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	Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Jérôme Boch IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩ Article dans une revue lirmm-00805031v1
	Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩ Article dans une revue lirmm-00805046v1

	Dynamic-Stress Neutrons Test of Commercial SRAMs Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4 Communication dans un congrès lirmm-00805349v1
	Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench Luigi Dilillo , Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6 Communication dans un congrès lirmm-00805120v1
	Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Frédéric Wrobel RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩ Communication dans un congrès lirmm-00805314v1
	Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria Communication dans un congrès lirmm-00566847v1

	A Roaming Memory Test Bench for Detecting Particle Induced SEUs Jean-Marc J.-M. Galliere , Paolo Rech , Patrick Girard , Luigi Dilillo ITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩ Poster de conférence lirmm-00537879v1

Jean-Marc Galliere