Number of documents

116

cv


Journal articles91 documents

  • Zirong Peng, Yifeng Lu, Constantinos Hatzoglou, Alisson Kwiatkowski da Silva, François Vurpillot, et al.. An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography. Microscopy and Microanalysis, Cambridge University Press (CUP), In press, pp.1-12. ⟨10.1017/S1431927618016112⟩. ⟨hal-02107351⟩
  • François Vurpillot, Constantinos Hatzoglou, Bertrand Radiguet, Gérald da Costa, Fabien Delaroche, et al.. Enhancing Element Identification by Expectation–Maximization Method in Atom Probe Tomography. Microscopy and Microanalysis, Cambridge University Press (CUP), In press, pp.1-11. ⟨10.1017/S1431927619000138⟩. ⟨hal-02107329⟩
  • C. Bacchi, G. da Costa, F. Vurpillot. Spatial and Compositional Biases Introduced by Position Sensitive Detection Systems in APT: A Simulation Approach. Microscopy and Microanalysis, Cambridge University Press (CUP), In press, pp.1-7. ⟨10.1017/S143192761801629X⟩. ⟨hal-02107336⟩
  • Zirong Peng, David Zanuttini, Benoit Gervais, Emmanuelle Jacquet, Ivan Blum, et al.. Unraveling the metastability of C n 2+ ( n = 2–4) Clusters. Journal of Physical Chemistry Letters, American Chemical Society, 2019, 10 (3), pp.581-588. ⟨10.1021/acs.jpclett.8b03449⟩. ⟨hal-02107343⟩
  • Constantinos Hatzoglou, Gérald da Costa, François Vurpillot. Enhanced dynamic reconstruction for atom probe tomography. Ultramicroscopy, Elsevier, 2019, 197, pp.72-82. ⟨10.1016/j.ultramic.2018.11.010⟩. ⟨hal-02107358⟩
  • François Vurpillot, Stefan Parviainen, Fluyra Djurabekova, David Zanuttini, Benoit Gervais. Simulation tools for atom probe tomography: A path for diagnosis and treatment of image degradation. Materials Characterization, Elsevier, 2018, 146, pp.336-346. ⟨10.1016/j.matchar.2018.04.024⟩. ⟨hal-02061494⟩
  • Zhifei Xu, Blaise Ravelo, Yang Liu, Lu Zhao, Fabien Delaroche, et al.. Kron–Branin modelling of ultra-short pulsed signal microelectrode. European Physical Journal: Applied Physics, EDP Sciences, 2018, 81 (2), pp.21001. ⟨10.1051/epjap/2018170383⟩. ⟨hal-02061749⟩
  • Shyam Katnagallu, Michal Dagan, Stefan Parviainen, Ali Nematollahi, Blazej Grabowski, et al.. Impact of local electrostatic field rearrangement on field ionization. Journal of Physics D: Applied Physics, IOP Publishing, 2018, 51 (10), pp.105601. ⟨10.1088/1361-6463/aaaba6⟩. ⟨hal-02107446⟩
  • Akanksha Kapoor, Nan Guan, Martin Vallo, Nan Messanvi, Nan Mancini, et al.. Green Electroluminescence from Radial m -Plane InGaN Quantum Wells Grown on GaN Wire Sidewalls by Metal–Organic Vapor Phase Epitaxy. ACS photonics, American Chemical Society,, 2018, 5 (11), pp.4330-4337. ⟨10.1021/acsphotonics.8b00520⟩. ⟨hal-01986657⟩
  • E. Di Russo, F. Moyon, N. Gogneau, L. Largeau, E. Giraud, et al.. Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography. Journal of Physical Chemistry C, American Chemical Society, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩. ⟨hal-01928844⟩
  • Mukesh Bachhav, Gorakh Pawar, François Vurpillot, Raphaële Danoix, Béatrice Hannoyer, et al.. Interpreting the Presence of an Additional Oxide Layer in Analysis of Metal Oxides–Metal Interfaces in Atom Probe Tomography. Journal of Physical Chemistry C, American Chemical Society, 2018, 123 (2), pp.1313-1319. ⟨10.1021/acs.jpcc.8b10895⟩. ⟨hal-02106738⟩
  • Constantinos Hatzoglou, Bertrand Radiguet, François Vurpillot, Philippe Pareige. A chemical composition correction model for nanoclusters observed by APT - Application to ODS steel nanoparticles. Journal of Nuclear Materials, Elsevier, 2018, 505, pp.240-248. ⟨10.1016/j.jnucmat.2018.03.057⟩. ⟨hal-02061493⟩
  • D. Zanuttini, I. Blum, E. Di Russo, L. Rigutti, F. Vurpillot, et al.. Dissociation of GaN 2+ and AlN 2+ in APT: Analysis of experimental measurements. Journal of Chemical Physics, American Institute of Physics, 2018, 149 (13), pp.134311. ⟨10.1063/1.5037010⟩. ⟨hal-02061762⟩
  • D. Zanuttini, F. Vurpillot, J. Douady, E. Jacquet, P.-M. Anglade, et al.. Dissociation of GaN$^{2+}$ and AlN$^{2+}$ in APT: Electronic structure and stability in strong DC field. Journal of Chemical Physics, American Institute of Physics, 2018, 149 (13), pp.134310. ⟨10.1063/1.5036933⟩. ⟨hal-02061759⟩
  • J. Barnes, A. Grenier, I. Mouton, S. Barraud, G. Audoit, et al.. Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives. Scripta Materialia, Elsevier, 2018, 148, pp.91 - 97. ⟨10.1016/j.scriptamat.2017.05.012⟩. ⟨hal-01765929⟩
  • Zirong Peng, François Vurpillot, Pyuck-Pa Choi, Yujiao Li, Dierk Raabe, et al.. On the detection of multiple events in atom probe tomography. Ultramicroscopy, Elsevier, 2018, 189, pp.54-60. ⟨10.1016/j.ultramic.2018.03.018⟩. ⟨hal-02061736⟩
  • Brian Geiser, François Vurpillot, Yimeng Chen, Katherine Rice, Stuart Wright, et al.. Recent Reconstruction Developments in IVAS. Microscopy and Microanalysis, Cambridge University Press (CUP), 2017, 23 (S1), pp.638-639. ⟨10.1017/S1431927617003853⟩. ⟨hal-02107488⟩
  • Lu Zhao, Antoine Normand, Jonathan Houard, Ivan Blum, Fabien Delaroche, et al.. Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing. Microscopy and Microanalysis, Cambridge University Press (CUP), 2017, 23 (2), pp.221-226. ⟨10.1017/S1431927616012666⟩. ⟨hal-02107518⟩
  • Lorenzo Mancini, Florian Moyon, David Hernàndez-Maldonado, Ivan Blum, Jonathan Houard, et al.. Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional Multimicroscopy. Nano Letters, American Chemical Society, 2017, 17 (7), pp.4261 - 4269. ⟨10.1021/acs.nanolett.7b01189⟩. ⟨hal-01765951⟩
  • François Vurpillot, Frederic Danoix, Matthieu Gilbert, Sebastian Koelling, Michal Dagan, et al.. True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy. Microscopy and Microanalysis, Cambridge University Press (CUP), 2017, 23 (02), pp.210 - 220. ⟨10.1017/s1431927617000198⟩. ⟨hal-01766137⟩
  • Stefan Parviainen, Michal Dagan, Shyam Katnagallu, Baptiste Gault, Michael Moody, et al.. Atomistic Simulations of Surface Effects Under High Electric Fields. Microscopy and Microanalysis, Cambridge University Press (CUP), 2017, 23 (S1), pp.644-645. ⟨10.1017/S1431927617003889⟩. ⟨hal-02107478⟩
  • Nicolas Rolland, François Vurpillot, Sébastien Duguay, Baishakhi Mazumder, James Speck, et al.. New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint. Microscopy and Microanalysis, Cambridge University Press (CUP), 2017, 23 (02), pp.247 - 254. ⟨10.1017/s1431927617000253⟩. ⟨hal-01766098⟩
  • François Vurpillot, David Zanuttini, Stefan Parviainen, Baishaikhi Mazumder, Nicolas Rolland, et al.. Reconstructing APT Datasets: Challenging the Limits of the Possible. Microscopy and Microanalysis, Cambridge University Press (CUP), 2017, 23 (S1), pp.640-641. ⟨10.1017/S1431927617003865⟩. ⟨hal-02107482⟩
  • Jonathan Hyde, Gérald da Costa, Constantinos Hatzoglou, Hannah Weekes, Bertrand Radiguet, et al.. Analysis of Radiation Damage in Light Water Reactors: Comparison of Cluster Analysis Methods for the Analysis of Atom Probe Data. Microscopy and Microanalysis, Cambridge University Press (CUP), 2017, 23 (02), pp.366 - 375. ⟨10.1017/s1431927616012678⟩. ⟨hal-01765920⟩
  • David Zanuttini, Ivan Blum, Lorenzo Rigutti, François Vurpillot, Julie Douady, et al.. Simulation of field-induced molecular dissociation in atom-probe tomography: Identification of a neutral emission channel. Physical Review A, American Physical Society, 2017, 95 (6), ⟨10.1103/PhysRevA.95.061401⟩. ⟨hal-02107497⟩
  • D. Zanuttini, I. Blum, L. Rigutti, F. Vurpillot, J. Douady, et al.. Electronic structure and stability of the SiO 2+ dications produced in tomographic atom probe experiments. Journal of Chemical Physics, American Institute of Physics, 2017, 147 (16), pp.164301. ⟨10.1063/1.5001113⟩. ⟨hal-02107463⟩
  • L. Mancini, F. Moyon, J. Houard, I. Blum, W. Lefebvre, et al.. Multi-excitonic emission from Stranski-Krastanov GaN/AlN quantum dots inside a nanoscale tip. Applied Physics Letters, American Institute of Physics, 2017, 111 (24), ⟨10.1063/1.5004417⟩. ⟨hal-01766091⟩
  • D. Melkonyan, C. Fleischmann, L. Arnoldi, J. Demeulemeester, A. Kumar, et al.. Atom probe tomography analysis of SiGe fins embedded in SiO$_2$ : Facts and artefacts. Ultramicroscopy, Elsevier, 2017, 179, pp.100 - 107. ⟨10.1016/j.ultramic.2017.04.006⟩. ⟨hal-01765926⟩
  • F. Vurpillot, N. Rolland, R. Estivill, S. Duguay, D. Blavette. Accuracy of analyses of microelectronics nanostructures in atom probe tomography. Semiconductor Science and Technology, 2016, 31 (7), ⟨10.1088/0268-1242/31/7/074002⟩. ⟨hal-01928850⟩
  • L. Rigutti, L. Mancini, W. Lefebvre, J. Houard, D. Hernàndez-Maldonado, et al.. Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers. Semiconductor Science and Technology, 2016, 31 (9), ⟨10.1088/0268-1242/31/9/095009⟩. ⟨hal-01928848⟩
  • Ivan Blum, David Zanuttini, Lorenzo Rigutti, François Vurpillot, Julie Douady, et al.. Dissociation of Molecular Ions During the DC Field Evaporation ZnO in Atom Probe Tomography. Microscopy and Microanalysis, Cambridge University Press (CUP), 2016, 22 (S3), pp.662-663. ⟨10.1017/S1431927616004165⟩. ⟨hal-02107558⟩
  • Mukesh Bachhav, François Vurpillot, Frederic Danoix, Raphaële Danoix, Béatrice Hannoyer, et al.. Field Evaporation Behavior of Metal Oxide/Metal Interfaces. Microscopy and Microanalysis, Cambridge University Press (CUP), 2016, 22 (S3), pp.678-679. ⟨10.1017/S1431927616004244⟩. ⟨hal-02107553⟩
  • F. Vurpillot, W. Lefebvre, J.M. Cairney, C. Oberdorfer, B.P. Geiser, et al.. Advanced Volume Reconstruction and Data Mining Methods in Atom Probe Tomography. MRS Bulletin, 2016, 41 (01), pp.46-52. ⟨10.1557/mrs.2015.312⟩. ⟨hal-01954244⟩
  • L. Zhao, Antoine Normand, Jonathan Houard, Ivan Blum, Fabien Delaroche, et al.. Nanoscale photoconductive switching effect applied to atom probe tomography. American Journal of Physics, American Association of Physics Teachers, 2016, 116, pp.2. ⟨10.1209/0295-5075/116/27002⟩. ⟨hal-01719197⟩
  • L. Zhao, A. Delamare, Antoine Normand, F. Delaroche, O. Latry, et al.. RF Pulse Signal Integrity Analysis for Nonlinear Ended Microstrip Line Atom-Probe Tomography. IOP Conference Series: Materials Science and Engineering, 2016, 120, pp.012006. ⟨10.1088/1757-899X/120/1/012006⟩. ⟨hal-01954239⟩
  • Ivan Blum, Lorenzo Rigutti, François Vurpillot, Angela Vella, Aurore Gaillard, et al.. Dissociation Dynamics of Molecular Ions in High Dc Electric Field. Journal of Physical Chemistry A, American Chemical Society, 2016, 120 (20), pp.3654-3662. ⟨10.1021/acs.jpca.6b01791⟩. ⟨hal-01954242⟩
  • L. Rigutti, L. Mancini, D. Hernández-Maldonado, W. Lefebvre, E. Giraud, et al.. Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N. Journal of Applied Physics, American Institute of Physics, 2016, 119 (10), ⟨10.1063/1.4943612⟩. ⟨hal-01928851⟩
  • L. Mancini, D. Hernández-Maldonado, W. Lefebvre, J. Houard, I. Blum, et al.. Multi-Microscopy Study of the Influence of Stacking Faults and Three-Dimensional In Distribution on the Optical Properties of m-Plane InGaN Quantum Wells Grown on Microwire Sidewalls. Applied Physics Letters, American Institute of Physics, 2016, 108 (4), pp.042102. ⟨10.1063/1.4940748⟩. ⟨hal-01954240⟩
  • L. Rigutti, L. Mancini, E. Di Russo, I. Blum, F. Moyon, et al.. Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem. Microscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩. ⟨hal-01954232⟩
  • N. Rolland, D. J. Larson, B. P. Geiser, S. Duguay, F. Vurpillot, et al.. An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials. Ultramicroscopy, 2015, 159, pp.195--201. ⟨10.1016/j.ultramic.2015.03.010⟩. ⟨hal-01928854⟩
  • Nicolas Rolland, François Vurpillot, Sébastien Duguay, Didier Blavette. A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography. Microscopy and Microanalysis, Cambridge University Press (CUP), 2015, 21 (6), pp.1649-1656. ⟨10.1017/S1431927615015184⟩. ⟨hal-02107013⟩
  • L. Zhao, Antoine Normand, F. Delaroche, B. Ravelo, F. Vurpillot. Pulse shaping optimization for improving atom probe tomography. International Journal of Mass Spectrometry, Elsevier, 2015, 386, pp.47-53. ⟨10.1016/j.ijms.2015.06.012⟩. ⟨hal-02177749⟩
  • Robert Estivill, Adeline Grenier, Sébastien Duguay, François Vurpillot, Tanguy Terlier, et al.. Quantitative investigation of SiGeC layers using atom probe tomography. Ultramicroscopy, 2015, 150, pp.23--29. ⟨10.1016/j.ultramic.2014.11.020⟩. ⟨hal-01928855⟩
  • L. Arnoldi, E. P. Silaeva, F. Vurpillot, B. Deconihout, E. Cadel, et al.. Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atoms. Ultramicroscopy, 2015, 159, pp.139--146. ⟨10.1016/j.ultramic.2014.11.018⟩. ⟨hal-01929137⟩
  • Nicolas Rolland, François Vurpillot, Sébastien Duguay, Didier Blavette. Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation. European Physical Journal: Applied Physics, EDP Sciences, 2015, 72 (2), pp.21001. ⟨10.1051/epjap/2015150233⟩. ⟨hal-02107622⟩
  • Matthieu Gilbert, Céline Byl, David Bérardan, Alexandre Gloter, Nita Dragoe, et al.. Nanoscale Microstructural and Chemical Analysis of SiO 2 -Zn 1− x Al x O Nanocomposites: Towards a Better Understanding of Si and Al Substitution in ZnO. Journal of the American Ceramic Society, Wiley, 2015, 98 (12), pp.3948-3955. ⟨10.1111/jace.13848⟩. ⟨hal-02107584⟩
  • B. Mazumder, Viswas Purohit, M. Gruber, A. Vella, F. Vurpillot, et al.. Challenges in the study of Fe/MgO/Fe interfaces using 3D Atom Probe. Thin Solid Films, Elsevier, 2015, 589, pp.38-46. ⟨10.1016/j.tsf.2015.04.079⟩. ⟨hal-02107626⟩
  • A. Grenier, S. Duguay, J. P. Barnes, R. Serra, N. Rolland, et al.. Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques. Applied Physics Letters, American Institute of Physics, 2015, 106 (21), ⟨10.1063/1.4921352⟩. ⟨hal-01928856⟩
  • N. Sévelin-Radiguet, L. Arnoldi, F. Vurpillot, Antoine Normand, B. Deconihout, et al.. Ion energy spread in laser-assisted atom probe tomography. EPL - Europhysics Letters, European Physical Society/EDP Sciences/Società Italiana di Fisica/IOP Publishing, 2015, 109 (3), pp.37009. ⟨10.1209/0295-5075/109/37009⟩. ⟨hal-02109749⟩
  • Robert Estivill, Adeline Grenier, Sébastien Duguay, François Vurpillot, Tanguy Terlier, et al.. Quantitative analysis of Si/SiGeC superlattices using atom probe tomography. Ultramicroscopy, Elsevier, 2015, 159, pp.223-231. ⟨10.1016/j.ultramic.2015.03.014⟩. ⟨hal-02107589⟩
  • F. Vurpillot, C. Oberdorfer. Modeling Atom Probe Tomography: A review. Ultramicroscopy, Elsevier, 2015, 159, pp.202-216. ⟨10.1016/j.ultramic.2014.12.013⟩. ⟨hal-02107615⟩
  • W. Lefebvre, D. Hernandez-Maldonado, F. Moyon, F. Cuvilly, C. Vaudolon, et al.. HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy. Ultramicroscopy, Elsevier, 2015, 159, pp.403-412. ⟨10.1016/j.ultramic.2015.02.011⟩. ⟨hal-02107619⟩
  • Lorenzo Rigutti, Ivan Blum, Deodatta Shinde, David Hernandez-Maldonado, Williams Lefebvre, et al.. Correlation of Microphotoluminescence Spectroscopy, Scanning Transmission Electron Microscopy, and Atom Probe Tomography on a Single Nano-object Containing an InGaN/GaN Multiquantum Well System. Nano Letters, American Chemical Society, 2014, 14 (1), pp.107-114. ⟨10.1021/nl4034768⟩. ⟨hal-01986734⟩
  • A. Grenier, S. Duguay, J. P. Barnes, R. Serra, G. Haberfehlner, et al.. 3D analysis of advanced nano-devices using electron and atom probe tomography. Ultramicroscopy, 2014, 136, pp.185--192. ⟨10.1016/j.ultramic.2013.10.001⟩. ⟨hal-01929139⟩
  • Lorenzo Mancini, Nooshin Amirifar, Deodatta Shinde, Ivan Blum, Matthieu Gilbert, et al.. Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field. Journal of Physical Chemistry C, American Chemical Society, 2014, 118 (41), pp.24136-24151. ⟨10.1021/jp5071264⟩. ⟨hal-01163403⟩
  • D.J. Larson, B. Gault, B.P. Geiser, F. de Geuser, F. Vurpillot. Atom probe tomography spatial reconstruction: Status and directions. Current Opinion in Solid State and Materials Science, Elsevier, 2013, 17 (5), pp.236-247. ⟨10.1016/j.cossms.2013.09.002⟩. ⟨hal-00935033⟩
  • E. Silaeva, Nikita Shcheblanov, Tatiana Itina, Angela Vella, Jonathan Houard, et al.. Numerical study of femtosecond laser assisted atom probe tomography. Applied physics. A, Materials science & processing, Springer Verlag, 2013, 110 (3), pp.703-707. ⟨10.1007/s00339-012-7189-7⟩. ⟨ujm-00866898⟩
  • Lorenzo Rigutti, Angela Vella, François Vurpillot, Aurore Gaillard, Nicolas Sevelin-Radiguet, et al.. Coupling atom probe tomography and photoluminescence spectroscopy: Exploratory results and perspectives. Ultramicroscopy, Elsevier, 2013, 132, pp.75-80. ⟨10.1016/j.ultramic.2013.02.002⟩. ⟨hal-02109344⟩
  • F. Vurpillot, A. Gaillard, G. da Costa, B. Deconihout. A model to predict image formation in Atom probeTomography. Ultramicroscopy, Elsevier, 2013, 132, pp.152-157. ⟨10.1016/j.ultramic.2012.12.007⟩. ⟨hal-02108150⟩
  • Sophie Cazottes, François Vurpillot, Abdeslem Fnidiki, Dany Lemarchand, Marcello Baricco, et al.. Nanometer scale tomographic investigation of fine scale precipitates in a CuFeNi granular system by three-dimensional field ion microscopy. Microscopy and Microanalysis, Cambridge University Press (CUP), 2012, 18 (5), pp.1129--1134. ⟨10.1017/S1431927612000517⟩. ⟨hal-01829269⟩
  • F. Danoix, T. Epicier, F. Vurpillot, D. Blavette. Atomic-scale imaging and analysis of single layer GP zones in a model steel. Journal of Materials Science, Springer Verlag, 2012, 47 (3), pp.1567-1571. ⟨10.1007/s10853-011-6008-4⟩. ⟨hal-01834903⟩
  • J. Houard, A. Vella, F. Vurpillot, B. Deconihout. Three-dimensional thermal response of a metal subwavelength tip under femtosecond laser illumination. Physical Review B : Condensed matter and materials physics, American Physical Society, 2011, 84 (3), ⟨10.1103/PhysRevB.84.033405⟩. ⟨hal-02109350⟩
  • D. Blavette, F. Vurpillot, B. Deconihout, A. Menand. Atom probe tomography: 3D imaging at the atomic level. Advanced Structured Materials, 2011, 10, pp.201--222. ⟨10.1007/978-3-642-17782-8_9⟩. ⟨hal-01928872⟩
  • F. Vurpillot, M. Gruber, G. da Costa, I. Martin, L. Renaud, et al.. Pragmatic reconstruction methods in atom probe tomography. Ultramicroscopy, Elsevier, 2011, 111 (8), pp.1286-1294. ⟨10.1016/j.ultramic.2011.04.001⟩. ⟨hal-02108161⟩
  • J. Houard, A. Vella, F. Vurpillot, B. Deconihout. Optical near-field absorption at a metal tip far from plasmonic resonance. Physical Review B : Condensed matter and materials physics, American Physical Society, 2010, 81 (12), ⟨10.1103/PhysRevB.81.125411⟩. ⟨hal-02109352⟩
  • A. Vella, J. Houard, F. Vurpillot, B. Deconihout. Ultrafast emission of ions during laser ablation of metal for 3D atom probe. Applied Surface Science, Elsevier, 2009, 255 (10), pp.5154-5158. ⟨10.1016/j.apsusc.2008.08.109⟩. ⟨hal-02109356⟩
  • O. Cojocaru-Mirédin, Emmanuel Cadel, F. Vurpillot, D. Mangelinck, D. Blavette. Three-dimensional atomic-scale imaging of boron clusters in implanted silicon. Scripta Materialia, 2009, 60 (5), pp.285-288. ⟨10.1016/j.scriptamat.2008.10.008⟩. ⟨hal-01953258⟩
  • F. Vurpillot, J. Houard, A. Vella, B. Deconihout. Thermal response of a field emitter subjected to ultra-fast laser illumination. Journal of Physics D: Applied Physics, IOP Publishing, 2009, 42 (12), pp.125502. ⟨10.1088/0022-3727/42/12/125502⟩. ⟨hal-02109353⟩
  • R. Larde, E. Talbot, F. Vurpillot, Philippe Pareige, G. Schmerber, et al.. Investigation at the atomic scale of the Co spatial distribution in Zn(Co)O magnetic semiconductor oxide. Journal of Applied Physics, American Institute of Physics, 2009, 105 (12), pp.126107. ⟨10.1063/1.3152579⟩. ⟨hal-01633464⟩
  • S. Duguay, F. Vurpillot, T. Philippe, E. Cadel, R. Lardé, et al.. Evidence of atomic-scale arsenic clustering in highly doped silicon. Journal of Applied Physics, American Institute of Physics, 2009, 106 (10), pp.106102. ⟨10.1063/1.3257178⟩. ⟨hal-01929143⟩
  • J. Houard, A. Vella, F. Vurpillot, B. Deconihout. Conditions to cancel the laser polarization dependence of a subwavelength tip. Applied Physics Letters, American Institute of Physics, 2009, 94 (12), pp.121905. ⟨10.1063/1.3095829⟩. ⟨hal-02109355⟩
  • Didier Blavette, Talaat Al Kassab, Emmanuel Cadel, Alexander Mackel, François Vurpillot, et al.. Laser-assisted atom probe tomography and nanosciences. International Journal of Materials Research, 2008, 99 (5), pp.454--460. ⟨10.3139/146.101672⟩. ⟨hal-01929148⟩
  • B. Deconihout, A. Vella, F. Vurpillot, G. da Costa, A. Bostel. 3D atom probe assisted by femtosecond laser pulses. Applied physics. A, Materials science & processing, Springer Verlag, 2008, 93 (4), pp.995-1003. ⟨10.1007/s00339-008-4774-x⟩. ⟨hal-02108177⟩
  • Xavier Sauvage, Peter Jessner, François Vurpillot, Reinhard Pippan. Nanostructure and properties of a Cu-Cr composite processed by severe plastic deformation.. Scripta Materialia, Elsevier, 2008, 58, pp.1125. ⟨10.1016/j.scriptamat.2008.02.010⟩. ⟨hal-00276105⟩
  • F. de Geuser, W. Lefebvre, F. Danoix, F. Vurpillot, B. Forbord, et al.. An improved reconstruction procedure for the correction of local magnification effects in three-dimensional atom-probe. Surface and Interface Analysis, Wiley-Blackwell, 2007, 39 (2-3), pp.268--272. ⟨10.1002/sia.2489⟩. ⟨hal-00408094⟩
  • F. de Geuser, B. Gault, A. Bostel, F. Vurpillot. Correlated field evaporation as seen by atom probe tomography. Surface Science, Elsevier, 2007, 601 (2), pp.536 - 543. ⟨10.1016/j.susc.2006.10.019⟩. ⟨hal-00408087⟩
  • B. Gault, A. Vella, F. Vurpillot, A. Menand, D. Blavette, et al.. Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitter. Ultramicroscopy, 2007, 107 (9), pp.713--719. ⟨10.1016/j.ultramic.2007.02.004⟩. ⟨hal-01928886⟩
  • A. Grenier, R. Larde, E. Cadel, F. Vurpillot, N. Tiercelin, et al.. Atomic scale study of TbCo2.5/Fe multilayers by laser-assisted tomographic atom probe. Journal of Applied Physics, American Institute of Physics, 2007, 102, pp.033912-1-4. ⟨10.1063/1.2761825⟩. ⟨hal-00255798⟩
  • A. Grenier, R. Lardé, E. Cadel, J.M. Le Breton, J. Juraszek, et al.. Structural investigation of TbCo2/Fe magnetostrictive thin films by tomographic atom probe and Mössbauer spectrometry. Journal of Magnetism and Magnetic Materials, Elsevier, 2007, 310, pp.2215-2216. ⟨10.1016/j.jmmm.2006.10.1102⟩. ⟨hal-00285631⟩
  • B. Gault, F. Vurpillot, A. Vella, M. Gilbert, A. Menand, et al.. Design of a femtosecond laser assisted tomographic atom probe. Review of Scientific Instruments, 2006, 77 (4), ⟨10.1063/1.2194089⟩. ⟨hal-01928897⟩
  • L Renaud, P Monsallut, P. Benard, P Saliot, G Da Costa, et al.. The New Laser assisted Wide Angle Tomographic Atom Probe. Microscopy and Microanalysis, Cambridge University Press (CUP), 2006, 12 (S02), pp.1726-1727. ⟨10.1017/S1431927606063410⟩. ⟨hal-02108563⟩
  • G. da Costa, F. Vurpillot, A. Bostel, M. Bouet, B. Deconihout. Design of a delay-line position-sensitive detector with improved performance. Review of Scientific Instruments, American Institute of Physics, 2005, 76 (1), pp.013304. ⟨10.1063/1.1829975⟩. ⟨hal-02108204⟩
  • F. Vurpillot, F. de Geuser, G. Da Costa, D. Blavette. Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probe. Journal of Microscopy, 2004, 216 (3), pp.234--240. ⟨10.1111/j.0022-2720.2004.01413.x⟩. ⟨hal-01928905⟩
  • F. Vurpillot, L. Renaud, D. Blavette. A new step towards the lattice reconstruction in 3DAP. Ultramicroscopy, 2003, 95, pp.223--229. ⟨10.1016/S0304-3991(02)00320-0⟩. ⟨hal-01928911⟩
  • F. Vurpillot, A. Bostel, D. Blavette. A new approach to the interpretation of atom probe field-ion microscopy images. Ultramicroscopy, 2001, 89 (1-3), pp.137--144. ⟨10.1016/S0304-3991(01)00097-3⟩. ⟨hal-01928921⟩
  • F. Vurpillot, G. Da Costa, A. Menand, D. Blavette. Structural analyses in three-dimensional atom probe: A Fourier transform approach. Journal of Microscopy, 2001, 203 (3), pp.295--302. ⟨10.1046/j.1365-2818.2001.00923.x⟩. ⟨hal-01928923⟩
  • D. Blavette, F. Vurpillot, P. Pareige, A. Menand. A model accounting for spatial overlaps in 3D atom-probe microscopy. Ultramicroscopy, 2001, 89 (1-3), pp.145--153. ⟨10.1016/S0304-3991(01)00120-6⟩. ⟨hal-01928919⟩
  • F. Vurpillot, A. Bostel, E. Cadel, D. Blavette. The spatial resolution of 3D atom probe in the investigation of single-phase materials. Ultramicroscopy, 2000, 84 (3-4), pp.213--224. ⟨10.1016/S0304-3991(00)00035-8⟩. ⟨hal-01928928⟩
  • F. Vurpillot, A. Bostel, D. Blavette. Trajectory overlaps and local magnification in three-dimensional atom probe. Applied Physics Letters, American Institute of Physics, 2000, 76 (21), pp.3127--3129. ⟨10.1063/1.126545⟩. ⟨hal-01928929⟩
  • F. Vurpillot, A. Bostel, D. Blavette. The shape of field emitters and the ion trajectories in three- dimensional atom probes. Journal of Microscopy, 1999, 196 (3), pp.332--336. ⟨10.1046/j.1365-2818.1999.00637.x⟩. ⟨hal-01928937⟩
  • F. Vurpillot, A. Bostel, A. Menand, D. Blavette. Trajectories of field emitted ions in 3D atom-probe. European Physical Journal: Applied Physics, EDP Sciences, 1999, 6 (2), pp.217--221. ⟨10.1051/epjap:1999173⟩. ⟨hal-01928938⟩

Conference papers18 documents

  • Z. Xu, Y. Liu, B. Ravelo, O. Maurice, L. Zhao, et al.. Analysis of transient electric-field emitted by atom-probe tomography electrode. 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. ⟨10.1109/emceurope.2017.8094618⟩. ⟨hal-01765924⟩
  • B. Gault, M. Dagan, S. Katnagallu, F. de Geuser, F. Vurpillot, et al.. Revisiting Field Ion Microscopy. TMS conference, 2017, San Diego, United States. ⟨hal-01838871⟩
  • Williams Lefebvre, Florian Moyon, Antoine Normand, Nicolas Rolland, Ivan Blum, et al.. Correlative Investigations by HAADF-STEM and Atom Probe Tomography. European Microscopy Congress, Aug 2016, Lyon, France. pp.775-776, ⟨10.1002/9783527808465.EMC2016.8364⟩. ⟨hal-01954243⟩
  • L. Zhao, A. Delamare, Antoine Normand, F. Delaroche, O. Latry, et al.. RF transient pulse signal integrity with ns-duration for atom-probe tomography. 2015 IEEE Radio and Antenna Days of the Indian Ocean (RADIO), Sep 2015, Belle Mare, France. pp.1-2, ⟨10.1109/RADIO.2015.7323403⟩. ⟨hal-02107624⟩
  • B. Deconihout, F. Vurpillot, G. Da Costa, J. Houard, Philippe Pareige, et al.. Atom probe tomography: An imaging tool at the atomic scale using ltrafast laser pulses. CLEO: Applications and Technology, CLEO_AT 2013, 2013, Unknown, Unknown Region. ⟨hal-01928864⟩
  • Elena Silaeva, N. Shcheblanov, Tatiana Itina, Angela Vella, N. Sévelin-Radiguet, et al.. Numerical study of femtosecond laser-assisted atom probe tomography. 11th International Conference on Laser Ablation, Nov 2011, Playa del Carmen, Mexico. pp.133. ⟨ujm-00710834⟩
  • W. Lefebvre, F. Vurpillot, M. Torsaeter, F. de Geuser. Methods for the study of clustering and precipitation in Al-based alloys by APT. International Conference on Aluminium Alloys (ICAA 12), 2010, Yokohama, Japan. ⟨hal-01838921⟩
  • F. Vurpillot, M. Gruber, S. Duguay, E. Cadel, B. Deconihout. Modeling artifacts in the analysis of test semiconductor structures in atom probe tomography. AIP Conference Proceedings, 2009, Unknown, Unknown Region. pp.175--180, ⟨10.1063/1.3251216⟩. ⟨hal-01929146⟩
  • B. Deconihout, F. Vurpillot, B. Gault, G. Da Costa, M. Bouet, et al.. Toward a laser assisted wide-angle tomographic atom-probe. Surface and Interface Analysis, 2007, Unknown, Unknown Region. pp.278--282, ⟨10.1002/sia.2491⟩. ⟨hal-01928893⟩
  • D. Blavette, E. Cadel, D. Mangelinck, K. Hoummada, R. Lardé, et al.. Laser atom probe tomography: Some applications. IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, 2006, Unknown, Unknown Region. pp.61--62, ⟨10.1109/IVNC.2006.335352⟩. ⟨hal-01928901⟩
  • A. Grenier, E. Cadel, F. Vurpillot, R. Iarde, N. Tiercelin, et al.. Investigation of TbCo2Fe magnetostrictive multilayers by laser assisted tomographic atom probe (LATAP). 2006, pp.187. ⟨hal-00152962⟩
  • A. Grenier, E. Cadel, F. Vurpillot, R. Larde, N. Tiercelin, et al.. Analyse d'une multicouche magnétostrictive TbCo2/Fe par sonde atomique tomographique assistée par laser. 10èmes Journées de la Matière Condensée, JMC10, 2006, Toulouse, France. ⟨hal-00241168⟩
  • F. Danoix, E. Bémont, P. Maugis, F. Vurpillot, D. Blavette. Atom probe tomography study of homogeneous and heterogeneous precipitation of niobium carbides in a model ferritic steel. IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, 2006, Unknown, Unknown Region. pp.91, ⟨10.1109/IVNC.2006.335372⟩. ⟨hal-01928902⟩
  • A. Menand, B. Deconihout, P. Pareige, F. Vurpillot, D. Blavette. The tomographic atom probe: Salient results and recent breakthroughs. Microscopy and Microanalysis, 2005, Unknown, Unknown Region. pp.96--97, ⟨10.1017/S1431927605501545⟩. ⟨hal-01928903⟩
  • F. Vurpillot, A. Cerezo, D. Blavette, D. J. Larson. Modeling image distortions in 3DAP. Microscopy and Microanalysis, 2004, Unknown, Unknown Region. pp.384--390, ⟨10.1017/S1431927604040486⟩. ⟨hal-01928907⟩
  • Didier Blavette, François Vurpillot, Frederic de Geuser, Emilie Bémont. Local magnification in 3DAP. 49th International Field Emission Symposium (IFES), 2004, Graz, Austria. ⟨hal-01838941⟩
  • Frederic de Geuser, W. Lefebvre, F. Danoix, F. Vurpillot, B. Forbord, et al.. An improved reconstruction procedure for the correction of local magnification effects in 3D Atom Probe. 49th International Field Emission Symposium (IFES), 2004, Graz, Austria. ⟨hal-01838942⟩
  • F. Danoix, F. Vurpillot, W. Lefebvre, D. Blavette. 3D atom probe: Chemical analysis with (near) atomic resolution. Microscopy and Microanalysis, 2003, Unknown, Unknown Region. pp.568--569. ⟨hal-01928912⟩

Poster communications2 documents

  • F. Vurpillot, G. Da Costa, F. de Geuser, B. Gault, B. Deconihout. Why do We Need a High Performance Position Sensitive Detector in Atom Probe Tomography?. 50th International Field Emission Symposium (IFES), 2006, Guilin, China. 2006. ⟨hal-01838932⟩
  • François Vurpillot, Alain Bostel, Frederic de Geuser, Bernard Deconihout. Composition measurements in 3DAP: a Bayesian approach. 49th International Field Emission Symposium (IFES), 2004, Graz, Austria. 2004. ⟨hal-01838939⟩

Book sections4 documents

Preprints, Working Papers, ...1 document

  • L. Zhao, Antoine Normand, J. Houard, Ivan Blum, F. Delaroche, et al.. Numeric modeling of synchronous laser pulsing and voltage pulsing field evaporation. 2019. ⟨hal-02127790⟩