2D and 3D Terahertz Imaging and X-Rays CT for Sigillography Study
Patrick Mounaix
,
Jean-Paul Guillet
,
F. Fauquet
,
H. Balacey
,
B. Recur
,
et al.
Article dans une revue
hal-01653623v1
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Test de circuits intégrés par faisceau laser pulsé
Dean Lewis
,
Vincent Pouget
,
Frédéric Darracq
,
Hervé Lapuyade
,
Pascal Fouillat
Colloque Interdisciplinaire en Instrumentation (C2I) , 2001, France. pp.1
Communication dans un congrès
hal-00185412v1
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Influence of Laser Pulse Duration in Single Event Upset Testing
Alexandre Douin
,
Vincent Pouget
,
Frédéric Darracq
,
Dean Lewis
,
Pascal Fouillat
,
et al.
8th European Conference on Radiation and its Effects on Components and Systems (RADECS) 2005 , Sep 2005, Cap d'Agde, France. pp.1-7
Communication dans un congrès
hal-00397942v1
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Optimizing pulsed OBIC technique for ESD defect localization
Fabien Essely
,
Nicolas Guitard
,
Frédéric Darracq
,
Vincent Pouget
,
Marise Bafleur
,
et al.
13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) , Jul 2006, Singapour, Singapore. pp.270-275, 10.1109/IPFA.2006.251044,
⟨10.1109/IPFA.2006.251044⟩
Communication dans un congrès
hal-00204574v1
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Impact of Negative Bias Temperature Instability on the Single-Event Upset Threshold of a 65nm SRAM cell
I. El Moukhtari
,
V. Pouget
,
C. Larue
,
Frédéric Darracq
,
D. Lewis
,
et al.
ESREF 2013 , 2013, Arcachon, France
Communication dans un congrès
hal-01935692v1
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Temperature Effect on Reflected Laser Probing Signal of Multiple Elementary Substructures
Mohamed Rebai
,
Frédéric Darracq
,
Jean-Paul Guillet
,
Philippe Perdu
,
Kévin Sanchez
,
et al.
21th International symposium on the Physical and Failure Analysis of integrated circuits (IPFA) , Jun 2014, Singapour, Singapore. pp.374-378
Communication dans un congrès
hal-01020683v1
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Application of various optical techniques for ESD defect localization
Fabien Essely
,
Frédéric Darracq
,
Vincent Pouget
,
Mustapha Remmach
,
Félix Beaudoin
,
et al.
Article dans une revue
istex
hal-00204570v1
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Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology
Issam El Moukhtari
,
Vincent Pouget
,
Frédéric Darracq
,
Camille Larue
,
Philippe Perdu
,
et al.
Article dans une revue
hal-00880480v1
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Evaluation of SRAMs Reliability for Space Electronics Using Ultra Short Laser Pulses
Frédéric Darracq
,
Hervé Lapuyade
,
Pascal Fouillat
,
Vincent Pouget
,
Dean Lewis
,
et al.
19th Symposium on Microelectronics Technology and Devices (SBMicro 2004) , 2004, Brazil. pp.1
Communication dans un congrès
hal-00185409v1
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Evaluation of SRAMs reliability for space electronics using ultrashort laser pulses
Frédéric Darracq
,
Herve Lapuyade
,
Pascal Fouillat
,
Vincent Pouget
,
Dean Lewis
,
et al.
Journal of Integrated Circuits and Systems , 2006, 1 (3), pp.11 -16
Article dans une revue
hal-00359396v1
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Comprehensive Study into Underlying Mechanisms of Anomalous Gate Leakage Degradation in GaN High Electron Mobility Transistors
Mukherjee Kalparupa
,
Frédéric Darracq
,
Arnaud Curutchet
,
Nathalie Malbert
,
Nathalie Labat
IRPS 2018 , Mar 2018, San Francisco, United States
Communication dans un congrès
hal-01718850v1
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TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices
Mukherjee Kalparupa
,
Frédéric Darracq
,
Arnaud Curutchet
,
Nathalie Malbert
,
Nathalie Labat
Microelectronics Reliability , 2017
Article dans une revue
hal-01625567v1
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Investigation of Trapping Behaviour in GaN HEMTs through physical TCAD Simulation of Capacitance Voltage characteristics
Mukherjee Kalparupa
,
Frédéric Darracq
,
Arnaud Curutchet
,
Nathalie Malbert
,
Nathalie Labat
Communication dans un congrès
hal-01718857v1
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TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices
Kalparupa Mukherjee
,
Frederic Darracq
,
Arnaud Curutchet
,
Nathalie Malbert
,
Nathalie Labat
ESREF 2017 , Sep 2017, Bordeaux, France
Communication dans un congrès
hal-02462694v1
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Radiation Hardness Assessment of an ADC for Space Application using a Laser Test Equipment
Vincent Pouget
,
Pascal Fouillat
,
Dean Lewis
,
Frédéric Darracq
Proc. of XIX Conference on Design of Circuits and Integrated Systems (DCIS) 2004, ISBN 2-9522971-0-X , Nov 2004, Bordeaux, France
Communication dans un congrès
hal-01887701v1
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Comprehensive study into underlying mechanisms of anomalous gate leakage degradation in GaN HEMTs
Mukherjee Kalparupa
,
Frédéric Darracq
,
Arnaud Curutchet
,
Nathalie Malbert
,
Nathalie Labat
Communication dans un congrès
hal-01787593v1
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Frequency modulated continuous wave terahertz imaging for art restoration
Jean-Paul Guillet
,
Kejian Wang
,
Marie Roux
,
Frederic Fauquet
,
Frédéric Darracq
,
et al.
Communication dans un congrès
hal-01418837v1
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Optical parametric amplification in gas-filled hollow core capillary for the generation of tunable pulses in the infrared
Olivia Zurita-Miranda
,
Coralie Fourcade Dutin
,
Pierre Béjot
,
Frederic Fauquet
,
Jean-Paul Guillet
,
et al.
9TH EPS-QEOD EUROPHOTON , EPS, Aug 2020, Prague, Czech Republic
Communication dans un congrès
hal-02965824v1
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Fundamentals of the Pulsed Laser Technique for single-event upset testing
Pascal Fouillat
,
Vincent Pouget
,
D. Mcmorrow
,
Frédéric Darracq
,
S. Buchner
,
et al.
School on the Effects of Radiation on Embedded Systems for Space Application (SERESSA) , 2005, Manaus, Brazil
Communication dans un congrès
hal-00401314v1
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Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects
Frédéric Darracq
,
Hervé Lapuyade
,
N. Buard
,
Pascal Fouillat
,
R. Dufayel
,
et al.
Microelectronics Reliability , 2003, 43, pp.1
Article dans une revue
hal-00185396v1
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Single-event Sensitivity of a single SRAM cell
Frédéric Darracq
,
Thomas Beauchene
,
Vincent Pouget
,
Hervé Lapuyade
,
Dean Lewis
,
et al.
RADECS , 2001, France. pp.1
Communication dans un congrès
hal-00185411v1
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Investigation of single event burnout sensitive depth in power MOSFETS
Frédéric Darracq
,
V. Pouget
,
D. Lewis
,
P. Fouillat
,
E. Lorfèvre
,
et al.
2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS), , Sep 2009, Bruges, Belgium. pp.106 - 111
Communication dans un congrès
hal-00667364v1
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Tunable source of infrared pulses in gas-filled hollow core capillary
Olivia Zurita-Miranda
,
Coralie Fourcade-Dutin
,
Pierre Béjot
,
Frederic Fauquet
,
Jean-Paul Guillet
,
et al.
Laser Congress (virtual event) , OSA, Oct 2020, San Diego, France
Communication dans un congrès
hal-02965842v1
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Low-frequency noise effect on terahertz tomography using thermal detectors.
Jean-Paul Guillet
,
Benoît Recur
,
Hugo Balacey
,
Joyce Bou Sleiman
,
F. Darracq
,
et al.
Article dans une revue
hal-01263737v1
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Frequency Modulated Continuous Wave Terahertz Imaging For Art Restoration
Patrick Mounaix
,
Frederic Darracq
,
Jean-Paul Guillet
,
Frederic Fauquet
,
Marie Roux
,
et al.
IRMMW 2016 , Sep 2016, copenague, Denmark
Communication dans un congrès
hal-01404415v1
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Analysis of Short-Term NBTI Effect on the Single-Event Upset Sensitivity of a 65nm SRAM using Two-Photon Absorption
El Moukthari Issam
,
Vincent Pouget
,
Frédéric Darracq
,
Camille Larue
,
Dean Lewis
,
et al.
14th European Conference on Radiation and Its Effects on Components and Systems , Sep 2013, Oxford, United Kingdom. pp.1-6,
⟨10.1109/RADECS.2013.6937408⟩
Communication dans un congrès
hal-01091193v1
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Analysis of short-term NBTI effect on the Single-Event Upset sensitivity of a 65nm SRAM using two-photon absorption
I. El Moukhtari
,
V. Pouget
,
F. Darracq
,
C. Larue
,
P. Perdu
,
et al.
IEEE RADECS , 2013, Oxford, United Kingdom
Communication dans un congrès
hal-01935693v1
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Art Painting Testing with Terahertz Pulse and Frequency Modulated Continuous Wave
Jean-Paul Guillet
,
Marie Roux
,
Kejian Wang
,
Xue Ma
,
Frederic Fauquet
,
et al.
2017 Progress In Electromagnetics Research Symposium , May 2017, Saint Petersbourg, Russia
Communication dans un congrès
hal-01546450v1
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Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing
Emeric Faraud
,
V. Pouget
,
Kai Shao
,
Camille Larue
,
Frédéric Darracq
,
et al.
Article dans une revue
hal-00667336v1
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Applications of various optical techniques for ESD defect localization
Fabien Essely
,
Frédéric Darracq
,
Vincent Pouget
,
Mustapha Remmach
,
Félix Beaudoin
,
et al.
European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF) , 2006, wuppertal, Germany. pp.1563-1568
Communication dans un congrès
hal-00401519v1
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