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Comportement dynamique de microscopie Kelvin en mode AM sous ultravide

 H. Diesinger , D. Deresmes , J.P. Nys , Thierry Melin
Forum des Microscopies à Sonde Locale, 2009, Hardelot, France
Communication dans un congrès hal-00575395v1

Assemblage de nano-objets par diélectrophorèse

 H. Diesinger , M. Marczak , D. Luxembourg , Yannick Coffinier , D. Hourlier , et al.
Journées du GDR Nanofils Nanotubes Semiconducteurs, 2006, Villeneuve d'Ascq, France
Communication dans un congrès hal-00243975v1

Kelvin probe force microscopy of charge transfer mechanisms from doped silicon nanocrystals

 Lukasz Borowik , Koku Kusiaku , D. Deresmes , Didier Theron , Heinrich Diesinger , et al.
Materials Research Society Fall Meeting, MRS Fall 2009, Symposium OO : Dynamic Scanning Probes - Imaging, Characterization, and Manipulation, Nov 2009, Boston, MA, United States
Communication dans un congrès hal-00575344v1

Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy

 Thierry Melin , Sophie Barbet , Heinrich Diesinger , Didier Theron , D. Deresmes
Review of Scientific Instruments, 2011, 82, pp.036101-1-3. ⟨10.1063/1.3516046⟩
Article dans une revue hal-00579085v1

Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : an analytical model for quantitative charge imaging

 Thierry Melin , H. Diesinger , D. Deresmes , D. Stievenard
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2004, 69, pp.035321/1-8
Article dans une revue hal-00141248v1

Electric force microscopy of individually charged semiconductor nanoparticles

 Thierry Melin , H. Diesinger , D. Deresmes , D. Stievenard
Materials Research Society Fall Meeting, 2003, Boston, MA, United States
Communication dans un congrès hal-00146615v1

Mesure du potentiel de surface d'un matériau

 Thierry Melin , Didier Theron , Sophie Barbet , D. Deresmes , Heinrich Diesinger
France, N° de brevet: FR2956484 (A1). 2011
Brevet hal-00616299v1

Comment on : Electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy

 M. Zdrojek , Thierry Melin , H. Diesinger , D. Stievenard , W. Gebicki , et al.
Physical Review Letters, 2006, 96, pp.039703
Article dans une revue hal-00127821v1

Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : quantitative charge measurements and dipole-dipole interactions

 Thierry Melin , H. Diesinger , D. Deresmes , D. Stiévenard
12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands
Communication dans un congrès hal-00146614v1
Image document

Traveling wave dielectrophoresis micropump based on the dispersion of a capacitive electrode layer

 M. Marczak , H. Diesinger
Journal of Applied Physics, 2009, 105, pp.124511-1-7. ⟨10.1063/1.3152787⟩
Article dans une revue hal-00473381v1
Image document

Frequency dependent rotation and translation of nanowires in liquid environment

 M. Marczak , D. Hourlier , Thierry Melin , L. Adamowicz , H. Diesinger
Applied Physics Letters, 2010, 96, pp.233502-1-3. ⟨10.1063/1.3430738⟩
Article dans une revue hal-00549071v1

Electric force microscopy of individually charged semiconductor nanoparticles

 Heinrich Diesinger , Thierry Melin , Sophie Barbet , D. Deresmes , Didier Stiévenard
physica status solidi (a), 2006, 203, pp.1344-1347. ⟨10.1002/pssa.200566162⟩
Article dans une revue istex hal-00127830v1

Scanning-probe measurements on undoped silicon nanowires

 Lukasz Borowik , Heinrich Diesinger , D. Hourlier-Bahloul , Thierry Melin
Forum des Microscopies à Sonde Locale, 2008, La Londe les Maures, France
Communication dans un congrès hal-00376238v1

Probing nanoscale dipole-dipole interactions by electric force microscopy

 Thierry Melin , H. Diesinger , D. Deresmes , D. Stievenard
Physical Review Letters, 2004, 92, pp.166101-1-4
Article dans une revue hal-00141249v1

Electric force microscopy of individually charged semiconductor nanoparticles

 Heinrich Diesinger , Thierry Melin , Sophie Barbet , D. Deresmes , Didier Stiévenard
Trends in Nanotechnology, TNT 2005, Aug 2005, Oviedo, Spain
Communication dans un congrès hal-00126431v1

Injection contrôlée de charges dans des nanoparticules individuelles de silicium

 H. Diesinger , Thierry Melin , D. Deresmes , D. Stievenard
Forum des microscopies à sonde locale, 2003, Montpellier, France
Communication dans un congrès hal-00146612v1
Image document

Cross-talk artefacts in Kelvin probe force microscopy imaging : a comprehensive study

 Sophie Barbet , Michka Popoff , Heinrich Diesinger , D. Deresmes , Didier Theron , et al.
Journal of Applied Physics, 2014, 115 (14), pp.144313. ⟨10.1063/1.4870710⟩
Article dans une revue hal-00981142v1
Image document

Charging and discharging processes of carbon nanotubes probed by electrostatic force microscopy

 M. Zdrojek , Thierry Melin , H. Diesinger , D. Stievenard , W. Gebicki , et al.
Journal of Applied Physics, 2006, 100, pp.114326/1-10
Article dans une revue hal-00127829v1

Charge transfer from doped silicon nanocrystals

 Lukasz Borowik , Koku Kusiaku , Didier Theron , Heinrich Diesinger , D. Deresmes , et al.
10th Trends in Nanotechnology International Conference, TNT2009, Sep 2009, Barcelona, Spain
Communication dans un congrès hal-00575400v1

Mapping charge transfers between quantum levels using noncontact atomic force microscopy

 Lukasz Borowik , Koku Kusiaku , D. Deresmes , Didier Theron , Heinrich Diesinger , et al.
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2010, 82, pp.073302-1-4. ⟨10.1103/PhysRevB.82.073302⟩
Article dans une revue hal-00549434v1

Electromagnetic modeling and optimization of photoconductive switches for terahertz generation and photocurrent transient spectroscopy

 Dominique Baillargeat , Heinrich Diesinger , Majid Panahandeh-Fard , Cesare Soci
Microwave Photonics, 2011 International Topical Meeting on & Microwave Photonics Conference, 2011 Asia-Pacific, MWP/APMP, Oct 2011, Singapore. pp.373-376
Communication dans un congrès hal-00922463v1

Charge transfer from doped silicon nanocrystals

 Lukasz Borowik , Koku Kusiaku , Didier Theron , Heinrich Diesinger , D. Deresmes , et al.
12th International Conference on Noncontact Atomic Force Microscopy, NC-AFM 2009, Aug 2009, New Haven, CT, United States
Communication dans un congrès hal-00575399v1

Kelvin force microscopy at the second cantilever resonance : an out-of-vacuum crosstalk compensation setup

 H. Diesinger , D. Deresmes , J.P. Nys , Thierry Melin
Ultramicroscopy, 2008, 108, pp.773-781
Article dans une revue hal-00357370v1

Noise performance of frequency modulation Kelvin force microscopy

 H. Diesinger , D. Deresmes , Thierry Melin
5th International Workshop on Advanced Scanning Probe Microscopy Techniques, ASXMT 2014, 2014, Karlsruhe, Germany
Communication dans un congrès hal-00951552v1

Hysteretic behavior of the charge injection in single silicon nanoparticles

 H. Diesinger , Thierry Melin , D. Deresmes , D. Stievenard , T. Baron
Applied Physics Letters, 2004, 85, pp.3546-3548
Article dans une revue hal-00141252v1

Performance en terme de bruit vers bande passante d'un microscope Kelvin mode détection de fréquence (FM-KFM)

 H. Diesinger , D. Deresmes , J.P. Nys , Thierry Melin
Forum des Microscopies à Sonde Locale, 2010, Mittelwihr, France
Communication dans un congrès hal-00574421v1

Controlled charge injection in semiconductor nanoparticles

 H. Diesinger , Thierry Melin , D. Deresmes , D. Stiévenard
12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands
Communication dans un congrès hal-00146616v1

Kelvin force microscopy frequency response optimization and application to nanowire/nanotube devices under polarization

 Heinrich Diesinger , D. Hourlier-Bahloul , David Brunel , D. Deresmes , Jean-Philippe Nys , et al.
Materials Research Society Fall Meeting, Symposium B : Nanoscale Phenomena in Functional Materials by Scanning Probe Microscopy, 2007, Boston, MA, United States
Communication dans un congrès hal-00285290v1
Image document

Voltage transient analysis as a generic tool for solar junction characterization

 Ari Bimo Prakoso , Chenjin Lu , C Rusli , Daniele Cortecchia , Cesare Soci , et al.
Journal of Physics D: Applied Physics, 2018, 51 (34), ⟨10.1088/1361-6463/aad274⟩
Article dans une revue hal-02331487v1

Nanoflexitouch - Programme P2N edition 2012

 Nicolas Decorde , Neralagatta Sangeetha , Benoit Viallet , Jérémie Grisolia , G. Viau , et al.
Journées Nationales en Nanosciences et Nanotechnologies, J3N 2013, Nov 2013, Marseille, France
Communication dans un congrès hal-00940920v1
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