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48 résultats
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triés par
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Practical Simulation Flow for Evaluating Analog and Mixed-Signal Test TechniquesIEEE Design & Test, 2016, ⟨10.1109/MDAT.2016.2590985⟩
Article dans une revue
hal-01359611v1
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Reliability Analysis of a Spiking Neural Network Hardware AcceleratorDesign, Automation and Test in Europe Conference (DATE), Mar 2022, Antwerp, Belgium. pp.370-375, ⟨10.23919/DATE54114.2022.9774711⟩
Communication dans un congrès
hal-03501968v1
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An End-To-End Neuromorphic Radio Classification System with an Efficient Sigma-Delta-Based Spike Encoding SchemeIEEE Transactions on Artificial Intelligence, In press, pp.1-14. ⟨10.1109/TAI.2023.3306334⟩
Article dans une revue
hal-04181477v1
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Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs40th IEEE VLSI Test Symposium 2022, Apr 2022, San Diego, United States. pp.1-8, ⟨10.1109/VTS52500.2021.9794208⟩
Communication dans un congrès
hal-03587673v1
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BIST-Assisted Analog Fault Diagnosis26th IEEE European Test Symposium, May 2021, Bruges (virtual), Belgium. pp.1-6, ⟨10.1109/ETS50041.2021.9465386⟩
Communication dans un congrès
hal-03181937v1
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Digital-to-Analog Hardware Trojan AttacksIEEE Transactions on Circuits and Systems I: Regular Papers, 2022, 69 (2), pp.573-586. ⟨10.1109/TCSI.2021.3116806⟩
Article dans une revue
hal-03357106v1
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Open Source Hardware and EDA Tools for Analog/Mixed-Signal Design and Prototyping2018 IEEE International Symposium on Circuits and Systems (ISCAS), May 2018, Florence, Italy. ⟨10.1109/ISCAS.2018.8351884⟩
Communication dans un congrès
hal-01843031v1
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Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IPDesign, Automation and Test in Europe Conference, Mar 2020, Grenoble, France. ⟨10.23919/DATE48585.2020.9116189⟩
Communication dans un congrès
hal-02385120v1
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Harnessing fabrication process signature for predicting yield across designsIEEE International Symposium on Circuits and Systems, May 2016, Montreal, Canada. ⟨10.1109/ISCAS.2016.7527386⟩
Communication dans un congrès
hal-01359613v1
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Securing Programmable Analog ICs Against PiracyDesign, Automation and Test in Europe Conference, Mar 2020, Grenoble, France. ⟨10.23919/DATE48585.2020.9116520⟩
Communication dans un congrès
hal-02384389v1
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Machine learning applications in IC testing2018 IEEE European Test Symposium (ETS), May 2018, Bremen, Germany. pp.1-10, ⟨10.1109/ETS.2018.8400701⟩
Communication dans un congrès
hal-02369135v1
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Evaluation of low-cost mixed-signal test techniques for circuits with long simulation timesIEEE International Test Conference (ITC 2015), Oct 2015, Anaheim, CA, United States. ⟨10.1109/TEST.2015.7342385⟩
Communication dans un congrès
hal-01259637v1
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Exploiting Pipeline ADC Properties for a Reduced-Code Linearity Test TechniqueIEEE Transactions on Circuits and Systems I: Regular Papers, 2015, 62 (10), pp.2391-2400. ⟨10.1109/TCSI.2015.2469014⟩
Article dans une revue
hal-01224434v1
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One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF CircuitsIEEE Transactions on Circuits and Systems I: Regular Papers, 2016, ⟨10.1109/TCSI.2016.2598184⟩
Article dans une revue
hal-01359608v1
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Analog and Mixed-Signal TestGrant Martin; Luciano Lavagno; Igor Markov. Electronic Design Automation for Integrated Circuits Handbook, CRC Press, 2016
Chapitre d'ouvrage
hal-02175745v1
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Anti-Piracy Design of RF TransceiversIEEE Transactions on Circuits and Systems I: Regular Papers, 2023, 70 (1), pp.492 - 505. ⟨10.1109/TCSI.2022.3214111⟩
Article dans une revue
hal-03808925v1
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Testing and Reliability of Spiking Neural Networks: A Review of the State-of-the-Art36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023), Oct 2023, Juan-Les-Pins, France
Communication dans un congrès
hal-04176109v1
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Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and PerspectivesIEEE Design & Test, 2023, 40 (2), pp.8 - 58. ⟨10.1109/MDAT.2023.3241116⟩
Article dans une revue
hal-03961502v1
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Adaptive Test with Test Escape Estimation for Mixed-Signal ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2017, ⟨10.1109/TCAD.2017.2783302⟩
Article dans une revue
hal-01669350v1
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A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADCIEEE Transactions on Circuits and Systems I: Regular Papers, 2016, ⟨10.1109/TCSI.2016.2602387⟩
Article dans une revue
hal-01447789v1
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Neuron-PUF: Physical Unclonable Function Based on a Single Spiking Neuron27th IEEE International Symposium on On-Line Testing and Robust System Design, Jun 2021, Virtual event, Italy. pp.1-6, ⟨10.1109/IOLTS52814.2021.9486716⟩
Communication dans un congrès
hal-03244954v1
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Breaking Analog Biasing Locking Techniques via Re-Synthesis26th Asia and South Pacific Design Automation Conference (ASPDAC '21), Jan 2021, Tokyo, Japan. ⟨10.1145/3394885.3431603⟩
Communication dans un congrès
hal-02978491v1
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Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access MechanismIEEE European Test Symposium, May 2020, Tallinn, Estonia. ⟨10.1109/ETS48528.2020.9131560⟩
Communication dans un congrès
hal-02532389v1
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Neuron Fault Tolerance in Spiking Neural Networks2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), Feb 2021, Grenoble (virtuel), France. pp.743-748, ⟨10.23919/DATE51398.2021.9474081⟩
Communication dans un congrès
hal-03036630v1
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Digitally-Assisted Mixed-Signal Circuit SecurityIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022, 41 (8), pp.2449-2462. ⟨10.1109/TCAD.2021.3111550⟩
Article dans une revue
hal-03337109v1
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Adaptive Test Flow for Mixed-Signal ICsIEEE 35th VLSI Test Symposium, Apr 2017, Las Vegas, United States. pp.1-6, ⟨10.1109/VTS.2017.7928919⟩
Communication dans un congrès
hal-01669360v1
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SyncLock: RF Transceiver Security Using Synchronization LockingDesign, Automation and Test in Europe Conference (DATE), Mar 2022, Antwerp, Belgium. pp.1153-1156, ⟨10.23919/DATE54114.2022.9774556⟩
Communication dans un congrès
hal-03609114v1
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Spiking Neuron Hardware-Level Fault Modeling26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Naples, Italy. ⟨10.1109/IOLTS50870.2020.9159745⟩
Communication dans un congrès
hal-02873418v1
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Built-in test of millimeter-wave circuits based on non-intrusive sensorsDesign, Automation & Test in Europe Conference, Mar 2016, Dresden, Germany
Communication dans un congrès
hal-01359620v1
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Anti-Piracy of Analog and Mixed-Signal Circuits in FD-SOI27th Asia and South Pacific Design Automation Conference (ASP-DAC), Jan 2022, Virtual, Taiwan. pp.423-428, ⟨10.1109/ASP-DAC52403.2022.9712547⟩
Communication dans un congrès
hal-03416062v2
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