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Number of documents

7


Luigi Dilillo    Patrick Girard   

Journal articles2 documents

  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Alessio Griffoni, Jérôme Boch, et al.. Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩. ⟨lirmm-00805031⟩
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩. ⟨lirmm-00805046⟩

Conference papers4 documents

  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Dynamic-Stress Neutrons Test of Commercial SRAMs. IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4. ⟨lirmm-00805349⟩
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Alessio Griffoni, Frédéric Wrobel, et al.. Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩. ⟨lirmm-00805314⟩
  • Luigi Dilillo, Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, et al.. Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench. IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6. ⟨lirmm-00805120⟩
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria. ⟨lirmm-00566847⟩

Poster communications1 document

  • Jean-Marc Galliere, Paolo Rech, Patrick Girard, Luigi Dilillo. A Roaming Memory Test Bench for Detecting Particle Induced SEUs. ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. pp.N/A, 2010. ⟨lirmm-00537879⟩