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CV. F. Orieux


François orieux is Assistant Professor at the Université Paris-Saclay, Science Faculty of Orsay, and a researcher in the Laboratoire des Signaux et Systèmes, Groupe Problèmes Inverses (Univ. Paris-Saclay, CNRS, CentraleSupélec, Université Paris-Saclay). He is also an associate researcher with the Institut d'Astrophysique Spatiale (Univ. Paris-Saclay, CNRS).

He received his Ph.D. degree in signal processing at Université Paris-Sud, Orsay, France.

His research focuses on Bayesian methodological approaches for ill-posed inverse problems resolution with examples of applications in astrophysics or biological microscopy.

F. Orieux is a member of the Laboratoire des Signaux et Systèmes (Univ. Paris-Saclay, CNRS, CentraleSupélec), 91 192, Gif-sur-Yvette, France. e-mail:}

Pierre Vermeulen   

Journal articles1 document

  • Pierre Vermeulen, H Zhan, François Orieux, Olivo-Marin Jean-Christophe, Zsolt Lenkei, et al.. Out of focus background subtraction for fast structured illumination super resolution microscopy of optically thick samples. Journal of Microscopy, Wiley, 2015, 259 (3), pp.257-268 ⟨10.1111/jmi.12259⟩. ⟨hal-01225859⟩

Conference papers2 documents

  • Pierre Vermeulen, François Orieux, Jean-Christophe Olivo-Marin, H. Zhan, Zsolt Lenkei, et al.. In vivo dual-color high resolution SIM of optically thick samples with background subtraction. Focus on Microscopy, Apr 2014, Sydney, Australia. ⟨hal-01623750⟩
  • Pierre Vermeulen, François Orieux, Eduardo Sepulveda, Jean-Christophe Olivo-Marin, Alexandra Fragola, et al.. Dynamic SIM for high-speed imaging and optical sectioning in living samples. Focus on Microscopy, Apr 2012, Singapour, Singapore. ⟨hal-01623757⟩