Nombre de documents

67

CV de Frédéric Wrobel


Communication dans un congrès38 documents

  • Alexandre Bosser, Viyas Gupta, Arto Javanainen, Georgios Tsiligiannis, Helmut Puchner, et al.. Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM. RADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany. 16th European Conference on Radiation and Its Effects on Components and Systems, 2016, <http://www.radecs2016.com/joomla/>. <lirmm-01337405>
  • Viyas Gupta, Alexandre Bosser, Frédéric Wrobel, Frédéric Saigne, Laurent Dusseau, et al.. MTCube project: COTS memory SEE ground-test results and in-orbit error rate prediction. 4S: Small Satellites Systems and Services Symposium, May 2016, La Valletta, Malta. 2016, <http://congrexprojects.com/4S2016/home>. <lirmm-01298423>
  • Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Eric Lorfèvre, et al.. The Power Law Shape of Heavy Ions Experimental Cross Section. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2016, Portland, United States. IEEE, 2016, <http://www.nsrec.com/>. <lirmm-01298421>
  • Luigi Dilillo, Alexandre Bosser, Viyas Gupta, Frédéric Wrobel, Frédéric Saigne. Real-Time SRAM Based Particle Detector. IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2015, Gallipoli, Italy. Proceeding IWASI 2015: 6th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI), pp.58-62, 2015, <http://iwasi2015.poliba.it/>. <10.1109/IWASI.2015.7184968>. <lirmm-01238435>
  • Axel Rodriguez, Frédéric Wrobel, Anne Samaras, Francoise Bezerra, Benjamin Vandevelde, et al.. Proton-Induced SDRAM Cell Degradation. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. 15th European Conference on Radiation and Its Effects on Components and Systems, 2015, <http://www.radecs2015.org/files/CONFERENCE_PROGRAM.pdf>. <10.1109/RADECS.2015.7365650>. <lirmm-01238408>
  • Alexandre Bosser, Viyas Gupta, Georgios Tsiligiannis, Rudy Ferraro, Christopher Frost, et al.. A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. 15th European Conference on Radiation and Its Effects on Components and Systems, 2015, <http://www.radecs2015.org/files/CONFERENCE_PROGRAM.pdf>. <10.1109/RADECS.2015.7365578>. <lirmm-01238397>
  • Viyas Gupta, Alexandre Bosser, Georgios Tsiligiannis, Ali Mohammadzadeh, Arto Javanainen, et al.. Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. 15th European Conference on Radiation and Its Effects on Components and Systems, 2015, <http://www.radecs2015.org/files/CONFERENCE_PROGRAM.pdf>. <10.1109/RADECS.2015.7365617>. <lirmm-01238392>
  • Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Robert Ecoffet, et al.. Generic Analytic Expression of Heavy Ion SEU Cross Section Derived from Monte-Carlo Diffusion-Based Prediction Code. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, United States. 2015, 2015 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2015). <http://www.nsrec.com/2015Brochure.pdf>. <lirmm-01238388>
  • Viyas Gupta, Alexandre Bosser, Georgios Tsiligiannis, Ali Mohammadzadeh, Arto Javanainen, et al.. Impact of Stacked-Layer Structure on SEE Rate of SRAMs. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, United States. 2015. <lirmm-01238384>
  • Alexandre Bosser, Viyas Gupta, Arto Javanainen, Heikki Kettunen, Helmut Puchner, et al.. Investigation on MCU Clustering Methodologies for Cross-Section Estimation of SRAMs. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, United States. IEEE, 2015, IEEE Nuclear and Space Radiation Effects Conferencee, Boston, USA, 2015. <http://www.nsrec.com/2015Brochure.pdf>. <lirmm-01237731>
  • Viyas Gupta, Luigi Dilillo, Frédéric Wrobel, Ali Mohammadzadeh, Georgios Tsiligiannis, et al.. Presentation of the MTCube CubeSat Project. 4S: Small Satellites Systems and Services Symposium, May 2014, Majorca, Spain. 2014, <http://congrexprojects.com/2014-events/4S2014/home>. <lirmm-01272951>
  • Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Frédéric Saigne. Single Event Upset Prediction from Heavy Ions Cross Sections with No Parameters. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. IEEE Nuclear & Space Radiation Effects Conference (NSREC 2014), 2014, <http://ieee-npss.org/wp-content/uploads/2014/03/2014-NSREC.pdf>. <lirmm-01237668>
  • Georgios Tsiligiannis, Luigi Dilillo, Viyas Gupta, Alberto Bosio, Patrick Girard, et al.. Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. IEEE Nuclear & Space Radiation Effects Conference (NSREC 2014), 2014. <lirmm-01237660>
  • Tarek Saad Saoud, Soilihi Moindjie, Jean-Luc Autran, Daniela Munteanu, Frédéric Wrobel, et al.. Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. IEEE Nuclear & Space Radiation Effects Conference (NSREC 2014), 2014, <http://ieee-npss.org/wp-content/uploads/2014/03/2014-NSREC.pdf>. <lirmm-01237717>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. IEEE Nuclear & Space Radiation Effects Conference (NSREC 2014), 2014, <http://ieee-npss.org/wp-content/uploads/2014/03/2014-NSREC.pdf>. <lirmm-01237709>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic Mode. RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. 14th European Conference on Radiation and Its Effects on Components and Systems, pp.1-4, 2013, <10.1109/RADECS.2013.6937429>. <lirmm-00839062>
  • Frédéric Wrobel, Luigi Dilillo, Antoine Touboul, Frédéric Saigne. Comparison of the transient current shapes obtained with the diffusion model and the double exponential law — Impact on the SER. RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. 14th European Conference on Radiation and Its Effects on Components and Systems, 2013, <10.1109/RADECS.2013.6937441>. <lirmm-01237599>
  • Frédéric Wrobel, Jean-Roch Vaillé, Antoine Touboul, Luigi Dilillo, Frédéric Saigne. An Integrated Solid Detector For Onboard Detection Of Natural Radiations In Atmosphere. iWoRID: International Workshop on Radiation Imaging Detectors, Jun 2013, Paris, France. 15th International Workshops on Radiation Imaging Detectors, 2013, <http://www.synchrotron-soleil.fr/Workshops/2013/IWORID2013>. <lirmm-01238432>
  • Ioana Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, et al.. On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell. DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on, pp.143-148, 2013, <http://www.dfts.org/dft13/>. <10.1109/DFT.2013.6653597>. <lirmm-01238413>
  • Lionel Foro, Antoine Touboul, Frédéric Wrobel, Paolo Rech, Luigi Dilillo, et al.. Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBT. RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. 14th European Conference on Radiation and Its Effects on Components and Systems, 2013, <10.1109/RADECS.2013.6937428>. <lirmm-01237617>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Temperature Impact on the Neutron SER of a Commercial 90nm SRAM. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. IEEE, pp.1-4, 2013, <http://www.nsrec.com/>. <lirmm-00805291>
  • Georgios Tsiligiannis, Ioana Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, et al.. SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations. IOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International, pp.145-150, 2013, <http://tima.imag.fr/conferences/iolts/iolts13/>. <10.1109/IOLTS.2013.6604066>. <lirmm-00818955>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. SEU Monitoring in Mixed-Field Radiation Environments of Particle Accelerators. RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. 14th European Conference on Radiation and Its Effects on Components and Systems, pp.1-4, 2013, <10.1109/RADECS.2013.6937419>. <lirmm-00839085>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation Environments. IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2013, Bari, Italy. 5th IEEE International Workshop on Advances in Sensors and Interfaces, pp.75-80, 2013, <10.1109/IWASI.2013.6576070>. <lirmm-00839046>
  • Frédéric Wrobel, Luigi Dilillo, Antoine Touboul, Frédéric Saigné. Alpha particle-induced transient currents in 65 nm and 40 nm technologies. SEE'2012: Single Event Effects Symposium, Apr 2012, San Diego, CA, United States. pp.1, 2012, <http://radhome.gsfc.nasa.gov/radhome/SEE/2012/index.cfm>. <lirmm-00805378>
  • Frédéric Wrobel, Luigi Dilillo, Antoine Touboul, Jean-Roch Vaillé, Frédéric Saigne. Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. IEEE, pp.1-4, 2012, <http://www.nsrec.com/>. <lirmm-00805275>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, et al.. Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron Radiation. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4, 2012, <http://www.ims-bordeaux.fr/RADECS2012/pages/pageDynamiqueSITEExt.php?guidPage=home_page>. <lirmm-00805165>
  • Denis Pantel, Jean-Roch Vaillé, Frédéric Wrobel, Luigi Dilillo, Jean-Marc Galliere, et al.. A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude. IEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, 2012, <10.1109/RTC.2012.6418104>. <lirmm-00805169>
  • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Jean-Marc Galliere, et al.. Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4, 2012, <http://www.ims-bordeaux.fr/RADECS2012/pages/pageDynamiqueSITEExt.php?guidPage=home_page>. <lirmm-00805150>
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigne, et al.. Dynamic-Stress Neutrons Test of Commercial SRAMs. IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4, 2011, <http://www.nsrec.com/>. <lirmm-00805349>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, et al.. Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron Radiation. IEEE. IOLTS'2012: International On-Line VLSI Test symposium, Jun 2012, Sitges, Spain. pp.212-222, 2012, <http://tima.imag.fr/conferences/iolts/iolts12/>. <10.1109/IOLTS.2012.6313853>. <lirmm-00805373>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, et al.. A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4, 2012, <http://www.ims-bordeaux.fr/RADECS2012/pages/pageDynamiqueSITEExt.php?guidPage=home_page>. <lirmm-00805163>
  • Alessio Griffoni, Jeroen Van Duivenbode, Dimitri Linten, Eddy Simoen, Paolo Rech, et al.. Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. IEEE, pp.226-231, 2011, <http://www.radecs2011.org/>. <10.1109/RADECS.2011.6131395>. <lirmm-00805339>
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Alessio Griffoni, Frédéric Wrobel, et al.. Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. IEEE, pp.274-280, 2011, <http://www.radecs2011.org/>. <10.1109/RADECS.2011.6131396>. <lirmm-00805314>
  • Luigi Dilillo, Alberto Bosio, Paolo Rech, Patrick Girard, Frédéric Wrobel, et al.. Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron Sensor. IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. IEEE, pp.176-180, 2011, <http://iwasi2011.poliba.it/commitee.html>. <10.1109/IWASI.2011.6004712>. <lirmm-00805394>
  • Luigi Dilillo, Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, et al.. Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench. IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. IEEE, pp.1-6, 2011, <https://www2.lirmm.fr/lirmm/interne/BIBLI/CDROM/MIC/2011/LATW_2011/panel.html>. <lirmm-00805120>
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria. IEEE, 11th, 2010. <lirmm-00566847>
  • Luigi Dilillo, Frédéric Wrobel, Jean-Marc Galliere, Frédéric Saigne. Neutron Detection through an SRAM-Based Test Bench. IEEE. IWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. IEEE, pp.64-69, 2009, <http://iwasi.poliba.it/iwasi2009/Home.html>. <10.1109/IWASI.2009.5184769>. <lirmm-00438842>

Article dans une revue28 documents

  • Luigi Dilillo, Georgios Tsiligiannis, Viyas Gupta, Alexandre Bosser, Frédéric Saigne, et al.. Soft errors in commercial off-the-shelf static random access memories. Semiconductor Science and Technology, IOP Publishing, 2016, Special Issue on Radiation Effects in Semiconductor Devices, 32 (1), <http://iopscience.iop.org/article/10.1088/1361-6641/32/1/013006/meta>. <10.1088/1361-6641/32/1/013006>. <lirmm-01434747>
  • Viyas Gupta, Alexandre Bosser, Georgios Tsiligiannis, Ali Mohammad Zadeh, Arto Javanainen, et al.. Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 63 (4), pp.2010-2015. <10.1109/TNS.2016.2559943>. <lirmm-01382552>
  • Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Eric Lorfèvre, et al.. The Power Law Shape of Heavy Ions Experimental Cross Section. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, <10.1109/TNS.2016.2608004>. <lirmm-01382480>
  • Axel Rodriguez, Frédéric Wrobel, Anne Samaras, Francoise Bezerra, Benjamin Vandevelde, et al.. Proton-Induced Single-Event Degradation in SDRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 63 (4), pp.2115-2121. <10.1109/TNS.2016.2551733>. <lirmm-01382563>
  • Alexandre Bosser, Viyas Gupta, Georgios Tsiligiannis, Christopher Frost, Ali Mohammad Zadeh, et al.. Methodologies for the Statistical Analysis of Memory Response to Radiation. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 63 (4), pp.2122-2128. <10.1109/TNS.2016.2527781>. <lirmm-01382508>
  • Viyas Gupta, Alexandre Bosser, Georgios Tsiligiannis, Mathias Rousselet, Ali Mohammadzadeh, et al.. SEE on Different Layers of Stacked-SRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2015, 62 (6 ), pp.2673-2678. <10.1109/TNS.2015.2496725>. <lirmm-01254148>
  • Alexandre Bosser, Viyas Gupta, Georgios Tsiligiannis, Arto Javanainen, Heikki Kettunen, et al.. Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2015, 62 (6), pp.2620-2626. <http://ieeexplore.ieee.org/Xplore/home.jsp>. <10.1109/TNS.2015.2496874>. <lirmm-01254157>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology. Journal of Instrumentation, IOP Publishing, 2014, 9, <10.1088/1748-0221/9/05/C05052>. <lirmm-01234448>
  • Lionel Foro, Antoine Touboul, Alain Michez, Frédéric Wrobel, Paolo Rech, et al.. Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1739-1746. <http://ieeexplore.ieee.org/Xplore/home.jsp>. <10.1109/TNS.2014.2332813>. <lirmm-01237646>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. An SRAM Based Monitor for Mixed-Field Radiation Environments. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1663-1670. <http://ieeexplore.ieee.org/Xplore/home.jsp>. <10.1109/TNS.2014.2299733>. <lirmm-01234441>
  • Frédéric Wrobel, Luigi Dilillo, Antoine Touboul, Vincent Pouget, Frédéric Saigne. Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1813-1818. <http://ieeexplore.ieee.org/Xplore/home.jsp>. <10.1109/TNS.2014.2299762>. <lirmm-01234429>
  • Georgios Tsiligiannis, Luigi Dilillo, Viyas Gupta, Alberto Bosio, Patrick Girard, et al.. Dynamic Test Methods for COTS SRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (6), pp.3095-3102. <http://ieeexplore.ieee.org/Xplore/home.jsp>. <10.1109/TNS.2014.2363123>. <lirmm-01234463>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. 90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (6), pp.3389-3394. <http://ieeexplore.ieee.org/Xplore/home.jsp>. <10.1109/TNS.2014.2363120>. <lirmm-01234455>
  • Tarek Saad Saoud, Soilihi Moindjie, Jean-Luc Autran, Daniela Munteanu, Frédéric Wrobel, et al.. Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (6), pp.3380-3388. <http://ieeexplore.ieee.org/Xplore/home.jsp>. <10.1109/TNS.2014.2365038>. <lirmm-01234464>
  • Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Robert Ecoffet, et al.. Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (6), pp.3564-3571. <http://ieeexplore.ieee.org/Xplore/home.jsp>. <10.1109/TNS.2014.2368613>. <lirmm-01234461>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Multiple Cell Upset Classification in Commercial SRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1747-1754. <http://ieeexplore.ieee.org/Xplore/home.jsp>. <10.1109/TNS.2014.2313742>. <lirmm-01234446>
  • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Jean-Marc Galliere, et al.. Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (4), pp.2386-2391. <http://ieeexplore.ieee.org/Xplore/home.jsp>. <10.1109/TNS.2013.2257847>. <lirmm-01234425>
  • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Jean-Marc Galliere, et al.. A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (5), pp.3603-3608. <http://ieeexplore.ieee.org/Xplore/home.jsp>. <10.1109/TNS.2013.2264957>. <lirmm-01234419>
  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, et al.. Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (4), pp.2617-2622. <10.1109/TNS.2013.2239311>. <lirmm-00805005>
  • Frédéric Wrobel, Antoine Touboul, Luigi Dilillo, Frédéric Saigne. Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (4), pp.2537-2541. <10.1109/TNS.2012.2235148>. <lirmm-00805001>
  • Denis Pantel, Jean-Roch Vaillé, Frédéric Wrobel, Luigi Dilillo, Jean-Marc Galliere, et al.. Embedded silicon detector to investigate the natural radiative environment. Journal of Instrumentation, IOP Publishing, 2012, pp.1-11. <http://iopscience.iop.org/1748-0221/7/05/P05007>. <10.1088/1748-0221/7/05/P05007>. <lirmm-00805011>
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Alessio Griffoni, Jérôme Boch, et al.. Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.893-899. <10.1109/TNS.2012.2187218>. <lirmm-00805031>
  • Alessio Griffoni, Jeroen Van Duivenbode, Dimitri Linten, Eddy Simoen, Paolo Rech, et al.. Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.866-871. <10.1109/TNS.2011.2180924>. <lirmm-00805039>
  • Mourad Benabdesselam, A. Petitfils, Frédéric Wrobel, Franck Mady, Serge Marcie, et al.. Behavior of CVD diamond-based TL dosimeters in radiotherapy environments using photon and electron beams from treatment accelerators. Diamond and Related Materials, Elsevier, 2011, 20 (4), pp.520-522. <10.1016/j.diamond.2011.02.004>. <hal-00740867>
  • Sébastien Martinie, Jean-Luc Autran, Daniela Munteanu, Frédéric Wrobel, Michael Gedion, et al.. Analytical Modeling of Alpha-Particle Emission Rate at Wafer-Level. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (6, 1), pp.2798-2803. <10.1109/TNS.2011.2170851>. <hal-01430100>
  • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigne, et al.. Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (3), pp.855-861. <10.1109/TNS.2011.2123114>. <lirmm-00805046>
  • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Paolo Rech, et al.. Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (3), pp.945-951. <10.1109/TNS.2011.2136359>. <lirmm-00805045>
  • Michael Gedion, Frédéric Wrobel, Frédéric Saigné. Natural radioactivity consideration for high- dielectrics and metal gates choice in nanoelectronic devices. Journal of Physics D: Applied Physics, IOP Publishing, 2010, 43 (27), pp.275501. <10.1088/0022-3727/43/27/275501>. <hal-00569646>

Poster1 document

  • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Evaluating An SEU Monitor For Mixed-Field Radiation Environments. iWoRID: International Workshop on Radiation Imaging Detectors, Jun 2013, Paris, France. 15th International Workshops on Radiation Imaging Detectors, 2013, <http://www.synchrotron-soleil.fr/Workshops/2013/IWORID2013>. <lirmm-01238433>