Florent Houdellier

Documents

Identifiants chercheurs

florent-houdellier
0000-0002-5272-7792
IdRef : 111155878

Présentation

**Research activities : new instrumental and methodological developments in Transmission Electron Microscopy (TEM)** Since 2022 : In charge of teaching "Advanced geometrical optics" in the 4th year and "Charged particle optics" in the 5th year of the physics department at INSA-Toulouse (70h) 2022 : Accreditation to Supervise Research (Habilitation à Diriger des Recherches-HDR) Since 2020 : CNRS Research Engineer (IRHC) at CEMES-CNRS. 2018-2023 : Director of the CNRS/Hitachi High-Technologies (HHT) Joint laboratory "HC-IUMi" (Hitachi-CNRS Infrastructure for Ultrafast Microscopy) located in CEMES-CNRS, which aims to develop the next generation of ultrafast coherent FE-TEM. 2016-2020 : CNRS Research Engineer (IR1) at CEMES-CNRS. Head of the Characterisation platform and TEM service. Member of the Electron Microscopy research group (I3EM). 2007-2016 : CNRS Research Engineer (IR2) at CEMES-CNRS. Head of the TEM service 2006 - 2007 : Post-doctoral position supported by the European ESTEEM project. Development of new holographic methods with elastic and inelastic electrons. Development of CHEF and EMCD experiments with a Cs-corrected microscope. 2003 - 2006 : PhD thesis at CEMES-CNRS (Centre d’Elaboration de Matériaux et d’Etudes Structurales-Centre National de la Recherche Scientifique) : Development of CBED and high resolution electron holography for strain measurements 1998 - 2003 : Engineering School INSA (Institut National des Sciences Appliquées) Toulouse. Speciality : Nanophysics *Some developments, a selective choice :* - *Dark field Electron Holography :* <http://archives.cnrs.fr/inp/article/469> - *New high brightness carbon nanocone CFEG :* <http://archives.cnrs.fr/inp/article/454> - *I2TEM microscope in collaboration with Hitachi High-Technologies (HHT) :*<http://archives.cnrs.fr/inp/article/584>, <https://videotheque.cnrs.fr/visio=4086> - *Partnership between CEMES- CNRS and HHT :* <http://archives.cnrs.fr/inp/article/389> - *New high brightness ultrafast CFEG :* <https://inp.cnrs.fr/fr/cnrsinfo/nouvelle-source-delectrons-pour-la-microscopie-electronique> - *CNRS-HHT joint laboratory :* <http://archives.cnrs.fr/presse/article/5654>, <http://www.cnrs.fr/fr/un-nouveau-microscope-de-pointe-inaugure-au-cemes-cnrs> *Awards :* 2020: CNRS Cristal award 2019: Ernst Ruska prize of the German Microscopy Society (DGE) 2019: European Microscopy Society (EMS) 2018 outstanding paper award 2006: Pierre Favard Award of the French Microscopy Society (Sfmu)

Publications

	Observer la matière à l’échelle du nanomètre et de la femtoseconde : la microscopie électronique en transmission ultrarapide Arnaud Arbouet , Florent Houdellier , Giuseppe Mario Caruso , Sophie Meuret , Mathieu Kociak Photoniques, 2020, 102, pp.26 - 30. ⟨10.1051/photon/202010226⟩ Article dans une revue hal-03030625v1
	Synthesis and (some) applications of carbon-nanotube-supported pyrolytic carbon nanocones Germercy Paredes , Grégory Seine , Robin Cours , Florent Houdellier , Hatem Allouche Indian Journal of Engineering & Materials Sciences, 2020, 27, pp.1091-1094. ⟨10.56042/ijems.v27i6.47547⟩ Article dans une revue hal-03091168v1
	High brightness ultrafast transmission electron microscope based on a laser-driven cold-field emission source: principle and applications Giuseppe Mario Caruso , Florent Houdellier , Sébastien J. Weber , M Kociak , Arnaud Arbouet Advances in Physics: X, 2019, 4 (1), pp.1660214. ⟨10.1080/23746149.2019.1660214⟩ Article dans une revue hal-03082027v1
	Optimization of off-axis electron holography performed with femtosecond electron pulses Florent Houdellier , Giuseppe Mario Caruso , Sébastien J. Weber , M.J. Hÿtch , Christophe Gatel Ultramicroscopy, 2019, ⟨10.1016/j.ultramic.2019.03.016⟩ Article dans une revue hal-02080673v1
	Nanoscale measurements of phosphorous-induced lattice expansion in nanosecond laser annealed germanium Simona Boninelli , R. Milazzo , Robert Carles , Florent Houdellier , Ray Duffy APL Materials, 2018, 6 (5), pp.058504. ⟨10.1063/1.5022876⟩ Article dans une revue hal-01796115v1
	Unlimited acquisition time in electron holography by automated feedback control of transmission electron microscope Christophe Gatel , Julien Dupuy , Florent Houdellier , Martin J. Hÿtch Applied Physics Letters, 2018, 113 (13), ⟨10.1063/1.5050906⟩ Article dans une revue hal-01884057v1
	Development of a high brightness ultrafast Transmission Electron Microscope based on a laser-driven cold field emission source Florent Houdellier , Giuseppe Mario Caruso , Sébastien J. Weber , M. Kociak , Arnaud Arbouet Ultramicroscopy, 2018, 186, pp.128 - 138. ⟨10.1016/j.ultramic.2017.12.015⟩ Article dans une revue hal-01846146v1
	Observation of large multiple scattering effects in ultrafast electron diffraction on monocrystalline silicon Isabel González Vallejo , Geoffrey Gallé , Brice Arnaud , Shelley Scott , Max Lagally Physical Review B, 2018, 97 (5), pp.54302. ⟨10.1103/PhysRevB.97.054302⟩ Article dans une revue hal-03088683v2
	200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy Shuichi Mamishin , Yudai Kubo , Robin Cours , Marc Monthioux , Florent Houdellier Ultramicroscopy, 2017, 182, pp.303 - 307. ⟨10.1016/j.ultramic.2017.07.018⟩ Article dans une revue hal-01741769v1
	Optimising electron microscopy experiment through electron optics simulation Y Kubo , Christophe Gatel , Etienne Snoeck , Florent Houdellier Ultramicroscopy, 2017, 175, pp.67--80. ⟨10.1016/j.ultramic.2017.01.007⟩ Article dans une revue hal-01706932v1
	Development of an ultrafast electron source based on a cold-field emission gun for ultrafast coherent TEM Giuseppe Mario Caruso , Florent Houdellier , Pierre Abeilhou , Arnaud Arbouet Applied Physics Letters, 2017, 111 (2), pp.023101. ⟨10.1063/1.4991681⟩ Article dans une revue hal-01739806v1
	Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection Charudatta Phatak , Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Martin Hÿtch Ultramicroscopy, 2016, 164, pp.24--30. ⟨10.1016/j.ultramic.2016.03.005⟩ Article dans une revue hal-01430579v1
	Realization of a tilted reference wave for electron holography by means of a condenser biprism Falk Röder , Florent Houdellier , Thibaud Denneulin , Etienne Snoeck , Martin Hÿtch Ultramicroscopy, 2016, 161, pp.23 - 40. ⟨10.1016/j.ultramic.2015.11.004⟩ Article dans une revue hal-01404505v1
	Dynamical holographic Moirés in a TEM Christophe Gatel , Florent Houdellier , Etienne Snoeck Journal of Physics D: Applied Physics, 2016, 49 (32), pp.324001. ⟨10.1088/0022-3727/49/32/324001⟩ Article dans une revue hal-01707046v1
	Differential phase-contrast dark-field electron holography for strain mapping Thibaud Denneulin , Florent Houdellier , Martin Hÿtch Ultramicroscopy, 2016, 160, pp.98-109. ⟨10.1016/j.ultramic.2015.10.002⟩ Article dans une revue hal-01723740v1
	Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , S Mamishin Ultramicroscopy, 2015, 151, pp.107--115. ⟨10.1016/j.ultramic.2014.11.021⟩ Article dans une revue hal-01430585v1
	Development of splitting convergent beam electron diffraction (SCBED) Florent Houdellier , Falk Röder , Etienne Snoeck Ultramicroscopy, 2015, 159 (P1), pp.59-66. ⟨10.1016/j.ultramic.2015.08.002⟩ Article dans une revue hal-01723741v1
	Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing Ludvig de Knoop , Christophe Gatel , Florent Houdellier , Marc Monthioux , Aurélien Masseboeuf Applied Physics Letters, 2015, 106 (26), pp.263101. ⟨10.1063/1.4923245⟩ Article dans une revue hal-01430586v2
	Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes Etienne Snoeck , Florent Houdellier , Yoshifumi Taniguch , Aurélien Masseboeuf , Christophe Gatel Microscopy and Microanalysis, 2014, 20 (S3), pp.932--933. ⟨10.1017/S1431927614006382⟩ Article dans une revue hal-01430589v1
	Determining the work function of a carbon-cone cold-field emitter by in situ electron holography Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Aurélien Masseboeuf , Marc Monthioux Micron, 2014, 63, pp.2--8. ⟨10.1016/j.micron.2014.03.005⟩ Article dans une revue hal-01430588v1
	Dynamical effects in strain measurements by dark-field electron holography Elsa Javon , Axel Lubk , Robin Cours , Shay Reboh , Nikolay Cherkashin Ultramicroscopy, 2014, 147, pp.70-85. ⟨10.1016/j.ultramic.2014.06.005⟩ Article dans une revue hal-01721158v1
	Mechanics of silicon nitride thin-film stressors on a transistor-like geometry Shay Reboh , P. Morin , Martin Hÿtch , Florent Houdellier , Alain Claverie APL Materials, 2013, 1 (4), ⟨10.1063/1.4826545⟩ Article dans une revue hal-01724108v1
	Interaction of an ultrashort optical pulse with a metallic nanotip: A Green dyadic approach Arnaud Arbouet , Florent Houdellier , Renaud Marty , Christian Girard Journal of Applied Physics, 2012, 112 (5), pp.053103. ⟨10.1063/1.4747840⟩ Article dans une revue hal-01742052v1
	A new linear transfer theory and characterization method for image detectors. Part II: Experiment Axel Lubk , Falk Röder , Tore Niermann , Christophe Gatel , Sébastien Joulié Ultramicroscopy, 2012, 115, pp.78 - 87. ⟨10.1016/j.ultramic.2012.01.011⟩ Article dans une revue hal-01742051v1
	New carbon cone nanotip for use in a highly coherent cold field emission electron microscope Florent Houdellier , Aurélien Masseboeuf , Marc Monthioux , Martin Hÿtch Carbon, 2012, 50 (5), pp.2037-2044. ⟨10.1016/j.carbon.2012.01.023⟩ Article dans une revue hal-00678407v1
	Study of Nanocrystalline BiMnO3--PbTiO3: Synthesis, Structural Elucidation, and Magnetic Characterization of the Whole Solid Solution Teresa Hungría , Covadonga Correas , Florent Houdellier , Octavio Peña , Eladio Vila Chemistry - A European Journal, 2012, 18 (29), pp.9075-9082. ⟨10.1002/chem.201200148⟩ Article dans une revue hal-00817004v1
	Surface electrostatic potentials in carbon nanotubes and graphene membranes investigated with electron holography Luca Ortolani , Florent Houdellier , Marc Monthioux , Etienne Snoeck , Vittorio Morandi Carbon, 2011, 49 (4), pp.1423 - 1429. ⟨10.1016/j.carbon.2010.12.010⟩ Article dans une revue hal-01742045v1
	Dark-field electron holography for the measurement of geometric phase Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Ultramicroscopy, 2011, 111 (8), pp.1328 - 1337. ⟨10.1016/j.ultramic.2011.04.008⟩ Article dans une revue hal-01742047v1
	Strain mapping in layers and devices by electron holography Martin Hÿtch , Nikolay Cherkashin , Shay Reboh , Florent Houdellier , Alain Claverie physica status solidi (a), 2011, 208 (3), pp.580-583. ⟨10.1002/pssa.201000281⟩ Article dans une revue hal-01736038v1
	Chirality dependent surface adhesion of single-walled carbon nanotubes on graphene surfaces Luca Ortolani , Florent Houdellier , Marc Monthioux , Vittorio Morandi Carbon, 2010, 48 (11), pp.3050 - 3056. ⟨10.1016/j.carbon.2010.04.036⟩ Article dans une revue hal-01742041v1
	Visualising alloy fluctuations by spherical-aberration–corrected HRTEM Marie-José Casanove , Nicolas Combe , Florent Houdellier , Martin Hÿtch EPL - Europhysics Letters, 2010, 91 (3), ⟨10.1209/0295-5075/91/36001⟩ Article dans une revue hal-01742039v1
	Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Journal of Physics: Conference Series, 2010, 241, pp.012027. ⟨10.1088/1742-6596/241/1/012027⟩ Article dans une revue hal-01742031v1
	Effects of severe plastic deformation on the structure and thermo-mechanical properties of Zr55Cu30Al10Ni5 bulk metallic glass N. van Steenberge , S. Hóbor , S. Suriñach , A. Zhilyaev , Florent Houdellier Journal of Alloys and Compounds, 2010, 500 (1), pp.61 - 67. ⟨10.1016/j.jallcom.2010.03.195⟩ Article dans une revue hal-01742036v1
	TEM investigation of the crystal lattice registration of carbon nanotubes over graphene membranes Luca Ortolani , Florent Houdellier , Marc Monthioux , Vittorio Morandi Microscopie, 2010, 14 (2), pp.43-49 Article dans une revue hal-02106215v1
	Monoclinic symmetry of twin-free nanocrystals in the BiScO3 -PbTiO3 solid solution as revealed by aberration-corrected TEM Teresa Hungría , Florent Houdellier , Miguel Algueró , Alicia Castro Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2010, 81 (10), ⟨10.1103/PhysRevB.81.100102⟩ Article dans une revue hal-01742032v1
	Microstructure and mechanical properties of high niobium containing TiAl alloys elaborated by spark plasma sintering Houria Jabbar , Jean-Philippe Monchoux , Florent Houdellier , Mickaël Dollé , Frank-Peter Schimansky Intermetallics, 2010, 18 (12), pp.2312-2321. ⟨10.1016/j.intermet.2010.07.024⟩ Article dans une revue hal-01742044v1
	Elastic strain around needle-shaped particles embedded in Al matrix Joël Douin , P. Donnadieu , Florent Houdellier Acta Materialia, 2010, 58 (17), pp.5782-5788. ⟨10.1016/j.actamat.2010.06.053⟩ Article dans une revue hal-00532981v1
	On the influence of elastic strain on the accommodation of carbon atoms into substitutional sites in strained Si:C layers grown on Si substrates Nikolay Cherkashin , Martin Hÿtch , Florent Houdellier , Florian Hüe , Vincent Paillard Applied Physics Letters, 2009, 94 (14), pp.141910. ⟨10.1063/1.3116648⟩ Article dans une revue hal-00417300v1
	Selective growth of tensily strained Si1−yCy films on patterned Si substrates A. Gouye , Florian Hüe , A. Halimaoui , O. Kermarrec , Y. Campidelli Materials Science in Semiconductor Processing, 2009, 12 (1-2), pp.34 - 39. ⟨10.1016/j.mssp.2009.07.006⟩ Article dans une revue hal-01742015v1
	Pyroxenes microstructure in comet 81P/Wild 2 terminal Stardust particles Damien Jacob , Julien Stodolna , Hugues Leroux , Falko Langenhorst , Florent Houdellier Meteoritics and Planetary Science, 2009, 44 (10), pp.1475 - 1488. ⟨10.1111/j.1945-5100.2009.tb01187.x⟩ Article dans une revue hal-01742027v1
	End of range defects in Ge S. Koffel , Nikolay Cherkashin , Florent Houdellier , Martin Hÿtch , Gérard Benassayag Journal of Applied Physics, 2009, 105, pp.126110. ⟨10.1063/1.3153985⟩ Article dans une revue hal-01736054v1
	Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography Florian Hüe , Martin Hÿtch , Florent Houdellier , Hugo Bender , Alain Claverie Applied Physics Letters, 2009, 95 (7), pp.73103 - 73103. ⟨10.1063/1.3192356⟩ Article dans une revue hal-01742020v1
	Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy Florian Hüe , Martin Hÿtch , Hugo Bender , Florent Houdellier , Alain Claverie Physical Review Letters, 2008, 100 (15), ⟨10.1103/PhysRevLett.100.156602⟩ Article dans une revue hal-01741994v1
	Lateral epitaxial growth of germanium on silicon oxide D. Cammilleri , V. Yam , F. Fossard , C. Renard , D. Bouchier Applied Physics Letters, 2008, 93 (4), pp.43110 - 43110. ⟨10.1063/1.2963363⟩ Article dans une revue hal-01742002v1
	Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography Florian Hüe , Martin Hÿtch , Florent Houdellier , Etienne Snoeck , Alain Claverie Materials Science and Engineering: B, 2008, 154-155, pp.221 - 224. ⟨10.1016/j.mseb.2008.10.020⟩ Article dans une revue hal-01742010v1
	Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique Bénédicte Warot-Fonrose , Florent Houdellier , Martin Hÿtch , Lionel Calmels , Virginie Serin Ultramicroscopy, 2008, 108 (5), pp.393 - 398. ⟨10.1016/j.ultramic.2007.05.013⟩ Article dans une revue hal-01707847v1
	Fatigue of single crystalline silicon: Mechanical behaviour and TEM observations Marc Legros , Olivier Ferry , Florent Houdellier , Alain Jacques , Amand George Materials Science and Engineering: A, 2008, 483-484, pp.353 - 364. ⟨10.1016/j.msea.2006.10.200⟩ Article dans une revue hal-01741996v1
	Nanoscale holographic interferometry for strain measurements in electronic devices Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Nature, 2008, 453 (7198), pp.1086 - 1089. ⟨10.1038/nature07049⟩ Article dans une revue hal-01742001v1
	Lateral growth of monocrystalline Ge on silicon oxide by ultrahigh vacuum chemical vapor deposition V. D. Cammilleri , V. Yam , F. Fossard , C. Renard , D. Bouchier Materials Science in Semiconductor Processing, 2008, 11 (5-6), pp.214-216. ⟨10.1016/j.mssp.2008.07.003⟩ Article dans une revue hal-01293141v1
	Effect of sample bending on diffracted intensities observed in CBED patterns of plan view strained samples Florent Houdellier , D. Jacob , Christian Roucau , Marie-José Casanove Ultramicroscopy, 2008, 108 (4), pp.295 - 301. ⟨10.1016/j.ultramic.2007.04.003⟩ Article dans une revue hal-01707829v1
	Optimal aperture sizes and positions for EMCD experiments J. Verbeeck , C. Hebert , S. Rubino , P. Novák , J. Rusz Ultramicroscopy, 2008, 108 (9), pp.865 - 872. ⟨10.1016/j.ultramic.2008.02.007⟩ Article dans une revue hal-01742004v1
	New approach for the dynamical simulation of CBED patterns in heavily strained specimens Florent Houdellier , A. Altibelli , Christian Roucau , Marie-José Casanove Ultramicroscopy, 2008, 108 (5), pp.426 - 432. ⟨10.1016/j.ultramic.2007.06.002⟩ Article dans une revue hal-01741992v1
	LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a Cs corrector: Comparison with electron precession J. Morniroli , Florent Houdellier , Christian Roucau , J. Puiggalí , S. Gestí Ultramicroscopy, 2008, 108 (2), pp.100 - 115. ⟨10.1016/j.ultramic.2007.03.006⟩ Article dans une revue hal-01707841v1
	Microstructure of Cs-implanted zirconia: Role of temperature L. Vincent , L. Thome , F. Garrido , O. Kaitasov , Florent Houdellier Journal of Applied Physics, 2008, 104 (11), pp.114904. ⟨10.1063/1.3021162⟩ Article dans une revue in2p3-00854119v1
	Energy-loss magnetic chiral dichroism (EMCD): Magnetic chiral dichroism in the electron microscope S. Rubino , P. Schattschneider , M. Stöger-Pollach , C. Hebert , J. Rusz Journal of Materials Research, 2008, 23 (10), pp.2582 - 2590. ⟨10.1557/JMR.2008.0348⟩ Article dans une revue hal-01742008v1
	Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF) Florent Houdellier , Martin Hÿtch Ultramicroscopy, 2008, 108 (3), pp.285 - 294. ⟨10.1016/j.ultramic.2007.08.016⟩ Article dans une revue hal-01707842v1
	Convergent beam electron diffraction for strain determination at the nanoscale Florent Houdellier , Christian Roucau , Marie-José Casanove Microelectronic Engineering, 2007, 84 (3), pp.464 - 467. ⟨10.1016/j.mee.2006.10.063⟩ Article dans une revue hal-01741979v1
	Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy Florent Houdellier , Martin Hÿtch Microelectronic Engineering, 2007, 84 (3), pp.460 - 463. ⟨10.1016/j.mee.2006.10.062⟩ Article dans une revue hal-01741980v1
	Experimental application of sum rules for electron energy loss magnetic chiral dichroism Lionel Calmels , Florent Houdellier , Bénédicte Warot-Fonrose , Christophe Gatel , Martin Hÿtch Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2007, 76 (6), ⟨10.1103/PhysRevB.76.060409⟩ Article dans une revue hal-01741982v1
	Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layers Florent Houdellier , Christian Roucau , L. Clement , J.L. Rouvière , Marie-José Casanove Ultramicroscopy, 2006, 106 (10), pp.951 - 959. ⟨10.1016/j.ultramic.2006.04.011⟩ Article dans une revue hal-01707838v1
	High-resolution electron holography for the study of composition and strain in thin film semiconductors Florent Houdellier , Martin Hÿtch , Etienne Snoeck , Marie-José Casanove Materials Science and Engineering: B, 2006, 135 (3), pp.188 - 191. ⟨10.1016/j.mseb.2006.08.035⟩ Article dans une revue hal-01741978v1

	Time-Resolved Cathodoluminescence in a Transmission Electron Microscope Sophie Meuret , Nikolay Cherkashin , L. H. G. Tizei , Yves Auad , Sébastien J. Weber 11th International Conference on Metamaterials, Photonic Crystals and Plasmonics (META 2021), Jul 2021, Warsaw, Poland Communication dans un congrès hal-04449931v1
	Synthesis and (some) applications of carbon-nanotube-supported pyrolytic carbon nanocones Germercy Paredes , Etienne Palleau , Mathieu Delmas , Grégory Seine , Florent Houdellier Conference on Carbon Materials "CCM-2019", Indian Carbon Society, Nov 2019, New Delhi, India Communication dans un congrès hal-02411274v1
	Micromagnetic Objects and dynamical imaging Interferometry Instrumentation & In situ for Electron Microscopy Christophe Gatel , Aurélien Masseboeuf , Etienne Snoeck , Bénédicte Warot-Fonrose , Florent Houdellier MCMeet - GDRs MCM2 et MEETICC, Oct 2017, Strasbourg, France Communication dans un congrès hal-01725341v1
	Towards ultrafast TEM based on a modified cold-field emission TEM Arnaud Arbouet , Christophe Gatel , Ludvig de Knoop , Aurélien Masseboeuf , Mathieu Kociak 2016 Houches WE Heraeus Workshop, May 2016, Les Houches, France Communication dans un congrès hal-01768918v1
	Measurement of crystalline lattice strain by transmission electron microscopy” Nikolay Cherkashin , Florent Houdellier , Martin Hÿtch , Maxim Korytov 14ème colloque de la Société Française des Microscopies, Jun 2015, Nice, France Communication dans un congrès hal-01763051v1
	In situ electron microscopy of hard and soft matter Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Aurélien Masseboeuf , Marc Monthioux Joint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela Communication dans un congrès hal-02123302v1
	Ultrafast laser-induced field emission from a single carbon nanotube based nanotip Mina Bionta , Benoît Chalopin , Marc Delmas , Florent Houdellier , Aurélien Masseboeuf 2015 Conference on Lasers and Electro-Optics (CLEO) : Applications and Technology, May 2015, San Jose, United States. pp.JW2A--52, ⟨10.1364/CLEO_AT.2015.JW2A.52⟩ Communication dans un congrès hal-01430583v1
	Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotip Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , Shuichi Mamishin PICO-2015, Apr 2015, Jülich, Netherlands Communication dans un congrès hal-02123316v1
	Synthesis and applications of individual carbon-nanotube-supported carbon nanocones Marc Monthioux , Mathieu Delmas , Florent Houdellier , Thierry Ondarçuhu , Aurélien Masseboeuf IEEE Nanotechnology Materials and Devices Conference, Oct 2014, Aci Castello, Italy Communication dans un congrès hal-02123308v1
	Comparaison des modes d'imagerie fond noir TEM et STEM pour l'observation de structures moléculaires J. Ayache , D. Jaillard , B. Payre , Christine Péchoux , Florent Houdellier 47. Journées du GUMP, Société Française des Microscopies (SFµ). Paris, FRA., May 2011, Guadeloupe, France. 1 p Communication dans un congrès hal-02810543v1
	Strain Mapping of Layers and Devices Using Electron Holography Alain Claverie , Nikolay Cherkashin , Florian Hüe , Shay Reboh , Florent Houdellier ECS Trans. 2010, 2010, Unknown, Unknown Region. ⟨10.1149/1.3487533⟩ Communication dans un congrès hal-01736051v1
	Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitation P. Donnadieu , Y. Shao , G. Botton , S. Lazar , M. Cheynet PTM2010 - International Conference on Solid-Solid Phase Transformations, 2010, AVIGNON, France Communication dans un congrès hal-00610638v1
	Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si Substrate Nikolay Cherkashin , Adrien Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch ECS Transactions, May 2008, Unknown, Unknown Region. ⟨10.1149/1.2911510⟩ Communication dans un congrès hal-01736065v1
	Determination of strain within Si1-yCy layers grown by CVD on a Si substrate Nikolay Cherkashin , A. Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch Symposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. pp.12-19, ⟨10.1557/PROC-1026-C07-03⟩ Communication dans un congrès hal-01736057v1

	Comparative molecular dark field modes in cell imaging J. Ayache , D. Jaillard , B. Payre , Christine Péchoux , Florent Houdellier The IFSM International Microscopy Congress IMC17, Sep 2010, Rio de Janeiro, Brazil. , 1 p., 2010 Poster de conférence hal-02820670v1

	Étonnante physique Marie Le Merrer , Juliette Pierre , Tatiana Budtova , Frank Smallenburg , Hannelore Derluyn Séverine Martrenchard. CNRS Editions, pp.422, 2023, 9782271148902 Ouvrages hal-04318170v1

	Chapter Two - Cold field emission electron source: From higher brightness to ultrafast beam Florent Houdellier Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, Elsevier, pp.107-161, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00002-X⟩ Chapitre d'ouvrage hal-04185381v1
	Chapter One - Characterization of nanomaterials properties using FE-TEM Florent Houdellier Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, pp.1-105, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00001-8⟩ Chapitre d'ouvrage hal-04185377v1
	Chapter Three - Every electron counts: Toward the development of aberration-optimized and aberration-corrected electron sources Florent Houdellier Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, Elsevier, pp.163-216, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00003-1⟩ Chapitre d'ouvrage hal-04185384v1
	Ultrafast Transmission Electron Microscopy: Historical Development, Instrumentation, and Applications Arnaud Arbouet , Giuseppe Mario Caruso , Florent Houdellier Peter W. Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France. Advances in Electronics and Electron Physics, 207, Elsevier, 2018, 1076-5670. ⟨10.1016/bs.aiep.2018.06.001⟩ Chapitre d'ouvrage hal-01839320v1
	Dark-Field Electron Holography for Strain Mapping Martin Hÿtch , Florent Houdellier , Nikolay Cherkashin , Shay Reboh , Elsa Javon Alain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩ Chapitre d'ouvrage hal-01736026v1
	CHAPTER 6 - Aberration Correction With the SACTEM-Toulouse: From Imaging to Diffraction Florent Houdellier , Martin Hÿtch , Florian Hüe , Etienne Snoeck P.W.Hawkes. Advances in Imaging and Electron Physics vol 153, 153, Academic press, 2008, Aberration-Corrected Electron Microscopy, 978-0-12-374220-9. ⟨10.1016/S1076-5670(08)01006-9⟩ Chapitre d'ouvrage hal-01742322v1

	Contribution au développement du CBED et de l’holographie HREM pour l’analyse des déformations de couches épitaxiées Florent Houdellier Optique [physics.optics]. INSA Toulouse; CNRS-CEMES, 2006. Français. ⟨NNT : ⟩ Thèse tel-01754061v1

	COHERENT ELECTRON MICROSCOPY: CONTRIBUTIONS AND PROJECT. Towards aberration-corrected bright electron source Florent Houdellier Optics [physics.optics]. Université Toulouse 3 Paul Sabatier, 2022 HDR tel-03695440v2

Florent Houdellier

Présentation

Publications

Observer la matière à l’échelle du nanomètre et de la femtoseconde : la microscopie électronique en transmission ultrarapide

Synthesis and (some) applications of carbon-nanotube-supported pyrolytic carbon nanocones

High brightness ultrafast transmission electron microscope based on a laser-driven cold-field emission source: principle and applications

Optimization of off-axis electron holography performed with femtosecond electron pulses

Nanoscale measurements of phosphorous-induced lattice expansion in nanosecond laser annealed germanium

Unlimited acquisition time in electron holography by automated feedback control of transmission electron microscope

Development of a high brightness ultrafast Transmission Electron Microscope based on a laser-driven cold field emission source

Observation of large multiple scattering effects in ultrafast electron diffraction on monocrystalline silicon

200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy

Optimising electron microscopy experiment through electron optics simulation

Development of an ultrafast electron source based on a cold-field emission gun for ultrafast coherent TEM

Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection

Realization of a tilted reference wave for electron holography by means of a condenser biprism

Dynamical holographic Moirés in a TEM

Differential phase-contrast dark-field electron holography for strain mapping

Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip

Development of splitting convergent beam electron diffraction (SCBED)

Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing

Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes

Determining the work function of a carbon-cone cold-field emitter by in situ electron holography

Dynamical effects in strain measurements by dark-field electron holography

Mechanics of silicon nitride thin-film stressors on a transistor-like geometry

Interaction of an ultrashort optical pulse with a metallic nanotip: A Green dyadic approach

A new linear transfer theory and characterization method for image detectors. Part II: Experiment

New carbon cone nanotip for use in a highly coherent cold field emission electron microscope

Study of Nanocrystalline BiMnO3--PbTiO3: Synthesis, Structural Elucidation, and Magnetic Characterization of the Whole Solid Solution

Surface electrostatic potentials in carbon nanotubes and graphene membranes investigated with electron holography

Dark-field electron holography for the measurement of geometric phase

Strain mapping in layers and devices by electron holography

Chirality dependent surface adhesion of single-walled carbon nanotubes on graphene surfaces

Visualising alloy fluctuations by spherical-aberration–corrected HRTEM

Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations

Effects of severe plastic deformation on the structure and thermo-mechanical properties of Zr55Cu30Al10Ni5 bulk metallic glass

TEM investigation of the crystal lattice registration of carbon nanotubes over graphene membranes

Monoclinic symmetry of twin-free nanocrystals in the BiScO3 -PbTiO3 solid solution as revealed by aberration-corrected TEM

Microstructure and mechanical properties of high niobium containing TiAl alloys elaborated by spark plasma sintering

Elastic strain around needle-shaped particles embedded in Al matrix

On the influence of elastic strain on the accommodation of carbon atoms into substitutional sites in strained Si:C layers grown on Si substrates

Selective growth of tensily strained Si1−yCy films on patterned Si substrates

Pyroxenes microstructure in comet 81P/Wild 2 terminal Stardust particles

End of range defects in Ge

Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography

Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy

Lateral epitaxial growth of germanium on silicon oxide

Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography

Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique

Fatigue of single crystalline silicon: Mechanical behaviour and TEM observations

Nanoscale holographic interferometry for strain measurements in electronic devices

Lateral growth of monocrystalline Ge on silicon oxide by ultrahigh vacuum chemical vapor deposition

Effect of sample bending on diffracted intensities observed in CBED patterns of plan view strained samples

Optimal aperture sizes and positions for EMCD experiments

New approach for the dynamical simulation of CBED patterns in heavily strained specimens

LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a Cs corrector: Comparison with electron precession

Microstructure of Cs-implanted zirconia: Role of temperature

Energy-loss magnetic chiral dichroism (EMCD): Magnetic chiral dichroism in the electron microscope

Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF)

Convergent beam electron diffraction for strain determination at the nanoscale

Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy

Experimental application of sum rules for electron energy loss magnetic chiral dichroism

Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layers

High-resolution electron holography for the study of composition and strain in thin film semiconductors

Time-Resolved Cathodoluminescence in a Transmission Electron Microscope

Synthesis and (some) applications of carbon-nanotube-supported pyrolytic carbon nanocones

Micromagnetic Objects and dynamical imaging Interferometry Instrumentation & In situ for Electron Microscopy

Towards ultrafast TEM based on a modified cold-field emission TEM

Measurement of crystalline lattice strain by transmission electron microscopy”

In situ electron microscopy of hard and soft matter

Ultrafast laser-induced field emission from a single carbon nanotube based nanotip

Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotip

Synthesis and applications of individual carbon-nanotube-supported carbon nanocones

Comparaison des modes d'imagerie fond noir TEM et STEM pour l'observation de structures moléculaires

Strain Mapping of Layers and Devices Using Electron Holography

Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitation

Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si Substrate

Determination of strain within Si1-yCy layers grown by CVD on a Si substrate

Comparative molecular dark field modes in cell imaging

Étonnante physique

200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy