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Frédéric Houzé


Yvan Bonnassieux   

Journal articles1 document

  • Aymeric Vecchiola, Pascal Chrétien, Sophie Delprat, Karim Bouzehouane, Olivier Schneegans, et al.. Wide range local resistance imaging on fragile materials by conducting probe atomic force microscopy in intermittent contact mode. Applied Physics Letters, American Institute of Physics, 2016, 108, pp.243101. ⟨10.1063/1.4953870⟩. ⟨cea-01331971⟩