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Frédéric De Geuser

12
Documents
Identifiants chercheurs
  • IdHAL frederic-de-geuser
  • ResearcherId : A-6039-2008
  • ORCID 0000-0002-2974-9432
  • Google Scholar : https://scholar.google.fr/citations?user=4bvXKrgAAAAJ&hl=fr
  • IdRef : 098447432
  • ResearcherId : http://www.researcherid.com/rid/A-6039-2008

Présentation

Publications

francois-vurpillot
Image document

Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods

Baptiste Gault , Benjamin Klaes , Felipe F Morgado , Christoph Freysoldt , Yue Li
Microscopy and Microanalysis, 2021, ⟨10.1017/S1431927621012952⟩
Article dans une revue hal-03388125v1

Atom probe tomography spatial reconstruction: Status and directions

D.J. Larson , B. Gault , B.P. Geiser , F. de Geuser , François Vurpillot
Current Opinion in Solid State and Materials Science, 2013, 17 (5), pp.236-247. ⟨10.1016/j.cossms.2013.09.002⟩
Article dans une revue hal-00935033v1
Image document

Correlated field evaporation as seen by atom probe tomography

F. de Geuser , B. Gault , A. Bostel , François Vurpillot
Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2007, 601 (2), pp.536 - 543. ⟨10.1016/j.susc.2006.10.019⟩
Article dans une revue hal-00408087v1
Image document

An improved reconstruction procedure for the correction of local magnification effects in three-dimensional atom-probe

F. de Geuser , Williams Lefebvre , Frédéric Danoix , François Vurpillot , B. Forbord
Surface and Interface Analysis, 2007, 39 (2-3), pp.268--272. ⟨10.1002/sia.2489⟩
Article dans une revue hal-00408094v1

Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probe

François Vurpillot , F. de Geuser , Gérald da Costa , D. Blavette
Journal of Microscopy, 2004, 216 (3), pp.234--240. ⟨10.1111/j.0022-2720.2004.01413.x⟩
Article dans une revue hal-01928905v1

Revisiting Field Ion Microscopy

B. Gault , M. Dagan , S. Katnagallu , F. de Geuser , F. Vurpillot
TMS conference, 2017, San Diego, United States
Communication dans un congrès hal-01838871v1

Methods for the study of clustering and precipitation in Al-based alloys by APT

Williams Lefebvre , F. Vurpillot , M. Torsaeter , F. de Geuser
International Conference on Aluminium Alloys (ICAA 12), 2010, Yokohama, Japan
Communication dans un congrès hal-01838921v1

An improved reconstruction procedure for the correction of local magnification effects in 3D Atom Probe

Frederic de Geuser , W. Lefebvre , Frédéric Danoix , F. Vurpillot , B. Forbord
49th International Field Emission Symposium (IFES), 2004, Graz, Austria
Communication dans un congrès hal-01838942v1

Local magnification in 3DAP

Didier Blavette , François Vurpillot , Frederic de Geuser , Emilie Bémont
49th International Field Emission Symposium (IFES), 2004, Graz, Austria
Communication dans un congrès hal-01838941v1

Why do We Need a High Performance Position Sensitive Detector in Atom Probe Tomography?

F. Vurpillot , Gérald da Costa , F. de Geuser , B. Gault , Bernard Deconihout
50th International Field Emission Symposium (IFES), 2006, Guilin, China. 2006
Poster de conférence hal-01838932v1

Composition measurements in 3DAP: a Bayesian approach

François Vurpillot , Alain Bostel , Frederic de Geuser , Bernard Deconihout
49th International Field Emission Symposium (IFES), 2004, Graz, Austria. 2004
Poster de conférence hal-01838939v1