromechanics. Comptes Rendus Physique, Elsevier Masson, 2011, 12, pp.898. <10.1016/j.crhy.2011.10.014>. <hal-01001674>
  • Justine Laurent, Aurélien Drezet, Hermann Sellier, Joël Chevrier, Serge Huant. Large Variation in the Boundary-Condition Slippage for a Rarefied Gas Flowing between Two Surfaces. Physical Review Letters, American Physical Society, 2011, 107, pp.164501. <10.1103/PHYSREVLETT.107.164501>. <hal-00709526>
  • Pieter Van Zwol, Karl Joulain, Philippe Ben-Abdallah, Jean-Jacques Greffet, Joël Chevrier. Fast nanoscale heat-flux modulation with phase-change materials. Physical Review B : Condensed matter and materials physics, American Physical Society, 2011, 83, pp.201404. <10.1103/PhysRevB.83.201404>. <hal-00649176>
  • Pieter Van Zwol, Karl Joulain, Philippe Ben-Abdallah, Joël Chevrier. Phonon-Polaritons enhance near field thermal transfer across the phase transition of VO2. Physical Review B : Condensed matter and materials physics, American Physical Society, 2011, 84 (16), pp.161413. <10.1103/PhysRevB.84.161413>. <hal-00649190>
  • Justine Laurent, Alexis Mosset, Olivier Arcizet, Joël Chevrier, Serge Huant, et al.. ''Negative'' Backaction Noise in Interferometric Detection of a Microlever. Physical Review Letters, American Physical Society, 2011, 107, pp.050801. <10.1103/PHYSREVLETT.107.050801>. <hal-00709525>
  • Florence Marchi, Sylvain Marlière, Jean-Loup Florens, Annie Luciani, Joël Chevrier. Nanomanipulator for Learning Nanophysics: The "NanoLearner" Platform. Transactions on edutainment IV, 2010, 6250, pp.157-175. <10.1007/978-3-642-14484-4_14>. <hal-00880057>
  • Aurélien Drezet, Alessandro Siria, Joel Chevrier, Serge Huant. Giant slip lengths of a simple fluid at vibrating solid interfaces. Physical Review E : Statistical, Nonlinear, and Soft Matter Physics, American Physical Society, 2010, 81, pp.046315. <hal-00985255>
  • Alessandro Siria, Serge Huant, G. Auvert, Fabio Comin, Joël Chevrier. A scheme for solving the plane-plane challenge in force measurements at the nanoscale. Nanoscale Research Letters, SpringerOpen, 2010, 5, pp.1360. <10.1007/s11671-010-9633-y>. <hal-01001049>
  • Guillaume Jourdan, Astrid Lambrecht, Fabio Comin, Joël Chevrier. Quantitative non contact dynamic Casimir force measurements. EPL - Europhysics Letters, European Physical Society/EDP Sciences/Società Italiana di Fisica/IOP Publishing, 2009, 85 (3), pp.31001. <10.1209/0295-5075/85/31001>. <hal-00195915>
  • Thomas Scheler, Mario S. Rodriguès, Thomas W. Cornelius, Christian Mocuta, Angelo Malachias, et al.. Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction. Applied Physics Letters, American Institute of Physics, 2009, 94, pp.023109. <hal-00356887>
  • Alessandro Siria, Olivier Dhez, Wilfrid Schwartz, Gauthier Torricelli, Fabio Comin, et al.. A MEMS-based high frequency x-ray chopper. Nanotechnology, Institute of Physics: Hybrid Open Access, 2009, 20, pp.175501. <10.1088/0957-4484/20/17/175501>. <hal-01001667>
  • Emmanuel Rousseau, Fabio Comin, Alessandro Siria, Guillaume Jourdan, Sebastian Volz, et al.. Radiative heat transfer at the nanoscale. Nature Photonics, Nature Publishing Group, 2009, 3, pp.514-517. <hal-00496314>
  • Emmanuel Rousseau, Alessandro Siria, Guillaume Jourdan, Sebastian Volz, Fabio Comin, et al.. Radiative heat transfer at the nanoscale. Nature Photonics, Nature Publishing Group, 2009, 3, pp.514-517. <10.1038/NPHOTON.2009.144>. <hal-00545171>
  • Alessandro Siria, Aurélien Drezet, Florence Marchi, F. Comin, Joel Chevrier, et al.. Viscous cavity damping of a microlever in a simple fluid. Physical Review Letters, American Physical Society, 2009, 102, pp.254503. <hal-00985260>
  • Mario Rodrigues, Olivier Dhez, Simon Le Denmat, Joël Chevrier, Roberto Felici, et al.. Local detection of X-ray spectroscopies with an in-situ AFM. Journal of Instrumentation, IOP Publishing, 2008, 3, pp.2001. <hal-00282863v4>
  • Florence Marchi, Raphaelle Dianoux, Henke Jan Smilde, Pierre Mur, Fabio Comin, et al.. Characterisation of trapped electric charge carriers behaviour at nanometer scale by electrostatic force microscopy. Journal of Electrostatics, Elsevier, 2008, pp.1-10. <10.1016/j.elstat.2008.06.006>. <hal-00318575>
  • Guillaume Jourdan, Fabio Comin, Joël Chevrier. Mechanical mode dependence of bolometric back-action in an AFM microlever. Physical Review Letters, American Physical Society, 2008, 101 (13), pp.133904. <10.1103/PhysRevLett.101.133904>. <hal-00257633v2>
  • Guillaume Jourdan, Gauthier Torricelli, Joël Chevrier, Fabio Comin. Tuning the effective coupling of an AFM lever to a thermal bath. Nanotechnology, Institute of Physics: Hybrid Open Access, 2007, 18, pp.475502. <10.1088/0957-4484/18/47/475502>. <hal-00172171v2>
  • Raphaelle Dianoux, Florence Marchi, Henke Jan Smilde, Nicolas Buffet, Pierre Mur, et al.. Charging dynamics and strong localization of a two-dimensional electron cloud. Nanotechnology, Institute of Physics: Hybrid Open Access, 2007, 18 (32), pp.325403. <10.1088/0957-4484/18/32/325403>. <hal-00088811>
  • F. Martins, B. Hackens, M. G. Pala, Thierry Ouisse, Hermann Sellier, et al.. Imaging electron wave functions inside open quantum rings. Physical Review Letters, American Physical Society, 2007, 99, pp.136807. <10.1103/PhysRevLett.99.136807>. <hal-00193197>
  • B. Hackens, F. Martins, T. Ouisse, H. Sellier, S. Bollaert, et al.. Imaging and controlling electron transport inside a quantum ring. Nature Physics, Nature Publishing Group, 2006, 2, pp.826. <10.1038/nphys459>. <hal-00167167>
  • Annie Luciani, Daniela Urma, Sylvain Marlière, Joël Chevrier. PRESENCE : the sense of believability on inaccessible worlds. Computers and Graphics, Elsevier, 2004, 28 (4), pp.509-517. <10.1016/j.cag.2004.04.006>. <hal-00479975>
  • S. Decossas, L. Patrone, A.M. Bonnot, F. Comin, M. Derivaz, et al.. Nanomanipulation by atomic force microscopy of carbon nanotubes on a nanostructured surface. Surface Science, Elsevier, 2003, pp.543, 57-62, (2003). <hal-00477221>
  • Joël Chevrier. Experimental Analysis of River Patterns in Silicon Brittle Fractures. Journal de Physique I, EDP Sciences, 1995, 5 (6), pp.675-683. <10.1051/jp1:1995159>. <jpa-00247093>
  • Joël Chevrier, A. Cruz, N. Pinto, I. Berbezier, J. Derrien. Influence of kinetic roughening on the epitaxial growth of silicon. Journal de Physique I, EDP Sciences, 1994, 4 (9), pp.1309-1324. <10.1051/jp1:1994190>. <jpa-00246993>
  • M.G. Le Boite, A. Traverse, H. Bernas, C. Janot, Joël Chevrier. Study of ion beam mixed multilayers via neutron scattering. Materials Letters, Elsevier, 1988, 6, pp.173-176. <in2p3-00001344>
  • Joël Chevrier, P. Sainfort, P. Germi, D. Pavuna. INFLUENCE OF RAPID QUENCHING AND SAMPLE TREATMENT ON THE STRUCTURE OF MELT SPUN Al-Si ALLOYS. Journal de Physique Colloques, 1985, 46 (C8), pp.C8-533-C8-537. <10.1051/jphyscol:1985884>. <jpa-00225237>
  • Joël Chevrier. Cinétique du transport de matière dans un tube ouvert. Revue de Physique Appliquee, 1977, 12 (6), pp.931-936. <10.1051/rphysap:01977001206093100>. <jpa-00244263>
  • A. Joullie, R. Dedies, Joël Chevrier, G. Bougnot. Diagramme de phases et croissance par épitaxie en phase liquide du GaxIn1-xSb. Revue de Physique Appliquee, 1974, 9 (2), pp.455-463. <10.1051/rphysap:0197400902045500>. <jpa-00243802>
  • Joël Chevrier, D. Etienne, G. Bougnot. Évaporation du séléniure de zinc en tube ouvert sous flux d'argon et d'hydrogène. Revue de Physique Appliquee, 1974, 9 (1), pp.315-321. <10.1051/rphysap:0197400901031500>. <jpa-00243766>

Pré-publication, Document de travail4 documents

  • Joel Chevrier. Des smartphones pour faire des expériences de physique au lycée et à l’université. 2014. <hal-01176253>
  • Sylvain Marlière, Jean-Loup Florens, Florence Marchi, Annie Luciani, Joël Chevrier. Implementation of perception and action at nanoscale. Proceedings of ENACTIVE/07 4th International Conference on Enactive Interfaces Grenoble, France, .. 2007. <hal-00202063>
  • Florence Marchi, Raphaelle Dianoux, Fabio Comin, Joël Chevrier. Injection and detection of electrical charges by EFM. 2006. <hal-00088795>
  • Gauthier Torricelli, Khaled Ayadi, Pavel Budau, Fabio Comin, Joël Chevrier. Non parabolic capacitive coupling in an AFM based microsystem at the picoNewton level. 2006. <hal-00088810>

Communication dans un congrès17 documents

  • Joel Chevrier, Laya Madani, Ahmad Bsiesy. Can a smartphone be a HomeLab ?. LearnxDesign Chicago 2015, Jun 2015, Chicago, United States. <hal-01180294>
  • Philippe Ben-Abdallah, Svend-Age Biehs, Felipe S. S. Rosa, K. Joulain, Pieter Van Zwol, et al.. Active control of near-field heat transfer. Meta12, Apr 2012, xx, France. <hal-00818632>
  • Nicolas Venant, Antoine Niguès, Florence Marchi, Michal Hrouzek, Fabio Comin, et al.. Multi-Sensorial Interface for 3D Teleoperation at Micro and Nanoscale. Haptics : generating and perceiving tangible sensations, Apr 2010, Amsterdam, Netherlands. pp.35-42, 2010. <hal-00910683>
  • Bénédicte Hingant, Joël Chevrier, Annie Luciani, Virginie Albe. Une analyse des controverses soulevées par les nanosciences et les nanotechnologies préalable à la mise en place et l'analyse de situations d'enseignement. 3ème Rencontres Jules Verne, Nov 2010, Nantes, France. pp.7. <hal-01092146>
  • Emmanuel Rousseau, Alessandro Siria, Guillaume Jourdan, S. Volz, Fabio Comin, et al.. Contribution of surface plasmons to radiative heat transfer at the nanoscale. Second International Conference on Metamaterials (Meta'10), Feb 2010, Cairo, Egypt. <hal-00576151>
  • Emmanuel Rousseau, Alessandro Siria, Guillaume Jourdan, S. Volz, Fabio Comin, et al.. Contribution of surface plasmons to radiative heat transfer at the nanoscale. Gordon Conference on Plasmonics, Jun 2010, Waterville, FL, United States. <hal-00576150>
  • Florence Marchi, Julien Castet, Sylvain Marlière, Joël Chevrier, Annie Luciani, et al.. Le concept du NanoLearner : les mains dans le Nanomonde du grand public à l'Université. CETSIS 2010 - Colloque sur l'enseignement des Technologies et des Sciences de l'Information et des Systèmes, Mar 2010, Grenoble, France. pp.77, 2010. <hal-00524788>
  • Joël Chevrier, Annie Luciani, Florence Marchi, Jean-Loup Florens. Hands-on Nanosciences. COGIS 2009 - COGnitive systems with Interactive Sensors, Nov 2009, Paris, France. pp.x-x, 2009. <hal-00420414>
  • Emmanuel Rousseau, Alessandro Siria, Guillaume Jourdan, S. Volz, Fabio Comin, et al.. Measurement of radiative heat transfer due to evanescent waves. Micro and Nanoscale Heat and Mass Transfer International Conference, Dec 2009, Shanghai, China. <hal-00574796>
  • Sylvain Marlière, Florence Marchi, Jean-Loup Florens, Annie Luciani, Joël Chevrier. An Augmented Reality Nanomanipulator for Learning Nanophysics: the "NanoLearner" Platform. Cyberworlds 2008, Sep 2008, Hangzhou, China. IEEE Computer Society, pp.94-101, 2008, <10.1109/CW.2008.82>. <hal-00437620>
  • Gildas Besancon, Alina Voda, Michal Hrouzek, Joël Chevrier. Observateur-contrôleur pour la mesure topographique par microscopie AFM. May 2006, 2006, 30-31 mai - 1er juin 2006, Bordeaux, France. <hal-00128254>
  • Michal Hrouzek, Gildas Besancon, Alina Voda, Joël Chevrier. Observer based position detection of a cantilever in atomic force microscopy. Sep 2006, 2006, 12-14 September 2006, Heidelberg, Germany. <hal-00128267>
  • Florence Marchi, Sylvain Marlière, Jean-Loup Florens, Annie Luciani, Claude Cadoz, et al.. Feeling nanospace through a multisensory nanomanipulator. Seeing at the Nanoscale European Conference II, 2004, Grenoble, France. 2004. <hal-00910676>
  • Annie Luciani, Sylvain Marlière, Florence Marchi, Joël Chevrier, Daniela Urma. Approaching nano-spaces : 1-DOF nanomanipulator. Trends in Nano-Technology Conference 2003, 2003, Salamanca, Spain. pp.145-146, 2003. <hal-00910595>
  • Jean-Loup Florens, Sylvain Marlière, Daniela Urma, Annie Luciani, Joël Chevrier, et al.. Atomic Force Microscope Functionality Simulation : Physical and Energetic Analogies. NANO 2003 - Integrated nanosytems, Sep 2003, Palo Alto, CA, United States. ASME, 2 p., 2003. <hal-00910452>
  • Annie Luciani, Daniela Urma, Sylvain Marlière, Joël Chevrier. PRESENCE: The Sense of Believability of Inaccessible Worlds. Tosiyasu L. Kunii, Seah Hock Soon, Alexei Sourin. CW 2003 - 2nd International Conference on Cyberworlds, Dec 2003, Singapore, Singapore. IEEE Computer Society, pp.114-119, 2003, <10.1109/CYBER.2003.1253443>. <hal-00281899>
  • Sylvain Marlière, Florence Marchi, Frédéric Gay, Joël Chevrier, Daniela Urma, et al.. Touching nanospace : Atomic Force Microscope coupling with a force feedback manipulation system. 12th international conference on Scanning, Tunneling, Microscopy/Spectroscopy and related techniques, 2003, Eindhoven, Netherlands. pp.2, 2003. <hal-00910599>

Brevet1 document

  • Michal Hrouzek, Alina Voda, Joël Chevrier, Gildas Besancon, Fabio Comin. Microscope à force atomique asservi. France, N° de brevet: B7586. CO. 2006, pp.12. <hal-00128257>