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Number of documents

9

Jérôme Fortineau


en cours de rédaction


Gaël Gautier   

Journal articles2 documents

  • Julien Bustillo, Jérôme Fortineau, Gaël Gautier, Marc Lethiecq. Ultrasonic characterization of electrochemically etched porous silicon. Japanese Journal of Applied Physics, Japan Society of Applied Physics, 2014, 53 (6), ⟨10.7567/JJAP.53.060308⟩. ⟨hal-01255201⟩
  • Julien Bustillo, Jérôme Fortineau, Gaël Gautier, Marc Lethiecq. Ultrasonic characterization of porous silicon using a genetic algorithm to solve the inverse problem. NDT International, Elsevier, 2013, 62, pp.93-98. ⟨10.1016/j.ndteint.2013.11.007⟩. ⟨hal-01080736⟩

Conference papers7 documents

  • Julien Bustillo, Gaël Gautier, Jérôme Fortineau, Laurianne Blanc. Caractérisation Ultrasonore de silicium poreux. S2P, Jul 2014, Tours, France. ⟨hal-01255332⟩
  • Julien Bustillo, Jérôme Fortineau, Gaël Gautier, Marc Lethiecq. Ultrasonic investigation of mesoporous silicon. PSST 2014, Mar 2014, Alicante, Spain. ⟨hal-01255222⟩
  • Julien Bustillo, Mathieu Domenjoud, Jérôme Fortineau, Gael Gautier, Marc Lethiecq. Determination of microscopic parameters of piezoceramic materials under electrical loading using genetic algorithm. IEEE International Symposium on the Applications of Ferroelectrics and Piezoresponse Force Microscopy, May 2014, Penn State, United States. ⟨10.1109/ISAF.2014.6922964⟩. ⟨hal-01235821⟩
  • Julien Bustillo, Jérôme Fortineau, Gaël Gautier, Marc Lethiecq. Caractérisation ultrasonore du silicium poreux. JAPSUS 2013, Jun 2013, Montpellier, France. ⟨hal-01255339⟩
  • Julien Bustillo, Mathieu Domenjoud, Jérôme Fortineau, Gaël Gautier, Marc Lethiecq. Characterisation of soft and hard piezoceramic materials using genetic algorithm based optimisation. Electroceramics for End-users, Mar 2013, Les Arcs, France. ⟨hal-01235846⟩
  • Julien Bustillo, Jérôme Fortineau, Gaël Gautier, Marc Lethiecq. Ultrasonic Characterization of Electrochemically Etched Porous Silicon. International Congress on Ultrasonics, May 2013, Singapore, Singapore. ⟨hal-01255327⟩
  • Julien Bustillo, Jérôme Fortineau, Marie Capelle, François Vander Meulen, Lionel Haumesser, et al.. Porosity evaluation of PoSi wafer using a nondestructive ultrasonic technic. Acoustics 2012, Apr 2012, Nantes, France. ⟨hal-00810963⟩