- 3
- 1
hubert klein
4
Documents
Identifiants chercheurs
- hubert-klein
- Arxiv : klein_h_1
- ResearcherId : M-8533-2014
- 0000-0002-8625-4778
- Google Scholar : https://scholar.google.fr/citations?user=FpYC7PUAAAAJ&hl=fr
- IdRef : 175659672
Présentation
My research activities are mainly focused on the development and the application of **Scanning Probe Microscopies** ( STM, and Atomic Force Microscopy, AFM). Notably, the development of a mechanically controlable break junction which allows the study of **atomic and molecular point contacts** at room temperature.
My research activities are mainly focused on the development and the application of **Scanning Probe Microscopies** ( STM, and Atomic Force Microscopy, AFM). Notably, the development of a mechanically controlable break junction which allows the study of **atomic and molecular point contacts** at room temperature.
Publications
- 1
- 1
- 1
- 1
- 4
- 3
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 2
- 1
- 1
|
Statistical evidence of strain induced breaking of metallic point contactsThe European Physical Journal B: Condensed Matter and Complex Systems, 2013, 86 (6), pp.243. ⟨10.1140/epjb/e2013-40040-5⟩
Article dans une revue
hal-04463262v1
|
|
Statistical evidence of strain induced breaking of metallic point contactsThe European Physical Journal B: Condensed Matter and Complex Systems, 2013, 86, pp.243. ⟨10.1140/epjb/e2013-40040-5⟩
Article dans une revue
hal-01424938v1
|
|
Tools for conductance measurements of metallic and molecular nanowiresGlobal Journal of Physical Chemistry, 2011, 2
Article dans une revue
hal-01770540v1
|
|
Are conductance plateaus independent events in atomic point contact measurements? A statistical approachNanotechnology, 2008, 19 (35), pp.355401. ⟨10.1088/0957-4484/19/35/355401⟩
Article dans une revue
hal-01586765v1
|