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114 résultats
Injection de fautes par modification de l'horloge: application à l'AES.Cryptopuce2009, Jun 2009, Porquerolle, France
Communication dans un congrès
emse-00463505v1
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On the Use of Forward Body Biasing to Decrease the Repeatability of Laser-Induced Faults2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2016, Dresde, Germany
Communication dans un congrès
emse-01855866v1
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Laser testing of a double-access BBICS architecture with improved SEE detection capabilities2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2016, Bremen, Germany. ⟨10.1109/RADECS.2016.8093172⟩
Communication dans un congrès
emse-01855833v1
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When Clocks Fail: On Critical Paths and Clock Faults9th IFIP WG 8.1/11.2 International conference, CARDIS 2010, Apr 2010, Passau, Germany. pp.182-193, ⟨10.1007/978-3-642-12510-2_13⟩
Communication dans un congrès
emse-00474337v1
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Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90nm technologyMicroelectronics Reliability, 2012, pp.2035-2038. ⟨10.1016/j.microrel.2012.06.047⟩
Article dans une revue
emse-01110360v1
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On the use of the EM medium as a fault injection meansCryptArchi: Cryptographic Architectures, Jun 2012, St-Etienne, France
Communication dans un congrès
emse-00742707v1
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Permanent Laser Fault Injection into the Flash Memory of a Microcontroller2021 19th IEEE International New Circuits and Systems Conference (NEWCAS), Jun 2021, Toulon, France. pp.1-4, ⟨10.1109/NEWCAS50681.2021.9462773⟩
Communication dans un congrès
hal-03360634v1
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Method for evaluation of transient-fault detection techniquesESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France
Communication dans un congrès
hal-01721081v1
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Frontside Versus Backside Laser Injection: A Comparative StudyACM Journal on Emerging Technologies in Computing Systems, 2016, Special Issue on Secure and Trustworthy Computing, 13 (1), pp.7. ⟨10.1145/2845999⟩
Article dans une revue
lirmm-01444121v1
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The bad and the good of physical functionsCryptarchi, Jun 2013, Fréjus, France
Communication dans un congrès
cea-01094232v1
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A DFA on AES based on the entropy of error distributionsFDTC 2012, Sep 2012, Leuven, Belgium. pp.34
Communication dans un congrès
emse-00742642v1
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Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOSMicroelectronics Reliability, 2014, 54 (9-10), pp.2289-2294. ⟨10.1016/j.microrel.2014.07.151⟩
Article dans une revue
emse-01094805v1
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Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault modelFDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩
Communication dans un congrès
emse-01856008v1
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A Bulk Built-in Sensor for Detection of Fault AttacksHOST: Hardware-Oriented Security and Trust, Jun 2013, Austin, TX, United States. pp.51-54, ⟨10.1109/HST.2013.6581565⟩
Communication dans un congrès
lirmm-01430800v1
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Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection AttemptsJoint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands
Communication dans un congrès
emse-01099040v1
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A Side-Channel and Fault-Attack Resistant AES Circuit Working on Duplicated Complemented ValuesISSCC 2011 - International Solid State Circuits Conference, Feb 2011, San Francisco, United States. pp.274-276, ⟨10.1109/ISSCC.2011.5746316⟩
Communication dans un congrès
emse-00541009v1
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Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currentsOn-Line Testing Symposium (IOLTS), 2015 IEEE 21st International, Jul 2015, Halkidiki, Greece. ⟨10.1109/IOLTS.2015.7229849⟩
Communication dans un congrès
emse-01227307v1
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Low cost fault injection method for security characterizationE-Smart 2009, Sep 2009, Sophia-Antipolis, France
Communication dans un congrès
emse-00481620v1
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Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell2020 33rd Symposium on Integrated Circuits and Systems Design (SBCCI), Aug 2020, Campinas, Brazil. pp.1-6, ⟨10.1109/SBCCI50935.2020.9189897⟩
Communication dans un congrès
hal-03217265v1
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An experimentally tuned compact electrical model for laser fault injection simulationIOLTS 2022 - IEEE 28th International Symposium on On-Line Testing and Robust System Design, IEEE, Sep 2022, Turin, Italy. pp.1-5, ⟨10.1109/IOLTS56730.2022.9897189⟩
Communication dans un congrès
hal-04134425v1
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Experimental Analysis of the Laser-Induced Instruction Skip Fault ModelThe 24th Nordic Conference on Secure IT Systems, Nordsec 2019, Nov 2019, Aalborg, Denmark. pp.221-237, ⟨10.1007/978-3-030-35055-0_14⟩
Communication dans un congrès
hal-02379754v1
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Electromagnetic Transient Faults Injection on a hardware and software implementations of AESFDTC 2012, Sep 2012, Leuven, Belgium. pp.7
Communication dans un congrès
emse-00742639v1
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An Overview of Laser Injection against Embedded Neural Network Models2021 IEEE 7th World Forum on Internet of Things (WF-IoT), Jun 2021, New Orleans, United States. ⟨10.1109/WF-IoT51360.2021.9595075⟩
Communication dans un congrès
cea-04176725v1
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Laser-Induced Faults in SRAM Memory Cells: Experimental Results and Simulation-based AnalysisTRUDEVICE - WG Meetings, 2013, Dec 2013, Freiburg, Germany
Communication dans un congrès
emse-01110358v1
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Robustness of CMOS Circuits Designed for Space and Terrestrial EnvironmentXVI Conference on Design of Circuits and Integrated Systems, Nov 2001, Porto, Portugal
Communication dans un congrès
emse-01130935v1
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Body Biasing Injection Attacks in PracticeCS2: Cryptography and Security in Computing Systems, Jan 2016, Prague, Czech Republic. pp.49-54, ⟨10.1145/2858930.2858940⟩
Communication dans un congrès
lirmm-01434143v1
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Building the electricalmodel of the PhotoelectricLaserStimulation of a PMOS transistor in 90 nm technologyMicroelectronics Reliability, 2012, 52, pp.2035-2038
Article dans une revue
emse-00742622v1
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Precise Spatio-Temporal Electromagnetic Fault Injections on Data Transfers2019 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), Aug 2019, Atlanta, United States. pp.1-8, ⟨10.1109/FDTC.2019.00009⟩
Communication dans un congrès
hal-02338456v1
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Experimental Analysis of the Electromagnetic Instruction Skip Fault Model and Consequences for Software CountermeasuresMicroelectronics Reliability, 2021
Article dans une revue
hal-03360628v1
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Evidence of an information leakage between logically independent blocksSecond Workshop on Cryptography and Security in Computing Systems (CS2'2015), Jan 2015, Amsterdam, Netherlands. pp.25, ⟨10.1145/2694805.2694810⟩
Communication dans un congrès
hal-01855795v1
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