Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects
Israel C Lopes
,
Vincent Pouget
,
Frédéric Wrobel
,
Frédéric Saigné
,
Antoine Touboul
,
et al.
Communication dans un congrès
hal-03251533v1
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Swift heavy ion-induced silicon dioxide nanostructuration: experimental observation of velocity effect
Antoine Touboul
,
A. Privat
,
R. Arinero
,
Frédéric Wrobel
,
E. Lorfèvre
,
et al.
Article dans une revue
istex
hal-01633533v1
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A calculation method to estimate single event upset cross section
Frédéric Wrobel
,
Antoine Touboul
,
Vincent Pouget
,
Luigi Dilillo
,
Jérôme Boch
,
et al.
Article dans une revue
hal-01636059v1
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Dynamic-Stress Neutrons Test of Commercial SRAMs
Paolo Rech
,
Jean-Marc J.-M. Galliere
,
Patrick Girard
,
Frédéric Wrobel
,
Frédéric Saigné
,
et al.
IEEE Nuclear and Space Radiation Effects Conference , Jul 2012, Las Vegas, NV, United States. pp.1-4
Communication dans un congrès
lirmm-00805349v1
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Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBT
Lionel Foro
,
Antoine Touboul
,
Frédéric Wrobel
,
Paolo Rech
,
Luigi Dilillo
,
et al.
Communication dans un congrès
lirmm-01237617v1
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Simulation studies of the parasitic structures involved in the SEU mechanisms in SRAMs
B. Sagnes
,
Frédéric Saigné
,
J.-M. Palau
,
Jean-Luc Autran
,
M.-C. Calvet
5th European Workshop on Radiation and its Effects on Components and Systems , 2004, Madrid, Spain
Communication dans un congrès
hal-01806844v1
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The use of dose-rate switching experiments to characterize bipolar devices
J. Boch
,
Y. Gonzalez Velo
,
Frédéric Saigné
,
N. Roche
,
J.-R. Vaillé
,
et al.
46th IEEE Nuclear Space and Radiation Effects Conference , 2009, Québec, Canada
Communication dans un congrès
hal-01822868v1
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Radiation Response of Forward biased Float Zone and Magnetic Czochralski Silicon Detectors of Different Geometry for 1-MeV Neutron Equivalent Fluence Monitoring
J. Mekki
,
M. Moll
,
M. Glaser
,
L. Dusseau
,
Frédéric Saigné
,
et al.
47th IEEE Nuclear Space and Radiation Effects Conference , 2010, Denver, United States
Communication dans un congrès
hal-01823535v1
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On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive operating area determination
A. Privat
,
Antoine Touboul
,
A. Michez
,
S. Bourdarie
,
J.-R. Vaillé
,
et al.
50th IEEE Nuclear Space and Radiation Effects Conference , 2014, Paris, France
Communication dans un congrès
hal-01824688v1
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Review and analysis of the radiation induced degradation observed on the input bias current of linear integrated circuits
L. Dusseau
,
M. Bernard
,
Y. Gonzalez Velo
,
N. Roche
,
E. Lorfèvre
,
et al.
45th IEEE Nuclear Space and Radiation Effects Conference , 2008, Tucson, United States
Communication dans un congrès
hal-01822450v1
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Contribution of Latent Defects Induced by High-Energy Heavy Ion Irradiation on the Gate Oxide Breakdown
Mathias Marinoni
,
Antoine Touboul
,
Aminata M. J. F. Carvalho
,
Frédéric Saigné
,
Frédéric Wrobel
,
et al.
Article dans une revue
hal-01631574v1
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Electrostatic propulsion for satellites application to the Robusta-3 nanosatellite
M. Guyot
,
S. Denise
,
L. Dusseau
,
F. Saigné
,
M. Bernard
,
et al.
Article dans une revue
hal-01635496v1
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Monte Carlo simulation of particle-induced bit upsets
Frédéric Wrobel
,
Antoine Touboul
,
Jean-Roch Vaillé
,
Jérôme Boch
,
Frédéric Saigné
13th International Conference on Radiation Shielding (ICRS-13) & 19th Topical Meeting of the Radiation Protection & Shielding Division of the American Nuclear Society -2016 (RPSD-2016) , Oct 2016, Paris, France. pp.06033,
⟨10.1051/epjconf/201715306033⟩
Communication dans un congrès
hal-01645320v1
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SEE Measurements and Simulations using Mono-Energetic GeV-Energy Hadron Beams
R. Alia Garcia
,
S. Danzeca
,
M. Brugger
,
G. Spiezia
,
S. Uznanski
,
et al.
Nuclear and Space Radiation Effects (NSREC) , 2013, San Francisco, United States
Communication dans un congrès
hal-01824413v1
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Study of a SOI SRAM Sensitivity to SEU by 3-D Device Simulation
K. Castellani-Coulié
,
B. Sagnes
,
Frédéric Saigné
,
J.-M. Palau
,
M.-C. Calvet
,
et al.
7th European Conference on Radiation and its Effects on Components and Systems , 2003, Noordwijk, Netherlands
Communication dans un congrès
hal-01806785v1
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Analysis of thermal annealing approach to extend electronic device lifetime
S. Dhombres
,
A. Michez
,
J. Boch
,
S. Beauvivre
,
D. Kraehenbuehl
,
et al.
IEEE RADECS 2015 , 2015, Moscou, Russia
Communication dans un congrès
hal-01932427v1
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Physical Model for the Low Dose Rate Effect in Bipolar Devices
J. Boch
,
Frédéric Saigné
,
R. D. Schrimpf
,
J.-R. Vaillé
,
L. Dusseau
,
et al.
43th IEEE Nuclear Space and Radiation Effects Conference , 2006, Ponte Vedra Beach, United States
Communication dans un congrès
hal-01808287v1
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Analysis of the Bias Effect on the Total-Dose Response of a Linear Bipolar Comparator
M. Bernard
,
L. Dusseau
,
J. Boch
,
Frédéric Saigné
,
R. D. Schrimpf
,
et al.
43th IEEE Nuclear Space and Radiation Effects Conference , 2006, Ponte Vedra Beach, United States
Communication dans un congrès
hal-01807732v1
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A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude
Denis Pantel
,
Jean-Roch Vaillé
,
Frédéric Wrobel
,
Luigi Dilillo
,
Jean-Marc J.-M. Galliere
,
et al.
Communication dans un congrès
lirmm-00805169v1
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Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity
Ygor Quadros de Aguiar
,
Frédéric Wrobel
,
Jean-Luc Autran
,
Paul Leroux
,
Frédéric Saigné
,
et al.
IEEE RADECS2018 , Sep 2018, Goteborg, Sweden
Communication dans un congrès
hal-02086422v1
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Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation
Tarek Saad Saoud
,
Soilihi Moindjie
,
Jean-Luc Autran
,
Daniela Munteanu
,
Frédéric Wrobel
,
et al.
NSREC: Nuclear and Space Radiation Effects Conference , Jul 2014, Paris, France
Communication dans un congrès
lirmm-01237717v1
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Effect of Temperature on Single Event Latchup Sensitivity
S. Guagliardo
,
Frédéric Wrobel
,
Ygor Quadros de Aguiar
,
Jean-Luc Autran
,
P. Leroux
,
et al.
Communication dans un congrès
hal-03187841v1
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Modeling low-dose-rate effects in irradiated bipolar-base oxides
R.J. Graves
,
C.R. Cirba
,
R.D. Schrimpf
,
R.J. Milanowski
,
A. Michez
,
et al.
Article dans une revue
hal-01801597v1
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Estimation of Low Dose Rate Degradation on Bipolar Linear Integrated Circuits Using Switching Experiments
J. Boch
,
Frédéric Saigné
,
R.D. Schrimpf
,
J.-R. Vaillé
,
L. Dusseau
Article dans une revue
hal-00327775v1
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Simultaneous evaluation of TID and displacement damage dose using a single OSL sensor
P. Garcia
,
J.-R. Vaillé
,
D. Benoit
,
H. Chabane
,
G. Berger
,
et al.
Article dans une revue
hal-00329597v1
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Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses
Frédéric Wrobel
,
Luigi Dilillo
,
Antoine Touboul
,
Vincent Pouget
,
Frédéric Saigné
Article dans une revue
lirmm-01234429v1
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Evaluation of MOS devices' total dose response using the isochronal annealing method
Frédéric Saigné
,
L. Dusseau
,
J. Fesquet
,
J. Gasiot
,
R. Ecoffet
,
et al.
Article dans une revue
hal-01801738v1
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Criterion for SEU Occurrence in SRAM Deduced From Circuit and Device Simulations in Case of Neutron-Induced SER
T. Mérelle
,
H. Chabane
,
J.-M. Palau
,
K. Castellani-Coulié
,
Frédéric Wrobel
,
et al.
Article dans une revue
hal-00328654v1
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Dynamic Test Methods for COTS SRAMs
Georgios Tsiligiannis
,
Luigi Dilillo
,
Viyas Gupta
,
Alberto Bosio
,
Patrick Girard
,
et al.
Article dans une revue
lirmm-01234463v1
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Study of a Thermal Annealing Approach for Very High Total Dose Environments
S. Dhombres
,
A. Michez
,
J. Boch
,
F. Saigné
,
S. Beauvivre
,
et al.
Article dans une revue
hal-01635351v1
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