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113 résultats
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An experimentally tuned compact electrical model for laser fault injection simulationIOLTS 2022 - IEEE 28th International Symposium on On-Line Testing and Robust System Design, IEEE, Sep 2022, Turin, Italy. pp.1-5, ⟨10.1109/IOLTS56730.2022.9897189⟩
Communication dans un congrès
hal-04134425v1
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An Overview of Laser Injection against Embedded Neural Network Models2021 IEEE 7th World Forum on Internet of Things (WF-IoT), Jun 2021, New Orleans, United States. ⟨10.1109/WF-IoT51360.2021.9595075⟩
Communication dans un congrès
cea-04176725v1
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Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell2020 33rd Symposium on Integrated Circuits and Systems Design (SBCCI), Aug 2020, Campinas, Brazil. pp.1-6, ⟨10.1109/SBCCI50935.2020.9189897⟩
Communication dans un congrès
hal-03217265v1
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A Bulk Built-in Sensor for Detection of Fault AttacksHOST: Hardware-Oriented Security and Trust, Jun 2013, Austin, TX, United States. pp.51-54, ⟨10.1109/HST.2013.6581565⟩
Communication dans un congrès
lirmm-01430800v1
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Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault modelFDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩
Communication dans un congrès
emse-01856008v1
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Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection AttemptsJoint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands
Communication dans un congrès
emse-01099040v1
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A Side-Channel and Fault-Attack Resistant AES Circuit Working on Duplicated Complemented ValuesISSCC 2011 - International Solid State Circuits Conference, Feb 2011, San Francisco, United States. pp.274-276, ⟨10.1109/ISSCC.2011.5746316⟩
Communication dans un congrès
emse-00541009v1
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Electromagnetic Transient Faults Injection on a hardware and software implementations of AESFDTC 2012, Sep 2012, Leuven, Belgium. pp.7
Communication dans un congrès
emse-00742639v1
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Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currentsOn-Line Testing Symposium (IOLTS), 2015 IEEE 21st International, Jul 2015, Halkidiki, Greece. ⟨10.1109/IOLTS.2015.7229849⟩
Communication dans un congrès
emse-01227307v1
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Low cost fault injection method for security characterizationE-Smart 2009, Sep 2009, Sophia-Antipolis, France
Communication dans un congrès
emse-00481620v1
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Experimental Analysis of the Laser-Induced Instruction Skip Fault ModelThe 24th Nordic Conference on Secure IT Systems, Nordsec 2019, Nov 2019, Aalborg, Denmark. pp.221-237, ⟨10.1007/978-3-030-35055-0_14⟩
Communication dans un congrès
hal-02379754v1
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Laser-Induced Faults in SRAM Memory Cells: Experimental Results and Simulation-based AnalysisTRUDEVICE - WG Meetings, 2013, Dec 2013, Freiburg, Germany
Communication dans un congrès
emse-01110358v1
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Characterization and TCAD Simulation of 90nm Technology PMOS Transistor Under Continuous Photoelectric Laser Stimulation for Failure Analysis Improvement38th International Symposium for Testing and Failure Analysis, ISTFA 2012, Nov 2012, Phoenix, United States
Communication dans un congrès
emse-01130626v1
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Robustness of CMOS Circuits Designed for Space and Terrestrial EnvironmentXVI Conference on Design of Circuits and Integrated Systems, Nov 2001, Porto, Portugal
Communication dans un congrès
emse-01130935v1
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Body Biasing Injection Attacks in PracticeCS2: Cryptography and Security in Computing Systems, Jan 2016, Prague, Czech Republic. pp.49-54, ⟨10.1145/2858930.2858940⟩
Communication dans un congrès
lirmm-01434143v1
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Evidence of an information leakage between logically independent blocksSecond Workshop on Cryptography and Security in Computing Systems (CS2'2015), Jan 2015, Amsterdam, Netherlands. pp.25, ⟨10.1145/2694805.2694810⟩
Communication dans un congrès
hal-01855795v1
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Building the electricalmodel of the PhotoelectricLaserStimulation of a PMOS transistor in 90 nm technologyMicroelectronics Reliability, 2012, 52, pp.2035-2038
Article dans une revue
emse-00742622v1
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Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detectionMicroelectronics Reliability, 2013, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 53 (9), pp.1320-1324. ⟨10.1016/j.microrel.2013.07.069⟩
Article dans une revue
istex
emse-01100723v1
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Single-bit Laser Fault Model in NOR Flash Memories2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), Sep 2020, Milan, Italy. pp.41-48, ⟨10.1109/FDTC51366.2020.00013⟩
Communication dans un congrès
hal-03034855v1
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Precise Spatio-Temporal Electromagnetic Fault Injections on Data Transfers2019 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), Aug 2019, Atlanta, United States. pp.1-8, ⟨10.1109/FDTC.2019.00009⟩
Communication dans un congrès
hal-02338456v1
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Practical measurements of data path delays for IP authentication & integrity verificationReconfigurable and Communication-Centric Systems-on-Chip (ReCoSoC), 2013 8th International Workshop on, Jul 2013, Darmstadt, Germany. ⟨10.1109/ReCoSoC.2013.6581551⟩
Poster de conférence
emse-01109140v1
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Fault Round Modification Analysis of the Advanced Encryption StandardHardware-Oriented Security and Trust (HOST), 2012, Jun 2012, San Francisco, United States. pp.140--145, ⟨10.1109/HST.2012.6224334⟩
Communication dans un congrès
emse-00742567v1
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Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and SimulationDSD 2017 - Euromicro Symposium on Digital System Design, Aug 2017, Vienna, Austria. pp.252-259, ⟨10.1109/DSD.2017.43⟩
Communication dans un congrès
lirmm-01699776v1
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Electromagnetic glitch on the AES round counterFourth International Workshop on Constructive Side-Channel Analysis and Secure Design - COSADE'2013, Mar 2013, Paris, France. pp 17-31, ⟨10.1007/978-3-642-40026-1⟩
Communication dans un congrès
emse-00837514v1
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Experimental Analysis of the Electromagnetic Instruction Skip Fault Model and Consequences for Software CountermeasuresMicroelectronics Reliability, 2021
Article dans une revue
hal-03360628v1
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Assessing Body Built-In Current Sensors for Detection of Multiple Transient FaultsMicroelectronics Reliability, 2018, 88-90, pp.128-134. ⟨10.1016/j.microrel.2018.07.111⟩
Article dans une revue
hal-01893676v1
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Photonic power firewallsJournal of Cryptographic Engineering, 2022, 12, pp.245-254
Article dans une revue
hal-03932237v1
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Comparison of side-channel leakage on Rich and Trusted Execution Environmentsthe Sixth Workshop, Jan 2019, Valencia, Spain. pp.19-22, ⟨10.1145/3304080.3304084⟩
Communication dans un congrès
hal-02380360v1
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Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany
Communication dans un congrès
hal-03094235v1
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Experimental Analysis of the Electromagnetic Instruction Skip Fault Model15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2020), Apr 2020, Marrakech, Morocco. ⟨10.1109/DTIS48698.2020.9081261⟩
Communication dans un congrès
hal-02572398v1
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