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Francois Bay


Emmanuel Picard   

Journal articles1 document

  • Simon Gousseau, Stéphane Moreau, David Bouchu, Alexis Farcy, Pierre Montmitonnet, et al.. Electromigration-induced failure in operando characterization of 3D interconnects: microstructure influence. Microelectronics Reliability, Elsevier, 2015, 55 (8), pp.1205-1213. ⟨10.1016/j.microrel.2015.05.019⟩. ⟨hal-01166314⟩