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Publications

	Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO2 by Atom Probe Tomography Rémi Demoulin , Manuel Roussel , Sébastien Duguay , Dominique Muller , Daniel Mathiot Journal of Physical Chemistry C, 2019, 123 (12), pp.7381-7389. ⟨10.1021/acs.jpcc.8b08620⟩ Article dans une revue hal-02082140v1

	Characterization of p-type Doping in Silicon Nanocrystals Embedded in SiO 2 Rémi Demoulin , Manuel Roussel , Sébastien Duguay , D. Muller , D. Mathiot Microscopy & Microanalysis 2019, Aug 2019, Portland, United States. pp.2540-2541, ⟨10.1017/S1431927619013436⟩ Communication dans un congrès hal-02294165v1