CV Accueil - Archive ouverte HAL

	Broadband Eddy Current Measurement of the Sheet Resistance of GaN Semiconductors Ghania Belkacem , Florent Loete , Tanguy Phulpin Sensors, 2024, 24 (5), pp.1629. ⟨10.3390/s24051629⟩ Article dans une revue hal-04506515v1
	Principal Component Analysis Enhanced with Bootstrapped Confidence Interval for the Classification of Parkinsonian Patients Using Gaussian Mixture Model and Gait Initiation Parameters Florent Loete , Arnaud Simonet , Paul Fourcade , Eric Yiou , Arnaud Delafontaine Sensors, 2024, 24 (6), ⟨10.3390/s24061885⟩ Article dans une revue hal-04506520v1
	A New Insight on the “S” Shape Pattern of Soft Faults in Time-Domain Reflectometry Florent Loete Sensors, 2023, 23 (24), pp.9867. ⟨10.3390/s23249867⟩ Article dans une revue hal-04506503v1
	Experimental Study and Phenomenological Laws of Some Nonlinear Behaviours of the Wheel–Rail Contact Associated with the Deshunting Phenomenon Guy-Léon Kaza , Frédéric Houzé , Florent Loëte , Philippe Teste Applied Sciences, 2023, 13 (21), pp.11752. ⟨10.3390/app132111752⟩ Article dans une revue hal-04297829v1
	Enhancing railway network safety by reproducing wheel–rail electrical contact on a laboratory scale Luna Haydar , Florent Loete , Frédéric Houzé , Tanguy Choupin , Fabien Guiche Applied Sciences, 2023, 13 (18), pp.10253. ⟨10.3390/app131810253⟩ Article dans une revue hal-04207532v1
	Time domain reflectometry model : analysis and characterization of a chafing defect in a coaxial cable Abelin Kameni , Florent Loete , Lionel Pichon European Physical Journal: Applied Physics, 2018, 83, ⟨10.1051/epjap/2018170430⟩ Article dans une revue hal-01852189v1
	Equivalent Circuit Model of Soft Shield Defects in Coaxial Cables Using Numerical Modeling Antony Manet , Abelin Kameni , Florent Loete , Jérôme Genoulaz , Lionel Pichon IEEE Transactions on Electromagnetic Compatibility, 2017, 59 (2), pp.533-536. ⟨10.1109/TEMC.2016.2612719⟩ Article dans une revue hal-01451176v1
	Novel Wideband Eddy Current Device for the Conductivity Measurement of Semiconductors Florent Loete , Yann Le Bihan , Denis Mencaraglia IEEE Sensors Journal, 2016, 16 (11), pp.4151-4152. ⟨10.1109/JSEN.2016.2544403⟩ Article dans une revue hal-01465306v1
	Experimental validation of the inverse scattering method for distributed characteristic impedance estimation Florent Loete , Qinghua Zhang , Michel Sorine IEEE Transactions on Antennas and Propagation, 2015, 63 (6), pp.7. ⟨10.1109/TAP.2015.2417215⟩ Article dans une revue hal-01231807v1
	Detection and Location of Defects in Wiring Networks Using Time-Domain Reflectometry and Neural Networks Mostafa-Kamel Smaïl , Tarik Hacib , Lionel Pichon , Florent Loete IEEE Transactions on Magnetics, 2011, 47 (5), pp.1502-1505. ⟨10.1109/TMAG.2010.2089503⟩ Article dans une revue hal-00710603v1
	Application of total internal reflexion fluorescence microsocopy for studying pH changes in an occluded electrochemical cell : Development of a waveguide sensor. Florent Loete , Bruno Vuillemin , Roland Oltra , Denis Chaumont , Eric Bourillot Electrochemistry Communications, 2006, 8, pp.1016-1020. ⟨10.1016/j.elecom.2006.04.004⟩ Article dans une revue hal-00084295v1
	Application of total internal reflexion fluorescence microscopy for studying pH changes in an occluded electrochemical cell : Development of a waveguide sensor. Florent Loete , Bruno Vuillemin , Roland Oltra , Denis Chaumont , Eric Bourillot Electrochemistry Communications, 2006, 8, pp.1016-1020. ⟨10.1016/j.elecom.2006.04.004⟩ Article dans une revue hal-00080825v1

	A wheel-rail electrical contact experiment at the laboratory scale Luna Haydar , Florent Loete , Frédéric Houzé , Philippe Teste , Tanguy Choupin 4th International Railway Symposium Aachen (IRSA 2023), Nov 2023, Aachen (Aix la Chapelle), Germany Communication dans un congrès hal-04214192v1
	Machine learning applied to the analysis of the gait initiation process in Parkinson’s disease using Principal Component Analysis and bootstrapping Florent Loete , Paul Fourcade , Eric Yiou , Arnaud Delafontaine 37eme congres de la societe francaise de medecine physique et de réadaptation. SOFMER 2022, Dec 2022, Rennes, France Communication dans un congrès hal-04506629v1
	Contactless Investigation of the p-Type Doping Concentration Level of Single Micrometric Size GaAs Crystals Grown on Silicon for Multijunction Solar Cells Alexandre Jaffré , José Alvarez , Hung-Ling Chen , Hajer Makhloufi , Charles Renard 35th European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC), EU PVSEC, Sep 2018, Bruxelles, Belgium. pp.660 - 664, ⟨10.4229/35thEUPVSEC20182018-2AV.3.17⟩ Communication dans un congrès hal-01936835v1
	Contactless conductivity measurement for ITO nanolayers on AsGa substrats over a wide frequency range Florent Loete , Hajer Makhloufi , Yann Le Bihan , Denis Mencaraglia IEEE SENSORS 2018, Oct 2018, New delhi, India. ⟨10.1109/icsens.2018.8589554⟩ Communication dans un congrès hal-01943876v1
	Modèle de réflectométrie en domaine temporel pour l’´etude des défauts non-francs Abelin Kameni , Florent Loete , Lionel Pichon NUMELEC 2017, Nov 2017, PARIS, France Communication dans un congrès hal-01689769v1
	Étude expérimentale du contact électrique roue/rail Florent Loete , Guy-Leon Kaza , Philippe Testé , Romaric Landfried , Frédéric Houzé XIIIème Colloque sur les Arcs Electriques et Workshop Arcs et Contacts Electriques (CAE XIII ACE 2017), Mar 2017, Nancy, France Communication dans un congrès hal-01481567v1
	Electrical tagging devices for the removal of fault location ambiguities by reflectometry in complex electrical networks Florent Loete , Michel Sorine IEEE SENSORS, Oct 2016, Orlando, FL, United States. ⟨10.1109/ICSENS.2016.7808646⟩ Communication dans un congrès hal-01943914v1
	Modélisation et analyse de défauts non francs dans le blindage des lignes coaxiales en vue du diagnostic Hossein Manesh , Abelin Kameni , Florent Loete , Jérôme Genoulaz , Lionel Pichon CEM2016, 18ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique,, Jul 2016, Rennes, France Communication dans un congrès hal-01388575v1
	Model-Based Eddy Current Determination of the Electrical Conductivity of Semiconductors Yann Le Bihan , Florent Loete , Josué Ferreira , Denis Mencaraglia 2016 IEEE Conference on Electromagnetic Field Computation (CEFC), Nov 2016, Miami, United States. ⟨10.1109/cefc.2016.7816375⟩ Communication dans un congrès hal-01460536v1
	Contactless device for the fast conductivity characterization of a large range semiconductors Florent Loëte , Yann Le Bihan , Denis Mencaraglia International Symposium on Semiconductor Manufacturing (ISSM 2016), Dec 2016, Tokyo, Japan. 4p., ⟨10.1109/issm.2016.7934522⟩ Communication dans un congrès hal-01637727v1
	Modélisation et Analyse de Défauts Non-Francs dans les Lignes de Transmission en vue du Diagnostic Hossein Manesh , Abelin Kameni , Florent Loete , Jérôme Genoulaz , Lionel Pichon 19èmes Journées Nationales Micro-ondes (JNM 2015), Jun 2015, Bordeaux, France Communication dans un congrès hal-01235563v1
	Experimental Evaluation of the Inverse Scattering Method for Electrical Cable Fault Diagnosis Florent Loete , Qinghua Zhang , Michel Sorine 9th IFAC Symposium on Fault Detection, Supervision and Safety of Technical Processes (SAFEPROCESS), Sep 2015, Paris, France. ⟨10.1016/j.ifacol.2015.09.619⟩ Communication dans un congrès hal-01232156v1
	Experimental Analysis and Modelling of Coaxial Transmission Lines with Soft Shield Defects Hossein Manesh , Abelin Kameni , Florent Loete , Jérôme Genoulaz , Lionel Pichon Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe, Aug 2015, Dresden, Germany. ⟨10.1109/ISEMC.2015.7256406⟩ Communication dans un congrès hal-01235557v1
	Time domain modeling of soft faults in wiring system by a nodal Discontinuous Galerkin Method with high-order hexahedral meshes Abelin Kameni , F Loete , S Ziani , K Kahalerras , Lionel Pichon COMPUMAG 2015, Jun 2015, MONTREAL, Canada Communication dans un congrès hal-01236028v1
	Inverse Scattering Experiments for Electric Cable Soft Fault Diagnosis and Connector Location Florent Loete , Qinghua Zhang , Michel Sorine PIERS Proceedings, Mar 2012, Kuala Lumpur, Malaysia. pp.1932-1936 Communication dans un congrès hal-00776082v1
	Diagnostic of Connector's Degradation Level by Frequency Domain Reflectometry Cedric Gilbert , Florent Loete Holm 2012, Sep 2012, Portland, United States. pp.101-104, ⟨10.1109/HOLM.2012.6336591⟩ Communication dans un congrès hal-00778770v1
	Observation of Branly's effect during shunting experiments on scaled wheel-rail contacts Hugues Chollet , Frédéric Houzé , Philippe Testé , Florent Loete , Xavier Lorang 9th International Conference on Contact Mechanics and Wear of Rail/Wheel Systems, Aug 2012, Chengdu, China. pp.111-114 Communication dans un congrès hal-00778780v1
	Electrical behaviour of the wheel-rail contact Frédéric Houzé , Philippe Testé , Florent Loete , Richard Andlauer , Hugues Chollet ICEC 2012, May 2012, Beijing, China. pp.67-72 Communication dans un congrès hal-00778767v1
	Essais de vieillissement par vibration de connecteurs pour la mécatronique J.P. Michelet , J. Guinet , C. Colin , P. Michon , Aurore Brézard-Oudot Journée "La Connectique : état de l'art et perspectives", Dec 2010, Paris, France Communication dans un congrès hal-00806336v1
	Detection and Location of Defects in Wiring Networks using Time Domain Reflectometry and Neural Networks Mostafa-Kamel Smaïl , Tarik Hacib , Lionel Pichon , Florent Loete 14th Biennial IEEE Conference on Electromagnetic Field Computation, May 2010, Chicago, États-Unis. pp.000 Communication dans un congrès hal-00555222v1
	Feasability of the detection of vibration induced faults in connectors by reflectometry Florent Loëte , Sophie Noël , René Meyer , M. Olivas , F. Auzanneau 24 th Int. Conf. on Elec. Contacts ICEC 2008, Jun 2008, St Malo, France. pp.CD-ROM Proceedings Communication dans un congrès hal-00351379v1

	Analyse par photoluminescence du dopage résiduel dans un cristal unique de GaAs de taille micrométrique épitaxié sur silicium pour la réalisation de multijonctions Alexandre Jaffré , J Alvarez , Hung-Ling Chen , Hajer Makhloufi , Charles Renard Journées Nationales du Photovoltaïque 2018 (JNPV 2018), Dec 2018, Dourdan, France Poster de conférence hal-01942352v1
	Tunable Eddy Current Device for the Contactless Characterization of a Large Variety of Semiconductor Materials Florent Loete , Yann Le Bihan , Denis Mencaraglia 2015 IEEE SENSORS, Nov 2015, Busan, South Korea. ⟨10.1109/ICSENS.2015.7370427⟩ Poster de conférence hal-01246248v1

	Contactless measurement of the conductivity of semiconductors using a multicarrier frequency test signal Denis Mencaraglia , Yann Le Bihan , Florent Loete United States, Patent n° : 10429435. 2019 Brevet hal-02936877v1
	Mesure sans contact de la conductivité de semiconducteurs Florent Loete , Yann Le Bihan , Denis Mencaraglia France, N° de brevet: FR 1553392. 2015 Brevet hal-01246254v1
	Procédé de marquage de faisceaux de lignes électriques pour le diagnostic par réflectométrie et kit correspondant Florent Loete , Michel Sorine France, N° de brevet: FR 1455748. LGEP 2014 ID = 1716. 2014 Brevet hal-01092470v1

florent LOETE

Publications

Broadband Eddy Current Measurement of the Sheet Resistance of GaN Semiconductors

Principal Component Analysis Enhanced with Bootstrapped Confidence Interval for the Classification of Parkinsonian Patients Using Gaussian Mixture Model and Gait Initiation Parameters

A New Insight on the “S” Shape Pattern of Soft Faults in Time-Domain Reflectometry

Experimental Study and Phenomenological Laws of Some Nonlinear Behaviours of the Wheel–Rail Contact Associated with the Deshunting Phenomenon

Enhancing railway network safety by reproducing wheel–rail electrical contact on a laboratory scale

Time domain reflectometry model : analysis and characterization of a chafing defect in a coaxial cable

Equivalent Circuit Model of Soft Shield Defects in Coaxial Cables Using Numerical Modeling

Novel Wideband Eddy Current Device for the Conductivity Measurement of Semiconductors

Experimental validation of the inverse scattering method for distributed characteristic impedance estimation

Detection and Location of Defects in Wiring Networks Using Time-Domain Reflectometry and Neural Networks

Application of total internal reflexion fluorescence microsocopy for studying pH changes in an occluded electrochemical cell : Development of a waveguide sensor.

Application of total internal reflexion fluorescence microscopy for studying pH changes in an occluded electrochemical cell : Development of a waveguide sensor.

A wheel-rail electrical contact experiment at the laboratory scale

Machine learning applied to the analysis of the gait initiation process in Parkinson’s disease using Principal Component Analysis and bootstrapping

Contactless Investigation of the p-Type Doping Concentration Level of Single Micrometric Size GaAs Crystals Grown on Silicon for Multijunction Solar Cells

Contactless conductivity measurement for ITO nanolayers on AsGa substrats over a wide frequency range

Modèle de réflectométrie en domaine temporel pour l’´etude des défauts non-francs

Étude expérimentale du contact électrique roue/rail

Electrical tagging devices for the removal of fault location ambiguities by reflectometry in complex electrical networks

Modélisation et analyse de défauts non francs dans le blindage des lignes coaxiales en vue du diagnostic

Model-Based Eddy Current Determination of the Electrical Conductivity of Semiconductors

Contactless device for the fast conductivity characterization of a large range semiconductors

Modélisation et Analyse de Défauts Non-Francs dans les Lignes de Transmission en vue du Diagnostic

Experimental Evaluation of the Inverse Scattering Method for Electrical Cable Fault Diagnosis

Experimental Analysis and Modelling of Coaxial Transmission Lines with Soft Shield Defects

Time domain modeling of soft faults in wiring system by a nodal Discontinuous Galerkin Method with high-order hexahedral meshes

Inverse Scattering Experiments for Electric Cable Soft Fault Diagnosis and Connector Location

Diagnostic of Connector's Degradation Level by Frequency Domain Reflectometry

Observation of Branly's effect during shunting experiments on scaled wheel-rail contacts

Electrical behaviour of the wheel-rail contact

Essais de vieillissement par vibration de connecteurs pour la mécatronique

Detection and Location of Defects in Wiring Networks using Time Domain Reflectometry and Neural Networks

Feasability of the detection of vibration induced faults in connectors by reflectometry

Analyse par photoluminescence du dopage résiduel dans un cristal unique de GaAs de taille micrométrique épitaxié sur silicium pour la réalisation de multijonctions

Tunable Eddy Current Device for the Contactless Characterization of a Large Variety of Semiconductor Materials

Contactless measurement of the conductivity of semiconductors using a multicarrier frequency test signal

Mesure sans contact de la conductivité de semiconducteurs

Procédé de marquage de faisceaux de lignes électriques pour le diagnostic par réflectométrie et kit correspondant