François Vurpillot

156

Documents

Publications

	Correlating laser energy with compositional and atomic-level information of oxides in atom probe tomography K.A. Hunnestad , C. Hatzoglou , François Vurpillot , I.-E. Nylund , Z. Yan Materials Characterization, 2023, 203, pp.113085. ⟨10.1016/j.matchar.2023.113085⟩ Article dans une revue hal-04132732v1
	Combining Structure, Chemistry and Properties at the Nanoscale with Correlative Tomography Approaches Williams Lefebvre , Gérald da Costa , Celia Castro , François Vurpillot Microscopy and Microanalysis, 2023, 29 (Supplement_1), pp.611-611. ⟨10.1093/micmic/ozad067.296⟩ Article dans une revue hal-04324995v1
	Atom probe tomography of hyper-doped Ge layers synthesized by Sb in-diffusion by pulsed laser melting Samba Ndiaye , Sébastien Duguay , François Vurpillot , Chiara Carraro , Gianluigi Maggioni Materials Science in Semiconductor Processing, 2023, 164, pp.107641. ⟨10.1016/j.mssp.2023.107641⟩ Article dans une revue hal-04125505v1
	Introducing a Dynamic Reconstruction Methodology for Multilayered Structures in Atom Probe Tomography Constantinos Hatzoglou , Gérald da Costa , Peter Wells , Xiaochen Ren , Brian Geiser Microscopy and Microanalysis, 2023, 29 (3), pp.1124-1136. ⟨10.1093/micmic/ozad054⟩ Article dans une revue hal-04152106v1
	Beyond Atom Mapping in Atom Probe Tomography Using Field Evaporation Energy Loss Spectroscopy François Vurpillot , Loïc Rousseau , C. Hatzoglou , Antoine Normand , Baptiste Gault Microscopy and Microanalysis, 2023, 29 (Supplement_1), pp.605-606. ⟨10.1093/micmic/ozad067.293⟩ Article dans une revue hal-04346766v1
	A Quantitative Investigation of Functionalized Glazing Stacks by Atom Probe Tomography Jacques Perrin Toinin , Constantinos Hatzoglou , Justine Voronkoff , Hervé Montigaud , Denis Guimard Advanced Materials Technologies, 2023, 8 (3), pp.2200922. ⟨10.1002/admt.202200922⟩ Article dans une revue hal-04351630v1
	Mesoscopic modeling of field evaporation on atom probe tomography Constantinos Hatzoglou , Benjamin Klaes , Fabien Delaroche , Gérald da Costa , Brian Geiser Journal of Physics D: Applied Physics, 2023, 56 (37), pp.375301. ⟨10.1088/1361-6463/acd649⟩ Article dans une revue hal-04344607v1
	Alloy distribution and compositional metrology of epitaxial ScAlN by atom probe tomography Samba Ndiaye , Caroline Elias , Aissatou Diagne , Hélène Rotella , Frédéric Georgi Applied Physics Letters, 2023, 123, pp.162102. ⟨10.1063/5.0167855⟩ Article dans une revue hal-04351608v1
	Synthesis of relaxed Ge0.9Sn0.1/Ge by nanosecond pulsed laser melting Enrico Di Russo , Francesco Sgarbossa , Pierpaolo Ranieri , Gianluigi Maggioni , Samba Ndiaye Applied Surface Science, 2023, 612, pp.155817. ⟨10.1016/j.apsusc.2022.155817⟩ Article dans une revue hal-03885778v1
	Introducing field evaporation energy loss spectroscopy Loïc Rousseau , Antoine Normand , Felipe Morgado , Hanne-Sofie Marie Scisly Søreide , Leigh Stephenson Communications Physics, 2023, 6 (1), pp.100. ⟨10.1038/s42005-023-01203-2⟩ Article dans une revue hal-04106937v1
	Surface Dynamics of Field Evaporation in Silicon Carbide Samba Ndiaye , Christian Bacchi , Benjamin Klaes , Mariaconcetta Canino , François Vurpillot Journal of Physical Chemistry C, 2023, 127 (11), pp.5467-5478. ⟨10.1021/acs.jpcc.2c08908⟩ Article dans une revue hal-04344583v1
	Improving Spatial and Elemental Associations in Analytical Field Ion Microscopy Felipe F Morgado , Leigh Stephenson , Loïc Rousseau , François Vurpillot , Simon Evertz Microscopy and Microanalysis, 2023, 29, pp.1077-1086. ⟨10.1093/micmic/ozad039⟩ Article dans une revue hal-04056079v1
	Development of an Energy-Sensitive Detector for the Atom Probe Tomography Christian Bacchi , Gérald da Costa , Emmanuel Cadel , Fabien Cuvilly , Jonathan Houard Microscopy Microanal., 2022, 28 (4), pp.1076-1091. ⟨10.1017/S1431927621012708⟩ Article dans une revue hal-03178516v1
	Mysterious Field Evaporation Behavior of Hydrogen in Aluminium Based Material Analyzed with Atom Probe Tomography Loïc Rousseau , Jean-Baptiste Maillet , Leigh Stephenson , Benoit Gervais , Baptiste Gault Microscopy and Microanalysis, 2022, 28 (S1), pp.690-691. ⟨10.1017/S1431927622003233⟩ Article dans une revue hal-03855834v1
	Influence of field conditions on quantitative analysis of single crystal thorium dioxide by atom probe tomography Amrita Sen , Mukesh Bachhav , François Vurpillot , J. Matthew Mann , Phyllis Morgan Ultramicroscopy, 2021, 220, pp.113167. ⟨10.1016/j.ultramic.2020.113167⟩ Article dans une revue hal-04355448v1
	Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi Benjamin Klaes , Jeoffrey Renaux , Rodrigue Lardé , Fabien Delaroche , Felipe Morgado Microscopy and Microanalysis, 2021, pp.1-9. ⟨10.1017/S1431927621012629⟩ Article dans une revue hal-03474770v1
	Surface Microscopy of Atomic and Molecular Hydrogen from Field-Evaporating Semiconductors Lorenzo Rigutti , Enrico Di Russo , Florian Chabanais , Ivan Blum , Jonathan Houard Journal of Physical Chemistry C, 2021, 125 (31), pp.17078-17087. ⟨10.1021/acs.jpcc.1c04778⟩ Article dans une revue hal-03448318v1
	Revealing atomic-scale vacancy-solute interaction in nickel Felipe Morgado , Shyam Katnagallu , Christoph Freysoldt , Benjamin Klaes , François Vurpillot Scripta Materialia, 2021, 203, pp.114036. ⟨10.1016/j.scriptamat.2021.114036⟩ Article dans une revue hal-03474754v1
	In Situ Spectroscopic Study of the Optomechanical Properties of Evaporating Field Ion Emitters P. Dalapati , G. Beainy , Enrico Di Russo , Ivan Blum , Jonathan Houard Physical Review Applied, 2021, 15 (2), ⟨10.1103/physrevapplied.15.024014⟩ Article dans une revue hal-03138523v1
	A Tomographic Atom Probe laser assisted by a flexible optical system Jonathan Houard , Angela Vella , Gérald da Costa , Ivan Blum , Fabien Delaroche Microscopy and Microanalysis, 2021, 27 (S1), pp.1260 - 1261. ⟨10.1017/s1431927621004724⟩ Article dans une revue hal-04360365v1
	Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods Baptiste Gault , Benjamin Klaes , Felipe F Morgado , Christoph Freysoldt , Yue Li Microscopy and Microanalysis, 2021, ⟨10.1017/S1431927621012952⟩ Article dans une revue hal-03388125v1
	Development of Wide Field of View Three-Dimensional Field Ion Microscopy and High-Fidelity Reconstruction Algorithms to the Study of Defects in Nuclear Materials Benjamin Klaes , Rodrigue Lardé , Fabien Delaroche , Constantinos Hatzoglou , Stefan Parviainen Microscopy and Microanalysis, 2021, 27 (2), pp.365-384. ⟨10.1017/S1431927621000131⟩ Article dans une revue hal-03474668v1
	Preferential evaporation in atom probe tomography: an analytical approach Constantinos Hatzoglou , Solène Rouland , Bertrand Radiguet , Auriane Etienne , Gérald da Costa Microscopy and Microanalysis, 2020, 26 (4), pp.689-698. ⟨10.1017/S1431927620001749⟩ Article dans une revue hal-02917595v1
	Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations R. Dubosq , B. Gault , C. Hatzoglou , K. Schweinar , François Vurpillot Ultramicroscopy, 2020, 218, pp.113092. ⟨10.1016/j.ultramic.2020.113092⟩ Article dans une revue hal-02921985v1
	A model to predict image formation in the three-dimensional field ion microscope Benjamin Klaes , Rodrigue Lardé , Fabien Delaroche , Stefan Parviainen , Nicolas Rolland Computer Physics Communications, 2020, pp.107317. ⟨10.1016/j.cpc.2020.107317⟩ Article dans une revue hal-02571970v1
	Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements Xing Wang , Constantinos Hatzoglou , Brian Sneed , Zhe Fan , Wei Guo Nature Communications, 2020, 11 (1), ⟨10.1038/s41467-020-14832-w⟩ Article dans une revue hal-02571976v1
	Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography Enrico Di Russo , Ivan Blum , Ivan Rivalta , Jonathan Houard , Gérald da Costa Journal of Physical Chemistry A, 2020, 124 (52), pp.10977-10988. ⟨10.1021/acs.jpca.0c09259⟩ Article dans une revue hal-03120561v1
	Dynamic Effects in Voltage Pulsed Atom Probe Loïc Rousseau , Antoine Normand , Felipe Morgado , Leigh Stephenson , Baptiste Gault Microscopy and Microanalysis, 2020, 26 (6), pp.1133-1146. ⟨10.1017/S1431927620024587⟩ Article dans une revue hal-03013684v1
	A Photonic Atom Probe coupling 3D Atomic Scale Analysis with in situ Photoluminescence Spectroscopy Jonathan Houard , Antoine Normand , Enrico Di Russo , Christian Bacchi , P Dalapati Review of Scientific Instruments, 2020, 91, pp.083704. ⟨10.1063/5.0012359⟩ Article dans une revue hal-02902892v1
	Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom Probe Enrico Di Russo , Pradip Dalapati , Jonathan Houard , Linda Venturi , Ivan Blum Nano Letters, 2020, ⟨10.1021/acs.nanolett.0c03584⟩ Article dans une revue hal-03024946v1
	Characterization of Pd and Pd@Au core-shell nanoparticles using atom probe tomography and field evaporation simulation Se-Ho Kim , Kyuseon Jang , Phil Woong Kang , Jae-Pyoung Ahn , Jae-Bok Seol Journal of Alloys and Compounds, 2020, 831, pp.154721. ⟨10.1016/j.jallcom.2020.154721⟩ Article dans une revue hal-02571984v1
	Imaging individual solute atoms at crystalline imperfections in metals Shyam Katnagallu , Leigh T. Stephenson , Isabelle Mouton , Christoph Freysoldt , Aparna P.A. Subramanyam New J.Phys., 2019, 21 (12), pp.123020. ⟨10.1088/1367-2630/ab5cc4⟩ Article dans une revue hal-02097141v1
	La sonde atomique tomographique Lorenzo Rigutti , François Vurpillot , Williams Lefebvre , Angela Vella Reflets de la Physique, 2019, 62, pp.4-10. ⟨10.1051/refdp/201962004⟩ Article dans une revue hal-03260708v1
	Spatial and Compositional Biases Introduced by Position Sensitive Detection Systems in APT: A Simulation Approach Christian Bacchi , Gérald da Costa , François Vurpillot Microscopy and Microanalysis, 2019, 25, pp.418-424. ⟨10.1017/S143192761801629X⟩ Article dans une revue hal-02107336v1
	Enhancing Element Identification by Expectation–Maximization Method in Atom Probe Tomography François Vurpillot , Constantinos Hatzoglou , Bertrand Radiguet , Gérald da Costa , Fabien Delaroche Microscopy and Microanalysis, 2019, 25, pp.367-377. ⟨10.1017/S1431927619000138⟩ Article dans une revue hal-02107329v1
	Unraveling the metastability of C n 2+ ( n = 2–4) Clusters Zirong Peng , David Zanuttini , Benoit Gervais , Emmanuelle Jacquet , Ivan Blum Journal of Physical Chemistry Letters, 2019, 10 (3), pp.581-588. ⟨10.1021/acs.jpclett.8b03449⟩ Article dans une revue hal-02107343v1
	An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography Zirong Peng , Yifeng Lu , Constantinos Hatzoglou , Alisson Kwiatkowski da Silva , François Vurpillot Microscopy and Microanalysis, 2019, 25, pp.389-400. ⟨10.1017/S1431927618016112⟩ Article dans une revue hal-02107351v1
	Enhanced dynamic reconstruction for atom probe tomography Constantinos Hatzoglou , Gérald da Costa , François Vurpillot Ultramicroscopy, 2019, 197, pp.72-82. ⟨10.1016/j.ultramic.2018.11.010⟩ Article dans une revue hal-02107358v1
	Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives J. Barnes , A. Grenier , I. Mouton , S. Barraud , G. Audoit Scripta Materialia, 2018, 148, pp.91 - 97. ⟨10.1016/j.scriptamat.2017.05.012⟩ Article dans une revue hal-01765929v1
	A chemical composition correction model for nanoclusters observed by APT - Application to ODS steel nanoparticles Constantinos Hatzoglou , Bertrand Radiguet , François Vurpillot , Philippe Pareige Journal of Nuclear Materials, 2018, 505, pp.240-248. ⟨10.1016/j.jnucmat.2018.03.057⟩ Article dans une revue hal-02061493v1
	Kron–Branin modelling of ultra-short pulsed signal microelectrode Zhifei Xu , Blaise Elysée Guy Ravelo , Yang Liu , Lu Zhao , Fabien Delaroche European Physical Journal: Applied Physics, 2018, 81 (2), pp.21001. ⟨10.1051/epjap/2018170383⟩ Article dans une revue hal-02611693v1
	Green electroluminescence from radial m -plane InGaN quantum wells grown on GaN wire sidewalls by metal–organic vapor phase epitaxy Akanksha Kapoor , Nan Guan , Martin Vallo , Agnès Messanvi , Lorenzo Mancini ACS photonics, 2018, 5 (11), pp.4330-4337. ⟨10.1021/acsphotonics.8b00520⟩ Article dans une revue hal-01986657v1
	Impact of local electrostatic field rearrangement on field ionization Shyam Katnagallu , Michal Dagan , Stefan Parviainen , Ali Nematollahi , Blazej Grabowski Journal of Physics D: Applied Physics, 2018, 51 (10), pp.105601. ⟨10.1088/1361-6463/aaaba6⟩ Article dans une revue hal-02107446v1
	Simulation tools for atom probe tomography: A path for diagnosis and treatment of image degradation François Vurpillot , Stefan Parviainen , Fluyra Djurabekova , David Zanuttini , Benoit Gervais Materials Characterization, 2018, 146, pp.336-346. ⟨10.1016/j.matchar.2018.04.024⟩ Article dans une revue hal-02061494v1
	Dissociation of GaN$^{2+}$ and AlN$^{2+}$ in APT: Electronic structure and stability in strong DC field David Zanuttini , François Vurpillot , J. Douady , E. Jacquet , P.-M. Anglade Journal of Chemical Physics, 2018, 149 (13), pp.134310. ⟨10.1063/1.5036933⟩ Article dans une revue hal-02061759v1
	Interpreting the Presence of an Additional Oxide Layer in Analysis of Metal Oxides–Metal Interfaces in Atom Probe Tomography Mukesh Bachhav , Gorakh Pawar , François Vurpillot , Raphaële Danoix , Frederic Danoix Journal of Physical Chemistry C, 2018, 123 (2), pp.1313-1319. ⟨10.1021/acs.jpcc.8b10895⟩ Article dans une revue hal-02106738v1
	On the detection of multiple events in atom probe tomography Zirong Peng , François Vurpillot , Pyuck-Pa Choi , Yujiao Li , Dierk Raabe Ultramicroscopy, 2018, 189, pp.54-60. ⟨10.1016/j.ultramic.2018.03.018⟩ Article dans une revue hal-02061736v1
	Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography Enrico Di Russo , F. Moyon , N. Gogneau , L. Largeau , E. Giraud Journal of Physical Chemistry C, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩ Article dans une revue hal-01928844v1
	Atomistic Simulations of Surface Effects Under High Electric Fields Stefan Parviainen , Michal Dagan , Shyam Katnagallu , Baptiste Gault , Michael Moody Microscopy and Microanalysis, 2017, 23 (S1), pp.644-645. ⟨10.1017/S1431927617003889⟩ Article dans une revue hal-02107478v1
	New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint Nicolas Rolland , François Vurpillot , Sébastien Duguay , Baishakhi Mazumder , James Speck Microscopy and Microanalysis, 2017, 23 (02), pp.247 - 254. ⟨10.1017/s1431927617000253⟩ Article dans une revue hal-01766098v1
	Reconstructing APT Datasets: Challenging the Limits of the Possible François Vurpillot , David Zanuttini , Stefan Parviainen , Baishaikhi Mazumder , Nicolas Rolland Microscopy and Microanalysis, 2017, 23 (S1), pp.640-641. ⟨10.1017/S1431927617003865⟩ Article dans une revue hal-02107482v1
	Simulation of field-induced molecular dissociation in atom-probe tomography: Identification of a neutral emission channel David Zanuttini , Ivan Blum , Lorenzo Rigutti , François Vurpillot , Julie Douady Physical Review A : Atomic, molecular, and optical physics [1990-2015], 2017, 95 (6), ⟨10.1103/PhysRevA.95.061401⟩ Article dans une revue hal-02107497v1
	True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy François Vurpillot , Frederic Danoix , Matthieu Gilbert , Sebastian Koelling , Michal Dagan Microscopy and Microanalysis, 2017, 23 (02), pp.210 - 220. ⟨10.1017/s1431927617000198⟩ Article dans une revue hal-01766137v1
	Atom probe tomography analysis of SiGe fins embedded in SiO$_2$ : Facts and artefacts D. Melkonyan , C. Fleischmann , L. Arnoldi , J. Demeulemeester , A. Kumar Ultramicroscopy, 2017, 179, pp.100 - 107. ⟨10.1016/j.ultramic.2017.04.006⟩ Article dans une revue hal-01765926v1
	Analysis of Radiation Damage in Light Water Reactors: Comparison of Cluster Analysis Methods for the Analysis of Atom Probe Data Jonathan Hyde , Gérald da Costa , Constantinos Hatzoglou , Hannah Weekes , Bertrand Radiguet Microscopy and Microanalysis, 2017, 23 (02), pp.366 - 375. ⟨10.1017/s1431927616012678⟩ Article dans une revue hal-01765920v1
	Electronic structure and stability of the SiO 2+ dications produced in tomographic atom probe experiments D. Zanuttini , Ivan Blum , Lorenzo Rigutti , François Vurpillot , Julie Douady Journal of Chemical Physics, 2017, 147 (16), pp.164301. ⟨10.1063/1.5001113⟩ Article dans une revue hal-03345835v1
	Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional Multimicroscopy Lorenzo Mancini , Florian Moyon , David Hernàndez-Maldonado , Ivan Blum , Jonathan Houard Nano Letters, 2017, 17 (7), pp.4261 - 4269. ⟨10.1021/acs.nanolett.7b01189⟩ Article dans une revue hal-01765951v1
	Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing Lu Zhao , Antoine Normand , Jonathan Houard , Ivan Blum , Fabien Delaroche Microscopy and Microanalysis, 2017, 23 (2), pp.221-226. ⟨10.1017/S1431927616012666⟩ Article dans une revue hal-02611781v1
	Recent Reconstruction Developments in IVAS Brian Geiser , François Vurpillot , Yimeng Chen , Katherine Rice , Stuart Wright Microscopy and Microanalysis, 2017, 23 (S1), pp.638-639. ⟨10.1017/S1431927617003853⟩ Article dans une revue hal-02107488v1
	Multi-excitonic emission from Stranski-Krastanov GaN/AlN quantum dots inside a nanoscale tip L. Mancini , F. Moyon , Jonathan Houard , Ivan Blum , Williams Lefebvre Applied Physics Letters, 2017, 111 (24), ⟨10.1063/1.5004417⟩ Article dans une revue hal-01766091v1
	Advanced Volume Reconstruction and Data Mining Methods in Atom Probe Tomography François Vurpillot , Williams Lefebvre , J.M. Cairney , C. Oberdorfer , B.P. Geiser MRS Bulletin, 2016, 41 (01), pp.46-52. ⟨10.1557/mrs.2015.312⟩ Article dans une revue hal-01954244v1
	RF Pulse Signal Integrity Analysis for Nonlinear Ended Microstrip Line Atom-Probe Tomography Lu Zhao , A. Delamare , Antoine Normand , Fabien Delaroche , O. Latry IOP Conference Series: Materials Science and Engineering, 2016, 120, pp.012006. ⟨10.1088/1757-899X/120/1/012006⟩ Article dans une revue hal-01954239v1
	Dissociation Dynamics of Molecular Ions in High Dc Electric Field Ivan Blum , Lorenzo Rigutti , François Vurpillot , Angela Vella , Aurore Gaillard Journal of Physical Chemistry A, 2016, 120 (20), pp.3654-3662. ⟨10.1021/acs.jpca.6b01791⟩ Article dans une revue hal-01954242v1
	Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers Lorenzo Rigutti , L. Mancini , Williams Lefebvre , Jonathan Houard , Daniel Hernandez Maldonado Semiconductor Science and Technology, 2016, 31 (9), pp.095009. ⟨10.1088/0268-1242/31/9/095009⟩ Article dans une revue hal-01928848v1
	Multi-Microscopy Study of the Influence of Stacking Faults and Three-Dimensional In Distribution on the Optical Properties of m-Plane InGaN Quantum Wells Grown on Microwire Sidewalls L. Mancini , Daniel Hernandez Maldonado , Williams Lefebvre , Jonathan Houard , Ivan Blum Applied Physics Letters, 2016, 108 (4), pp.042102. ⟨10.1063/1.4940748⟩ Article dans une revue hal-01954240v1
	Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N Lorenzo Rigutti , L. Mancini , Daniel Hernandez Maldonado , Williams Lefebvre , E. Giraud Journal of Applied Physics, 2016, 119 (10), pp.105704. ⟨10.1063/1.4943612⟩ Article dans une revue hal-01928851v1
	Dissociation of Molecular Ions During the DC Field Evaporation ZnO in Atom Probe Tomography Ivan Blum , David Zanuttini , Lorenzo Rigutti , François Vurpillot , Julie Douady Microscopy and Microanalysis, 2016, 22 (S3), pp.662-663. ⟨10.1017/S1431927616004165⟩ Article dans une revue hal-02107558v1
	Field Evaporation Behavior of Metal Oxide/Metal Interfaces Mukesh Bachhav , François Vurpillot , Frederic Danoix , Raphaële Danoix , Béatrice Hannoyer Microscopy and Microanalysis, 2016, 22 (S3), pp.678-679. ⟨10.1017/S1431927616004244⟩ Article dans une revue hal-02107553v1
	Nanoscale photoconductive switching effect applied to atom probe tomography Lu Zhao , Antoine Normand , Jonathan Houard , Ivan Blum , Fabien Delaroche American Journal of Physics, 2016, 116, pp.2. ⟨10.1209/0295-5075/116/27002⟩ Article dans une revue hal-01719197v1
	Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem Lorenzo Rigutti , L. Mancini , Enrico Di Russo , Ivan Blum , F. Moyon Microscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩ Article dans une revue hal-01954232v1
	Accuracy of analyses of microelectronics nanostructures in atom probe tomography François Vurpillot , Nicolas Rolland , Robert Estivill , Sébastien Duguay , D. Blavette Semiconductor Science and Technology, 2016, 31 (7), pp.074002. ⟨10.1088/0268-1242/31/7/074002⟩ Article dans une revue hal-01928850v1
	Ion energy spread in laser-assisted atom probe tomography Nicolas Sevelin-Radiguet , L. Arnoldi , François Vurpillot , Antoine Normand , Bernard Deconihout EPL - Europhysics Letters, 2015, 109 (3), pp.37009. ⟨10.1209/0295-5075/109/37009⟩ Article dans une revue hal-02109749v1
	Pulse shaping optimization for improving atom probe tomography Lu Zhao , Antoine Normand , Fabien Delaroche , B. Ravelo , François Vurpillot International Journal of Mass Spectrometry, 2015, 386, pp.47-53. ⟨10.1016/j.ijms.2015.06.012⟩ Article dans une revue hal-02177749v1
	Challenges in the study of Fe/MgO/Fe interfaces using 3D Atom Probe B. Mazumder , Viswas Purohit , M. Gruber , Angela Vella , François Vurpillot Thin Solid Films, 2015, 589, pp.38-46. ⟨10.1016/j.tsf.2015.04.079⟩ Article dans une revue hal-02107626v1
	HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy Williams Lefebvre , Daniel Hernandez Maldonado , F. Moyon , Fabien Cuvilly , Charly Vaudolon Ultramicroscopy, 2015, 159, pp.403-412. ⟨10.1016/j.ultramic.2015.02.011⟩ Article dans une revue hal-02107619v1
	Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atoms L. Arnoldi , Elena Silaeva , François Vurpillot , Bernard Deconihout , E. Cadel Ultramicroscopy, 2015, 159, pp.139--146. ⟨10.1016/j.ultramic.2014.11.018⟩ Article dans une revue hal-01929137v1
	An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials Nicolas Rolland , D. J. Larson , B. P. Geiser , Sébastien Duguay , François Vurpillot Ultramicroscopy, 2015, 159, pp.195--201. ⟨10.1016/j.ultramic.2015.03.010⟩ Article dans une revue hal-01928854v1
	Quantitative analysis of Si/SiGeC superlattices using atom probe tomography Robert Estivill , Adeline Grenier , Sébastien Duguay , François Vurpillot , Tanguy Terlier Ultramicroscopy, 2015, 159, pp.223-231. ⟨10.1016/j.ultramic.2015.03.014⟩ Article dans une revue hal-02107589v1
	Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques A. Grenier , Sébastien Duguay , J. P. Barnes , R. Serra , Nicolas Rolland Applied Physics Letters, 2015, 106 (21), pp.213102. ⟨10.1063/1.4921352⟩ Article dans une revue hal-01928856v1
	Nanoscale Microstructural and Chemical Analysis of SiO 2 -Zn 1− x Al x O Nanocomposites: Towards a Better Understanding of Si and Al Substitution in ZnO Matthieu Gilbert , Céline Byl , David Bérardan , Alexandre Gloter , Nita Dragoe Journal of the American Ceramic Society, 2015, 98 (12), pp.3948-3955. ⟨10.1111/jace.13848⟩ Article dans une revue hal-02107584v1
	Modeling Atom Probe Tomography: A review François Vurpillot , C. Oberdorfer Ultramicroscopy, 2015, 159, pp.202-216. ⟨10.1016/j.ultramic.2014.12.013⟩ Article dans une revue hal-02107615v1
	Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation Nicolas Rolland , François Vurpillot , Sébastien Duguay , Didier Blavette European Physical Journal: Applied Physics, 2015, 72 (2), pp.21001. ⟨10.1051/epjap/2015150233⟩ Article dans une revue hal-02107622v1
	A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography Nicolas Rolland , François Vurpillot , Sébastien Duguay , Didier Blavette Microscopy and Microanalysis, 2015, 21 (6), pp.1649-1656. ⟨10.1017/S1431927615015184⟩ Article dans une revue hal-02107013v1
	Quantitative investigation of SiGeC layers using atom probe tomography Robert Estivill , Adeline Grenier , Sébastien Duguay , François Vurpillot , Tanguy Terlier Ultramicroscopy, 2015, 150, pp.23--29. ⟨10.1016/j.ultramic.2014.11.020⟩ Article dans une revue hal-01928855v1
	Correlation of Microphotoluminescence Spectroscopy, Scanning Transmission Electron Microscopy, and Atom Probe Tomography on a Single Nano-object Containing an InGaN/GaN Multiquantum Well System Lorenzo Rigutti , Ivan Blum , Deodatta Shinde , David Hernandez-Maldonado , Williams Lefebvre Nano Letters, 2014, 14 (1), pp.107-114. ⟨10.1021/nl4034768⟩ Article dans une revue hal-01986734v1
	Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field Lorenzo Mancini , Nooshin Amirifar , Deodatta Shinde , Ivan Blum , Matthieu Gilbert Journal of Physical Chemistry C, 2014, 118 (41), pp.24136-24151. ⟨10.1021/jp5071264⟩ Article dans une revue hal-01163403v1
	3D analysis of advanced nano-devices using electron and atom probe tomography A. Grenier , Sébastien Duguay , J. P. Barnes , R. Serra , G. Haberfehlner Ultramicroscopy, 2014, 136, pp.185--192. ⟨10.1016/j.ultramic.2013.10.001⟩ Article dans une revue hal-01929139v1
	Numerical study of femtosecond laser assisted atom probe tomography E. Silaeva , Nikita Shcheblanov , Tatiana Itina , Angela Vella , Jonathan Houard Applied physics. A, Materials science & processing, 2013, 110 (3), pp.703-707. ⟨10.1007/s00339-012-7189-7⟩ Article dans une revue ujm-00866898v1
	Atom probe tomography spatial reconstruction: Status and directions D.J. Larson , B. Gault , B.P. Geiser , F. de Geuser , François Vurpillot Current Opinion in Solid State and Materials Science, 2013, 17 (5), pp.236-247. ⟨10.1016/j.cossms.2013.09.002⟩ Article dans une revue hal-00935033v1
	A model to predict image formation in Atom probeTomography François Vurpillot , A. Gaillard , Gérald da Costa , Bernard Deconihout Ultramicroscopy, 2013, 132, pp.152-157. ⟨10.1016/j.ultramic.2012.12.007⟩ Article dans une revue hal-02108150v1
	Coupling atom probe tomography and photoluminescence spectroscopy: Exploratory results and perspectives Lorenzo Rigutti , Angela Vella , François Vurpillot , Aurore Gaillard , Nicolas Sevelin-Radiguet Ultramicroscopy, 2013, 132, pp.75-80. ⟨10.1016/j.ultramic.2013.02.002⟩ Article dans une revue hal-02109344v1
	Nanometer scale tomographic investigation of fine scale precipitates in a CuFeNi granular system by three-dimensional field ion microscopy Sophie Cazottes , François Vurpillot , Abdeslem Fnidiki , Dany Lemarchand , Marcello Baricco Microscopy and Microanalysis, 2012, 18 (5), pp.1129--1134. ⟨10.1017/S1431927612000517⟩ Article dans une revue hal-01829269v1
	Atomic-scale imaging and analysis of single layer GP zones in a model steel Frédéric Danoix , T. Epicier , François Vurpillot , D. Blavette Journal of Materials Science, 2012, 47 (3), pp.1567-1571. ⟨10.1007/s10853-011-6008-4⟩ Article dans une revue hal-01834903v1
	Application of Delaunay tessellation for the characterization of solute-rich clusters in atom probe tomography W Lefebvre , Thomas Philippe , F. Vurpillot Ultramicroscopy, 2011, 111 (3), pp.200-206. ⟨10.1016/j.ultramic.2010.11.034⟩ Article dans une revue hal-03035627v1
	Three-dimensional thermal response of a metal subwavelength tip under femtosecond laser illumination Jonathan Houard , Angela Vella , François Vurpillot , Bernard Deconihout Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2011, 84 (3), ⟨10.1103/PhysRevB.84.033405⟩ Article dans une revue hal-02109350v1
	Pragmatic reconstruction methods in atom probe tomography François Vurpillot , M. Gruber , Gérald da Costa , I. Martin , L. Renaud Ultramicroscopy, 2011, 111 (8), pp.1286-1294. ⟨10.1016/j.ultramic.2011.04.001⟩ Article dans une revue hal-02108161v1
	Atom probe tomography: 3D imaging at the atomic level D. Blavette , François Vurpillot , Bernard Deconihout , A. Menand Advanced Structured Materials, 2011, 10, pp.201--222. ⟨10.1007/978-3-642-17782-8_9⟩ Article dans une revue hal-01928872v1
	Optical near-field absorption at a metal tip far from plasmonic resonance Jonathan Houard , Angela Vella , François Vurpillot , Bernard Deconihout Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2010, 81 (12), ⟨10.1103/PhysRevB.81.125411⟩ Article dans une revue hal-02109352v1
	Investigation at the atomic scale of the Co spatial distribution in Zn(Co)O magnetic semiconductor oxide Rodrigue Lardé , Etienne Talbot , François Vurpillot , Philippe Pareige , G. Schmerber Journal of Applied Physics, 2009, 105 (12), pp.126107. ⟨10.1063/1.3152579⟩ Article dans une revue hal-01633464v1
	Three-dimensional atomic-scale imaging of boron clusters in implanted silicon O. Cojocaru-Mirédin , Emmanuel Cadel , François Vurpillot , Dominique Mangelinck , D. Blavette Scripta Materialia, 2009, 60 (5), pp.285-288. ⟨10.1016/j.scriptamat.2008.10.008⟩ Article dans une revue hal-01953258v1
	Evidence of atomic-scale arsenic clustering in highly doped silicon Sébastien Duguay , François Vurpillot , Thomas Philippe , E. Cadel , Rodrigue Lardé Journal of Applied Physics, 2009, 106 (10), pp.106102. ⟨10.1063/1.3257178⟩ Article dans une revue hal-01929143v1
	Ultrafast emission of ions during laser ablation of metal for 3D atom probe Angela Vella , Jonathan Houard , François Vurpillot , Bernard Deconihout Applied Surface Science, 2009, 255 (10), pp.5154-5158. ⟨10.1016/j.apsusc.2008.08.109⟩ Article dans une revue hal-02109356v1
	Conditions to cancel the laser polarization dependence of a subwavelength tip Jonathan Houard , Angela Vella , François Vurpillot , Bernard Deconihout Applied Physics Letters, 2009, 94 (12), pp.121905. ⟨10.1063/1.3095829⟩ Article dans une revue hal-02109355v1
	Thermal response of a field emitter subjected to ultra-fast laser illumination François Vurpillot , Jonathan Houard , Angela Vella , Bernard Deconihout Journal of Physics D: Applied Physics, 2009, 42 (12), pp.125502. ⟨10.1088/0022-3727/42/12/125502⟩ Article dans une revue hal-02109353v1
	Depth resolution function of the laser assisted tomographic atom probe in the investigation of semiconductors Emmanuel Cadel , François Vurpillot , Rodrigue Lardé , Sébastien Duguay , Bernard Deconihout Journal of Applied Physics, 2009, 106 (4), pp.044908. ⟨10.1063/1.3186617⟩ Article dans une revue hal-01929144v1
	Laser-assisted atom probe tomography and nanosciences Didier Blavette , Talaat Al Kassab , Emmanuel Cadel , Alexander Mackel , François Vurpillot International Journal of Materials Research, 2008, 99 (5), pp.454--460. ⟨10.3139/146.101672⟩ Article dans une revue hal-01929148v1
	3D atom probe assisted by femtosecond laser pulses Bernard Deconihout , Angela Vella , François Vurpillot , Gérald da Costa , A. Bostel Applied physics. A, Materials science & processing, 2008, 93 (4), pp.995-1003. ⟨10.1007/s00339-008-4774-x⟩ Article dans une revue hal-02108177v1
	Nanostructure and properties of a Cu-Cr composite processed by severe plastic deformation. Xavier Sauvage , Peter Jessner , François Vurpillot , Reinhard Pippan Scripta Materialia, 2008, 58, pp.1125. ⟨10.1016/j.scriptamat.2008.02.010⟩ Article dans une revue hal-00276105v1
	An improved reconstruction procedure for the correction of local magnification effects in three-dimensional atom-probe F. de Geuser , Williams Lefebvre , Frédéric Danoix , François Vurpillot , B. Forbord Surface and Interface Analysis, 2007, 39 (2-3), pp.268--272. ⟨10.1002/sia.2489⟩ Article dans une revue hal-00408094v1
	Structural investigation of TbCo2/Fe magnetostrictive thin films by tomographic atom probe and Mössbauer spectrometry A. Grenier , R. Lardé , E. Cadel , J.M. Le Breton , J. Juraszek Journal of Magnetism and Magnetic Materials, 2007, 310, pp.2215-2216. ⟨10.1016/j.jmmm.2006.10.1102⟩ Article dans une revue hal-00285631v1
	Correlated field evaporation as seen by atom probe tomography F. de Geuser , B. Gault , A. Bostel , François Vurpillot Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2007, 601 (2), pp.536 - 543. ⟨10.1016/j.susc.2006.10.019⟩ Article dans une revue hal-00408087v1
	Atomic scale study of TbCo2.5/Fe multilayers by laser-assisted tomographic atom probe A. Grenier , R. Larde , E. Cadel , F. Vurpillot , J. Juraszek Journal of Applied Physics, 2007, 102, pp.033912-1-4. ⟨10.1063/1.2761825⟩ Article dans une revue hal-00255798v1
	Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitter B. Gault , A. Vella , François Vurpillot , A. Menand , D. Blavette Ultramicroscopy, 2007, 107 (9), pp.713--719. ⟨10.1016/j.ultramic.2007.02.004⟩ Article dans une revue hal-01928886v1
	The New Laser assisted Wide Angle Tomographic Atom Probe L Renaud , P Monsallut , P. Benard , P Saliot , Gérald da Costa Microscopy and Microanalysis, 2006, 12 (S02), pp.1726-1727. ⟨10.1017/S1431927606063410⟩ Article dans une revue hal-02108563v1
	Design of a femtosecond laser assisted tomographic atom probe B. Gault , François Vurpillot , A. Vella , M. Gilbert , A. Menand Review of Scientific Instruments, 2006, 77 (4), ⟨10.1063/1.2194089⟩ Article dans une revue hal-01928897v1
	Design of a delay-line position-sensitive detector with improved performance Gérald da Costa , François Vurpillot , A. Bostel , M. Bouet , Bernard Deconihout Review of Scientific Instruments, 2005, 76 (1), pp.013304. ⟨10.1063/1.1829975⟩ Article dans une revue hal-02108204v1
	Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probe François Vurpillot , F. de Geuser , Gérald da Costa , D. Blavette Journal of Microscopy, 2004, 216 (3), pp.234--240. ⟨10.1111/j.0022-2720.2004.01413.x⟩ Article dans une revue hal-01928905v1
	A new step towards the lattice reconstruction in 3DAP François Vurpillot , Ludovic Renaud , D. Blavette Ultramicroscopy, 2003, 95, pp.223--229. ⟨10.1016/S0304-3991(02)00320-0⟩ Article dans une revue hal-01928911v1
	Structural analyses in three-dimensional atom probe: A Fourier transform approach François Vurpillot , Gérald da Costa , A. Menand , D. Blavette Journal of Microscopy, 2001, 203 (3), pp.295--302. ⟨10.1046/j.1365-2818.2001.00923.x⟩ Article dans une revue hal-01928923v1
	A new approach to the interpretation of atom probe field-ion microscopy images François Vurpillot , A. Bostel , D. Blavette Ultramicroscopy, 2001, 89 (1-3), pp.137--144. ⟨10.1016/S0304-3991(01)00097-3⟩ Article dans une revue hal-01928921v1
	A model accounting for spatial overlaps in 3D atom-probe microscopy D. Blavette , François Vurpillot , Philippe Pareige , A. Menand Ultramicroscopy, 2001, 89 (1-3), pp.145--153. ⟨10.1016/S0304-3991(01)00120-6⟩ Article dans une revue hal-01928919v1
	Trajectory overlaps and local magnification in three-dimensional atom probe François Vurpillot , A. Bostel , D. Blavette Applied Physics Letters, 2000, 76 (21), pp.3127--3129. ⟨10.1063/1.126545⟩ Article dans une revue hal-01928929v1
	The spatial resolution of 3D atom probe in the investigation of single-phase materials François Vurpillot , A. Bostel , E. Cadel , D. Blavette Ultramicroscopy, 2000, 84 (3-4), pp.213--224. ⟨10.1016/S0304-3991(00)00035-8⟩ Article dans une revue hal-01928928v1
	Trajectories of field emitted ions in 3D atom-probe François Vurpillot , A. Bostel , A. Menand , D. Blavette European Physical Journal: Applied Physics, 1999, 6 (2), pp.217--221. ⟨10.1051/epjap:1999173⟩ Article dans une revue hal-01928938v1
	The shape of field emitters and the ion trajectories in three- dimensional atom probes François Vurpillot , A. Bostel , D. Blavette Journal of Microscopy, 1999, 196 (3), pp.332--336. ⟨10.1046/j.1365-2818.1999.00637.x⟩ Article dans une revue hal-01928937v1

	Characterization of a High Voltage and High Frequency pulse generator configuration for Atom Probe Loïc Rousseau , Antoine Normand , Tehrani Kambiz , François Vurpillot 2020 IEEE 15th International Conference of System of Systems Engineering (SoSE), Jun 2020, Budapest, France. pp.193-198, ⟨10.1109/SoSE50414.2020.9130486⟩ Communication dans un congrès hal-02889710v1
	Design of A Multistage Marx Generator topology based on SiC-MOSFET Device for Atomic Probe Tomography Applications Kambiz Tehrani , Yunbi Liu , Loic Rousseau , Antoine Normand , François Vurpillot 2020 IEEE 15th International Conference of System of Systems Engineering (SoSE), Jun 2020, Budapest, Hungary. pp.000423-000428, ⟨10.1109/SoSE50414.2020.9130521⟩ Communication dans un congrès hal-02964346v1
	Design of A Multistage Marx Generator topology based on SiC-MOSFET Device for Atomic Probe Tomography Applications Kambiz Tehrani , Yunbi Liu , Loïc Rousseau , Antoine Normand , François Vurpillot 2020 IEEE 15th International Conference of System of Systems Engineering (SoSE), Jun 2020, Budapest, France. pp.000423-000428, ⟨10.1109/SoSE50414.2020.9130521⟩ Communication dans un congrès hal-02889711v1
	Analysis of transient electric-field emitted by atom-probe tomography electrode Z. Xu , Y. Liu , B. Ravelo , O. Maurice , L. Zhao 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. ⟨10.1109/emceurope.2017.8094618⟩ Communication dans un congrès hal-01765924v1
	Revisiting Field Ion Microscopy B. Gault , M. Dagan , S. Katnagallu , F. de Geuser , F. Vurpillot TMS conference, 2017, San Diego, United States Communication dans un congrès hal-01838871v1
	Correlative Investigations by HAADF-STEM and Atom Probe Tomography Williams Lefebvre , Florian Moyon , Antoine Normand , Nicolas Rolland , Ivan Blum European Microscopy Congress, Aug 2016, Lyon, France. pp.775-776, ⟨10.1002/9783527808465.EMC2016.8364⟩ Communication dans un congrès hal-01954243v1
	RF transient pulse signal integrity with ns-duration for atom-probe tomography Lu Zhao , A. Delamare , Antoine Normand , Fabien Delaroche , O. Latry 2015 IEEE Radio and Antenna Days of the Indian Ocean (RADIO), Sep 2015, Belle Mare, France. pp.1-2, ⟨10.1109/RADIO.2015.7323403⟩ Communication dans un congrès hal-02107624v1
	Asymmetrical PCB Interconnect Tree Modelling with Coupling Effect B. Ravelo , F. Vurpillot , A K Jastrzebski EMC Europe 2014, Sep 2014, Gothenburg, Sweden Communication dans un congrès hal-02485771v1
	Atom probe tomography: An imaging tool at the atomic scale using ltrafast laser pulses Bernard Deconihout , F. Vurpillot , Gérald da Costa , Jonathan Houard , Philippe Pareige CLEO: Applications and Technology, CLEO_AT 2013, 2013, Unknown, Unknown Region Communication dans un congrès hal-01928864v1
	Numerical study of femtosecond laser-assisted atom probe tomography Elena Silaeva , N. Shcheblanov , Tatiana Itina , Angela Vella , N. Sévelin-Radiguet 11th International Conference on Laser Ablation, Nov 2011, Playa del Carmen, Mexico. pp.133 Communication dans un congrès ujm-00710834v1
	Methods for the study of clustering and precipitation in Al-based alloys by APT Williams Lefebvre , F. Vurpillot , M. Torsaeter , F. de Geuser International Conference on Aluminium Alloys (ICAA 12), 2010, Yokohama, Japan Communication dans un congrès hal-01838921v1
	Modeling artifacts in the analysis of test semiconductor structures in atom probe tomography F. Vurpillot , M. Gruber , S. Duguay , E. Cadel , Bernard Deconihout AIP Conference Proceedings, 2009, Unknown, Unknown Region. pp.175--180, ⟨10.1063/1.3251216⟩ Communication dans un congrès hal-01929146v1
	Toward a laser assisted wide-angle tomographic atom-probe Bernard Deconihout , F. Vurpillot , B. Gault , Gérald da Costa , M. Bouet Surface and Interface Analysis, 2007, Unknown, Unknown Region. pp.278--282, ⟨10.1002/sia.2491⟩ Communication dans un congrès hal-01928893v1
	Analyse d'une multicouche magnétostrictive TbCo2/Fe par sonde atomique tomographique assistée par laser A. Grenier , E. Cadel , F. Vurpillot , R. Larde , Nicolas Tiercelin 10èmes Journées de la Matière Condensée, JMC10, 2006, Toulouse, France Communication dans un congrès hal-00241168v1
	Investigation of TbCo2Fe magnetostrictive multilayers by laser assisted tomographic atom probe (LATAP) A. Grenier , E. Cadel , F. Vurpillot , R. Iarde , Nicolas Tiercelin 2006, pp.187 Communication dans un congrès hal-00152962v1
	Atom probe tomography study of homogeneous and heterogeneous precipitation of niobium carbides in a model ferritic steel Frédéric Danoix , E. Bémont , Philippe Maugis , F. Vurpillot , D. Blavette IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, 2006, Unknown, Unknown Region. pp.91, ⟨10.1109/IVNC.2006.335372⟩ Communication dans un congrès hal-01928902v1
	Laser atom probe tomography: Some applications D. Blavette , E. Cadel , Dominique Mangelinck , K. Hoummada , Rodrigue Lardé IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, 2006, Unknown, Unknown Region. pp.61--62, ⟨10.1109/IVNC.2006.335352⟩ Communication dans un congrès hal-01928901v1
	The tomographic atom probe: Salient results and recent breakthroughs A. Menand , Bernard Deconihout , P. Pareige , F. Vurpillot , D. Blavette Microscopy and Microanalysis, 2005, Unknown, Unknown Region. pp.96--97, ⟨10.1017/S1431927605501545⟩ Communication dans un congrès hal-01928903v1
	Local magnification in 3DAP Didier Blavette , François Vurpillot , Frederic de Geuser , Emilie Bémont 49th International Field Emission Symposium (IFES), 2004, Graz, Austria Communication dans un congrès hal-01838941v1
	Modeling image distortions in 3DAP F. Vurpillot , A. Cerezo , D. Blavette , D. J. Larson Microscopy and Microanalysis, 2004, Unknown, Unknown Region. pp.384--390, ⟨10.1017/S1431927604040486⟩ Communication dans un congrès hal-01928907v1
	An improved reconstruction procedure for the correction of local magnification effects in 3D Atom Probe Frederic de Geuser , W. Lefebvre , Frédéric Danoix , F. Vurpillot , B. Forbord 49th International Field Emission Symposium (IFES), 2004, Graz, Austria Communication dans un congrès hal-01838942v1
	3D atom probe: Chemical analysis with (near) atomic resolution Frédéric Danoix , F. Vurpillot , Williams Lefebvre , D. Blavette Microscopy and Microanalysis, 2003, Unknown, Unknown Region. pp.568--569 Communication dans un congrès hal-01928912v1

	Why do We Need a High Performance Position Sensitive Detector in Atom Probe Tomography? F. Vurpillot , Gérald da Costa , F. de Geuser , B. Gault , Bernard Deconihout 50th International Field Emission Symposium (IFES), 2006, Guilin, China. 2006 Poster de conférence hal-01838932v1
	Composition measurements in 3DAP: a Bayesian approach François Vurpillot , Alain Bostel , Frederic de Geuser , Bernard Deconihout 49th International Field Emission Symposium (IFES), 2004, Graz, Austria. 2004 Poster de conférence hal-01838939v1

	Time-of-Flight Mass Spectrometry and Composition Measurements Cristelle Pareige , W. Lefebvre-Ulrikson , F. Vurpillot , Xavier Sauvage Atom Probe Tomography, Elsevier, pp.123-154, 2016, 978-0-12-804647-0. ⟨10.1016/B978-0-12-804647-0.00005-X⟩ Chapitre d'ouvrage hal-01954224v1
	Field Ion Emission Mechanisms F. Vurpillot Atom Probe Tomography Put Theory Into Practice, Elsevier, pp.17-72, 2016, ⟨10.1016/B978-0-12-804647-0.00002-4⟩ Chapitre d'ouvrage hal-02107609v1
	Basics of Field Ion Microscopy Frédéric Danoix , F. Vurpillot Atom Probe Tomography, Elsevier, pp.73-95, 2016, 978-0-12-804647-0. ⟨10.1016/B978-0-12-804647-0.00003-6⟩ Chapitre d'ouvrage hal-01954245v1
	Chapter Seven - Three-Dimensional Reconstruction in Atom Probe Tomography: Basics and Advanced Approaches F. Vurpillot Atom Probe Tomography Put Theory into practice, Elsevier, pp.183-249, 2016, ⟨10.1016/B978-0-12-804647-0.00007-3⟩ Chapitre d'ouvrage hal-02107614v1

	Crystallographic dependence of Field Evaporation Energy Barrier in metals using Field Evaporation Energy Loss Spectroscopy mapping François Vurpillot , Constantinos Hatzoglou , Benjamin Klaes , Loic Rousseau , Jean-Baptiste Maillet 2024 Pré-publication, Document de travail hal-04530255v1
	Reflections on the spatial performance of atom probe tomography in the analysis of atomic neighbourhoods Baptiste Gault , Benjamin Klaes , Felipe F. Morgado , Christoph Freysoldt , Yue Li 2021 Pré-publication, Document de travail hal-03474777v1
	Numeric modeling of synchronous laser pulsing and voltage pulsing field evaporation Lu Zhao , Antoine Normand , Jonathan Houard , Ivan Blum , Fabien Delaroche 2019 Pré-publication, Document de travail hal-02127790v1

François Vurpillot

Publications

Correlating laser energy with compositional and atomic-level information of oxides in atom probe tomography

Combining Structure, Chemistry and Properties at the Nanoscale with Correlative Tomography Approaches

Atom probe tomography of hyper-doped Ge layers synthesized by Sb in-diffusion by pulsed laser melting

Introducing a Dynamic Reconstruction Methodology for Multilayered Structures in Atom Probe Tomography

Beyond Atom Mapping in Atom Probe Tomography Using Field Evaporation Energy Loss Spectroscopy

A Quantitative Investigation of Functionalized Glazing Stacks by Atom Probe Tomography

Mesoscopic modeling of field evaporation on atom probe tomography

Alloy distribution and compositional metrology of epitaxial ScAlN by atom probe tomography

Synthesis of relaxed Ge0.9Sn0.1/Ge by nanosecond pulsed laser melting

Introducing field evaporation energy loss spectroscopy

Surface Dynamics of Field Evaporation in Silicon Carbide

Improving Spatial and Elemental Associations in Analytical Field Ion Microscopy

Development of an Energy-Sensitive Detector for the Atom Probe Tomography

Mysterious Field Evaporation Behavior of Hydrogen in Aluminium Based Material Analyzed with Atom Probe Tomography

Influence of field conditions on quantitative analysis of single crystal thorium dioxide by atom probe tomography

Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi

Surface Microscopy of Atomic and Molecular Hydrogen from Field-Evaporating Semiconductors

Revealing atomic-scale vacancy-solute interaction in nickel

In Situ Spectroscopic Study of the Optomechanical Properties of Evaporating Field Ion Emitters

A Tomographic Atom Probe laser assisted by a flexible optical system

Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods

Development of Wide Field of View Three-Dimensional Field Ion Microscopy and High-Fidelity Reconstruction Algorithms to the Study of Defects in Nuclear Materials

Preferential evaporation in atom probe tomography: an analytical approach

Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations

A model to predict image formation in the three-dimensional field ion microscope

Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements

Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography

Dynamic Effects in Voltage Pulsed Atom Probe

A Photonic Atom Probe coupling 3D Atomic Scale Analysis with in situ Photoluminescence Spectroscopy

Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom Probe

Characterization of Pd and Pd@Au core-shell nanoparticles using atom probe tomography and field evaporation simulation

Imaging individual solute atoms at crystalline imperfections in metals

La sonde atomique tomographique

Spatial and Compositional Biases Introduced by Position Sensitive Detection Systems in APT: A Simulation Approach

Enhancing Element Identification by Expectation–Maximization Method in Atom Probe Tomography

Unraveling the metastability of C n 2+ ( n = 2–4) Clusters

An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography

Enhanced dynamic reconstruction for atom probe tomography

Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives

A chemical composition correction model for nanoclusters observed by APT - Application to ODS steel nanoparticles

Kron–Branin modelling of ultra-short pulsed signal microelectrode

Green electroluminescence from radial m -plane InGaN quantum wells grown on GaN wire sidewalls by metal–organic vapor phase epitaxy

Impact of local electrostatic field rearrangement on field ionization

Simulation tools for atom probe tomography: A path for diagnosis and treatment of image degradation

Dissociation of GaN$^{2+}$ and AlN$^{2+}$ in APT: Electronic structure and stability in strong DC field

Interpreting the Presence of an Additional Oxide Layer in Analysis of Metal Oxides–Metal Interfaces in Atom Probe Tomography

On the detection of multiple events in atom probe tomography

Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

Atomistic Simulations of Surface Effects Under High Electric Fields

New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint

Reconstructing APT Datasets: Challenging the Limits of the Possible

Simulation of field-induced molecular dissociation in atom-probe tomography: Identification of a neutral emission channel

True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy

Atom probe tomography analysis of SiGe fins embedded in SiO$_2$ : Facts and artefacts

Analysis of Radiation Damage in Light Water Reactors: Comparison of Cluster Analysis Methods for the Analysis of Atom Probe Data

Electronic structure and stability of the SiO 2+ dications produced in tomographic atom probe experiments

Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional Multimicroscopy

Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing

Recent Reconstruction Developments in IVAS

Multi-excitonic emission from Stranski-Krastanov GaN/AlN quantum dots inside a nanoscale tip

Advanced Volume Reconstruction and Data Mining Methods in Atom Probe Tomography

RF Pulse Signal Integrity Analysis for Nonlinear Ended Microstrip Line Atom-Probe Tomography

Dissociation Dynamics of Molecular Ions in High Dc Electric Field

Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers

Multi-Microscopy Study of the Influence of Stacking Faults and Three-Dimensional In Distribution on the Optical Properties of m-Plane InGaN Quantum Wells Grown on Microwire Sidewalls

Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N

Dissociation of Molecular Ions During the DC Field Evaporation ZnO in Atom Probe Tomography

Field Evaporation Behavior of Metal Oxide/Metal Interfaces

Nanoscale photoconductive switching effect applied to atom probe tomography

Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem

Accuracy of analyses of microelectronics nanostructures in atom probe tomography

Ion energy spread in laser-assisted atom probe tomography

Pulse shaping optimization for improving atom probe tomography

Challenges in the study of Fe/MgO/Fe interfaces using 3D Atom Probe

HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy

Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atoms

An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials

Quantitative analysis of Si/SiGeC superlattices using atom probe tomography