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Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects

 Israel C Lopes , Vincent Pouget , Frédéric Wrobel , Frédéric Saigné , Antoine Touboul , et al.
IEEE Latin American Test Symposium (LATS) 2020, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093681⟩
Communication dans un congrès hal-03251533v1

Swift heavy ion-induced silicon dioxide nanostructuration: experimental observation of velocity effect

 Antoine Touboul , A. Privat , R. Arinero , Frédéric Wrobel , E. Lorfèvre , et al.
European Physical Journal: Applied Physics, 2012, 60 (1), ⟨10.1051/epjap/2012120349⟩
Article dans une revue istex hal-01633533v1

A calculation method to estimate single event upset cross section

 Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Jérôme Boch , et al.
Microelectronics Reliability, 2017, 76-77, pp.644-649. ⟨10.1016/j.microrel.2017.07.056⟩
Article dans une revue hal-01636059v1

Dynamic-Stress Neutrons Test of Commercial SRAMs

 Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné , et al.
IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4
Communication dans un congrès lirmm-00805349v1

Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBT

 Lionel Foro , Antoine Touboul , Frédéric Wrobel , Paolo Rech , Luigi Dilillo , et al.
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937428⟩
Communication dans un congrès lirmm-01237617v1

Simulation studies of the parasitic structures involved in the SEU mechanisms in SRAMs

 B. Sagnes , Frédéric Saigné , J.-M. Palau , Jean-Luc Autran , M.-C. Calvet
5th European Workshop on Radiation and its Effects on Components and Systems, 2004, Madrid, Spain
Communication dans un congrès hal-01806844v1

The use of dose-rate switching experiments to characterize bipolar devices

 J. Boch , Y. Gonzalez Velo , Frédéric Saigné , N. Roche , J.-R. Vaillé , et al.
46th IEEE Nuclear Space and Radiation Effects Conference, 2009, Québec, Canada
Communication dans un congrès hal-01822868v1

Radiation Response of Forward biased Float Zone and Magnetic Czochralski Silicon Detectors of Different Geometry for 1-MeV Neutron Equivalent Fluence Monitoring

 J. Mekki , M. Moll , M. Glaser , L. Dusseau , Frédéric Saigné , et al.
47th IEEE Nuclear Space and Radiation Effects Conference, 2010, Denver, United States
Communication dans un congrès hal-01823535v1

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive operating area determination

 A. Privat , Antoine Touboul , A. Michez , S. Bourdarie , J.-R. Vaillé , et al.
50th IEEE Nuclear Space and Radiation Effects Conference, 2014, Paris, France
Communication dans un congrès hal-01824688v1

Review and analysis of the radiation induced degradation observed on the input bias current of linear integrated circuits

 L. Dusseau , M. Bernard , Y. Gonzalez Velo , N. Roche , E. Lorfèvre , et al.
45th IEEE Nuclear Space and Radiation Effects Conference, 2008, Tucson, United States
Communication dans un congrès hal-01822450v1

Electrostatic propulsion for satellites application to the Robusta-3 nanosatellite

 M. Guyot , S. Denise , L. Dusseau , F. Saigné , M. Bernard , et al.
IEEE Transactions on Dielectrics and Electrical Insulation, 2014, 21 (3), pp.1161 - 1165. ⟨10.1109/TDEI.2014.6832261⟩
Article dans une revue hal-01635496v1

Monte Carlo simulation of particle-induced bit upsets

 Frédéric Wrobel , Antoine Touboul , Jean-Roch Vaillé , Jérôme Boch , Frédéric Saigné
13th International Conference on Radiation Shielding (ICRS-13) & 19th Topical Meeting of the Radiation Protection & Shielding Division of the American Nuclear Society -2016 (RPSD-2016), Oct 2016, Paris, France. pp.06033, ⟨10.1051/epjconf/201715306033⟩
Communication dans un congrès hal-01645320v1

SEE Measurements and Simulations using Mono-Energetic GeV-Energy Hadron Beams

 R. Alia Garcia , S. Danzeca , M. Brugger , G. Spiezia , S. Uznanski , et al.
Nuclear and Space Radiation Effects (NSREC), 2013, San Francisco, United States
Communication dans un congrès hal-01824413v1

Analysis of thermal annealing approach to extend electronic device lifetime

 S. Dhombres , A. Michez , J. Boch , S. Beauvivre , D. Kraehenbuehl , et al.
IEEE RADECS 2015, 2015, Moscou, Russia
Communication dans un congrès hal-01932427v1

Physical Model for the Low Dose Rate Effect in Bipolar Devices

 J. Boch , Frédéric Saigné , R. D. Schrimpf , J.-R. Vaillé , L. Dusseau , et al.
43th IEEE Nuclear Space and Radiation Effects Conference, 2006, Ponte Vedra Beach, United States
Communication dans un congrès hal-01808287v1

Analysis of the Bias Effect on the Total-Dose Response of a Linear Bipolar Comparator

 M. Bernard , L. Dusseau , J. Boch , Frédéric Saigné , R. D. Schrimpf , et al.
43th IEEE Nuclear Space and Radiation Effects Conference, 2006, Ponte Vedra Beach, United States
Communication dans un congrès hal-01807732v1

Contribution of Latent Defects Induced by High-Energy Heavy Ion Irradiation on the Gate Oxide Breakdown

 Mathias Marinoni , Antoine Touboul , Aminata M. J. F. Carvalho , Frédéric Saigné , Frédéric Wrobel , et al.
IEEE Transactions on Nuclear Science, 2009, 56 (4), pp.2213 - 2217. ⟨10.1109/TNS.2008.2010258⟩
Article dans une revue hal-01631574v1

Study of a SOI SRAM Sensitivity to SEU by 3-D Device Simulation

 K. Castellani-Coulié , B. Sagnes , Frédéric Saigné , J.-M. Palau , M.-C. Calvet , et al.
7th European Conference on Radiation and its Effects on Components and Systems, 2003, Noordwijk, Netherlands
Communication dans un congrès hal-01806785v1

A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude

 Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere , et al.
IEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩
Communication dans un congrès lirmm-00805169v1
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Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity

 Ygor Quadros de Aguiar , Frédéric Wrobel , Jean-Luc Autran , Paul Leroux , Frédéric Saigné , et al.
IEEE RADECS2018, Sep 2018, Goteborg, Sweden
Communication dans un congrès hal-02086422v1

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

 Tarek Saad Saoud , Soilihi Moindjie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel , et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès lirmm-01237717v1
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Effect of Temperature on Single Event Latchup Sensitivity

 S. Guagliardo , Frédéric Wrobel , Ygor Quadros de Aguiar , Jean-Luc Autran , P. Leroux , et al.
International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), Apr 2020, Marrakech, Morocco. ⟨10.1109/dtis48698.2020.9081275⟩
Communication dans un congrès hal-03187841v1

ELDRS : Optimization Tools for the Switched Dose Rate Technique

 J. Boch , Y. Gonzalez Velo , Frédéric Saigné , Nicolas Jean-Henri Roche , S. Perez , et al.
IEEE Transactions on Nuclear Science, 2011, 58 (6), pp.2998 - 3003. ⟨10.1109/TNS.2011.2171003⟩
Article dans une revue hal-01632664v1

Modeling low-dose-rate effects in irradiated bipolar-base oxides

 R.J. Graves , C.R. Cirba , R.D. Schrimpf , R.J. Milanowski , A. Michez , et al.
IEEE Transactions on Nuclear Science, 1998, 45 (6), pp.2352 - 2360. ⟨10.1109/23.736454⟩
Article dans une revue hal-01801597v1

Estimation of Low Dose Rate Degradation on Bipolar Linear Integrated Circuits Using Switching Experiments

 J. Boch , Frédéric Saigné , R.D. Schrimpf , J.-R. Vaillé , L. Dusseau
IEEE Transactions on Nuclear Science, 2005, VOL 52 (NUMB 6), p. 2616-2621. ⟨10.1109/TNS.2005.860711⟩
Article dans une revue hal-00327775v1

Simultaneous evaluation of TID and displacement damage dose using a single OSL sensor

 P. Garcia , J.-R. Vaillé , D. Benoit , H. Chabane , G. Berger , et al.
IEEE Transactions on Nuclear Science, 2006, 53 (6), pp.3713-3717. ⟨10.1109/TNS.2006.885003⟩
Article dans une revue hal-00329597v1

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

 Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Vincent Pouget , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1813-1818. ⟨10.1109/TNS.2014.2299762⟩
Article dans une revue lirmm-01234429v1

Criterion for SEU Occurrence in SRAM Deduced From Circuit and Device Simulations in Case of Neutron-Induced SER

 T. Mérelle , H. Chabane , J.-M. Palau , K. Castellani-Coulié , Frédéric Wrobel , et al.
IEEE Transactions on Nuclear Science, 2005, 52 (4), pp.1148-1155. ⟨10.1109/TNS.2005.852319⟩
Article dans une revue hal-00328654v1

Dynamic Test Methods for COTS SRAMs

 Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard , et al.
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3095-3102. ⟨10.1109/TNS.2014.2363123⟩
Article dans une revue lirmm-01234463v1

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

 A. Privat , Antoine Touboul , A. Michez , S. Bourdarie , J.-R. Vaillé , et al.
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.2930 - 2935. ⟨10.1109/TNS.2014.2365041⟩
Article dans une revue hal-01635347v1
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