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Florence Azais

226
Documents

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Multilinear Regression Analysis between Local Bioimpedance Spectroscopy and Fish Morphological Parameters

Vincent Kerzérho , Florence Azaïs , Serge Bernard , Sylvain Bonhommeau , Blandine Brisset
Article dans une revue lirmm-03970313v1
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On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
Journal of Electronic Testing: : Theory and Applications, 2023, 39, pp.155-170. ⟨10.1007/s10836-023-06058-7⟩
Article dans une revue lirmm-04080259v1
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Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
Journal of Electronic Testing: : Theory and Applications, 2021, 37 (2), pp.225-242. ⟨10.1007/s10836-021-05934-4⟩
Article dans une revue lirmm-03426173v1
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Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition

Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021, 40 (11), pp.2400-2410. ⟨10.1109/TCAD.2020.3043318⟩
Article dans une revue lirmm-03426162v1
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Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
Journal of Electronic Testing: : Theory and Applications, 2020, 36 (2), pp.189-203. ⟨10.1007/s10836-020-05868-3⟩
Article dans une revue lirmm-03000864v1
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Low-Cost Digital Test Solution for Symbol Error Detection of RF ZigBee Transmitters

Thibault Vayssade , Florence Azaïs , Laurent Latorre , Francois Lefèvre
IEEE Transactions on Device and Materials Reliability, 2019, 19 (1), pp.16-24. ⟨10.1109/TDMR.2019.2898769⟩
Article dans une revue lirmm-02077048v1

Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies

Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2019, 35 (1), pp.59-75. ⟨10.1007/s10836-019-05776-1⟩
Article dans une revue lirmm-02075690v1
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On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints

Stéphane David-Grignot , Achraf Lamlih , Mohamed Moez Belhaj , Vincent Kerzérho , Florence Azaïs
Journal of Electronic Testing: : Theory and Applications, 2018, 34 (3), pp.281-290. ⟨10.1007/s10836-018-5710-4⟩
Article dans une revue lirmm-01706621v1

Influence of Body-Biasing, Supply Voltage, and Temperature on the Detection of Resistive Short Defects in FDSOI Technology

Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell
IEEE Transactions on Nanotechnology, 2017, 16 (3), pp.417-430. ⟨10.1109/TNANO.2017.2664895⟩
Article dans une revue hal-01709588v1

Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies

Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2017, 33 (4), pp.515-527. ⟨10.1007/s10836-017-5674-9⟩
Article dans une revue hal-01709587v1

SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE

Florence Azaïs , Stéphane David-Grignot , Laurent Latorre , François Lefevre
Journal of Electronic Testing: : Theory and Applications, 2016, 32 (1), pp.69-82. ⟨10.1007/s10836-015-5556-y⟩
Article dans une revue lirmm-01347312v1

Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits

Florence Azaïs , Stéphane David-Grignot , Laurent Latorre , François Lefevre
Journal of Circuits, Systems, and Computers, 2016, 25 (3), pp.#1640014. ⟨10.1142/S0218126616400144⟩
Article dans une revue lirmm-01233013v1

Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies

Syhem Larguech , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
Microelectronics Journal, 2015, 46 (11), pp.1091-1102. ⟨10.1016/j.mejo.2015.09.014⟩
Article dans une revue lirmm-01232890v1

Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range

Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre
Journal of Electronic Testing: : Theory and Applications, 2015, 31 (5-6), pp.443-459. ⟨10.1007/s10836-015-5548-y⟩
Article dans une revue lirmm-01233017v1

Testing for Gate Oxide Short Defects using the Detectability Interval Paradigm

Jean-Marc J.-M. Galliere , Florence Azaïs , Mariane Comte , Michel Renovell
Information Technology, 2014, 56 (4), pp.173-181. ⟨10.1515/itit-2013-1040⟩
Article dans une revue hal-01167054v1
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Enhancing Confidence in Indirect Analog/RF Testing against the Lack of Correlation between Regular Parameters and Indirect Measurements

Haithem Ayari , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
Microelectronics Journal, 2014, 45 (3), pp.336-344. ⟨10.1016/j.mejo.2013.12.006⟩
Article dans une revue lirmm-00936443v1

Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers

Ahmed Rekik , Florence Azaïs , Frédérick Mailly , Pascal Nouet
Journal of Electronic Testing: : Theory and Applications, 2014, 30 (1), pp.87-100. ⟨10.1007/s10836-013-5423-7⟩
Article dans une revue lirmm-00984275v1
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A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC

Vincent Kerzérho , Serge Bernard , Florence Azaïs , Mariane Comte , Olivier Potin
Microelectronics Journal, 2013, 44 (9), pp.840-843. ⟨10.1016/j.mejo.2013.06.009⟩
Article dans une revue lirmm-00875985v1

A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level

Ahmed Rekik , Florence Azaïs , Norbert Dumas , Frédérick Mailly , Pascal Nouet
Journal of Electronic Testing: : Theory and Applications, 2011, 27 (3), pp.411-423. ⟨10.1007/s10836-011-5207-x⟩
Article dans une revue lirmm-00702741v1
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Digital Test Method for Embedded Converters with Unknown-Phase Harmonics

Vincent Kerzérho , Mariane Comte , Florence Azaïs , Philippe Cauvet , Serge Bernard
Journal of Electronic Testing: : Theory and Applications, 2011, 27 (3), pp.335-350. ⟨10.1007/s10836-011-5194-y⟩
Article dans une revue lirmm-00609243v1

A Level-Crossing Approach for the Analysis of RF Modulated Signals using only Digital Test Resources

Nicolas Pous , Florence Azaïs , Laurent Latorre , Jochen Rivoir
Journal of Electronic Testing: : Theory and Applications, 2011, 27 (3), pp.289-303. ⟨10.1007/s10836-011-5222-y⟩
Article dans une revue lirmm-00702746v1

Study of an electrical setup for capacitive MEMS accelerometers test and calibration

Norbert Dumas , Florence Azaïs , Frédérick Mailly , Pascal Nouet
Journal of Electronic Testing: : Theory and Applications, 2010, 26-1, pp.111-125. ⟨10.1007/s10836-009-5122-6⟩
Article dans une revue lirmm-00432757v1

Characterization of the Transient Behavior of Gated/STI Diodes and their Associated BJT in the CDM Time Domain

Jean-Robert Manouvrier , Pascal Fonteneau , Charles-Alexandre Legrand , Pascal Nouet , Florence Azaïs
Microelectronics Reliability, 2009, 49 (12), pp.1424-1432. ⟨10.1016/j.microrel.2009.06.056⟩
Article dans une revue lirmm-00435866v1
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ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator

Vincent Kerzérho , Philippe Cauvet , Serge Bernard , Florence Azaïs , Michel Renovell
VLSI Design, 2008, 2008 (#482159), ⟨10.1155/2008/482159⟩
Article dans une revue lirmm-00346722v1
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Fully Digital Test Solution for a Set of ADCs and DACs embedded in a SiP or SoC

Vincent Kerzérho , Philippe Cauvet , Serge Bernard , Florence Azaïs , Mariane Comte
IET Computers & Digital Techniques, 2007, 1 (3), pp.146-153. ⟨10.1049/iet-cdt:20060136⟩
Article dans une revue lirmm-00195172v1

Sensor Testing Through Bias Superposition

Carl Jeffrey , Norbert Dumas , Zhou Xu , Frédérick Mailly , Florence Azaïs
Sensors and Actuators A: Physical , 2007, 136 (1), pp.441-455. ⟨10.1016/j.sna.2006.11.030⟩
Article dans une revue lirmm-00177756v1

Electro-Thermal Short Pulsed Simulation for SOI Technology

Christophe Entringer , Philippe Flatresse , Philippe Galy , Florence Azaïs , Pascal Nouet
Microelectronics Reliability, 2006, 46 (9-11), pp.1482-1485. ⟨10.1016/j.microrel.2006.07.015⟩
Article dans une revue lirmm-00128255v1

Electro-thermal stimuli for MEMS testing in FSBM technology

Norbert Dumas , Florence Azaïs , Laurent Latorre , Pascal Nouet
Journal of Electronic Testing: : Theory and Applications, 2006, 22 (2), pp.189-198. ⟨10.1007/s10836-005-6132-7⟩
Article dans une revue lirmm-00112942v1
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A Novel DFT Technique to Test a Complete Set of ADC's and DAC's Embedded in a Complex SiP

Serge Bernard , Vincent Kerzérho , Philippe Cauvet , Florence Azaïs , Mariane Comte
IEEE Design & Test of Computers, 2006, 23 (3), pp.237-243. ⟨10.1109/MDT.2006.59⟩
Article dans une revue lirmm-00115131v1

A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters

Florence Azaïs , Marcelo Lubaszewski , Pascal Nouet , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2005, 21 (1), pp.9-16. ⟨10.1007/s10836-005-5283-x⟩
Article dans une revue lirmm-00105328v1

Built-In Self-Test of Global Interconnects of Field Programmable Analog Arrays

Antonio Andrade , Gustavo Vieira , Tiago Balen , Marcelo Lubaszewski , Florence Azaïs
Microelectronics Journal, 2005, 36 (12), pp.1112-1123. ⟨10.1016/j.mejo.2005.06.001⟩
Article dans une revue lirmm-00367974v1

Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications

Florence Azaïs , Serge Bernard , Mariane Comte , Yves Bertrand , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2005, 21 (3), pp.291-298. ⟨10.1007/s10836-005-6358-4⟩
Article dans une revue lirmm-00105322v1

Delay Testing Viability of Gate Oxide Short Defect

Jean-Marc J.-M. Galliere , Michel Renovell , Florence Azaïs , Yves Bertrand
Journal of Computer Science and Technology, 2005, 20 (2), pp.195-200. ⟨10.1007/s11390-005-0195-x⟩
Article dans une revue lirmm-00105323v1

Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks

Tiago R. Balen , Antonio Andrade Jr. , Florence Azaïs , Marcelo Lubaszewski , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2005, 21 (2), pp.135-146. ⟨10.1007/s10836-005-6143-4⟩
Article dans une revue lirmm-00105334v1

A New Multi-Finger SCR-Based Structure for Efficient On-Chip ESD Protection

Florence Azaïs , Benjamin Caillard , Stéphanie Dournelle , Pascal Salomé , Pascal Nouet
Microelectronics Reliability, 2005, 45 (2), pp.233-243. ⟨10.1016/j.microrel.2004.05.011⟩
Article dans une revue lirmm-00105321v1

Viability of a Delay Testing of Gate Oxide Short Transistors

Jean-Marc J.-M. Galliere , Michel Renovell , Florence Azaïs , Yves Bertrand
Journal of Computer Science and Technology, 2005, 20 (2), pp.6. ⟨10.1007/s11390-005-0195-x⟩
Article dans une revue lirmm-00370370v1

Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors

Mariane Comte , Florence Azaïs , Yves Bertrand , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2004, Vol. 20 n°3, pp. 257-267. ⟨10.1023/B:JETT.0000029459.74815.56⟩
Article dans une revue hal-00004514v1

A Compact DC Model of Gate Oxide Short Defect

Rachid Bouchakour , Jean-Michel Portal , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand
Microelectronic Engineering, 2004, 72 (1-4), pp.140-148. ⟨10.1016/j.mee.2003.12.051⟩
Article dans une revue lirmm-00108564v1
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Automated Diagnosis and Probing Flow for Fast Fault Localization in IC

Da. Martin , Romain Desplats , Gérard Haller , Florence Azaïs , Pascal Nouet
Microelectronics Reliability, 2004, 44 (9/11), pp.1553-1558. ⟨10.1016/j.microrel.2004.07.057⟩
Article dans une revue lirmm-00108546v1
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Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure

Florence Azaïs , Serge Bernard , Yves Bertrand , Mariane Comte , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2004, 20 (4), pp.375-387. ⟨10.1023/B:JETT.0000039605.02565.ef⟩
Article dans une revue lirmm-00108545v1

Modeling the Random Parameter Effects in a Non-Split Model of Gate Oxide Short

Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand
Journal of Electronic Testing: : Theory and Applications, 2003, 19 (4), pp. 377-386. ⟨10.1023/A:1024683708105⟩
Article dans une revue lirmm-00269754v1

Extending IEEE Std. 1149.4 analog boundary modules to enhance mixed-signal test

Uroš Kač , Franc Novak , Florence Azaïs , Pascal Nouet , Michel Renovell
IEEE Design & Test, 2003, 20 (2), pp.32-39. ⟨10.1109/MDT.2003.1188260⟩
Article dans une revue lirmm-00269600v1

On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST

Serge Bernard , Florence Azaïs , Yves Bertrand , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2003, 19 (4), pp. 469-479. ⟨10.1023/A:1024652328578⟩
Article dans une revue lirmm-00269602v1

An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs

Florence Azaïs , Yves Bertrand , Michel Renovell , André Ivanov , Sassan Tabatabaei
IEEE Design & Test, 2003, 20 (1), pp.60-67. ⟨10.1109/MDT.2003.1173054⟩
Article dans une revue lirmm-00269822v1

A-to-D Converter Static Error Detection from Dynamic Parameter Measurements

Florence Azaïs , Serge Bernard , Yves Bertrand , Mariane Comte , Michel Renovell
Microelectronics Journal, 2003, 34 (10), pp. 945-953. ⟨10.1016/S0026-2692(03)00161-7⟩
Article dans une revue lirmm-00269601v1

Analog Built-In Saw-Tooth Generator for ADC Histogram Test

Florence Azaïs , Serge Bernard , Yves Bertrand , Michel Renovell
Microelectronics Journal, 2002, 33 (10), pp.781-789. ⟨10.1016/S0026-2692(02)00090-3⟩
Article dans une revue lirmm-00268587v1

Improving Defect Detection in Static-Voltage Testing

Michel Renovell , Florence Azaïs , Yves Bertrand
IEEE Design & Test, 2002, 17 (6), pp.83-89. ⟨10.1109/MDT.2002.1047747⟩
Article dans une revue lirmm-00268605v1
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Low-cost digital solution for production test of ZigBee transmitters - Special Session “AMS-RF testing”

Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre
LATS 2023 - IEEE 24th Latin American Test Symposium, Mar 2023, Veracruz, Mexico. pp.1-2, ⟨10.1109/LATS58125.2023.10154484⟩
Communication dans un congrès lirmm-04257082v1

Leveraging Layout-based Effects for Locking Analog ICs

Muayad Aljafar , Florence Azaïs , Marie-Lise Flottes , Samuel Pagliarini
ASHES 2022 - 6th Workshop on Attacks and Solutions in Hardware Security @CCS 2022, Nov 2022, Los Angeles, CA, United States. pp.5-13, ⟨10.1145/3560834.3563826⟩
Communication dans un congrès lirmm-04080258v1
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Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli

Thibault Vayssade , Mouhamad Chehaitly , Florence Azaïs , Laurent Latorre , François Lefèvre
ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-6, ⟨10.1109/ETS50041.2021.9465473⟩
Communication dans un congrès lirmm-03426321v1
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Digital test of ZigBee transmitters: Validation in industrial test environment

Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre
DATE 2021 - 24th Design, Automation and Test in Europe Conference and Exhibition, Feb 2021, Grenoble, France. pp.396-401, ⟨10.23919/DATE51398.2021.9474090⟩
Communication dans un congrès lirmm-03426209v1
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Exploring on-line RF performance monitoring based on the indirect test strategy

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
LATS 2021 - IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este (virtual), Uruguay. pp.1-7, ⟨10.1109/LATS53581.2021.9651743⟩
Communication dans un congrès lirmm-03426373v1
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Low-cost testing of a 2.4GHz ZigBee transmitter using standard digital ATE

Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre
ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia
Communication dans un congrès lirmm-03001537v1
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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

Florence Azaïs , Serge Bernard , Mariane Comte , Bastien Deveautour , Sophie Dupuis
IOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩
Communication dans un congrès lirmm-02993384v1
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Implementing indirect test of RF circuits without compromising test quality: a practical case study

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
LATS 2020 - 21st IEEE Latin American Test Symposium, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093666⟩
Communication dans un congrès lirmm-03000910v1
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EVM measurement of RF ZigBee transceivers using standard digital ATE

Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre
DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250900⟩
Communication dans un congrès lirmm-03000882v1
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Indirect test of RF circuits using ensemble methods

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia
Communication dans un congrès lirmm-03001530v1
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The use of ensemble methods for indirect test of RF circuits

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
13e Colloque National du GDR SOC², Jun 2019, Montpellier, France
Communication dans un congrès lirmm-02375900v1
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Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition

Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefevre
ETS 2019 - 24th IEEE European Test Symposium, May 2019, Baden-Baden, Germany. ⟨10.1109/ETS.2019.8791540⟩
Communication dans un congrès lirmm-02274367v1

Test of 2.4 GHz ZigBee Transmitter using Standard Digital ATE

Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefevre
SETS 2019 - South European Test Seminar, 2019, Pitztal, Austria
Communication dans un congrès lirmm-02375880v1
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Which metrics to use for RF indirect test strategy?

Hassan El Badawi , Mariane Comte , Florence Azaïs , Vincent Kerzérho , Serge Bernard
SMACD 2019 - 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jul 2019, Lausanne, Switzerland. pp.73-76, ⟨10.1109/SMACD.2019.8795302⟩
Communication dans un congrès lirmm-02338027v1

The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated Circuits

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
SETS 2019 - South European Test Seminar, 2019, Pitztal, Austria
Communication dans un congrès lirmm-02375866v1
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Use of ensemble methods for indirect test of RF circuits: can it bring benefits?

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. pp.1-6, ⟨10.1109/LATW.2019.8704641⟩
Communication dans un congrès lirmm-02338047v1
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Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE

Thibault Vayssade , Florence Azaïs , Laurent Latorre , Francois Lefèvre
IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d'Aro, Spain. pp.17-22, ⟨10.1109/IOLTS.2018.8474229⟩
Communication dans un congrès lirmm-01997910v1

Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies

Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell
LATS 2018 - 19th IEEE Latin American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349696⟩
Communication dans un congrès lirmm-02064921v1
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Analytical Study of On-chip Generations of Analog Sine-wave Based on Combined Digital Signals

Stéphane David-Grignot , Achraf Lamlih , Vincent Kerzérho , Florence Azaïs , Fabien Soulier
IMSTW: International Mixed Signals Testing Workshop, Jul 2017, Thessaloniki, Greece. ⟨10.1109/IMS3TW.2017.7995205⟩
Communication dans un congrès lirmm-01699387v1

Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions

Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell
ETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩
Communication dans un congrès hal-01709615v1

Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology

Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩
Communication dans un congrès hal-01709614v1

Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurations

Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩
Communication dans un congrès lirmm-01374292v1

Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect

Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell
LATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩
Communication dans un congrès lirmm-01374300v1

A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition

Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre
ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. pp.1-6, ⟨10.1109/ETS.2015.7138761⟩
Communication dans un congrès lirmm-01233093v1

A framework for efficient implementation of analog/RF alternate test with model redundancy

Syhem Larguech , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.621-626, ⟨10.1109/ISVLSI.2015.30⟩
Communication dans un congrès lirmm-01233104v1

Embedded test instrument for on-chip phase noise evaluation of analog/IF signals

Florence Azaïs , Stéphane David-Grignot , Laurent Latorre , François Lefevre
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.237-242, ⟨10.1109/DDECS.2015.11⟩
Communication dans un congrès lirmm-01233136v1

A generic methodology for building efficient prediction models in the context of alternate testing

Syhem Larguech , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177873⟩
Communication dans un congrès lirmm-01233150v1

Digital on-chip measurement circuit for built-in phase noise testing

Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre
IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177880⟩
Communication dans un congrès lirmm-01233161v1

Toward adaptation of ADCs to operating conditions through on-chip correction

Vincent Kerzérho , Ludovic Guillaume-Sage , Florence Azaïs , Mariane Comte , Michel Renovell
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639, ⟨10.1109/ISVLSI.2015.62⟩
Communication dans un congrès lirmm-01233117v1
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Special session: Hot topics: Statistical test methods

Manuel J. Barragan , Gildas Leger , Florence Azaïs , R. D. Blanton , Adit D. Singh
VTS: VLSI Test Symposium, Apr 2015, Napa, CA, United States. ⟨10.1109/VTS.2015.7116265⟩
Communication dans un congrès hal-01177043v1

A digital technique for the evaluation of SSB phase noise of analog/RF signals

Florence Azaïs , Stéphane David-Grignot , François Lefevre , Laurent Latorre
LATS: Latin-American Test Symposium, Mar 2015, Puerto Vallarta, Mexico. ⟨10.1109/LATW.2015.7102407⟩
Communication dans un congrès lirmm-01233125v1

Analog test: Why still “à la mode” after more than 25 years of research?

Florence Azaïs
ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138772⟩
Communication dans un congrès lirmm-01922917v1

Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter module

Mouhamadou Dieng , Florence Azaïs , Mariane Comte , Serge Bernard , Vincent Kerzérho
IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. ⟨10.1109/IMS3TW.2014.6997401⟩
Communication dans un congrès lirmm-01119365v1
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New implementions of predictive alternate analog/RF test with augmented model redundancy

Haithem Ayari , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
DATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.144⟩
Communication dans un congrès lirmm-00994714v1

Stochastic model for phase noise measurement from 1-bit signal acquisition

Stéphane David-Grignot , Florence Azaïs , François Lefevre , Laurent Latorre
IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. ⟨10.1109/IMS3TW.2014.6997400⟩
Communication dans un congrès lirmm-01119368v1

Solutions for the self-adaptation of communicating systems in operation

Martin Andraud , Anthony Deluthault , Mouhamadou Dieng , Florence Azaïs , Serge Bernard
IOLTS: International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. pp.234-239, ⟨10.1109/IOLTS.2014.6873705⟩
Communication dans un congrès hal-01118068v1

Self-Adaptive NFC Systems

Vincent Kerzérho , Florence Azaïs , Mouhamadou Dieng , Mariane Comte , Serge Bernard
IOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain
Communication dans un congrès lirmm-01084355v1

Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing

Syhem Larguech , Florence Azaïs , Serge Bernard , Vincent Kerzérho , Mariane Comte
LATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. ⟨10.1109/LATW.2014.6841930⟩
Communication dans un congrès lirmm-01119361v1

Investigations on alternate analog/RF test with model redundancy

Haithem Ayari , Florence Azaïs , Serge Bernard , Vincent Kerzérho , Syhem Larguech
STEM Workshop, May 2014, Paderborn, Germany
Communication dans un congrès lirmm-01119374v1

Low-cost phase noise testing of complex RF ICs using standard digital ATE

Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre
ITC: International Test Conference, Oct 2014, Seattle, WA, United States. ⟨10.1109/TEST.2014.7035301⟩
Communication dans un congrès lirmm-01119356v1

Phase noise measurement on IF analog signals using standard digital ATE resources

Stéphane David-Grignot , Laurent Latorre , Florence Azaïs , François Lefevre
NEWCAS: New Circuits and Systems, Jun 2014, Trois-Rivieres, Canada. pp.121-124, ⟨10.1109/NEWCAS.2014.6933998⟩
Communication dans un congrès lirmm-01119359v1
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MIRID: Mixed-Mode IR-Drop Induced Delay Simulator

Jie Jiang , Marina Aparicio Rodriguez , Mariane Comte , Florence Azaïs , Michel Renovell
ATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. pp.177-182, ⟨10.1109/ATS.2013.41⟩
Communication dans un congrès lirmm-00932357v1
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Accurate and Efficient Analytical Electrical Model of Antenna for NFC Applications

Mouhamadou Dieng , Mariane Comte , Serge Bernard , Vincent Kerzérho , Florence Azaïs
NEWCAS: New Circuits and Systems, Jun 2013, Paris, France. pp.137-141, ⟨10.1109/NEWCAS.2013.6573657⟩
Communication dans un congrès lirmm-00839190v1

Self-test and self-calibration of a MEMS convective accelerometer

Ahmed Rekik , Florence Azaïs , Frédérick Mailly , Pascal Nouet , Mohamed Masmoudi
DTIP: Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2013, Barcelona, Spain. pp.239-242
Communication dans un congrès lirmm-00814231v1

Pre-characterization Procedure for a Mixed Mode Simulation of IR-Drop Induced Delays

Marina Aparicio Rodriguez , Mariane Comte , Florence Azaïs , Michel Renovell , Jie Jiang
LATW: Latin American Test Workshop, Apr 2013, Cordoba, Argentina. ⟨10.1109/LATW.2013.6562657⟩
Communication dans un congrès lirmm-00820067v1

A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing

Syhem Larguech , Florence Azaïs , Serge Bernard , Vincent Kerzérho , Mariane Comte
3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States
Communication dans un congrès lirmm-00985422v1

A MEMS Convective Accelerometer Equipped with On-Chip Facilities for Sensitivity Electrical Calibration

Ahmed Rekik , Florence Azaïs , Norbert Dumas , Frédérick Mailly , Pascal Nouet
IMS3TW'11: IEEE International Mixed-Signals, Sensors and Systems Test Workshop, United States. pp.82-87, ⟨10.1109/IMS3TW.2011.21⟩
Communication dans un congrès lirmm-00702759v1

Making predictive analog/RF alternate test strategy independent of training set size

Haithem Ayari , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.9, ⟨10.1109/TEST.2012.6401560⟩
Communication dans un congrès lirmm-00803564v1
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An IR-Drop Simulation Principle Oriented to Delay Testing

Marina Aparicio Rodriguez , Mariane Comte , Florence Azaïs , Yves Bertrand , Michel Renovell
DCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.404-409
Communication dans un congrès lirmm-00804254v1

On the use of redundancy to reduce prediction error in alternate analog/RF test

Haithem Ayari , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩
Communication dans un congrès lirmm-00803556v1

Low-cost SNR estimation of analog signals using standard digital Automated Test Equipment (ATE)

Florence Azaïs , Laurent Latorre
NEWCAS: International New Circuits and Systems Conference, Jun 2012, Montréal, Canada. pp.197-200, ⟨10.1109/NEWCAS.2012.6328990⟩
Communication dans un congrès lirmm-00803558v1
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Design-for-manufacturability of MEMS convective accelerometers through adaptive electrical calibration strategy

Ahmed Rekik , Florence Azaïs , Frédérick Mailly , Pascal Nouet
LATW: Latin American Test Workshop, Apr 2012, Quito, Ecuador. ⟨10.1109/LATW.2012.6261237⟩
Communication dans un congrès lirmm-00803451v1

Smart selection of indirect parameters for DC-based alternate RF IC testing

Haithem Ayari , Florence Azaïs , Serge Bernard , Mariane Comte , Michel Renovell
VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩
Communication dans un congrès lirmm-00803453v1

Investigation on the Effect of Geometrical Dimensions on the Conductive Behaviour of a MEMS Convective Accelerometer

Ahmed Rekik , Brahim Mezghani , Florence Azaïs , Norbert Dumas , Mohamed Masmoudi
DTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.14-17
Communication dans un congrès lirmm-00632610v1
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An Electrical Test Method for MEMS Convective Accelerometers: Development and Evaluation

Ahmed Rekik , Florence Azaïs , Norbert Dumas , Frédérick Mailly , Pascal Nouet
DATE: Design, Automation and Test in Europe, Mar 2011, Grenoble, France. ⟨10.1109/DATE.2011.5763137⟩
Communication dans un congrès lirmm-00702754v1

Level-Crossing based QAM Demodulation for Low-Cost Analog/RF Testing

Nicolas Pous , Florence Azaïs , Laurent Latorre , Gabriel Confais , Jochen Rivoir
NEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.309-312, ⟨10.1109/NEWCAS.2011.5981317⟩
Communication dans un congrès lirmm-00702763v1

Test and Calibration of MEMS Convective Accelerometers with a Fully Electrical Setup

Ahmed Rekik , Florence Azaïs , Norbert Dumas , Frédérick Mailly , Pascal Nouet
LATW: Latin American Test Workshop, Mar 2011, Porto de Galinhas, Brazil. ⟨10.1109/LATW.2011.5985907⟩
Communication dans un congrès lirmm-00702769v1
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ANC-Based Method for Testing Converters with Random-Phase Harmonics

Vincent Kerzérho , Florence Azaïs , Mariane Comte , Philippe Cauvet , Serge Bernard
IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès lirmm-00494578v1
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AM-Demodulation of Analog/RF Signals Using Digital Tester Channels

Nicolas Pous , Florence Azaïs , Laurent Latorre , Jochen Rivoir
IMS3TW 2010 - 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, Jun 2010, La Grande Motte, France. ⟨10.1109/IMS3TW.2010.5503013⟩
Communication dans un congrès lirmm-00494546v1
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Adaptive LUT-Based System for In Situ ADC Auto-correction

Serge Bernard , Florence Azaïs , Mariane Comte , Olivier Potin , Vincent Kerzérho
IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès lirmm-00494424v1

Experiments on the Analysis of Phase/Frequency-Modulated RF Signals Using Digital Tester Channels

Nicolas Pous , Florence Azaïs , Laurent Latorre , Pascal Nouet , Jochen Rivoir
LATW'10: 11th Latin-American Test Workshop, Punta del Este, Uruguay. pp.N/A
Communication dans un congrès lirmm-00473524v1
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Modeling the Influence of Etching Defects on the Sensitivity of MEMS Convective Accelerometers

Ahmed Rekik , Florence Azaïs , Norbert Dumas , Frédérick Mailly , Pascal Nouet
IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès lirmm-00494555v1
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On the Use of Standard Digital ATE for the Analysis of RF Signals

Nicolas Pous , Florence Azaïs , Laurent Latorre , Jochen Rivoir
ETS 2010 - 15th IEEE European Test Symposium, May 2010, Prague, Czech Republic. pp.43-48, ⟨10.1109/ETSYM.2010.5512782⟩
Communication dans un congrès lirmm-00492828v1

A Study of Package Effects on the Behavior of MEMS Convective Accelerometers

Ahmed Rekik , Florence Azaïs , Norbert Dumas , Mohamed Masmoudi , Frédérick Mailly
DTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, Seville, Spain. pp.6-9
Communication dans un congrès lirmm-00489026v1

LH-BIST for Digital Correction of ADC Offset

Serge Bernard , Florence Azaïs , Mariane Comte , Yves Bertrand , Michel Renovell
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.199-203
Communication dans un congrès lirmm-00375659v1

A Method for Electrical Calibration of MEMS Accelerometers Through Multivariate Regression

Norbert Dumas , Florence Azaïs , Frédérick Mailly , Pascal Nouet
IMS3TW'09: IEEE 15th Mixed-Signals, Sensors and Systems Test Workshop, Jun 2009, pp.N/A
Communication dans un congrès lirmm-00399110v1

Analyzing the Impact of Simultaneous Switching Noise on the Timing Behavior of CMOS Digital Blocks

Florence Azaïs , Yves Bertrand , Michel Renovell
LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A
Communication dans un congrès lirmm-00367718v1
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A Multi-Converter DFT Technique for Complex SIP: Concepts and Validation

Vincent Kerzérho , Philippe Cauvet , Serge Bernard , Florence Azaïs , Mariane Comte
ECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. pp.747-750
Communication dans un congrès lirmm-00448863v1

Investigations on Electrical-only Test Setup for MEMS Convective Accelerometer

Ahmed Rekik , Florence Azaïs , Norbert Dumas , Frédérick Mailly , Pascal Nouet
ICSCS: International Conference on Signals, Circuits and Systems, Nov 2009, Medenine, Tunisia. ⟨10.1109/ICSCS.2009.5412624⟩
Communication dans un congrès lirmm-00436265v1

Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models

Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell , Luigi Dilillo
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229
Communication dans un congrès lirmm-00370798v1

An Analysis of the Timing Behavior of CMOS Digital Blocks under Simultaneous Switching Noise Conditions

Florence Azaïs , Yves Bertrand , Michel Renovell
DDECS'09: IEEE Design and Diagnostics of Electronic Circuits and Systems, Apr 2009, Liberec, Czech Republic. pp.158-163
Communication dans un congrès lirmm-00386906v1

Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals using Digital ATE

Florence Azaïs , Laurent Latorre , Pascal Nouet , Nicolas Pous , Jochen Rivoir
ATS: Asian Test Symposium, 2009, Taichung, Taiwan. pp.261-266, ⟨10.1109/ATS.2009.56⟩
Communication dans un congrès lirmm-00436384v1

Evaluation of a Fully Electrical Test and Calibration Method for MEMS Capacitive Accelerometers

Norbert Dumas , Florence Azaïs , Frédérick Mailly , Pascal Nouet
IMS3TW'08: 14th IEEE International Mixed-Signals, Sensor, and Systems Test Workshop, Jun 2008, Vancouver, Canada, pp.6, ⟨10.1109/IMS3TW.2008.4581616⟩
Communication dans un congrès lirmm-00337875v1

Transit Time Extraction Method for ESD Protection Diodes Model

Jean-Robert Manouvrier , Pascal Fonteneau , Charles-Alexandre Legrand , Pascal Nouet , Florence Azaïs
IEW'08: International ESD Workshop, Port d'Albret, France
Communication dans un congrès lirmm-00337884v1

Use of a Statistical Approach for Efficient Implementation of Oscillation-Based Test Strategy

Aboubacar Chaehoi , Laurent Latorre , Florence Azaïs , Pascal Nouet
IMSTW'03: 9th IEEE International Mixed-Signal Testing Workshop, Sevilla (Spain), France. pp. 99-103
Communication dans un congrès lirmm-00269582v1
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A Novel Method for Test and Calibration of Capacitive Accelerometers with a Fully Electrical Setup

Norbert Dumas , Florence Azaïs , Frédérick Mailly , Andrew Richardson , Pascal Nouet
DDECS 2008 - 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2008, Bratislava, Slovakia. ⟨10.1109/DDECS.2008.4538807⟩
Communication dans un congrès lirmm-00337873v1

On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise

Florence Azaïs , Laurent Larguier , Yves Bertrand , Michel Renovell
LATW'08: 9th Latin-American Test Workshop, Puebla, Mexico, pp.11-16
Communication dans un congrès lirmm-00260194v1

A Physics-Based Compact Model for ESD Protection Diodes under Very Fast Transients

Jean-Robert Manouvrier , Pascal Fonteneau , Charles-Alexandre Legrand , Hélène Beckrich-Ros , Corinne Richier
30th Annual EOS/ESD Symposium, Sep 2008, Tuscon, Arizona, USA, pp.9
Communication dans un congrès lirmm-00337880v1

Caractérisation et Modélisation de Thyristors Parasites en Technologie CMOS Fortement Submicronique

Florence Azaïs , Benjamin Caillard , Pascal Nouet , Pascal Salomé
Colloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 137-140
Communication dans un congrès lirmm-00269319v1

A Novel SCR-Based Protection Structure Against ESD with Efficient Multi-Finger Triggering

Florence Azaïs , Benjamin Caillard , Stéphanie Dournelle , Pascal Nouet , Pascal Salomé
ESSDERC'03: 3rd European Solid-State Device Research Conference, Estoril (Portugal), pp. 207-210
Communication dans un congrès lirmm-00269605v1

European Network for Test Education

Yves Bertrand , Marie-Lise Flottes , Florence Azaïs , Serge Bernard , Laurent Latorre
DELTA'02: 1st International Workshop on Electronic DesignTest and Applications, Christchurch, New Zeland, pp.230-239
Communication dans un congrès lirmm-00268490v1

STMSCR: A New Multi-Finger SCR-Based Protection Structure Against ESD

Benjamin Caillard , Florence Azaïs , Pascal Nouet , Stéphanie Dournelle , Pascal Salomé
EOS/ESD Symposium, Las Vegas (USA), pp. 223-241
Communication dans un congrès lirmm-00269603v1
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On the Detection of SSN-Induced Logic Errors Through On-Chip Monitoring

Florence Azaïs , Laurent Larguier , Yves Bertrand , Michel Renovell
IOLTS: International On-Line Testing Symposium, Jul 2008, Rhodes, Greece. pp.233-238, ⟨10.1109/IOLTS.2008.19⟩
Communication dans un congrès lirmm-00294767v1

Conception de MEMS : de l'idée à l'integration SoC/SiP

Olivier Leman , Boris Alandry , El Mehdi Boujamaa , Norbert Dumas , Frédérick Mailly
GDR SoC-SiP: System-On-Chip & Sytem-In-Package, Jun 2008, Paris, France
Communication dans un congrès lirmm-00361232v1

Design of an IEEE 1149.4 Test Chip with Extended ABM Functionality

Florence Azaïs , Pascal Nouet , Uroš Kač , Franc Novak
IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Montreux (Suisse), France. pp. 153-159
Communication dans un congrès lirmm-00269340v1

Protection contre les ESD : Caractérisation et Modélisation de Thyristors Parasites

Benjamin Caillard , Florence Azaïs , Pascal Nouet , Pascal Salomé , Stéphanie Dournelle
EOS/ESD/EMI Workshop, Toulouse (France), France. pp.P nd
Communication dans un congrès lirmm-00269343v1

"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC

Vincent Kerzérho , Philippe Cauvet , Serge Bernard , Florence Azaïs , Mariane Comte
ETS: European Test Symposium, May 2007, Freiburg, Germany. pp.211-216, ⟨10.1109/ETS.2007.1⟩
Communication dans un congrès lirmm-00158527v1

On the Use of LVTPNP in ESD Protection Structures

Antoine Rivière , Philippe Coll , David Bernard , Pascal Nouet , Florence Azaïs
IEW'07: International Electrostatic Discharge Workshop, May 2007, Lake Tahoe, CA, United States
Communication dans un congrès lirmm-00199246v1

Characterization of the Transient Behavior of Gated/STI Diodes and their Associated BJT in the CDM Time Domain

Jean-Robert Manouvrier , Pascal Fonteneau , Charles-Alexandre Legrand , Pascal Nouet , Florence Azaïs
EOS/ESD'07: 29th Electrical Overstress/Electrostatic Discharge Symposium, Sep 2007, Anaheim, CA, USA, pp.3A.2_1- 3A.2_10, ⟨10.1109/EOSESD.2007.4401748⟩
Communication dans un congrès lirmm-00199232v1

Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators

Vincent Kerzérho , Philippe Cauvet , Serge Bernard , Florence Azaïs , Michel Renovell
IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201
Communication dans un congrès lirmm-00161708v1
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Analyzing the Logic Behavior of Digital CMOS Circuits in Presence of Simultaneous Switching Noise

Florence Azaïs , Laurent Larguier , Michel Renovell
LATW: Latin American Test Workshop, Mar 2007, Cuzco, Peru
Communication dans un congrès lirmm-00199261v1

Impact of Simultaneous Switching Noise on the Static Behavior of Digital CMOS Circuits

Florence Azaïs , Laurent Larguier , Michel Renovell
ATS: Asian Test Symposium, Oct 2007, Beijing, China. pp.239-244
Communication dans un congrès lirmm-00179262v1

Partially Depleted SOI Body-Contacted MOSFET-Triggered Silicon Controlled Rectifier for ESD Protection

Christophe Entringer , Philippe Flatresse , Philippe Galy , Florence Azaïs , Pascal Nouet
EOS/ESD Symposium, Sep 2006, Tucson (USA), pp.6
Communication dans un congrès lirmm-00112952v1
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Experimental Validation of the "Analogue Network of Converters" Technique to Test Complex SiP/SoC

Serge Bernard , Florence Azaïs , Philippe Cauvet , Mariane Comte , Vincent Kerzérho
IEEE International Mixed-Signal Testing Workshop, Jun 2006, Paris, France. pp.84-88
Communication dans un congrès lirmm-00119266v1
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“Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC

Florence Azaïs , Serge Bernard , Philippe Cauvet , Mariane Comte , Vincent Kerzérho
ETS: European Test Symposium, May 2006, Southampton, United Kingdom. pp.159-164
Communication dans un congrès lirmm-00115676v1

Electro-thermal short pulsed simulation for SOI technology

Christophe Entringer , Philippe Flatresse , Philippe Galy , Florence Azaïs , Pascal Nouet
ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2006, Wuppertal, Germany
Communication dans un congrès lirmm-00112981v1

On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field Sensor

Olivier Leman , Florence Azaïs , Laurent Latorre , Frédérick Mailly , Pascal Nouet
LATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.29-34
Communication dans un congrès lirmm-00102750v1

A simulation tool for CDM stress evaluation at circuit level

Marie Lafont , Florence Azaïs , Philippe Galy , Pascal Salomé , Pascal Nouet
EOS/ESD/EMI Workshop, May 2006, Toulouse, France. pp.89-92
Communication dans un congrès lirmm-00112986v1

Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias Modulation

Frédérick Mailly , Norbert Dumas , Laurent Latorre , Florence Azaïs , Pascal Nouet
LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.213-218
Communication dans un congrès lirmm-00106517v1

Fast and Fully-Efficient Test Flow for ADCs

Serge Bernard , Mariane Comte , Florence Azaïs , Yves Bertrand , Michel Renovell
IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249
Communication dans un congrès lirmm-00106523v1

On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor

Norbert Dumas , Florence Azaïs , Laurent Latorre , Pascal Nouet
VTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.213-218
Communication dans un congrès lirmm-00105996v1

Analysis and Attenuation Proposal in Ground Bounce: II

Antonio Zenteno , Víctor H. Champac , Michel Renovell , Florence Azaïs
LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.34-39
Communication dans un congrès lirmm-00106514v1

Towards On-Line Testing of MEMS Using Electro-Thermal Excitation

Frédérick Mailly , Florence Azaïs , Norbert Dumas , Laurent Latorre , Pascal Nouet
ETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.76-81
Communication dans un congrès lirmm-00106009v1

Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays

Gustavo Pereira , Antonio Andrade Jr. , Tiago R. Balen , Marcelo Lubaszewski , Florence Azaïs
VTS: VLSI Test Symposium, May 2005, Palm Springs, CA, United States. pp.389-400, ⟨10.1109/VTS.2005.85⟩
Communication dans un congrès lirmm-00105998v1

BIST Implementation of Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor

Norbert Dumas , Florence Azaïs , Laurent Latorre , Pascal Nouet
LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.207-212
Communication dans un congrès lirmm-00106516v1

Design&Test of an Oscillation Based System Architecture for DNA Sensor Arrays

Hong Liu , H.G. Kerkhoff , A. D. Richardson , X. Zhang , Pascal Nouet
IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.234-239
Communication dans un congrès lirmm-00106525v1

Comparison Between 0.13 µm PD-SOI Gated Diode and non Gated Diode through DC TCAD Simulations

Christophe Entringer , P. Flatrese , Pascal Salomé , Pascal Nouet , Florence Azaïs
EUROSOI'05, Jan 2005, Grenade, Spain
Communication dans un congrès lirmm-00106519v1

Superposition vs. Modulation: A Comparative Analysis for Electro-Thermal On-Line MEMS Testing

Frédérick Mailly , Florence Azaïs , Norbert Dumas , Laurent Latorre , Pascal Nouet
IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.212-219
Communication dans un congrès lirmm-00106522v1

Physics and Design Optimization of ESD Diode for 0.13mm PD-SOI Technology

Christophe Entringer , Philippe Flatresse , Pascal Salomé , Pascal Nouet , Florence Azaïs
EOS/ESD: Electrical Overstress/Electrostatic Discharge, Sep 2005, Anaheim, United States
Communication dans un congrès lirmm-00106041v1

VHDL-AMS Fault Simulation for Testing DNA Bio-Sensing Arrays

Hans G. Kerkhoff , X. Zhang , Hong Liu , Andrew D. Richardson , Pascal Nouet
IEEE SENSORS, Oct 2005, Irvine, United States. ⟨10.1109/ICSENS.2005.1597878⟩
Communication dans un congrès lirmm-00106042v1

Test of a CMOS Micro Compass

Florence Azaïs
2nd PATENT-DfMM Summer School, Sep 2005
Communication dans un congrès lirmm-00106560v1

Towards Low-Cost Testing of Analog-to-Digital Converters

Florence Azaïs
Workshop on the Testing of High Resolution Mixed-Signal Interfaces, 2004
Communication dans un congrès lirmm-00109143v1

On the Use of Electrical Stimuli for MEMS Testing

Norbert Dumas , Florence Azaïs , Laurent Latorre , Pascal Nouet
LATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.118-122
Communication dans un congrès lirmm-00108651v1

Electrically-Induced Thermal Stimuli for MEMS Testing

Norbert Dumas , Florence Azaïs , Laurent Latorre , Pascal Nouet
ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.60-65
Communication dans un congrès lirmm-00108904v1

An Approach to the Built-in-Self of Field Programmable Analog Arrays

Tiago R. Balen , Antonio Andrade Jr. , Florence Azaïs , Marcelo Lubaszewski , Michel Renovell
VTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.383-388
Communication dans un congrès lirmm-00108908v1

Analysis and Attenuation Proposal in Ground Bounce

Antonio Zenteno , Víctor H. Champac , Michel Renovell , Florence Azaïs
ATS: Asian Test Symposium, Nov 2004, Kenting Taiwan. pp.460-463, ⟨10.1109/ATS.2004.25⟩
Communication dans un congrès lirmm-00108931v1

Testing Global Interconnects of Field Programmable Analog Arrays

Antonio Andrade Jr , Gustavo Vieira , Tiago R. Balen , Marcelo Lubaszewski , Florence Azaïs
IMSTW'04: 10th International Mixed-Signal Testing Workshop, Jun 2004, Portland, Oregon, United States
Communication dans un congrès lirmm-00108657v1

Optimised Probing Flow for High Speed Fault Localization

Da. Martin , R. Desplats , G. Haller , Florence Azaïs , Pascal Nouet
ISTFA'04: International Symposium on Testing and Failure Analysis, Nov 2004, Worcester (USA)
Communication dans un congrès lirmm-00108898v1
Image document

Testing the Configurable Analog Blocks of Field Programmable Analog Arrays

Tiago R. Balen , Antonio Andrade Jr. , Florence Azaïs , Marcelo Lubaszewski , Michel Renovell
ITC: International Test Conference, Oct 2004, Charlotte, United States. pp.893-902
Communication dans un congrès lirmm-00108897v1

Investigations on the Use of EWS Data for Failure Diagnosis Enhancement

Da. Martin , G. Haller , Florence Azaïs , Pascal Nouet
LATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena (Colombia), pp.6-10
Communication dans un congrès lirmm-00108652v1

Test Digital, Test de Mémoires, Test Mixte : 5 Centres de Compétence pour la Formation en Europe

Laurent Latorre , Florence Azaïs , Marie-Lise Flottes , Serge Bernard , Régis Lorival
CNFM'04 : 8ème Journées Pédagogiques du Comité National de Formation en Microélectronique, 2004, Saint Malo, France. p. 242
Communication dans un congrès lirmm-00108671v1

Electrical Modeling of LSCRs in Deep Submicron CMOS Technologies for Circuit-Level Simulation of ESD

Benjamin Caillard , Florence Azaïs , Pascal Nouet , Stéphanie Dournelle , Pascal Salomé
BCTM 2003 - Bipolar/BiCMOS Circuits and Technology Meeting, Sep 2003, Toulouse, France. pp.97-100, ⟨10.1109/BIPOL.2003.1274943⟩
Communication dans un congrès lirmm-00269608v1

On the Synthesis of Analog Cascaded Filters with Optimal Test Point Insertion

Florence Azaïs , Marcelo Lubaszewski , Pascal Nouet , Michel Renovell
LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.212-216
Communication dans un congrès lirmm-00269499v1

Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCs

Mariane Comte , Florence Azaïs , Serge Bernard , Yves Bertrand , Michel Renovell
IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.185-190
Communication dans un congrès lirmm-00269583v1

Delay Testing of MOS Transistor with Gate Oxide Short

Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand
ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.168-173
Communication dans un congrès lirmm-00269641v1
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A New Methodology for ADC Test Flow Optimization

Serge Bernard , Mariane Comte , Florence Azaïs , Yves Bertrand , Michel Renovell
ITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, ⟨10.1109/TEST.2003.1270841⟩
Communication dans un congrès lirmm-00269527v1

GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model

Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand , Jean-Michel Portal
LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil
Communication dans un congrès lirmm-00269604v1

On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static Errors

Mariane Comte , Florence Azaïs , Serge Bernard , Yves Bertrand , Michel Renovell
LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203
Communication dans un congrès lirmm-00269498v1

An Automatic Tool for Generation of ADC BIST Architecture

Serge Bernard , Florence Azaïs , Mariane Comte , Yves Bertrand , Michel Renovell
IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84
Communication dans un congrès lirmm-00269580v1

Automatic Generation of LH-BIST Architecture for ADC Testing

Serge Bernard , Florence Azaïs , Mariane Comte , Yves Bertrand , Michel Renovell
IWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12
Communication dans un congrès lirmm-00269683v1

OBIST Applied to FPAAs: A Case Study

Michel Renovell , Tiago R. Balen , M. Schreiber , Florence Azaïs , Marcelo Lubaszewski
LATW 2003 - 4th IEEE Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.238-243
Communication dans un congrès lirmm-00269501v1

A Non-Split Model for Realistic Gate Oxide Short in CMOS Technology

Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand
DCIS: Design of Circuits and Integrated Systems, 2002, Santander, Spain. pp.197-204
Communication dans un congrès lirmm-00268432v1

A high accuracy triangle-wave signal generator for on-chip ADC testing

Serge Bernard , Florence Azaïs , Yves Bertrand , Michel Renovell
ETW 2002 - 7th IEEE European Test Workshop, May 2002, Corfu, Greece. pp.89-94, ⟨10.1109/ETW.2002.1029644⟩
Communication dans un congrès lirmm-00268483v1

Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde Short

Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand
DBT: Defect Based Testing, Apr 2002, Monterey, CA, United States. pp.11-16
Communication dans un congrès lirmm-00269333v1

Low Voltage Testing of Gate Oxide Short in CMOS Technology

Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand
DDECS: Design and Diagnostics of Electronic Circuits and Systems, 2002, Brno, Czech Republic. pp.168-174
Communication dans un congrès lirmm-00268526v1

Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse Spectrale

Mariane Comte , Florence Azaïs , Serge Bernard , Yves Bertrand , Michel Renovell
Colloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.47-50
Communication dans un congrès lirmm-00269325v1

EuNICE-Test Project: A remote Access to Engineering Test for European Universities

Yves Bertrand , Marie-Lise Flottes , Florence Azaïs , Serge Bernard , Laurent Latorre
EWME: European Workshop on Microelectronics Education, 2002, Vigo, Spain. pp.133-136
Communication dans un congrès lirmm-00268489v1

Designing Testable Analog Filters with Optimal DFT Insertion

Florence Azaïs , Yves Bertrand , Jose Vicente Calvano , Marcelo Lubaszewski , Pascal Nouet
IMSTW: International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.201-203
Communication dans un congrès lirmm-00269341v1

Evaluation of ADC Static Parameters via Frequency Domain

Florence Azaïs , Serge Bernard , Yves Bertrand , Mariane Comte , Michel Renovell
IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169
Communication dans un congrès lirmm-00269347v1
Image document

Modeling Gate Oxide Short Defects in CMOS Minimum Transistors

Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand
ETW: European Test Workshop, 2002, Corfu, Greece. pp.15-20
Communication dans un congrès lirmm-00268527v1
Image document

Implementation of an Experimental IEEE 1149.4 Mixed-Signal Test Chip

Uroš Kač , Franc Novak , Florence Azaïs , Pascal Nouet , Michel Renovell
BTW: Board Test Workshop, Oct 2002, Baltimore, United States. paper 4.2
Communication dans un congrès lirmm-00269342v1
Image document

Experimental test infrastructure supporting IEEE 11494 Standard

Uroš Kač , Franc Novak , Jozef Stefan , Florence Azaïs , Pascal Nouet
ETW: European Test Workshop, 2002, Corfou, Greece
Communication dans un congrès lirmm-00268606v1

On the Evaluation of ADC Static Parameters Through Dynamic Testing

Mariane Comte , Florence Azaïs , Serge Bernard , Yves Bertrand , Michel Renovell
ADDA & EWADC, Jun 2002, Prague, Czech Republic. pp.95-98
Communication dans un congrès lirmm-00269338v1
Image document

A Remote Access to Engineering Test Facilities for the Distant Education of European Microelectronics Students

Yves Bertrand , Marie-Lise Flottes , Florence Azaïs , Serge Bernard , Laurent Latorre
32nd Annual Frontiers in Education (FIE), Nov 2002, Boston, MA, United States. pp.T2E-24, ⟨10.1109/FIE.2002.1157943⟩
Communication dans un congrès lirmm-00269423v1

Estimating Static Parameters of A-to-D Converters from Spectral Analysis

Florence Azaïs , Serge Bernard , Yves Bertrand , Mariane Comte , Michel Renovell
LATW: Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.174-179
Communication dans un congrès lirmm-00269320v1

Boolean and Current Detection of MOS Transistor with Gate Oxide Short

Michel Renovell , Jean-Marc J.-M. Galliere , Florence Azaïs , Yves Bertrand
IEEE International Test Conference, Oct 2001, Baltimore, USA, pp.10
Communication dans un congrès lirmm-00370400v1

A multi-mode stimuli generator for analogue and mixed-signal built-in-self-test

Marcelo Lubaszewski , Michel Renovell , Florence Azaïs , Yves Bertrand
IMSTW: International Mixed Signal Testing Workshop, Jun 1998, The Hague, Pays-Bas. pp.100-106
Communication dans un congrès hal-01384740v1

A built-in multi-mode stimuli generator for analogue and mixed-signal testing

Marcelo Lubaszewski , Michel Renovell , Salvador Mir , Florence Azaïs , Yves Bertrand
Brazilian Symposium on Integrated Circuit Design, 1998, Rio de Janeiro, Brazil. pp.175-178, ⟨10.1109/SBCCI.1998.715435⟩
Communication dans un congrès hal-00005876v1
Image document

A multi-mode signature analyzer for analog and mixed circuits

Michel Renovell , Marcelo Lubaszewski , Salvador Mir , Florence Azaïs , Yves Bertrand
VLSI: Integrated Systems on Silicon, Aug 1997, Gramado, Brazil. pp.65-76, ⟨10.1007/978-0-387-35311-1_6⟩
Communication dans un congrès hal-01399998v1

Analog Measurements based on Digital Test Equipment for Low-Cost Testing of Analog/RF Circuits

Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre
ETS: European Test Symposium, May 2013, Avignon, France. , 18th IEEE European Test Symposium, 2013
Poster de conférence lirmm-00820084v1

Implementing model redundancy in predictive alternate test to improve test confidence

Haithem Ayari , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
ETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013, ⟨10.1109/ETS.2013.6569386⟩
Poster de conférence lirmm-00820077v1

Logic Errors in CMOS Circuits due to Simultaneous Switching Noise

Florence Azaïs , Laurent Larguier , Michel Renovell
ETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.59-64, 2007
Poster de conférence lirmm-00154744v1

On the Development of a Low-Cost Diagnostic Flow for Efficient Failure Analysis

Da. Martin , Gérard Haller , Florence Azaïs , Pascal Nouet
ETS: European Test Symposium, May 2004, Ajaccio, France. 9th IEEE European Test Symposium, 2004
Poster de conférence lirmm-00108658v1

Models for Bridging Defects

Michel Renovell , Florence Azaïs , Joan Figueras , Rosa Rodríguez-Montañés , Daniel Arumi
Models in Hardware Testing, 43, Springer Netherlands, pp.33-70, 2010, Frontiers in Electronic Testing, 978-90-481-3281-2
Chapitre d'ouvrage lirmm-00371365v1

Analog and Mixed-Signal Test Bus: IEEE 1149.4 Test Standard

Florence Azaïs , Pascal Nouet
Huertas J.L. Test and Design-for-Testability in Mixed-Signal Integrated Circuits, Kluwer Academic Publishers, pp.28, 2004, 1-4020-7724-6
Chapitre d'ouvrage lirmm-00109159v1
Image document

On-Chip Generator of a Saw-Tooth Test Stimulus for ADC BIST

Florence Azaïs , Serge Bernard , Yves Bertrand , Michel Renovell
SOC Design Methodologies, 90, Kluwer Academic Publishers, pp.425-436, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_36⟩
Chapitre d'ouvrage lirmm-00268477v1

Rapport Technique intermédiaire, Contrat TOETS CT 302, Programme CEE CATRENE

Patrick Girard , Serge Bernard , Florence Azaïs , Alberto Bosio , Luigi Dilillo
2011
Autre publication scientifique lirmm-00679018v1

Rapport Technique de fin d'année, Contrat TOETS CT 302, Programme CEE CATRENE

Patrick Girard , Serge Bernard , Florence Azaïs , Alberto Bosio , Luigi Dilillo
2011
Autre publication scientifique lirmm-00679022v1

TOETS CT302 - Programme CEE CATRENE - Summary Technical Report 2S-2009 - Rapport Technique de Fin d'année

Patrick Girard , Florence Azaïs , Serge Bernard , Alberto Bosio , Luigi Dilillo
2010
Autre publication scientifique lirmm-00461745v1

Contrat TOETS CT 302 - Programme CEE CATRENE (Rapport Intermédiaire)

Patrick Girard , Serge Bernard , Florence Azaïs , Alberto Bosio , Luigi Dilillo
2010
Autre publication scientifique lirmm-00504873v1

Advanced Solutions for Innovative SOC Testing in Europe, Contrat CEE ASSOCIATE A503, Programme MEDEA+ (Rapport Technique Intermédiaire)

Patrick Girard , Michel Renovell , Florence Azaïs , Yves Bertrand , Marie-Lise Flottes
2003, pp.P nd
Autre publication scientifique lirmm-00269720v1

Caractérisation TLP des Structures STMSCR du Run H8T106

Florence Azaïs , Benjamin Caillard , Pascal Nouet
2003, pp.P nd
Autre publication scientifique lirmm-00269719v1

Advanced Solutions for Innovative SOC Testing in Europe, Contrat CEE ASSOCIATE A503, Programme MEDEA+ (Rapport Technique de Fin d'Année)

Patrick Girard , Michel Renovell , Florence Azaïs , Serge Bernard , Marie-Lise Flottes
2003, pp.P nd
Autre publication scientifique lirmm-00269749v1

Advanced Solutions for Innovative SOC Testing in Europe

Patrick Girard , Florence Azaïs , Serge Bernard , Yves Bertrand , Marie-Lise Flottes
2002
Autre publication scientifique lirmm-00268586v1

Project Management and Trainer Education Deliverable: Management Report, Attendees and Training Contents, Training Evaluation

Marie-Lise Flottes , Yves Bertrand , Florence Azaïs , Régis Lorival , Serge Bernard
2002
Autre publication scientifique lirmm-00268593v1

Mixed-Signal BISR

Florence Azaïs , Serge Bernard , Yves Bertrand , Michel Renovell
2002
Autre publication scientifique lirmm-00268607v1

Modélisation Electrique de LSCR en Technologie H9

Florence Azaïs , Benjamin Caillard , Pascal Nouet
2002
Autre publication scientifique lirmm-00268608v1