Francois Bay

Documents

Publications

karim-inal

pierre-montmitonnet

marc-zelsmann

	Electromigration-induced failure in operando characterization of 3D interconnects: microstructure influence Simon Gousseau , Stéphane Moreau , David Bouchu , Alexis Farcy , Pierre Montmitonnet Microelectronics Reliability, 2015, 55 (8), pp.1205-1213. ⟨10.1016/j.microrel.2015.05.019⟩ Article dans une revue hal-01166314v1