Jean-Marc Galliere
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Documents
Présentation
Publications
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Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-StressIEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩
Article dans une revue
lirmm-00805031v1
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Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and NeutronsIEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩
Article dans une revue
lirmm-00805046v1
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Dynamic-Stress Neutrons Test of Commercial SRAMsIEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4
Communication dans un congrès
lirmm-00805349v1
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Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM ArraysRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩
Communication dans un congrès
lirmm-00805314v1
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Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test BenchIEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6
Communication dans un congrès
lirmm-00805120v1
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Impact of Resistive-Open Defects on SRAM sensitivity to Soft ErrorsRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria
Communication dans un congrès
lirmm-00566847v1
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