Nombre de documents

12

CV de Jakey Blue


Article dans une revue6 documents

  • Claude Yugma, Jakey Blue, Stéphane Dauzere-Peres, Ali Obeid. Integration of Scheduling and Advanced Process Control in Semiconductor Manufacturing: Review and Outlook. Journal of Scheduling, Springer Verlag, 2015, 18 (2), pp.195-205. <10.1007/s10951-014-0381-1>. <hal-01079917>
  • Jakey Blue, Dietmar Gleispach, Agnès Roussy, Scheibelhofer Peter. Tool Condition Diagnosis With a Recipe-Independent Hierarchical Monitoring Scheme. IEEE Transactions on Semiconductor Manufacturing, Institute of Electrical and Electronics Engineers, 2013, 26 (1), pp.82-91. <10.1109/TSM.2012.2230279>. <hal-01079929>
  • Jakey Blue, Argon Chen. Spatial Variance Spectrum Analysis and Its Application to Unsupervised Detection of Systematic Wafer Spatial Variations. IEEE Transactions on Automation Science and Engineering, Institute of Electrical and Electronics Engineers, 2011, 8 (1), pp.56-66. <emse-01098363>
  • Argon Chen, Jakey Blue. Performance Analysis of Demand Planning Approaches for Aggregating, Forecasting and Disaggregating Interrelated Demands. International Journal of Production Economics, Elsevier, 2010, 128 (2), pp.586-602. <emse-01098365>
  • Argon Chen, Jakey Blue. Recipe-Independent Health Indicator for Tool Predictive Maintenance and Fault Diagnosis. IEEE Transactions on Semiconductor Manufacturing, Institute of Electrical and Electronics Engineers, 2009, 22 (4), pp.522-535. <emse-01098366>
  • Argon Chen, Chia-Hau Hsu, Jakey Blue. Demand Planning Approaches to Aggregating and Forecasting Interrelated Demands for Safety Stock and Backup Capacity Planning. International Journal of Production Research, Taylor & Francis, 2007, 45 (10), pp.2269-2294. <emse-01098367>

Communication dans un congrès6 documents

  • Espéran Padonou, Jakey Blue. Wafer Spatial Pattern Decomposition and Diagnosis Based on Processing Characteristics. 15th Annual Conference of the European Network for Business and Industrial Statistics ENBIS-15, Sep 2015, Prague, Czech Republic. <emse-01412221>
  • Espéran Padonou, Olivier Roustant, Jakey Blue, Duverneuil Hugues. Spatial risk assessment on circular domains: Application to wafer profile monitoring. 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), May 2015, Saratoga Springs, United States. IEEE, <10.1109/ASMC.2015.7164475>. <emse-01338842>
  • Espéran Padonou, Jakey Blue, Olivier Roustant, Duverneuil Hugues. Response surface approximation for profile monitoring in circular domains. 14th Annual Conference of the European Network for Business and Industrial Statistics ENBIS-14, Sep 2014, Linz, Austria. <emse-01412227>
  • Jakey Blue, Alexis Thieullen, Agnès Roussy, Jacques Pinaton. Efficient FDC based on Hierarchical Tool Condition Monitoring Scheme. Advanced Semiconductor Manufacturing Conference 2012, May 2012, Saratoga Springs, New York, United States. pp.359-364, 2012. <emse-00742452>
  • Dietmar Gleispach, Jakey Blue, Agnès Roussy, Haselmann Matthias. Hierarchical Monitor Scheme for Recipe-independent Tool Condition Evaluation. One approach of EHF (Equipment Health Factor). European Advanced Process Control and Manufacturing Conference 2012, Apr 2012, Grenoble, France. <emse-00742445>
  • Jakey Blue, Agnès Roussy, Dietmar Gleispach, Haselmann Matthias, Stéphane Dauzère-Pérès. Tool Condition Prognosis with the Hierarchical Monitor Scheme. Intel European Research & Innovation Conference 2011, Oct 2011, Leixlip, Ireland. <emse-00742436>