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Florent Houdellier

10
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Identifiants chercheurs

Présentation

**Research activities : new instrumental and methodological developments in Transmission Electron Microscopy (TEM)** Since 2022 : In charge of teaching "Advanced geometrical optics" in the 4th year and "Charged particle optics" in the 5th year of the physics department at INSA-Toulouse (70h) 2022 : Accreditation to Supervise Research (Habilitation à Diriger des Recherches-HDR) Since 2020 : CNRS Research Engineer (IRHC) at CEMES-CNRS. 2018-2023 : Director of the CNRS/Hitachi High-Technologies (HHT) Joint laboratory "HC-IUMi" (Hitachi-CNRS Infrastructure for Ultrafast Microscopy) located in CEMES-CNRS, which aims to develop the next generation of ultrafast coherent FE-TEM. 2016-2020 : CNRS Research Engineer (IR1) at CEMES-CNRS. Head of the Characterisation platform and TEM service. Member of the Electron Microscopy research group (I3EM). 2007-2016 : CNRS Research Engineer (IR2) at CEMES-CNRS. Head of the TEM service 2006 - 2007 : Post-doctoral position supported by the European ESTEEM project. Development of new holographic methods with elastic and inelastic electrons. Development of CHEF and EMCD experiments with a Cs-corrected microscope. 2003 - 2006 : PhD thesis at CEMES-CNRS (Centre d’Elaboration de Matériaux et d’Etudes Structurales-Centre National de la Recherche Scientifique) : Development of CBED and high resolution electron holography for strain measurements 1998 - 2003 : Engineering School INSA (Institut National des Sciences Appliquées) Toulouse. Speciality : Nanophysics *Some developments, a selective choice :* - *Dark field Electron Holography :* <http://archives.cnrs.fr/inp/article/469> - *New high brightness carbon nanocone CFEG :* <http://archives.cnrs.fr/inp/article/454> - *I2TEM microscope in collaboration with Hitachi High-Technologies (HHT) :*<http://archives.cnrs.fr/inp/article/584>, <https://videotheque.cnrs.fr/visio=4086> - *Partnership between CEMES- CNRS and HHT :* <http://archives.cnrs.fr/inp/article/389> - *New high brightness ultrafast CFEG :* <https://inp.cnrs.fr/fr/cnrsinfo/nouvelle-source-delectrons-pour-la-microscopie-electronique> - *CNRS-HHT joint laboratory :* <http://archives.cnrs.fr/presse/article/5654>, <http://www.cnrs.fr/fr/un-nouveau-microscope-de-pointe-inaugure-au-cemes-cnrs> *Awards :* 2020: CNRS Cristal award 2019: Ernst Ruska prize of the German Microscopy Society (DGE) 2019: European Microscopy Society (EMS) 2018 outstanding paper award 2006: Pierre Favard Award of the French Microscopy Society (Sfmu)

Publications

nikolay-cherkashin

Time-Resolved Cathodoluminescence in a Transmission Electron Microscope

Sophie Meuret , Nikolay Cherkashin , L. H. G. Tizei , Yves Auad , Sébastien J. Weber
11th International Conference on Metamaterials, Photonic Crystals and Plasmonics (META 2021), Jul 2021, Warsaw, Poland
Communication dans un congrès hal-04449931v1

Measurement of crystalline lattice strain by transmission electron microscopy”

Nikolay Cherkashin , Florent Houdellier , Martin Hÿtch , Maxim Korytov
14ème colloque de la Société Française des Microscopies, Jun 2015, Nice, France
Communication dans un congrès hal-01763051v1

Strain Mapping of Layers and Devices Using Electron Holography

Alain Claverie , Nikolay Cherkashin , Florian Hüe , Shay Reboh , Florent Houdellier
ECS Trans. 2010, 2010, Unknown, Unknown Region. ⟨10.1149/1.3487533⟩
Communication dans un congrès hal-01736051v1

Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si Substrate

Nikolay Cherkashin , Adrien Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch
ECS Transactions, May 2008, Unknown, Unknown Region. ⟨10.1149/1.2911510⟩
Communication dans un congrès hal-01736065v1

Determination of strain within Si1-yCy layers grown by CVD on a Si substrate

Nikolay Cherkashin , A. Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch
Symposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. pp.12-19, ⟨10.1557/PROC-1026-C07-03⟩
Communication dans un congrès hal-01736057v1

Dark-Field Electron Holography for Strain Mapping

Martin Hÿtch , Florent Houdellier , Nikolay Cherkashin , Shay Reboh , Elsa Javon
Alain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩
Chapitre d'ouvrage hal-01736026v1