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Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model

 Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Stephan de Castro , Louis-Barthelemy Faber , et al.
FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩
Communication dans un congrès emse-01856008v1
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A Bulk Built-in Sensor for Detection of Fault Attacks

 Rodrigo Possamai Bastos , Frank Sill Torres , Jean Max Dutertre , Marie-Lise Flottes , Giorgio Di Natale , et al.
HOST: Hardware-Oriented Security and Trust, Jun 2013, Austin, TX, United States. pp.51-54, ⟨10.1109/HST.2013.6581565⟩
Communication dans un congrès lirmm-01430800v1
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Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts

 Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Giorgio Di Natale , et al.
Joint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands
Communication dans un congrès emse-01099040v1

A Side-Channel and Fault-Attack Resistant AES Circuit Working on Duplicated Complemented Values

 Jacques Jean-Alain Fournier , Marion Doulcier , Jean-Max Dutertre , Jean-Baptiste Rigaud , Bruno Robisson , et al.
ISSCC 2011 - International Solid State Circuits Conference, Feb 2011, San Francisco, United States. pp.274-276, ⟨10.1109/ISSCC.2011.5746316⟩
Communication dans un congrès emse-00541009v1
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Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents

 Clément Champeix , Nicolas Borrel , Jean-Max Dutertre , Bruno Robisson , Mathieu Lisart , et al.
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International, Jul 2015, Halkidiki, Greece. ⟨10.1109/IOLTS.2015.7229849⟩
Communication dans un congrès emse-01227307v1

Low cost fault injection method for security characterization

 Jean-Max Dutertre , Assia Tria , Bruno Robisson , Michel Agoyan
E-Smart 2009, Sep 2009, Sophia-Antipolis, France
Communication dans un congrès emse-00481620v1
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Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell

 William Souza da Cruz , Jean-Max Dutertre , Jean-Baptiste Rigaud , Hubert Guillaume
2020 33rd Symposium on Integrated Circuits and Systems Design (SBCCI), Aug 2020, Campinas, Brazil. pp.1-6, ⟨10.1109/SBCCI50935.2020.9189897⟩
Communication dans un congrès hal-03217265v1
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An experimentally tuned compact electrical model for laser fault injection simulation

 William Souza da Cruz , Raphael Viera , Jean-Baptiste Rigaud , Guillaume Hubert , Jean-Max Dutertre
IOLTS 2022 - IEEE 28th International Symposium on On-Line Testing and Robust System Design, IEEE, Sep 2022, Turin, Italy. pp.1-5, ⟨10.1109/IOLTS56730.2022.9897189⟩
Communication dans un congrès hal-04134425v1
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Experimental Analysis of the Laser-Induced Instruction Skip Fault Model

 Jean-Max Dutertre , Timothé Riom , Olivier Potin , Jean-Baptiste Rigaud
The 24th Nordic Conference on Secure IT Systems, Nordsec 2019, Nov 2019, Aalborg, Denmark. pp.221-237, ⟨10.1007/978-3-030-35055-0_14⟩
Communication dans un congrès hal-02379754v1

Electromagnetic Transient Faults Injection on a hardware and software implementations of AES

 Amine Dehbaoui , Jean-Max Dutertre , Bruno Robisson , Assia Tria
FDTC 2012, Sep 2012, Leuven, Belgium. pp.7
Communication dans un congrès emse-00742639v1
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An Overview of Laser Injection against Embedded Neural Network Models

 Pierre-Alain Moëllic , Raphael Viera , Jean-Max Dutertre , Rémi Bernhard
2021 IEEE 7th World Forum on Internet of Things (WF-IoT), Jun 2021, New Orleans, United States. ⟨10.1109/WF-IoT51360.2021.9595075⟩
Communication dans un congrès cea-04176725v1

Injection de fautes par modification de l'horloge: application à l'AES.

 Jean-Max Dutertre , Assia Tria , Bruno Robisson
Cryptopuce2009, Jun 2009, Porquerolle, France
Communication dans un congrès emse-00463505v1
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When Clocks Fail: On Critical Paths and Clock Faults

 Michel Agoyan , Jean-Max Dutertre , David Naccache , Bruno Robisson , Assia Tria
9th IFIP WG 8.1/11.2 International conference, CARDIS 2010, Apr 2010, Passau, Germany. pp.182-193, ⟨10.1007/978-3-642-12510-2_13⟩
Communication dans un congrès emse-00474337v1
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On the Use of Forward Body Biasing to Decrease the Repeatability of Laser-Induced Faults

 Marc Lacruche , Noemie Beringuier-Boher , Jean-Max Dutertre , Jean-Baptiste Rigaud , Edith Kussener
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2016, Dresde, Germany
Communication dans un congrès emse-01855866v1
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Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

 Clément Champeix , Jean-Max Dutertre , Vincent Pouget , Bruno Robisson , Mathieu Lisart , et al.
2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2016, Bremen, Germany. ⟨10.1109/RADECS.2016.8093172⟩
Communication dans un congrès emse-01855833v1
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Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90nm technology

 A Sarafianos , R Llido , O Gagliano , V Serradeil , M Lisart , et al.
Microelectronics Reliability, 2012, pp.2035-2038. ⟨10.1016/j.microrel.2012.06.047⟩
Article dans une revue emse-01110360v1

The bad and the good of physical functions

 Bruno Robisson , Ingrid Exurville , Jean-Yves Zie , Hélène Le Bouder , Jean-Max Dutertre , et al.
Cryptarchi, Jun 2013, Fréjus, France
Communication dans un congrès cea-01094232v1
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Permanent Laser Fault Injection into the Flash Memory of a Microcontroller

 Raphael Viera , Jean-Max Dutertre , Mathieu Dumont , Pierre-Alain Moëllic
2021 19th IEEE International New Circuits and Systems Conference (NEWCAS), Jun 2021, Toulon, France. pp.1-4, ⟨10.1109/NEWCAS50681.2021.9462773⟩
Communication dans un congrès hal-03360634v1

On the use of the EM medium as a fault injection means

 Philippe Maurine , Amine Dehbaoui , François Poucheret , Jean-Max Dutertre , Bruno Robisson , et al.
CryptArchi: Cryptographic Architectures, Jun 2012, St-Etienne, France
Communication dans un congrès emse-00742707v1

Frontside Versus Backside Laser Injection: A Comparative Study

 Stephan de Castro , Jean-Max Dutertre , Bruno Rouzeyre , Giorgio Di Natale , Marie-Lise Flottes
ACM Journal on Emerging Technologies in Computing Systems, 2016, Special Issue on Secure and Trustworthy Computing, 13 (1), pp.7. ⟨10.1145/2845999⟩
Article dans une revue lirmm-01444121v1

A DFA on AES based on the entropy of error distributions

 Ronan Lashermes , Guillaume Reymond , Jean-Max Dutertre , Jacques Jean-Alain Fournier , Bruno Robisson , et al.
FDTC 2012, Sep 2012, Leuven, Belgium. pp.34
Communication dans un congrès emse-00742642v1

Method for evaluation of transient-fault detection techniques

 Raphael Andreoni Camponogara-Viera , Rodrigo Possamai Bastos , Jean-Max Dutertre , Philippe Maurine
ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France
Communication dans un congrès hal-01721081v1
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Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS

 Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre , et al.
Microelectronics Reliability, 2014, 54 (9-10), pp.2289-2294. ⟨10.1016/j.microrel.2014.07.151⟩
Article dans une revue emse-01094805v1
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Lightweight Countermeasures Against Original Linear Code Extraction Attacks on a RISC-V Core

 Théophile Gousselot , Olivier Thomas , Jean-Max Dutertre , Olivier Potin , Jean-Baptiste Rigaud
2023 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), May 2023, San Jose, France. pp.89-99, ⟨10.1109/HOST55118.2023.10133316⟩
Communication dans un congrès hal-04465052v1
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Security characterisation of a hardened AES cryptosystem using a laser

 Cyril Roscian , Florian Praden , Jean-Max Dutertre , Jacques Jean-Alain Fournier , Assia Tria
"Technical Sciences", University of Warmia and Mazury publishing,, 2012
Article dans une revue emse-00742726v1
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Power supply glitch induced faults on FPGA: an in-depth analysis of the injection mechanism

 Loïc Zussa , Jean-Max Dutertre , Jessy Clédière , Assia Tria
On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International, Jul 2013, Chania, Greece. ⟨10.1109/IOLTS.2013.6604060⟩
Communication dans un congrès emse-01109131v1

Investigation of timing constraints violation as a fault injection means

 Loïc Zussa , Jean-Max Dutertre , Jessy Clédière , Bruno Robisson , Assia Tria
27th Conference on Design of Circuits and Integrated Systems (DCIS), Nov 2012, Avignon, France. pas encore paru
Communication dans un congrès emse-00742652v1
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Improving an SEU Hard Design using a Pulsed Laser

 Jean-Max Dutertre , Fernand-Michel Roche , Patrice Fouillat , Dean Lewis
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on, Sep 2001, Grenoble, France. ⟨10.1109/RADECS.2001.1159287⟩
Communication dans un congrès emse-01130950v1
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Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells

 Cyril Roscian , Alexandre Sarafianos , Jean-Max Dutertre , Assia Tria
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2013 Workshop on, Aug 2013, Santa-Barbara, United States. ⟨10.1109/FDTC.2013.17⟩
Communication dans un congrès emse-01109133v1
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Actes de la conférence CAID 2020

 François de Vieilleville , Stéphane May , Adrien Lagrange , A Dupuis , Rosa Ruiloba , et al.
2021
Proceedings/Recueil des communications hal-03206297v1
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