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Jean-Marc Galliere

9
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florence-azais
mariane-comte

Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies

Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell
LATS 2018 - 19th IEEE Latin American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349696⟩
Communication dans un congrès lirmm-02064921v1

Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions

Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell
ETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩
Communication dans un congrès hal-01709615v1

Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology

Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩
Communication dans un congrès hal-01709614v1

Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect

Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell
LATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩
Communication dans un congrès lirmm-01374300v1

Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurations

Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩
Communication dans un congrès lirmm-01374292v1