Nombre de documents

10

Franck Jandard


Article dans une revue10 documents

  • M. Dehlinger, C. Fauquet, F. Jandard, A. Bjeoumikhova, R. Gubzhokov, et al.. Toward sub-micro-XRF working at nanometer range using capillary optics. X-Ray Spectrometry, Wiley, 2013, 42 (6), pp.456-461. 〈hal-00919570〉
  • F. Jandard, C. Fauquet, M. Dehlinger, A. Ranguis, A. Bjeoumikhov, et al.. Mapping of X-ray induced luminescence using a SNOM probe. Applied Surface Science, Elsevier, 2013, 267, pp.81-85. 〈hal-00843731〉
  • M. Dehlinger, C. Fauquet, S. Lavandier, O. Aumporn, F. Jandard, et al.. Spatial resolution of confocal XRF technique using capillary optics. Nanoscale Research Letters, SpringerOpen, 2013, 8, pp.UNSP 271. 〈hal-00914734〉
  • M. Dehlinger, C. Dorczynski, C. Fauquet, F. Jandard, D. Tonneau, et al.. Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy. International Journal of Nanotechnology, Inderscience, 2012, 9 (3-7), pp.460-470. 〈hal-00697528〉
  • C. Fauquet, M. Dehlinger, F. Jandard, S. Ferrero, D. Pailharey, et al.. Combining scanning probe microscopy and X-ray spectroscopy. Nanoscale Research Letters, SpringerOpen, 2011, 6, pp.308. 〈hal-00975161〉
  • N. Rochdi, D. Tonneau, F. Jandard, H. Dallaporta, V. Safarov. Fabrication and electrical properties of ultra-thin silicon nanowires. physica status solidi (a), Wiley, 2008, 205 (5), pp.1157-1161. 〈hal-00386844〉
  • S. Larcheri, F. Rocca, F. Jandard, D. Pailharey, R. Graziola, et al.. X-ray excited optical luminescence detection by scanning near-field optical microscope : a new tool for nanoscience. Review of Scientific Instruments, American Institute of Physics, 2008, 79 (1), pp.013702. 〈hal-00269961〉
  • N. Rochdi, D. Tonneau, F. Jandard, H. Dallaporta, V. Safarov, et al.. Electrical conductivity of ultra-thin silicon nanowires. Journal of Vacuum Science and Technology B, 2008, 26 (1), pp.159-163. 〈hal-00303801〉
  • S. Larcheri, C. Armellini, F. Rocca, A. Kuzmin, R. Lalendarev, et al.. X-Ray studies on optical and structural properties of ZnO nanostructured thin films. Superlattices and Microstructures, Elsevier, 2006, 39, n° 1-4, pp.267-274. 〈hal-00020374〉
  • M. Prestigiacomo, F. Bedu, F. Jandard, D. Tonneau, H. Dallaporta, et al.. Purification and crystallization of tungsten wires fabricated by focused-ion-beam-induced deposition. Applied Physics Letters, American Institute of Physics, 2005, 〈10.1063/1.1927714〉. 〈hal-01578387〉