Florent Houdellier

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Identifiants chercheurs

florent-houdellier
0000-0002-5272-7792
IdRef : 111155878

Présentation

**Research activities : new instrumental and methodological developments in Transmission Electron Microscopy (TEM)** Since 2022 : In charge of teaching "Advanced geometrical optics" in the 4th year and "Charged particle optics" in the 5th year of the physics department at INSA-Toulouse (70h) 2022 : Accreditation to Supervise Research (Habilitation à Diriger des Recherches-HDR) Since 2020 : CNRS Research Engineer (IRHC) at CEMES-CNRS. 2018-2023 : Director of the CNRS/Hitachi High-Technologies (HHT) Joint laboratory "HC-IUMi" (Hitachi-CNRS Infrastructure for Ultrafast Microscopy) located in CEMES-CNRS, which aims to develop the next generation of ultrafast coherent FE-TEM. 2016-2020 : CNRS Research Engineer (IR1) at CEMES-CNRS. Head of the Characterisation platform and TEM service. Member of the Electron Microscopy research group (I3EM). 2007-2016 : CNRS Research Engineer (IR2) at CEMES-CNRS. Head of the TEM service 2006 - 2007 : Post-doctoral position supported by the European ESTEEM project. Development of new holographic methods with elastic and inelastic electrons. Development of CHEF and EMCD experiments with a Cs-corrected microscope. 2003 - 2006 : PhD thesis at CEMES-CNRS (Centre d’Elaboration de Matériaux et d’Etudes Structurales-Centre National de la Recherche Scientifique) : Development of CBED and high resolution electron holography for strain measurements 1998 - 2003 : Engineering School INSA (Institut National des Sciences Appliquées) Toulouse. Speciality : Nanophysics *Some developments, a selective choice :* - *Dark field Electron Holography :* <http://archives.cnrs.fr/inp/article/469> - *New high brightness carbon nanocone CFEG :* <http://archives.cnrs.fr/inp/article/454> - *I2TEM microscope in collaboration with Hitachi High-Technologies (HHT) :*<http://archives.cnrs.fr/inp/article/584>, <https://videotheque.cnrs.fr/visio=4086> - *Partnership between CEMES- CNRS and HHT :* <http://archives.cnrs.fr/inp/article/389> - *New high brightness ultrafast CFEG :* <https://inp.cnrs.fr/fr/cnrsinfo/nouvelle-source-delectrons-pour-la-microscopie-electronique> - *CNRS-HHT joint laboratory :* <http://archives.cnrs.fr/presse/article/5654>, <http://www.cnrs.fr/fr/un-nouveau-microscope-de-pointe-inaugure-au-cemes-cnrs> *Awards :* 2020: CNRS Cristal award 2019: Ernst Ruska prize of the German Microscopy Society (DGE) 2019: European Microscopy Society (EMS) 2018 outstanding paper award 2006: Pierre Favard Award of the French Microscopy Society (Sfmu)

Publications

martin-hytch

	Optimization of off-axis electron holography performed with femtosecond electron pulses Florent Houdellier , Giuseppe Mario Caruso , Sébastien J. Weber , M.J. Hÿtch , Christophe Gatel Ultramicroscopy, 2019, ⟨10.1016/j.ultramic.2019.03.016⟩ Article dans une revue hal-02080673v1
	Unlimited acquisition time in electron holography by automated feedback control of transmission electron microscope Christophe Gatel , Julien Dupuy , Florent Houdellier , Martin J. Hÿtch Applied Physics Letters, 2018, 113 (13), ⟨10.1063/1.5050906⟩ Article dans une revue hal-01884057v1
	Differential phase-contrast dark-field electron holography for strain mapping Thibaud Denneulin , Florent Houdellier , Martin Hÿtch Ultramicroscopy, 2016, 160, pp.98-109. ⟨10.1016/j.ultramic.2015.10.002⟩ Article dans une revue hal-01723740v1
	Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection Charudatta Phatak , Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Martin Hÿtch Ultramicroscopy, 2016, 164, pp.24--30. ⟨10.1016/j.ultramic.2016.03.005⟩ Article dans une revue hal-01430579v1
	Realization of a tilted reference wave for electron holography by means of a condenser biprism Falk Röder , Florent Houdellier , Thibaud Denneulin , Etienne Snoeck , Martin Hÿtch Ultramicroscopy, 2016, 161, pp.23 - 40. ⟨10.1016/j.ultramic.2015.11.004⟩ Article dans une revue hal-01404505v1
	Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , S Mamishin Ultramicroscopy, 2015, 151, pp.107--115. ⟨10.1016/j.ultramic.2014.11.021⟩ Article dans une revue hal-01430585v1
	Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing Ludvig de Knoop , Christophe Gatel , Florent Houdellier , Marc Monthioux , Aurélien Masseboeuf Applied Physics Letters, 2015, 106 (26), pp.263101. ⟨10.1063/1.4923245⟩ Article dans une revue hal-01430586v2
	Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes Etienne Snoeck , Florent Houdellier , Yoshifumi Taniguch , Aurélien Masseboeuf , Christophe Gatel Microscopy and Microanalysis, 2014, 20 (S3), pp.932--933. ⟨10.1017/S1431927614006382⟩ Article dans une revue hal-01430589v1
	Determining the work function of a carbon-cone cold-field emitter by in situ electron holography Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Aurélien Masseboeuf , Marc Monthioux Micron, 2014, 63, pp.2--8. ⟨10.1016/j.micron.2014.03.005⟩ Article dans une revue hal-01430588v1
	Dynamical effects in strain measurements by dark-field electron holography Elsa Javon , Axel Lubk , Robin Cours , Shay Reboh , Nikolay Cherkashin Ultramicroscopy, 2014, 147, pp.70-85. ⟨10.1016/j.ultramic.2014.06.005⟩ Article dans une revue hal-01721158v1
	Mechanics of silicon nitride thin-film stressors on a transistor-like geometry Shay Reboh , P. Morin , Martin Hÿtch , Florent Houdellier , Alain Claverie APL Materials, 2013, 1 (4), ⟨10.1063/1.4826545⟩ Article dans une revue hal-01724108v1
	A new linear transfer theory and characterization method for image detectors. Part II: Experiment Axel Lubk , Falk Röder , Tore Niermann , Christophe Gatel , Sébastien Joulié Ultramicroscopy, 2012, 115, pp.78 - 87. ⟨10.1016/j.ultramic.2012.01.011⟩ Article dans une revue hal-01742051v1
	New carbon cone nanotip for use in a highly coherent cold field emission electron microscope Florent Houdellier , Aurélien Masseboeuf , Marc Monthioux , Martin Hÿtch Carbon, 2012, 50 (5), pp.2037-2044. ⟨10.1016/j.carbon.2012.01.023⟩ Article dans une revue hal-00678407v1
	Dark-field electron holography for the measurement of geometric phase Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Ultramicroscopy, 2011, 111 (8), pp.1328 - 1337. ⟨10.1016/j.ultramic.2011.04.008⟩ Article dans une revue hal-01742047v1
	Strain mapping in layers and devices by electron holography Martin Hÿtch , Nikolay Cherkashin , Shay Reboh , Florent Houdellier , Alain Claverie physica status solidi (a), 2011, 208 (3), pp.580-583. ⟨10.1002/pssa.201000281⟩ Article dans une revue hal-01736038v1
	Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Journal of Physics: Conference Series, 2010, 241, pp.012027. ⟨10.1088/1742-6596/241/1/012027⟩ Article dans une revue hal-01742031v1
	Visualising alloy fluctuations by spherical-aberration–corrected HRTEM Marie-José Casanove , Nicolas Combe , Florent Houdellier , Martin Hÿtch EPL - Europhysics Letters, 2010, 91 (3), ⟨10.1209/0295-5075/91/36001⟩ Article dans une revue hal-01742039v1
	End of range defects in Ge S. Koffel , Nikolay Cherkashin , Florent Houdellier , Martin Hÿtch , Gérard Benassayag Journal of Applied Physics, 2009, 105, pp.126110. ⟨10.1063/1.3153985⟩ Article dans une revue hal-01736054v1
	Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography Florian Hüe , Martin Hÿtch , Florent Houdellier , Hugo Bender , Alain Claverie Applied Physics Letters, 2009, 95 (7), pp.73103 - 73103. ⟨10.1063/1.3192356⟩ Article dans une revue hal-01742020v1
	Selective growth of tensily strained Si1−yCy films on patterned Si substrates A. Gouye , Florian Hüe , A. Halimaoui , O. Kermarrec , Y. Campidelli Materials Science in Semiconductor Processing, 2009, 12 (1-2), pp.34 - 39. ⟨10.1016/j.mssp.2009.07.006⟩ Article dans une revue hal-01742015v1
	On the influence of elastic strain on the accommodation of carbon atoms into substitutional sites in strained Si:C layers grown on Si substrates Nikolay Cherkashin , Martin Hÿtch , Florent Houdellier , Florian Hüe , Vincent Paillard Applied Physics Letters, 2009, 94 (14), pp.141910. ⟨10.1063/1.3116648⟩ Article dans une revue hal-00417300v1
	Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique Bénédicte Warot-Fonrose , Florent Houdellier , Martin Hÿtch , Lionel Calmels , Virginie Serin Ultramicroscopy, 2008, 108 (5), pp.393 - 398. ⟨10.1016/j.ultramic.2007.05.013⟩ Article dans une revue hal-01707847v1
	Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy Florian Hüe , Martin Hÿtch , Hugo Bender , Florent Houdellier , Alain Claverie Physical Review Letters, 2008, 100 (15), ⟨10.1103/PhysRevLett.100.156602⟩ Article dans une revue hal-01741994v1
	Lateral epitaxial growth of germanium on silicon oxide D. Cammilleri , V. Yam , F. Fossard , C. Renard , D. Bouchier Applied Physics Letters, 2008, 93 (4), pp.43110 - 43110. ⟨10.1063/1.2963363⟩ Article dans une revue hal-01742002v1
	Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography Florian Hüe , Martin Hÿtch , Florent Houdellier , Etienne Snoeck , Alain Claverie Materials Science and Engineering: B, 2008, 154-155, pp.221 - 224. ⟨10.1016/j.mseb.2008.10.020⟩ Article dans une revue hal-01742010v1
	Nanoscale holographic interferometry for strain measurements in electronic devices Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Nature, 2008, 453 (7198), pp.1086 - 1089. ⟨10.1038/nature07049⟩ Article dans une revue hal-01742001v1
	Lateral growth of monocrystalline Ge on silicon oxide by ultrahigh vacuum chemical vapor deposition V. D. Cammilleri , V. Yam , F. Fossard , C. Renard , D. Bouchier Materials Science in Semiconductor Processing, 2008, 11 (5-6), pp.214-216. ⟨10.1016/j.mssp.2008.07.003⟩ Article dans une revue hal-01293141v1
	Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF) Florent Houdellier , Martin Hÿtch Ultramicroscopy, 2008, 108 (3), pp.285 - 294. ⟨10.1016/j.ultramic.2007.08.016⟩ Article dans une revue hal-01707842v1
	Experimental application of sum rules for electron energy loss magnetic chiral dichroism Lionel Calmels , Florent Houdellier , Bénédicte Warot-Fonrose , Christophe Gatel , Martin Hÿtch Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2007, 76 (6), ⟨10.1103/PhysRevB.76.060409⟩ Article dans une revue hal-01741982v1
	Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy Florent Houdellier , Martin Hÿtch Microelectronic Engineering, 2007, 84 (3), pp.460 - 463. ⟨10.1016/j.mee.2006.10.062⟩ Article dans une revue hal-01741980v1
	High-resolution electron holography for the study of composition and strain in thin film semiconductors Florent Houdellier , Martin Hÿtch , Etienne Snoeck , Marie-José Casanove Materials Science and Engineering: B, 2006, 135 (3), pp.188 - 191. ⟨10.1016/j.mseb.2006.08.035⟩ Article dans une revue hal-01741978v1

	In situ electron microscopy of hard and soft matter Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Aurélien Masseboeuf , Marc Monthioux Joint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela Communication dans un congrès hal-02123302v1
	Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotip Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , Shuichi Mamishin PICO-2015, Apr 2015, Jülich, Netherlands Communication dans un congrès hal-02123316v1
	Measurement of crystalline lattice strain by transmission electron microscopy” Nikolay Cherkashin , Florent Houdellier , Martin Hÿtch , Maxim Korytov 14ème colloque de la Société Française des Microscopies, Jun 2015, Nice, France Communication dans un congrès hal-01763051v1
	Synthesis and applications of individual carbon-nanotube-supported carbon nanocones Marc Monthioux , Mathieu Delmas , Florent Houdellier , Thierry Ondarçuhu , Aurélien Masseboeuf IEEE Nanotechnology Materials and Devices Conference, Oct 2014, Aci Castello, Italy Communication dans un congrès hal-02123308v1
	Strain Mapping of Layers and Devices Using Electron Holography Alain Claverie , Nikolay Cherkashin , Florian Hüe , Shay Reboh , Florent Houdellier ECS Trans. 2010, 2010, Unknown, Unknown Region. ⟨10.1149/1.3487533⟩ Communication dans un congrès hal-01736051v1
	Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si Substrate Nikolay Cherkashin , Adrien Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch ECS Transactions, May 2008, Unknown, Unknown Region. ⟨10.1149/1.2911510⟩ Communication dans un congrès hal-01736065v1
	Determination of strain within Si1-yCy layers grown by CVD on a Si substrate Nikolay Cherkashin , A. Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch Symposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. pp.12-19, ⟨10.1557/PROC-1026-C07-03⟩ Communication dans un congrès hal-01736057v1

	Dark-Field Electron Holography for Strain Mapping Martin Hÿtch , Florent Houdellier , Nikolay Cherkashin , Shay Reboh , Elsa Javon Alain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩ Chapitre d'ouvrage hal-01736026v1
	CHAPTER 6 - Aberration Correction With the SACTEM-Toulouse: From Imaging to Diffraction Florent Houdellier , Martin Hÿtch , Florian Hüe , Etienne Snoeck P.W.Hawkes. Advances in Imaging and Electron Physics vol 153, 153, Academic press, 2008, Aberration-Corrected Electron Microscopy, 978-0-12-374220-9. ⟨10.1016/S1076-5670(08)01006-9⟩ Chapitre d'ouvrage hal-01742322v1

Florent Houdellier

Présentation

Publications

Optimization of off-axis electron holography performed with femtosecond electron pulses

Unlimited acquisition time in electron holography by automated feedback control of transmission electron microscope

Differential phase-contrast dark-field electron holography for strain mapping

Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection

Realization of a tilted reference wave for electron holography by means of a condenser biprism

Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip

Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing

Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes

Determining the work function of a carbon-cone cold-field emitter by in situ electron holography

Dynamical effects in strain measurements by dark-field electron holography

Mechanics of silicon nitride thin-film stressors on a transistor-like geometry

A new linear transfer theory and characterization method for image detectors. Part II: Experiment

New carbon cone nanotip for use in a highly coherent cold field emission electron microscope

Dark-field electron holography for the measurement of geometric phase

Strain mapping in layers and devices by electron holography

Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations

Visualising alloy fluctuations by spherical-aberration–corrected HRTEM

End of range defects in Ge

Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography

Selective growth of tensily strained Si1−yCy films on patterned Si substrates

On the influence of elastic strain on the accommodation of carbon atoms into substitutional sites in strained Si:C layers grown on Si substrates

Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique

Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy

Lateral epitaxial growth of germanium on silicon oxide

Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography

Nanoscale holographic interferometry for strain measurements in electronic devices

Lateral growth of monocrystalline Ge on silicon oxide by ultrahigh vacuum chemical vapor deposition

Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF)

Experimental application of sum rules for electron energy loss magnetic chiral dichroism

Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy

High-resolution electron holography for the study of composition and strain in thin film semiconductors

In situ electron microscopy of hard and soft matter

Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotip

Measurement of crystalline lattice strain by transmission electron microscopy”

Synthesis and applications of individual carbon-nanotube-supported carbon nanocones

Strain Mapping of Layers and Devices Using Electron Holography

Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si Substrate

Determination of strain within Si1-yCy layers grown by CVD on a Si substrate

Dark-Field Electron Holography for Strain Mapping

CHAPTER 6 - Aberration Correction With the SACTEM-Toulouse: From Imaging to Diffraction