Florent LOETE

Abelin Kameni, Florent Loete, Lionel Pichon. Time domain reflectometry model : analysis and characterization of a chafing defect in a coaxial cable. European Physical Journal: Applied Physics, EDP Sciences, 2018, 83, ⟨10.1051/epjap/2018170430⟩. ⟨hal-01852189⟩

Antony Manet, Abelin Kameni, Florent Loete, Jérôme Genoulaz, Lionel Pichon, et al.. Equivalent Circuit Model of Soft Shield Defects in Coaxial Cables Using Numerical Modeling. IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2017, 59 (2), pp.533-536. ⟨10.1109/TEMC.2016.2612719⟩. ⟨hal-01451176⟩

Florent Loete, Yann Le Bihan, Denis Mencaraglia. Novel Wideband Eddy Current Device for the Conductivity Measurement of Semiconductors. IEEE Sensors Journal, Institute of Electrical and Electronics Engineers, 2016, 16 (11), pp.4151-4152. ⟨10.1109/JSEN.2016.2544403⟩. ⟨hal-01465306⟩

Florent Loete, Qinghua Zhang, Michel Sorine. Experimental validation of the inverse scattering method for distributed characteristic impedance estimation. IEEE Transactions on Antennas and Propagation, Institute of Electrical and Electronics Engineers, 2015, 63 (6), pp.7. ⟨10.1109/TAP.2015.2417215⟩. ⟨hal-01231807⟩

Mostafa-Kamel Smaïl, Tarik Hacib, Lionel Pichon, Florent Loete. Detection and Location of Defects in Wiring Networks Using Time-Domain Reflectometry and Neural Networks. IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2011, 47 (5), pp.1502-1505. ⟨10.1109/TMAG.2010.2089503⟩. ⟨hal-00710603⟩

Florent Loete, Bruno Vuillemin, Roland Oltra, Denis Chaumont, Eric Bourillot. Application of total internal reflexion fluorescence microsocopy for studying pH changes in an occluded electrochemical cell : Development of a waveguide sensor.. Electrochemistry Communications, Elsevier, 2006, 8, pp.1016-1020. ⟨10.1016/j.elecom.2006.04.004⟩. ⟨hal-00084295⟩

Florent Loete, Bruno Vuillemin, Roland Oltra, Denis Chaumont, Eric Bourillot. Application of total internal reflexion fluorescence microscopy for studying pH changes in an occluded electrochemical cell : Development of a waveguide sensor.. Electrochemistry Communications, Elsevier, 2006, 8, pp.1016-1020. ⟨10.1016/j.elecom.2006.04.004⟩. ⟨hal-00080825⟩

Alexandre Jaffré, José Alvarez, Hung-Ling Chen, Hajer Makhloufi, Charles Renard, et al.. Contactless Investigation of the p-Type Doping Concentration Level of Single Micrometric Size GaAs Crystals Grown on Silicon for Multijunction Solar Cells. 35th European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC), EU PVSEC, Sep 2018, Bruxelles, Belgium. pp.660 - 664, ⟨10.4229/35thEUPVSEC20182018-2AV.3.17⟩. ⟨hal-01936835⟩

Florent Loete, Hajer Makhloufi, Yann Le Bihan, Denis Mencaraglia. Contactless conductivity measurement for ITO nanolayers on AsGa substrats over a wide frequency range. IEEE SENSORS 2018, Oct 2018, New delhi, India. ⟨10.1109/icsens.2018.8589554⟩. ⟨hal-01943876⟩

Florent Loete, Guy-Leon Kaza, Philippe Testé, Romaric Landfried, Frédéric Houzé, et al.. Étude expérimentale du contact électrique roue/rail. XIIIème Colloque sur les Arcs Electriques et Workshop Arcs et Contacts Electriques (CAE XIII ACE 2017), Mar 2017, Nancy, France. ⟨hal-01481567⟩

Abelin Kameni, Florent Loete, Lionel Pichon. Modèle de réflectométrie en domaine temporel pour l’´etude des défauts non-francs. NUMELEC 2017, Nov 2017, PARIS, France. ⟨hal-01689769⟩

Florent Loëte, Yann Le Bihan, Denis Mencaraglia. Contactless device for the fast conductivity characterization of a large range semiconductors. International Symposium on Semiconductor Manufacturing (ISSM 2016), Dec 2016, Tokyo, Japan. 4p., ⟨10.1109/issm.2016.7934522⟩. ⟨hal-01637727⟩

Hossein Manesh, Abelin Kameni, Florent Loete, Jérôme Genoulaz, Lionel Pichon, et al.. Modélisation et analyse de défauts non francs dans le blindage des lignes coaxiales en vue du diagnostic. CEM2016, 18ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique,, Jul 2016, Rennes, France. ⟨hal-01388575⟩

Yann Le Bihan, Florent Loete, Josué Ferreira, Denis Mencaraglia. Model-Based Eddy Current Determination of the Electrical Conductivity of Semiconductors. 2016 IEEE Conference on Electromagnetic Field Computation (CEFC), Nov 2016, Miami, United States. ⟨10.1109/cefc.2016.7816375⟩. ⟨hal-01460536⟩

Florent Loete, Michel Sorine. Electrical tagging devices for the removal of fault location ambiguities by reflectometry in complex electrical networks. IEEE SENSORS, Oct 2016, Orlando, FL, United States. ⟨10.1109/ICSENS.2016.7808646⟩. ⟨hal-01943914⟩

Florent Loete, Qinghua Zhang, Michel Sorine. Experimental Evaluation of the Inverse Scattering Method for Electrical Cable Fault Diagnosis. 9th IFAC Symposium on Fault Detection, Supervision and Safety of Technical Processes (SAFEPROCESS), Sep 2015, Paris, France. ⟨10.1016/j.ifacol.2015.09.619⟩. ⟨hal-01232156⟩

Abelin Kameni, F Loete, S Ziani, K Kahalerras, Lionel Pichon. Time domain modeling of soft faults in wiring system by a nodal Discontinuous Galerkin Method with high-order hexahedral meshes. COMPUMAG 2015, Jun 2015, MONTREAL, Canada. ⟨hal-01236028⟩

Hossein Manesh, Abelin Kameni, Florent Loete, Jérôme Genoulaz, Lionel Pichon, et al.. Modélisation et Analyse de Défauts Non-Francs dans les Lignes de Transmission en vue du Diagnostic. 19ième Journées Nationales Micro-ondes, Jun 2015, Bordeaux, France. ⟨hal-01235563⟩

Hossein Manesh, Abelin Kameni, Florent Loete, Jérôme Genoulaz, Lionel Pichon, et al.. Experimental Analysis and Modelling of Coaxial Transmission Lines with Soft Shield Defects. Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe, Aug 2015, Dresden, Germany. ⟨10.1109/ISEMC.2015.7256406⟩. ⟨hal-01235557⟩

Frédéric Houzé, Philippe Testé, Florent Loete, Richard Andlauer, Hugues Chollet, et al.. Electrical behaviour of the wheel-rail contact. ICEC 2012, May 2012, Beijing, China. pp.67-72. ⟨hal-00778767⟩

Cedric Gilbert, Florent Loete. Diagnostic of Connector's Degradation Level by Frequency Domain Reflectometry. Holm 2012, Sep 2012, Portland, United States. pp.101-104, ⟨10.1109/HOLM.2012.6336591⟩. ⟨hal-00778770⟩

Hugues Chollet, Frédéric Houzé, Philippe Testé, Florent Loete, Xavier Lorang, et al.. Observation of Branly's effect during shunting experiments on scaled wheel-rail contacts. 9th International Conference on Contact Mechanics and Wear of Rail/Wheel Systems, Aug 2012, Chengdu, China. pp.111-114. ⟨hal-00778780⟩

Mostafa-Kamel Smaïl, Tarik Hacib, Lionel Pichon, Florent Loete. Detection and Location of Defects in Wiring Networks using Time Domain Reflectometry and Neural Networks. 14th Biennial IEEE Conference on Electromagnetic Field Computation, May 2010, Chicago, États-Unis. pp.000. ⟨hal-00555222⟩

J.P. Michelet, J. Guinet, C. Colin, P. Michon, Aurore Brézard-Oudot, et al.. Essais de vieillissement par vibration de connecteurs pour la mécatronique. Journée "La Connectique : état de l'art et perspectives", Dec 2010, Paris, France. ⟨hal-00806336⟩

Florent Loëte, Sophie Noël, René Meyer, M. Olivas, F. Auzanneau, et al.. Feasability of the detection of vibration induced faults in connectors by reflectometry. 24 th Int. Conf. on Elec. Contacts ICEC 2008, Jun 2008, St Malo, France. pp.CD-ROM Proceedings. ⟨hal-00351379⟩

Alexandre Jaffré, J Alvarez, Hung-Ling Chen, Hajer Makhloufi, Charles Renard, et al.. Analyse par photoluminescence du dopage résiduel dans un cristal unique de GaAs de taille micrométrique épitaxié sur silicium pour la réalisation de multijonctions. Journées Nationales du Photovoltaïque 2018 (JNPV 2018), Dec 2018, Dourdan, France. ⟨hal-01942352⟩

Florent Loete, Yann Le Bihan, Denis Mencaraglia. Tunable Eddy Current Device for the Contactless Characterization of a Large Variety of Semiconductor Materials. 2015 IEEE SENSORS, Nov 2015, Busan, South Korea. ⟨10.1109/ICSENS.2015.7370427⟩. ⟨hal-01246248⟩

Denis Mencaraglia, Yann Le Bihan, Florent Loete. Contactless measurement of the conductivity of semiconductors using a multicarrier frequency test signal. United States, Patent n° : 10429435. 2019. ⟨hal-02936877⟩

Florent Loete, Yann Le Bihan, Denis Mencaraglia. Mesure sans contact de la conductivité de semiconducteurs. France, N° de brevet: FR 1553392. 2015. ⟨hal-01246254⟩

Florent Loete, Michel Sorine. Procédé de marquage de faisceaux de lignes électriques pour le diagnostic par réflectométrie et kit correspondant. France, N° de brevet: FR 1455748. LGEP 2014 ID = 1716. 2014. ⟨hal-01092470⟩