Jean-Marc Galliere

Documents

Présentation

Publications

	Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell Journal of Electronic Testing: : Theory and Applications, 2019, 35 (1), pp.59-75. ⟨10.1007/s10836-019-05776-1⟩ Article dans une revue lirmm-02075690v1
	Detectability Challenges of Bridge Defects in FinFET Based Logic Cells Freddy Forero , Jean-Marc J.-M. Galliere , Michel Renovell , Victor Champac Journal of Electronic Testing: : Theory and Applications, 2018, 34 (2), pp.123-134. ⟨10.1007/s10836-018-5714-0⟩ Article dans une revue lirmm-03109355v1
	Influence of Body-Biasing, Supply Voltage, and Temperature on the Detection of Resistive Short Defects in FDSOI Technology Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell IEEE Transactions on Nanotechnology, 2017, 16 (3), pp.417-430. ⟨10.1109/TNANO.2017.2664895⟩ Article dans une revue hal-01709588v1
	Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell Journal of Electronic Testing: : Theory and Applications, 2017, 33 (4), pp.515-527. ⟨10.1007/s10836-017-5674-9⟩ Article dans une revue hal-01709587v1
	Testing for Gate Oxide Short Defects using the Detectability Interval Paradigm Jean-Marc J.-M. Galliere , Florence Azaïs , Mariane Comte , Michel Renovell Information Technology, 2014, 56 (4), pp.173-181. ⟨10.1515/itit-2013-1040⟩ Article dans une revue hal-01167054v1
	Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2386-2391. ⟨10.1109/TNS.2013.2257847⟩ Article dans une revue lirmm-01234425v1
	A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere IEEE Transactions on Nuclear Science, 2013, 60 (5), pp.3603-3608. ⟨10.1109/TNS.2013.2264957⟩ Article dans une revue lirmm-01234419v1
	Embedded silicon detector to investigate the natural radiative environment Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere Journal of Instrumentation, 2012, 7 (5), pp.1-11. ⟨10.1088/1748-0221/7/05/P05007⟩ Article dans une revue lirmm-00805011v1
	Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Jérôme Boch IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩ Article dans une revue lirmm-00805031v1
	Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩ Article dans une revue lirmm-00805046v1
	Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Paolo Rech IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.945-951. ⟨10.1109/TNS.2011.2136359⟩ Article dans une revue lirmm-00805045v1
	Delay Testing Viability of Gate Oxide Short Defect Jean-Marc J.-M. Galliere , Michel Renovell , Florence Azaïs , Yves Bertrand Journal of Computer Science and Technology, 2005, 20 (2), pp.195-200. ⟨10.1007/s11390-005-0195-x⟩ Article dans une revue lirmm-00105323v1
	Viability of a Delay Testing of Gate Oxide Short Transistors Jean-Marc J.-M. Galliere , Michel Renovell , Florence Azaïs , Yves Bertrand Journal of Computer Science and Technology, 2005, 20 (2), pp.6. ⟨10.1007/s11390-005-0195-x⟩ Article dans une revue lirmm-00370370v1
	A Compact DC Model of Gate Oxide Short Defect Rachid Bouchakour , Jean-Michel Portal , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand Microelectronic Engineering, 2004, 72 (1-4), pp.140-148. ⟨10.1016/j.mee.2003.12.051⟩ Article dans une revue lirmm-00108564v1
	Modeling the Random Parameter Effects in a Non-Split Model of Gate Oxide Short Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand Journal of Electronic Testing: : Theory and Applications, 2003, 19 (4), pp. 377-386. ⟨10.1023/A:1024683708105⟩ Article dans une revue lirmm-00269754v1

	On the scaling of EMFI probes Julien Toulemont , Geoffrey Chancel , Jean-Marc J.-M. Galliere , Frédérick Mailly , Pascal Nouet FDTC 2021 - Workshop on Fault Detection and Tolerance in Cryptography, Sep 2021, Milan, Italy. pp.67-73, ⟨10.1109/FDTC53659.2021.00019⟩ Communication dans un congrès lirmm-03476820v1
	Iterative Method for Performance Prediction Improvement of Integrated Circuits Gwenael Chaillou , Philippe Maurine , Jean-Marc J.-M. Galliere , Nadine Azemard DCIS 2021 - 36th Conference on Design of Circuits and Integrated Systems, Nov 2021, Vila do Conde, Portugal. pp.1-5, ⟨10.1109/DCIS53048.2021.9666182⟩ Communication dans un congrès lirmm-03710383v1
	Combined analysis of supply voltage and body-bias voltage for energy management Rida Kheirallah , Jean-Marc J.-M. Galliere , Nadine Azemard , Gilles R. Ducharme PATMOS: Power And Timing Modeling, Optimization and Simulation, Jul 2018, Platja d’Aro, Spain. pp.88-91, ⟨10.1109/PATMOS.2018.8464159⟩ Communication dans un congrès lirmm-01867809v1
	Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell LATS 2018 - 19th IEEE Latin American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349696⟩ Communication dans un congrès lirmm-02064921v1
	Thermal Scans for Detecting Hardware Trojans Maxime Cozzi , Philippe Maurine , Jean-Marc J.-M. Galliere COSADE 2018 - 9th International Workshop on Constructive Side-Channel Analysis and Secure Design, Apr 2018, Singapour, Singapore. pp.117-132, ⟨10.1007/978-3-319-89641-0_7⟩ Communication dans un congrès lirmm-01823444v1
	Exploiting Phase Information in Thermal Scans for Stealthy Trojan Detection Maxime Cozzi , Jean-Marc J.-M. Galliere , Philippe Maurine DSD 2018 - 21st Euromicro Conference on Digital System Design, Aug 2018, Prague, Slovakia. pp.573-576, ⟨10.1109/DSD.2018.00100⟩ Communication dans un congrès lirmm-01872499v1
	Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell ISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩ Communication dans un congrès hal-01709614v1
	Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell ETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩ Communication dans un congrès hal-01709615v1
	Analysis of short defects in FinFET based logic cells Freddy Forero , Jean-Marc J.-M. Galliere , Michel Renovell , Víctor H. Champac LATS 2017 - 18th IEEE Latin American Test Symposium, Mar 2017, Bogota, Colombia. ⟨10.1109/LATW.2017.7906755⟩ Communication dans un congrès hal-01709620v1
	Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurations Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell ISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩ Communication dans un congrès lirmm-01374292v1
	Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell LATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩ Communication dans un congrès lirmm-01374300v1
	Statistical Energy Study for 28nm FDSOI Devices Rida Kheirallah , Jean-Marc J.-M. Galliere , Aida Todri-Sanial , Gilles R. Ducharme , Nadine Azemard EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2015, Budapest, Hungary. ⟨10.1109/EuroSimE.2015.7103149⟩ Communication dans un congrès lirmm-01168602v1
	A toolkit to demystify CMOS Active Pixel Sensors Jean-Marc J.-M. Galliere , Jérôme Boch MSE: Microelectronic Systems Education, Jun 2013, Austin, TX, United States. ⟨10.1109/MSE.2013.6566696⟩ Communication dans un congrès hal-01709627v1
	Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4 Communication dans un congrès lirmm-00805150v1
	Dynamic-Stress Neutrons Test of Commercial SRAMs Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4 Communication dans un congrès lirmm-00805349v1
	A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere IEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩ Communication dans un congrès lirmm-00805169v1
	Versatile March Test Generator for Hands-on Memory Testing Laboratory Jean-Marc J.-M. Galliere , Luigi Dilillo MSE: Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. pp.41-42, ⟨10.1109/MSE.2011.5937088⟩ Communication dans un congrès lirmm-00805300v1
	Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench Luigi Dilillo , Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6 Communication dans un congrès lirmm-00805120v1
	Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Frédéric Wrobel RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩ Communication dans un congrès lirmm-00805314v1
	Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria Communication dans un congrès lirmm-00566847v1
	Use of BOBST for the Detection of Neutrons Induced Errors in SRAM Luigi Dilillo , Frédéric Wrobel , Jean-Marc J.-M. Galliere , F. Saigné IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy Communication dans un congrès hal-01957246v1
	A mixed TCAD/Electrical simulation laboratory to open up the microelectronics teaching Jean-Marc J.-M. Galliere , Jérôme Boch MSE: Microelectronic Systems Education, Jul 2009, San Francisco, United States. ⟨10.1109/MSE.2009.5270836⟩ Communication dans un congrès hal-01709636v1
	Neutron Detection through an SRAM-Based Test Bench Luigi Dilillo , Frédéric Wrobel , Jean-Marc J.-M. Galliere , Frédéric Saigné IWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩ Communication dans un congrès lirmm-00438842v1
	Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell , Luigi Dilillo DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229 Communication dans un congrès lirmm-00370798v1
	A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric Transducers Jean-Marc J.-M. Galliere , Philippe Papet , Laurent Latorre BMAS 2008 - IEEE International Workshop on Behavioral Modeling and Simulation, Sep 2008, San Jose, United States. pp.148-152, ⟨10.1109/BMAS.2008.4751257⟩ Communication dans un congrès lirmm-00370390v1
	A Unified Electrical SPICE Model for Piezoelectric Transducers Jean-Marc J.-M. Galliere , Philippe Papet , Laurent Latorre BMAS: Behavioral Modeling and Simulation, Sep 2007, San Jose, SA, United States. ⟨10.1109/BMAS.2007.4437540⟩ Communication dans un congrès lirmm-00370388v1
	Programmable Analog Array in Control-Systems Laboratory Jean-Marc J.-M. Galliere IEEE Mediterranean Conference on Control and Automation, Jun 2007, Athens, Greece, pp.5 Communication dans un congrès lirmm-00370394v1
	Stream Manager, Easy CAD Tools Switching in Academic Context Jean-Marc J.-M. Galliere , Guy Cathébras MSE: Microelectronic Systems Education, Jun 2007, San Diego, United States. ⟨10.1109/MSE.2007.77⟩ Communication dans un congrès hal-01709640v1
	Stream Manager, Easy CAD Tools Switching in Academic Context Jean-Marc J.-M. Galliere , Guy Cathébras IEEE Conference on Microelectronic Systems Education, Jun 2007, San Diego, USA, pp.2 Communication dans un congrès lirmm-00370396v1
	Stream Manager, an Answer to Academic Project Policy Jean-Marc J.-M. Galliere , Guy Cathébras AQTR: Automation, Quality and Testing, Robotics, May 2006, Cluj-Napoca, Romania. ⟨10.1109/AQTR.2006.254614⟩ Communication dans un congrès hal-01709644v1
	Stream Manager: Une Assistance à la Gestion des Projets Microélectroniques Guy Cathébras , Jean-Marc J.-M. Galliere CNFM'06 : 9èmes Journées Pédagogiques, Nov 2006, Saint-Malo (France), pp.5-8 Communication dans un congrès lirmm-00117324v1
	Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies I. Polian , Kundu Sandip , Jean-Marc J.-M. Galliere , P. Engelke , Michel Renovell VTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.343-348 Communication dans un congrès lirmm-00105997v1
	Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror S. Bernardini , P. Masson , Jean-Michel Portal , Jean-Marc J.-M. Galliere , Michel Renovell LATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17 Communication dans un congrès lirmm-00108659v1
	Delay Testing of MOS Transistor with Gate Oxide Short Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.168-173 Communication dans un congrès lirmm-00269641v1
	GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand , Jean-Michel Portal LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil Communication dans un congrès lirmm-00269604v1
	Modeling Gate Oxide Short Defects in CMOS Minimum Transistors Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand ETW: European Test Workshop, 2002, Corfu, Greece. pp.15-20 Communication dans un congrès lirmm-00268527v1
	A Non-Split Model for Realistic Gate Oxide Short in CMOS Technology Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand DCIS: Design of Circuits and Integrated Systems, 2002, Santander, Spain. pp.197-204 Communication dans un congrès lirmm-00268432v1
	Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde Short Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand DBT: Defect Based Testing, Apr 2002, Monterey, CA, United States. pp.11-16 Communication dans un congrès lirmm-00269333v1
	Low Voltage Testing of Gate Oxide Short in CMOS Technology Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand DDECS: Design and Diagnostics of Electronic Circuits and Systems, 2002, Brno, Czech Republic. pp.168-174 Communication dans un congrès lirmm-00268526v1
	Boolean and Current Detection of MOS Transistor with Gate Oxide Short Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand IEEE International Test Conference, Oct 2001, Baltimore, USA, pp.10 Communication dans un congrès lirmm-00370400v1

	Méthode Itérative pour l’Amélioration de la Prédiction des Performances des Circuits Intégrés Gwenael Chaillou , Philippe Maurine , Jean-Marc J.-M. Galliere , Nadine Azemard 15e Colloque National du GDR SoC², Jun 2021, Rennes, France Poster de conférence lirmm-03358670v1
	A Roaming Memory Test Bench for Detecting Particle Induced SEUs Jean-Marc J.-M. Galliere , Paolo Rech , Patrick Girard , Luigi Dilillo ITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩ Poster de conférence lirmm-00537879v1

	A Simple Protocol to Compare EMFI platforms Julien Toulemont , Nasr-Eddine Ouldei-Tebina , Jean-Marc J.-M. Galliere , Pascal Nouet , Eric Bourbao 2020 Pré-publication, Document de travail lirmm-03626807v1

	A Compact Model for Electrical Simulation of MOS Transistor with Gate Oxide Short Defect Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand , Jean-Michel Portal [Research Report] 04080, Lirmm, University of Montpellier. 2004 Rapport lirmm-00109221v1

Jean-Marc Galliere

Présentation

Publications

Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies

Detectability Challenges of Bridge Defects in FinFET Based Logic Cells

Influence of Body-Biasing, Supply Voltage, and Temperature on the Detection of Resistive Short Defects in FDSOI Technology

Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies

Testing for Gate Oxide Short Defects using the Detectability Interval Paradigm

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation

Embedded silicon detector to investigate the natural radiative environment

Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons

Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon

Delay Testing Viability of Gate Oxide Short Defect

Viability of a Delay Testing of Gate Oxide Short Transistors

A Compact DC Model of Gate Oxide Short Defect

Modeling the Random Parameter Effects in a Non-Split Model of Gate Oxide Short

On the scaling of EMFI probes

Iterative Method for Performance Prediction Improvement of Integrated Circuits

Combined analysis of supply voltage and body-bias voltage for energy management

Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies

Thermal Scans for Detecting Hardware Trojans

Exploiting Phase Information in Thermal Scans for Stealthy Trojan Detection

Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology

Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions

Analysis of short defects in FinFET based logic cells

Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurations

Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect

Statistical Energy Study for 28nm FDSOI Devices

A toolkit to demystify CMOS Active Pixel Sensors

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

Dynamic-Stress Neutrons Test of Commercial SRAMs

A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude

Versatile March Test Generator for Hands-on Memory Testing Laboratory

Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench

Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays

Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors

Use of BOBST for the Detection of Neutrons Induced Errors in SRAM

A mixed TCAD/Electrical simulation laboratory to open up the microelectronics teaching

Neutron Detection through an SRAM-Based Test Bench

Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models

A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric Transducers

A Unified Electrical SPICE Model for Piezoelectric Transducers

Programmable Analog Array in Control-Systems Laboratory

Stream Manager, Easy CAD Tools Switching in Academic Context

Stream Manager, Easy CAD Tools Switching in Academic Context

Stream Manager, an Answer to Academic Project Policy

Stream Manager: Une Assistance à la Gestion des Projets Microélectroniques

Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies

Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror

Delay Testing of MOS Transistor with Gate Oxide Short

GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model

Modeling Gate Oxide Short Defects in CMOS Minimum Transistors

A Non-Split Model for Realistic Gate Oxide Short in CMOS Technology

Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde Short

Low Voltage Testing of Gate Oxide Short in CMOS Technology

Boolean and Current Detection of MOS Transistor with Gate Oxide Short

Méthode Itérative pour l’Amélioration de la Prédiction des Performances des Circuits Intégrés

A Roaming Memory Test Bench for Detecting Particle Induced SEUs

A Simple Protocol to Compare EMFI platforms

A Compact Model for Electrical Simulation of MOS Transistor with Gate Oxide Short Defect