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Giorgio Di Natale

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jean-max-dutertre

	Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS bulk J.-M. Dutertre , Vincent Beroulle , Philippe Candelier , Stephan de Castro , Louis-Barthelemy Faber IEEE Transactions on Device and Materials Reliability, 2019, 19 (1), pp.6-15. ⟨10.1109/TDMR.2018.2886463⟩ Article dans une revue hal-01971932v1
	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults Raphael Viera , Jean-Max Dutertre , Marie-Lise Flottes , Olivier Potin , Giorgio Di Natale Microelectronics Reliability, 2018, 88-90, pp.128-134. ⟨10.1016/j.microrel.2018.07.111⟩ Article dans une revue hal-01893676v1
	Frontside Versus Backside Laser Injection: A Comparative Study Stephan de Castro , Jean-Max Dutertre , Bruno Rouzeyre , Giorgio Di Natale , Marie-Lise Flottes ACM Journal on Emerging Technologies in Computing Systems, 2016, Special Issue on Secure and Trustworthy Computing, 13 (1), pp.7. ⟨10.1145/2845999⟩ Article dans une revue lirmm-01444121v1
	Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre Microelectronics Reliability, 2014, 54 (9-10), pp.2289-2294. ⟨10.1016/j.microrel.2014.07.151⟩ Article dans une revue emse-01094805v1
	Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre Microelectronics Reliability, 2013, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 53 (9), pp.1320-1324. ⟨10.1016/j.microrel.2013.07.069⟩ Article dans une revue emse-01100723v1

	Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Stephan de Castro , Louis-Barthelemy Faber FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩ Communication dans un congrès emse-01856008v1
	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults Raphael Viera , Jean-Max Dutertre , Marie-Lise Flottes , Olivier Potin , Giorgio Di Natale ESREF 2018 - European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2018, Aalborg, Denmark Communication dans un congrès hal-04457522v1
	The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Louis-Barthelemy Faber , Marie-Lise Flottes IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d’Aro, Spain. pp.214-219, ⟨10.1109/IOLTS.2018.8474230⟩ Communication dans un congrès emse-01856000v1
	Validation Of Single BBICS Architecture In Detecting Multiple Faults Raphael Andreoni Camponogara-Viera , Rodrigo Possamai Bastos , Jean-Max Dutertre , Olivier Potin , Marie-Lise Flottes ATS: Asian Test Symposium, Nov 2015, Mumbai, India Communication dans un congrès lirmm-01234067v1
	Figure of merits of 28nm Si technologies for implementing laser attack resistant security dedicated circuits Stephan de Castro , Jean-Max Dutertre , Giorgio Di Natale , Marie-Lise Flottes , Bruno Rouzeyre ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.362-367, ⟨10.1109/ISVLSI.2015.76⟩ Communication dans un congrès emse-01227138v1
	Laser-Induced Fault Effects in Security-Dedicated Circuits Vincent Beroulle , Philippe Candelier , Stephan de Castro , Giorgio Di Natale , Jean-Max Dutertre VLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩ Communication dans un congrès hal-01383737v1
	Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany Communication dans un congrès hal-03094235v1
	Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Giorgio Di Natale Joint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands Communication dans un congrès emse-01099040v1
	Laser attacks on integrated circuits: from CMOS to FD-SOI Jean-Max Dutertre , Stephan de Castro , Alexandre Sarafianos , Noémie Boher , Bruno Rouzeyre DTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2014, Santorin, Greece. ⟨10.1109/DTIS.2014.6850664⟩ Communication dans un congrès emse-01099042v1
	A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults Rodrigo Possamai Bastos , Frank Sill Torres , Jean-Max Dutertre , Marie-Lise Flottes , Giorgio Di Natale PATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2013, Karlsruhe, Germany. pp.157-163, ⟨10.1109/PATMOS.2013.6662169⟩ Communication dans un congrès lirmm-00968621v1
	A Bulk Built-in Sensor for Detection of Fault Attacks Rodrigo Possamai Bastos , Frank Sill Torres , Jean Max Dutertre , Marie-Lise Flottes , Giorgio Di Natale HOST: Hardware-Oriented Security and Trust, Jun 2013, Austin, TX, United States. pp.51-54, ⟨10.1109/HST.2013.6581565⟩ Communication dans un congrès lirmm-01430800v1
	Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2013, Arcachon, France. pp.B3c-2 #68 Communication dans un congrès hal-00872705v1