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Impact of contact and channel resistance on the frequency-dependent capacitance and conductance of pseudo-MOSFET

 S. Sato , G. Ghibaudo , L. Benea , I. Ionica , Y. Omura , et al.
Solid-State Electronics, 2019, 159, pp.197-203. ⟨10.1016/j.sse.2019.03.059⟩
Article dans une revue hal-02321909v1

Parasitic bipolar effect in advanced FD SOI MOSFETs: experimental evidence and gain extraction

 Fanyu Liu , Irina Ionica , Mayline Bawedin , Sorin Cristoloveanu,
10th EUROSOI Workshop, Jan 2014, Tarrogona, Spain
Communication dans un congrès hal-02008226v1

Electrical characterization of ultra-thin silicon-on-insulator substrates : static and split C–V measurements in the Pseudo–MOSFET configuration

 Piro L. , Diab A. , Ionica I. , Gérard Ghibaudo , Cristoloveanu S.
4th Int. Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Technology (ULSIC ), Jul 2013, Villard de Lans, France. pp.203-208
Communication dans un congrès hal-01182173v1
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Second harmonic generation for contactless non-destructive characterization of silicon on insulator wafers

 D. Damianos , L. Pirro , G. Soylu , I. Ionica , V. Nguyen , et al.
Solid-State Electronics, 2016, 115, pp.237 - 243. ⟨10.1016/j.sse.2015.08.006⟩
Article dans une revue hal-01893414v1

Electrical detection of bacteria on SOI film using the pseudo-MOSFET configuration

 Médéric Vindret , Licinius Benea , Irina Ionica , Cécile Delacour , Pascal Xavier , et al.
International Workshop on Semi-conducting Nanomaterials for Health, Environment and Security Applications, Nanonets2Sense, Nov 2018, Grenoble, France
Communication dans un congrès hal-02016817v1

Effect of back gate on parasitic bipolar effect in FD SOI MOSFETs

 Fanyu Liu , Irina Ionica , Mayline Bawedin , Sorin Cristoloveanu
2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2014, Millbrae, United States. pp.5.8, ⟨10.1109/S3S.2014.7028210⟩
Communication dans un congrès hal-02003967v1

Scanning microwave microscopy for non-destructive characterization of SOI wafers

 L. Michalas , I. Ionica , E. Brinciotti , L. Pirro , F. Kienberger , et al.
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.238-241, ⟨10.1109/ULIS.2016.7440097⟩
Communication dans un congrès hal-02004364v1

Back-gated InGaAs-on-insulator lateral N+NN+ MOSFET: Fabrication and typical conduction mechanisms

 H.J. Park , L. Pirro , L. Czornomaz , I. Ionica , M. Bawedin , et al.
Solid-State Electronics, 2017, 128, pp.80-86. ⟨10.1016/j.sse.2016.10.019⟩
Article dans une revue hal-02003226v1

Special characterization techniques for advanced FDSOI process

 S. Cristoloveanu , M. Bawedin , I. Ionica
2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.9a.1, ⟨10.1109/S3S.2015.7333543⟩
Communication dans un congrès hal-02004273v1

Second Harmonic Generation: A Non-Destructive Characterization Method for Dielectric-Semiconductor Interfaces

 I. Ionica , D. Damianos , A. Kaminski-Cachopo , A. Bouchard , X. Mescot , et al.
2018 International Semiconductor Conference (CAS), Oct 2018, Sinaia, Romania. pp.35-42, ⟨10.1109/SMICND.2018.8539758⟩
Communication dans un congrès hal-01974421v1

Out-of-equilibrium body potential measurements in pseudo-MOSFET for biosensing

 Licinius Benea , Maryline Bawedin , Cécile Delacour , Sorin Cristoloveanu , Irina Ionica
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.19-22, ⟨10.1109/ULIS.2017.7962590⟩
Communication dans un congrès hal-02007128v1
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Field-effect passivation of Si by ALD-Al2O3: second harmonic generation monitoring and simulation

 D Damianos , G. Vitrant , A. Kaminski-Cachopo , D. Blanc-Pélissier , G. Ghibaudo , et al.
Journal of Applied Physics, 2018, 124 (12), pp.125309. ⟨10.1063/1.5041062⟩
Article dans une revue hal-01883529v1

Pseudo-MOSFET under illumination: a novel method for extraction of carrier lifetime.

 M. Daanoune , S. Sirajeddine , A. Diab , A. Kaminski-Cachopo , I. Ionica , et al.
EuroSOI 2013, Jan 2013, Paris, France. pp.P1.2
Communication dans un congrès hal-01067987v1
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Experimental and simulation investigation of the out-of-equilibrium phenomena on the pseudo-MOSFET configuration under transient linear voltage ramps

 Miltiadis Alepidis , Licinius Benea , Davide Bucci , Xavier Mescot , Maryline Bawedin , et al.
Solid-State Electronics, 2020, 168, pp.107721. ⟨10.1016/j.sse.2019.107721⟩
Article dans une revue hal-03171017v1

Parasitic bipolar effect in ultra-thin FD SOI MOSFETs

 F.Y. Liu , I. Ionica , M. Bawedin , S. Cristoloveanu
Solid-State Electronics, 2015, 112, pp.29-36. ⟨10.1016/j.sse.2015.02.009⟩
Article dans une revue hal-02003101v1

Nanoindentation effects on the electrical caracterizaron in Ψ-MOSFET configuration

 Licinius Benea , Tiphaine Cerba , Maryline Bawedin , Cécile Delacour , Sorin Cristoloveanu , et al.
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Mar 2018, Granada, Spain. pp.141-144, ⟨10.1109/ULIS.2018.8354754⟩
Communication dans un congrès hal-01948053v1

Second Harmonic Generation as a Contactless Probe of Al2O3 Passivation Layer

 Dimitrios Damianos , Irina Ionica , Anne Kaminski , Danièle Blanc-Pelissier , J. Changala , et al.
Journées Énergie du Labex LANEF. Photovoltaïque: Couches MInces & Concepts avancés., R. André, V. Consonni, L. Grenet, J.P. Travers, May 2017, Grenoble, France
Communication dans un congrès hal-02016903v1

Volume and interface conduction in InGaAs junctionless transistors

 L. Pirro , H. Park , I. Ionica , M. Bawedin , S. Cristoloveanu , et al.
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.104-107, ⟨10.1109/ULIS.2016.7440063⟩
Communication dans un congrès hal-02004340v1

Advances in the pseudo-MOSFET characterization method

 I. Ionica , A. El Hajj Diab , Y.H. Bae , X. Mescot , A. Ohata , et al.
IEEE Conference Proceedings., 2010, France. pp.45-51
Communication dans un congrès hal-00604270v1
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Impact of Blend Morphology on Interface State Recombination in Bulk Heterojunction Organic Solar Cells

 Benjamin Bouthinon , Raphaël Clerc , Jérôme Vaillant , J.-M Verilhac , Jérôme Faure-Vincent , et al.
Advanced Functional Materials, 2015, pp.10.1002/adfm.201401633. ⟨10.1002/adfm.201401633⟩
Article dans une revue hal-01100102v1

Interface trap density evaluation on bare silicon-on-insulator wafers using the quasi-static capacitance technique

 L. Pirro , I. Ionica , G. Ghibaudo , X. Mescot , L. Faraone , et al.
Journal of Applied Physics, 2016, 119 (17), pp.175702. ⟨10.1063/1.4947498⟩
Article dans une revue hal-01947679v1

Low-frequency noise in bare SOI wafers: Experiments and model

 Luca Pirro , Irina Ionica , Sorin Cristoloveanu , Gérard Ghibaudo
2015 ESSDERC - 45th European Solid-State Device Research Conference, Sep 2015, Graz, Austria. pp.286-289, ⟨10.1109/ESSDERC.2015.7324770⟩
Communication dans un congrès hal-02004194v1

Transient second harmonic generation and correlation with Ψ-MOSFET in SOI wafers

 D. Damianos , I. Ionica , A. Kaminski-Cachopo , G. Vitrant , S. Cristoloveanu , et al.
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.222-225, ⟨10.1109/ULIS.2016.7440093⟩
Communication dans un congrès hal-01974394v1
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Effet de champ et blocage de Coulomb dans des nanostructures de silicium élaborées par microscopie à force atomique

 Irina Ionica
Physique [physics]. Institut National Polytechnique de Grenoble - INPG, 2005. Français. ⟨NNT : ⟩
Thèse tel-00097465v1
Image document

Out-of-Equilibrium Body Potential Measurements in Pseudo-MOSFET for Sensing Applications

 Licinius Benea , Maryline Bawedin , Cécile Delacour , Irina Ionica
Solid-State Electronics, 2018, 143, pp.69-76. ⟨10.1016/j.sse.2017.11.010⟩
Article dans une revue hal-01685404v1

Split-Capacitance and Conductance-Frequency Characteristics of SOI Wafers in Pseudo-MOSFET Configuration

 Luca Pirro , Amer Diab , Irina Ionica , Gérard Ghibaudo , Lorenzo Faraone , et al.
IEEE Transactions on Electron Devices, 2015, 62 (9), pp.2717-2723. ⟨10.1109/TED.2015.2454438⟩
Article dans une revue hal-01947654v1

Back-gate effects and detailed characterization of junctionless transistor

 Mukta Singh Parihar , Fan Yu Liu , Carlos Navarro , Sylvain Barraud , Maryline Bawedin , et al.
2015 ESSDERC - 45th European Solid-State Device Research Conference, Sep 2015, Graz, Austria. pp.282-285, ⟨10.1109/ESSDERC.2015.7324769⟩
Communication dans un congrès hal-02004181v1

A simple compact model for carrier distribution and its application in single-, double- and triple-gate junctionless transistors

 Fanyu Liu , Irina Ionica , Maryline Bawedin , Sorin Cristoloveanu
2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.277-280, ⟨10.1109/ULIS.2015.7063827⟩
Communication dans un congrès hal-02004057v1

Selected SOI puzzles and tentative answers

 K.-I. Na , W. van den Daele , L. Pham-Nguyen , M. Bawedin , K.-H. Park , et al.
1st Ukrainian-French Symposium 'Semiconductor-On-Insulator Materials, Devices and Circuits: Physics, Technology and Diagnostics, Oct 2010, Kiev, Ukraine
Communication dans un congrès hal-00604923v1

Characterization of heavily doped SOI wafers under pseudo-MOSFET configuration

 F.Y. Liu , A. Diab , I. Ionica , K. Akarvardar , C. Hobbs , et al.
Solid-State Electronics, 2013, 90, pp.65-72. ⟨10.1016/j.sse.2013.02.050⟩
Article dans une revue istex hal-01001965v1
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