Nombre de documents

18

CV de Fabrice CAIGNET


HDR1 document

  • Fabrice Caignet. Approche systémique pour l’analyse de l’impact des décharges électrostatiques : du composant au système. Micro et nanotechnologies/Microélectronique. Universite Toulouse III Paul Sabatier, 2015. <tel-01292134>

Communication dans un congrès10 documents

  • Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. From quasi-static to transient system level ESD simulation: Extraction of turn-on elements. Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2016 38th, Sep 2016, Anaheim, United States. Proceedings of Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), pp.1 - 10, 2016, <https://www.esda.org/>. <10.1109/EOSESD.2016.7592563>. <hal-01387072>
  • Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Dynamic system level ESD current measurement using magnetic field probe. Asia-Pacific International Symposium on Electromagnetic Compatibility ( APEMC ), May 2015, Taipei, Taiwan. 2015, <10.1109/APEMC.2015.7175400>. <hal-01239444>
  • Rémi Bèges, Fabrice Caignet, Patrice Besse, Jean-Philippe Laine, Alain Salles, et al.. TLP-based Human Metal Model stress generator and analysis method of ESD generators. Electrical Overstress / Electrostatic Discharge Symposium (EOS/ESD 2015), Sep 2015, Reno, United States. 2015, <10.1109/EOSESD.2015.7314777>. <hal-01239451>
  • Marise Bafleur, Fabrice Caignet, Nicolas Nolhier, David Trémouilles. Tackling the challenges of System level ESD: from efficient ICs ESD protection to system level predictive modeling. Taiwan ESD and Reliability Conference, Nov 2013, Hsinchu, Taiwan. 2013. <hal-00957728>
  • Thomas Epert, Fabrice Caignet, Christophe Viallon, Anqing Wang, Nicolas Mauran, et al.. Oscilloscope intégré sur puce appliqué à la caractérisation d'un générateur d'impulsions à 20 GHz. 18èmes Journées Nationales Microondes, May 2013, Paris, France. pp.4, 2013. <hal-00924176>
  • Fabrice Caignet, Nicolas Monnereau, Nicolas Nolhier, Marise Bafleur. Behavioral ESD Protection Modeling to perform System Level ESD Efficient Design. Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), May 2012, SINGAPORE, Singapore. pp.401-404, 2012. <hal-00722644>
  • Nicolas Monnereau, Fabrice Caignet, Nicolas Nolhier, David Trémouilles, Marise Bafleur. Behavioral-Modeling Methodology to Predict Electrostatic-Discharge Susceptibility Failures at System Level : an IBIS Improvement. Int. Symposium on Electromagnetic Compatibility (EMC Europe 2011), Sep 2011, YORK, United Kingdom. pp.457-463, 2011. <hal-00722643>
  • Ali Alaeldine, Nicolas Lacrampe, Fabrice Caignet, Richard Perdriau, Marise Bafleur, et al.. Efficiency of Embedded On-Chip EMI Protections to Continuous Harmonic and Fast Transient Pulses with Respect to Substrate Injection. IEEE EMC 2007 International Symposium on Electromagnetic Compatibility, Jul 2007, Honolulu (Hawaii), United States. 2007. <hal-00239403>
  • Nicolas Lacrampe, Ali Alaeldine, Fabrice Caignet, Richard Perdriau, Marise Bafleur, et al.. Investigation on ESD Transient Immunity of Integrated Circuit. IEEE EMC 2007 International Symposium on Electromagnetic Compatibility, Jul 2007, Honolulu (Hawaii), United States. 2007. <hal-00239408>
  • C. Chambrelan, N. Gervais, R. Grisel, R. Horn, Yves Danto, et al.. Formations à distance en EEA : Le projet de Master première année M1 e-EEA. 5ème Colloque sur l'Enseignement des Technologies et des Sciences de l'Information et des Systèmes, 2005, France. NC, pp.1, 2005. <hal-00183071>

Article dans une revue6 documents

  • Claude Vanhecke, Laurent Assouère, Anqing Wang, Paul Durand-Estèbe, Fabrice Caignet, et al.. Multisource and Battery-free Energy Harvesting Architecture for Aeronautics Applications. Power Electronics, IEEE Transactions on, 2015, 30 (6), pp.3215-3227. <10.1109/TPEL.2014.2331365>. <hal-01020992v2>
  • Bertrand Courivaud, Nicolas Nolhier, G Ferru, Marise Bafleur, Fabrice Caignet. Reliability of ESD protection devices designed in a 3D technology. Microelectronics Reliability, Elsevier, 2014, Microelectronics Reliability, 54 (9), pp.2272-2277. <http://www.journals.elsevier.com/microelectronics-reliability>. <10.1016/j.microrel.2014.07.136>. <hal-01218702>
  • Nicolas Monnereau, Fabrice Caignet, David Trémouilles, Nicolas Nolhier, Marise Bafleur. A System-Level Electrostatic-Discharge-Protection Modeling Methodology for Time-Domain Analysis. IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2013, 55 (1), pp.45-57. <10.1109/TEMC.2012.2208973>. <hal-00941876>
  • Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, Anqing Wang, Nicolas Mauran. On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. Microelectronics Reliability, Elsevier, 2013, 53 (9-11), pp.1278-1283. <10.1016/j.microrel.2013.07.056>. <hal-00941840>
  • Nicolas Monnereau, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, David Trémouilles. Investigation of Modeling System ESD Failure and Probability Using IBIS ESD Models. IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2012, 12 (4), pp.599-606. <10.1109/TDMR.2012.2218605>. <hal-00941823>
  • Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, et al.. Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits. Microelectronics Journal, Elsevier, 2008, 39 (12), pp.1728-1735. <10.1016/j.mejo.2008.02.022>. <hal-00537773>

Chapitre d'ouvrage1 document

  • Marise Bafleur, Fabrice Caignet, Nicolas Nolhier, Patrice Besse, Jean-­‐philippe Lainé. Protecting Mixed-­Signal Technologies Against Electrostatic Discharges: Challenges and Protection Strategies from Component to System. Thomas NOULIS. Mixed-signal circuits, CRC PRESS, 40p. Chapter 3, 2015, Devices, Circuits, and Systems Series, 9781482260625. <https://www.crcpress.com/>. <hal-01218627>