Jean-Marc Galliere
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Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-StressIEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩
Article dans une revue
lirmm-00805031v1
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A toolkit to demystify CMOS Active Pixel SensorsMSE: Microelectronic Systems Education, Jun 2013, Austin, TX, United States. ⟨10.1109/MSE.2013.6566696⟩
Communication dans un congrès
hal-01709627v1
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A mixed TCAD/Electrical simulation laboratory to open up the microelectronics teachingMSE: Microelectronic Systems Education, Jul 2009, San Francisco, United States. ⟨10.1109/MSE.2009.5270836⟩
Communication dans un congrès
hal-01709636v1
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