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A calculation method to estimate single event upset cross section

 Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Jérôme Boch , et al.
Microelectronics Reliability, 2017, 76-77, pp.644-649. ⟨10.1016/j.microrel.2017.07.056⟩
Article dans une revue hal-01636059v1

The use of dose-rate switching experiments to characterize bipolar devices

 J. Boch , Y. Gonzalez Velo , Frédéric Saigné , N. Roche , J.-R. Vaillé , et al.
46th IEEE Nuclear Space and Radiation Effects Conference, 2009, Québec, Canada
Communication dans un congrès hal-01822868v1

Review and analysis of the radiation induced degradation observed on the input bias current of linear integrated circuits

 L. Dusseau , M. Bernard , Y. Gonzalez Velo , N. Roche , E. Lorfèvre , et al.
45th IEEE Nuclear Space and Radiation Effects Conference, 2008, Tucson, United States
Communication dans un congrès hal-01822450v1

Orbital Parameters Drift of Seven Vega Maiden Flight CubeSats

 M. Bernard , L. Dusseau , M. Dudeck , A. Gaboriaud , V. Gupta , et al.
Small Satellite Services and Systems Symposium (ESA/CNES), 2014, Mallorca, Spain
Communication dans un congrès hal-01934480v1

Monte Carlo simulation of particle-induced bit upsets

 Frédéric Wrobel , Antoine Touboul , Jean-Roch Vaillé , Jérôme Boch , Frédéric Saigné
13th International Conference on Radiation Shielding (ICRS-13) & 19th Topical Meeting of the Radiation Protection & Shielding Division of the American Nuclear Society -2016 (RPSD-2016), Oct 2016, Paris, France. pp.06033, ⟨10.1051/epjconf/201715306033⟩
Communication dans un congrès hal-01645320v1

Analysis of thermal annealing approach to extend electronic device lifetime

 S. Dhombres , A. Michez , J. Boch , S. Beauvivre , D. Kraehenbuehl , et al.
IEEE RADECS 2015, 2015, Moscou, Russia
Communication dans un congrès hal-01932427v1

Physical Model for the Low Dose Rate Effect in Bipolar Devices

 J. Boch , Frédéric Saigné , R. D. Schrimpf , J.-R. Vaillé , L. Dusseau , et al.
43th IEEE Nuclear Space and Radiation Effects Conference, 2006, Ponte Vedra Beach, United States
Communication dans un congrès hal-01808287v1

Analysis of the Bias Effect on the Total-Dose Response of a Linear Bipolar Comparator

 M. Bernard , L. Dusseau , J. Boch , Frédéric Saigné , R. D. Schrimpf , et al.
43th IEEE Nuclear Space and Radiation Effects Conference, 2006, Ponte Vedra Beach, United States
Communication dans un congrès hal-01807732v1

Application de comptage et de recensement pour les inventaires avifaunes

 E. Vas , G. T. Kesse , S. Chakib , J. Boch , G. Boguszewski , et al.
Colloque scientifique francophone Drones et moyens légers aéroportés d’observation, 2014, Montpellier, France
Communication dans un congrès hal-01934630v1

Estimation of Low Dose Rate Degradation on Bipolar Linear Integrated Circuits Using Switching Experiments

 J. Boch , Frédéric Saigné , R.D. Schrimpf , J.-R. Vaillé , L. Dusseau
IEEE Transactions on Nuclear Science, 2005, VOL 52 (NUMB 6), p. 2616-2621. ⟨10.1109/TNS.2005.860711⟩
Article dans une revue hal-00327775v1

Simultaneous evaluation of TID and displacement damage dose using a single OSL sensor

 P. Garcia , J.-R. Vaillé , D. Benoit , H. Chabane , G. Berger , et al.
IEEE Transactions on Nuclear Science, 2006, 53 (6), pp.3713-3717. ⟨10.1109/TNS.2006.885003⟩
Article dans une revue hal-00329597v1

Criterion for SEU Occurrence in SRAM Deduced From Circuit and Device Simulations in Case of Neutron-Induced SER

 T. Mérelle , H. Chabane , J.-M. Palau , K. Castellani-Coulié , Frédéric Wrobel , et al.
IEEE Transactions on Nuclear Science, 2005, 52 (4), pp.1148-1155. ⟨10.1109/TNS.2005.852319⟩
Article dans une revue hal-00328654v1
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The CELESTA CubeSat In-Flight Radiation Measurements and their Comparison with Ground Facilities Predictions

 Andrea Coronetti , Alessandro Zimmaro , Rubén García Alía , Salvatore Danzeca , Alessandro Masi , et al.
IEEE Transactions on Nuclear Science, In press, ⟨10.1109/TNS.2024.3376749⟩
Article dans une revue hal-04526716v1

Study of a Thermal Annealing Approach for Very High Total Dose Environments

 S. Dhombres , A. Michez , J. Boch , F. Saigné , S. Beauvivre , et al.
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.2923 - 2929. ⟨10.1109/TNS.2014.2365875⟩
Article dans une revue hal-01635351v1

ELDRS : Optimization Tools for the Switched Dose Rate Technique

 J. Boch , Y. Gonzalez Velo , Frédéric Saigné , Nicolas Jean-Henri Roche , S. Perez , et al.
IEEE Transactions on Nuclear Science, 2011, 58 (6), pp.2998 - 3003. ⟨10.1109/TNS.2011.2171003⟩
Article dans une revue hal-01632664v1

A toolkit to demystify CMOS Active Pixel Sensors

 Jean-Marc J.-M. Galliere , Jérôme Boch
MSE: Microelectronic Systems Education, Jun 2013, Austin, TX, United States. ⟨10.1109/MSE.2013.6566696⟩
Communication dans un congrès hal-01709627v1

Innovative Simulations of Heavy Ion cross-sections in a 130nm CMOS SRAM. Influence of the passivation layers and PMOS contribution

 V. Correas , Frédéric Saigné , B. Sagnes , J. Boch , G. Gasiot , et al.
44th IEEE Nuclear Space and Radiation Effects Conference, 2007, Honolulu, United States
Communication dans un congrès hal-01822422v1

Prediction of Multiple Cell Upset Induced by Heavy Ions in a 90 nm Bulk SRAM

 V. Correas , Frédéric Saigné , B. Sagnes , Frédéric Wrobel , J. Boch , et al.
IEEE Transactions on Nuclear Science, 2009, 56 (4), pp.2050 - 2055. ⟨10.1109/TNS.2009.2013622⟩
Article dans une revue hal-01631580v1

Temperature Effect on Geminate Recombination

 J. Boch , Frédéric Saigné , L. Dusseau , R.D. Schrimpf
Applied Physics Letters, 2006, 89 (4), pp.042108.1-042108.3. ⟨10.1063/1.2236707⟩
Article dans une revue hal-00329586v1

Effects of Total Ionizing Dose on I-V and Low Frequency Noise characteristics in advanced Si/SiGe:C Heterojunction Bipolar Transistors

 J. Elbeyrouthy , A. Vauthelin , M. Seif , Bruno Sagnes , F. Pascal , et al.
RADECS 2019, 30th European Conference on Radiation and its Effects on Components and Systems, Sep 2019, Montpellier, France
Communication dans un congrès hal-02380234v1

Dose Effects on CMOS Active Pixel Sensors

 S. Dhombres , A. Michez , J. Boch , S. Beauvivre , D. Kraehenbuehl , et al.
IEEE RADECS 2015, 2015, Moscou, Russia
Communication dans un congrès hal-01824754v1

Radiation Hardness Assurance for Nanosatellites

 M. Rousselet , J. Boch , L. Dusseau , F. Saigné , M. Bernard , et al.
Small Satellite Services and Systems Symposium (ESA/CNES), 2014, Mallorca, Spain
Communication dans un congrès hal-01824748v1

Measurement of the energy depositions in a silicon volume by 14 MeV neutrons

 H. Chabane , J.-R. Vaillé , Bruno Barelaud , Frédéric Wrobel , Y. Calzavara , et al.
IEEE Transactions on Nuclear Science, 2006, 53 (6), pp.3707-3712. ⟨10.1109/TNS.2006.885008⟩
Article dans une revue hal-00329675v1

ECORCE: A TCAD Tool for Total Ionizing Dose and Single Event Effect Modeling

 A. Michez , S. Dhombres , J. Boch
IEEE Transactions on Nuclear Science, 2015, 62 (4), pp.1516 - 1527. ⟨10.1109/TNS.2015.2449281⟩
Article dans une revue hal-01635741v1

Temperature Effect on Heavy-Ion Induced Parasitic Current on SRAM by Device Simulation: Effect on SEU Sensitivity

 D. Truyen , J. Boch , B. Sagnes , N. Renaud , E. Leduc , et al.
IEEE Transactions on Nuclear Science, 2007, 54 (4), pp.1025-1029. ⟨10.1109/TNS.2007.894298⟩
Article dans une revue hal-00327115v1

Effect of Switching from High to Low Dose Rate on Linear Bipolar Technology Radiation Response

 J. Boch , Frédéric Saigné , R.D. Schrimpf , D.M. Fleetwood , S. Ducret , et al.
IEEE Transactions on Nuclear Science, 2004, 51 (Issue 5, Part 3), pp.2896-2902. ⟨10.1109/TNS.2004.835047⟩
Article dans une revue hal-00327364v1

Conductive atomic force microscopy as a tool to reveal high ionising dose effects on ultra thin SiO2/Si structures

 Richard Arinero , Antoine Touboul , M. Ramonda , C. Guasch , Y. Gonzalez-Velo , et al.
Applied Nanoscience, 2013, 3 (3), pp.235 - 240. ⟨10.1007/s13204-012-0126-4⟩
Article dans une revue hal-01633528v1

CRATEBO: A High-speed, Radiation-Tolerant and Versatile Testing Platform for FPGA Radiation Qualification for High-Energy Particle Accelerator applications

 Antonio Scialdone , Rudy Ferraro , Panagiotis Gkountoumis , Salvatore Danzeca , Luigi Dilillo , et al.
TWEPP 2023 Topical Workshop on Electronics for Particle Physics, Oct 2023, Geremeas, Italy
Communication dans un congrès hal-04122431v1

Exploring Radiation-Induced Vulnerabilities in RFICs through Traditional RF Metrics

 Antonio Scialdone , Rudy Ferraro , Luigi Dilillo , Frederic Saigne , Jérôme Boch , et al.
IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.2068-2075. ⟨10.1109/TNS.2023.3270206⟩
Article dans une revue hal-04120913v1

Development of a New Methodology to Model the Synergistic Effects between TID and ASETs

 N. Roche , L. Dusseau , J. Boch , Y. Gonzalez Velo , J.-R. Vaillé , et al.
10th European Conference on Radiation and its Effects on Components and Systems, 2009, Bruges, Belgium
Communication dans un congrès hal-01822891v1
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