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Number of documents

17


Luigi Dilillo   

Journal articles6 documents

  • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Jean-Marc Galliere, et al.. A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (5), pp.3603-3608. ⟨10.1109/TNS.2013.2264957⟩. ⟨lirmm-01234419⟩
  • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Jean-Marc Galliere, et al.. Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (4), pp.2386-2391. ⟨10.1109/TNS.2013.2257847⟩. ⟨lirmm-01234425⟩
  • Denis Pantel, Jean-Roch Vaillé, Frédéric Wrobel, Luigi Dilillo, Jean-Marc Galliere, et al.. Embedded silicon detector to investigate the natural radiative environment. Journal of Instrumentation, IOP Publishing, 2012, 7 (5), pp.1-11. ⟨10.1088/1748-0221/7/05/P05007⟩. ⟨lirmm-00805011⟩
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Alessio Griffoni, Jérôme Boch, et al.. Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩. ⟨lirmm-00805031⟩
  • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Paolo Rech, et al.. Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (3), pp.945-951. ⟨10.1109/TNS.2011.2136359⟩. ⟨lirmm-00805045⟩
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩. ⟨lirmm-00805046⟩

Conference papers10 documents

  • Denis Pantel, Jean-Roch Vaillé, Frédéric Wrobel, Luigi Dilillo, Jean-Marc Galliere, et al.. A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude. IEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩. ⟨lirmm-00805169⟩
  • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Jean-Marc Galliere, et al.. Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4. ⟨lirmm-00805150⟩
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Dynamic-Stress Neutrons Test of Commercial SRAMs. IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4. ⟨lirmm-00805349⟩
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Alessio Griffoni, Frédéric Wrobel, et al.. Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩. ⟨lirmm-00805314⟩
  • Luigi Dilillo, Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, et al.. Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench. IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6. ⟨lirmm-00805120⟩
  • Jean-Marc Galliere, Luigi Dilillo. Versatile March Test Generator for Hands-on Memory Testing Laboratory. MSE: Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. pp.41-42, ⟨10.1109/MSE.2011.5937088⟩. ⟨lirmm-00805300⟩
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria. ⟨lirmm-00566847⟩
  • Luigi Dilillo, Frédéric Wrobel, Jean-Marc Galliere, Frédéric Saigné. Neutron Detection through an SRAM-Based Test Bench. IWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩. ⟨lirmm-00438842⟩
  • Luigi Dilillo, Frédéric Wrobel, Jean-Marc Galliere, F. Saigné. Use of BOBST for the Detection of Neutrons Induced Errors in SRAM. IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. ⟨hal-01957246⟩
  • Jean-Marc Galliere, Florence Azaïs, Michel Renovell, Luigi Dilillo. Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229. ⟨lirmm-00370798⟩

Poster communications1 document

  • Jean-Marc Galliere, Paolo Rech, Patrick Girard, Luigi Dilillo. A Roaming Memory Test Bench for Detecting Particle Induced SEUs. ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. pp.N/A, 2010. ⟨lirmm-00537879⟩