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Giorgio Di Natale

32
Documents

Présentation

Giorgio Di Natale received the PhD in Computer Engineering from the Politecnico di Torino in 2003. He is director of research for the National Research Center of France at the TIMA laboratory in Grenoble. His research interests include hardware security and trust, secure circuits design and test, reliability evaluation and fault tolerance, software implemented hardware fault tolerance, and VLSI testing.

Publications

alberto-bosio

SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems

Alessandro Vallero , Alessandro Savino , Athanasios Chatzidimitriou , Manolis Kaliorakis , Maha Kooli
IEEE Transactions on Computers, 2019, 68 (5), pp.765-783. ⟨10.1109/TC.2018.2887225⟩
Article dans une revue lirmm-01961657v1

Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems

Maha Kooli , Giorgio Di Natale , Alberto Bosio
Journal of Electronic Testing: : Theory and Applications, 2019, ⟨10.1007/s10836-019-05785-0⟩
Article dans une revue hal-02078889v1

Computing reliability: On the differences between software testing and software fault injection techniques

Maha Kooli , Firas Kaddachi , Giorgio Di Natale , Alberto Bosio , Pascal Benoit
Microprocessors and Microsystems: Embedded Hardware Design , 2017, 50, pp.102-112. ⟨10.1016/j.micpro.2017.02.007⟩
Article dans une revue lirmm-01693156v1
Image document

Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview

Alessandro Vallero , Sotiris Tselonis , Nikos Foutris , Manolis Kaliorakis , Maha Kooli
Microprocessors and Microsystems: Embedded Hardware Design , 2015, 39 (8), pp.1204-1214. ⟨10.1016/j.micpro.2015.06.003⟩
Article dans une revue lirmm-01297595v1

Statistical Reliability Estimation of Microprocessor-Based Systems

Alessandro Savino , Stefano Di Carlo , Politano Gianfranco , Alfredo Benso , Alberto Bosio
IEEE Transactions on Computers, 2012, 61 (11), pp.1521-1534. ⟨10.1109/TC.2011.188⟩
Article dans une revue lirmm-00744608v1

March Test Generation Revealed

Alfredo Benso , Alberto Bosio , Stefano Di Carlo , Giorgio Di Natale , Paolo Prinetto
IEEE Transactions on Computers, 2008, 57 (12), pp.1704-1713. ⟨10.1109/TC.2008.105⟩
Article dans une revue lirmm-00350780v1

March Test BDN, a new March Test for Dynamic Faults

Alberto Bosio , Giorgio Di Natale
Journal of Control Engineering and Applied Informatics, 2008, 10 (2), pp.3-9. ⟨10.1109/AQTR.2008.4588712⟩
Article dans une revue lirmm-00324111v1
Image document

Dependability of Alternative Computing Paradigms for Machine Learning: hype or hope?

Cristiana Bolchini , Alberto Bosio , Luca Cassano , Bastien Deveautour , Giorgio Di Natale
IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2022), Apr 2022, Prague, Czech Republic. ⟨10.1109/DDECS54261.2022.9770138⟩
Communication dans un congrès hal-03641285v1

Alternatives to fault injections for early safety/security evaluations

Régis Leveugle , Michele Portolan , S. Di Carlo , A. Savino , Giorgio Di Natale
24th IEEE European Test Symposium (ETS 2019), May 2019, Baden Baden, Germany. ⟨10.1109/ETS.2019.8791555⟩
Communication dans un congrès hal-02110119v1
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Rebooting Computing: The Challenges for Test and Reliability

Alberto Bosio , Ian O'Connor , G. Rodrigues , F. Lima , Elena Ioana Vatajelu
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct 2019, Noordwijk, Netherlands. pp.8138-8143, ⟨10.1109/DFT.2019.8875270⟩
Communication dans un congrès hal-02462194v1

Reliability of computing systems: From flip flops to variables

Giorgio Di Natale , Maha Kooli , Alberto Bosio , Michele Portolan , Régis Leveugle
IOLTS: International On-Line Testing Symposium, Jul 2017, Thessaloniki, Greece. pp.196-198, ⟨10.1109/IOLTS.2017.8046242⟩
Communication dans un congrès lirmm-01700744v1
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SCHIFI: Scalable and flexible high performance FPGA-based fault injector

Suman Sau , Maha Kooli , Giorgio Di Natale , Alberto Bosio , Amlan Chakrabarti
DCIS 2016 - 31st Conference on Design of Circuits and Integrated Systems, Nov 2016, Granada, Spain. ⟨10.1109/DCIS.2016.7845375⟩
Communication dans un congrès lirmm-01700747v1

Faster-than-at-speed execution of functional programs: An experimental analysis

Paolo Bernardi , Alberto Bosio , Giorgio Di Natale , Andrea Guerriero , Federico Venini
VLSI-SoC: Very Large Scale Integration and System-on-Chip, Sep 2016, Tallinn, Estonia. ⟨10.1109/VLSI-SoC.2016.7753581⟩
Communication dans un congrès lirmm-01444403v1
Image document

Cache-aware reliability evaluation through LLVM-based analysis and fault injection

Maha Kooli , Giorgio Di Natale , Alberto Bosio
IOLTS: International On-Line Testing Symposium, Jul 2016, Sant Feliu de Guixols, Spain. pp.19-22, ⟨10.1109/IOLTS.2016.7604663⟩
Communication dans un congrès lirmm-01444619v1

Cache- and register-aware system reliability evaluation based on data lifetime analysis

Maha Kooli , Firas Kaddachi , Giorgio Di Natale , Alberto Bosio
VTS: VLSI Test Symposium, Apr 2016, Las Vegas, United States. ⟨10.1109/VTS.2016.7477299⟩
Communication dans un congrès lirmm-01374569v1
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Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs

Paolo Bernardi , Alberto Bosio , Giorgio Di Natale , Andrea Guerriero , Ernesto Sanchez
VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability, Sep 2016, Tallinn, Estonia. pp.130-151, ⟨10.1007/978-3-319-67104-8_7⟩
Communication dans un congrès hal-01675205v1

Cross-layer system reliability assessment framework for hardware faults

Alessandro Vallero , Alessandro Savino , Gianfranco Michele Maria Politano , Stefano Di Carlo , Athanasios Chatzidimitriou
ITC: International Test Conference, Nov 2016, Fort Worth, TX, United States. ⟨10.1109/TEST.2016.7805863⟩
Communication dans un congrès lirmm-01444774v1

Fault injection tools based on Virtual Machines

Maha Kooli , Giorgio Di Natale , Pascal Benoit , Alberto Bosio , Lionel Torres
ReCoSoC: Reconfigurable and Communication-Centric Systems-on-Chip, May 2014, Montpellier, France. ⟨10.1109/ReCoSoC.2014.6861351⟩
Communication dans un congrès hal-01075479v1

A novel Adaptive Fault Tolerant Flip-Flop Architecture based on TMR

Luca Cassano , Alberto Bosio , Giorgio Di Natale
ETS: European Test Symposium, May 2014, Paderborn, Germany. ⟨10.1109/ETS.2014.6847831⟩
Communication dans un congrès lirmm-01234133v1
Image document

LIFTING: an Open-Source Logic Simulator

Alberto Bosio , Giorgio Di Natale
DATE 2009 - Design, Automation and Test in Europe Conference and Exhibition, Apr 2009, Nice, France
Communication dans un congrès lirmm-00407166v1

Modularer Selbsttest und Optimierte Reparaturanalyse für Eingebettete Speicher

Philipp Öhler , Sybille Hellebrand , Alberto Bosio , Giorgio Di Natale
ZUE'08: Zuverlässigkeit und Entwurf, Germany. pp.049-056
Communication dans un congrès lirmm-00332558v1
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March Test BDN: A new March Test for Dynamic Faults

Alberto Bosio , Giorgio Di Natale
AQTR'08: Automation, Quality and Testing, Robotics, May 2008, Cluj-Napoca, Romania, pp.085-089
Communication dans un congrès lirmm-00303528v1

LIFTING: A Flexible Open-Source Fault Simulator

Alberto Bosio , Giorgio Di Natale
ATS 2008 - 17th IEEE Asian Test Symposium, Nov 2008, Saporro, Japan. pp.035-040, ⟨10.1109/ATS.2008.17⟩
Communication dans un congrès lirmm-00343610v1

LIFTING: an Open-Source Logic Simulator

Alberto Bosio , Giorgio Di Natale
SAME'08: Sophia-Antipolis Forum on MicroElectronics 2008, Sep 2008, Sophia-Antipolis, France
Communication dans un congrès lirmm-00363795v1

Parallel Test of Identical Cores Using Test Elevators in 3D Circuits

Alberto Bosio , Giorgio Di Natale
3D-Test: Testing Three-Dimensional Stacked Integrated Circuits, Nov 2010, Austin, TX, United States. IEEE, 1st International Workshop on Testing Three-Dimensional Stacked Integrated Circuits, 2010
Poster de conférence lirmm-00537857v1
Image document

A Modular Memory BIST for Optimized Memory Repair

Philipp Öhler , Alberto Bosio , Giorgio Di Natale , Sybille Hellebrand
IEEE Computer Society. IOLTS: International On-Line Testing Symposium, Jul 2008, Rhodes, Greece. 14th International On-Line Testing and Robust System Design Symposium, pp.171-172, 2008, ⟨10.1109/IOLTS.2008.30⟩
Poster de conférence lirmm-00363724v1

Cross-Layer Reliability of Computing Systems

Giorgio Di Natale , Dimitris Gizopoulos , Stefano Di Carlo , Alberto Bosio , Ramon Canal
iet - the institution of engineering and technology, pp.1-328, 2020, 978-1785617973. ⟨10.1049/PBCS057E⟩
Ouvrages hal-02986877v1

Design techniques to improve the resilience of computing systems: software layer

Alberto Bosio , Stefano Di Carlo , Giorgio Di Natale , M. Sonza Reorda , J.E. Rodriguez Condia
Cross-Layer Reliability of Computing Systems, iet - the institution of engineering and technology, pp.95-112, 2020, 978-1785617973. ⟨10.1049/PBCS057E_ch4⟩
Chapitre d'ouvrage hal-02986855v1