Recherche - Archive ouverte HAL Accéder directement au contenu

Filtrer vos résultats

14 résultats
Image document

Robust monitoring of an industrial IT system in presence of structural change

Espéran Padonou , Olivier Roustant , Michel Lutz
2013
Pré-publication, Document de travail hal-00790206v1

Polar Gaussian Processes and Experimental Designs in Circular Domains

Espéran Padonou , Olivier Roustant
SIAM/ASA Journal on Uncertainty Quantification, 2016, 4 (1), pp.1014 - 1033. ⟨10.1137/15M1032740⟩
Article dans une revue emse-01412189v1

Wafer Spatial Pattern Decomposition and Diagnosis Based on Processing Characteristics

Espéran Padonou , Jakey Blue
15th Annual Conference of the European Network for Business and Industrial Statistics ENBIS-15, Sep 2015, Prague, Czech Republic
Communication dans un congrès emse-01412221v1

Implementing statistical methods to improve information system management in a semiconductor industry

Michel Lutz , Espéran Padonou , Olivier Roustant
European Network for Business and Industrial Statistics (ENBIS), Sep 2013, Ankara, Turkey
Communication dans un congrès hal-02093439v1

Predicting on circular domains with Gaussian processes

Olivier Roustant , Espéran Padonou
Predicting on circular domains with Gaussian processes, Mar 2015, Dortmund, Germany. ⟨10.1002/qre.1651⟩
Communication dans un congrès emse-01235067v1

Robust control chart to monitor the information system of semiconductor production plant

Espéran Padonou , Olivier Roustant , Michel Lutz
European Network for Business and Industrial Statistics (ENBIS), Sep 2012, Ljubljana, Slovenia
Communication dans un congrès hal-02093437v1
Image document

Polar Gaussian Processes and Experimental Designs in Circular Domains

Espéran Padonou , O Roustant
2016
Pré-publication, Document de travail hal-01119942v4

Response surface approximation for profile monitoring in circular domains

Espéran Padonou , Jakey Blue , Olivier Roustant , Duverneuil Hugues
14th Annual Conference of the European Network for Business and Industrial Statistics ENBIS-14, Sep 2014, Linz, Austria
Communication dans un congrès emse-01412227v1

Spatial risk assessment on circular domains: Application to wafer profile monitoring

Espéran Padonou , Olivier Roustant , Jakey Blue , Duverneuil Hugues
26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), May 2015, Saratoga Springs, United States. ⟨10.1109/ASMC.2015.7164475⟩
Communication dans un congrès emse-01338842v1

Inverse modeling to estimate methane surface emission with optimization and reduced models: application of waste landfill plants

Mireille Batton-Hubert , Mickaël Binois , Espéran Padonou
13th Annual Conference of the European Network for Business and Industrial, Sep 2013, Ankara, Turkey
Communication dans un congrès emse-00849417v1

Analyse de sensibilité en domaine circulaire

Espéran Padonou , Olivier Roustant
SFdS 49èmes Journées de Statistique, May 2017, Avignon, France
Communication dans un congrès emse-01540219v1

Estimation of Energy Savings through a Kriging Metamodel

Espéran Padonou , Jonathan Villot
13th Annual Conference of the European Network for Business and Industrial Statistics (ENBIS-13), Sep 2013, Ankara, Turkey
Communication dans un congrès emse-00864669v1

Robust Monitoring of an Industrial IT System in the Presence of Structural Change

Espéran Padonou , Olivier Roustant , Michel Lutz
Quality and Reliability Engineering International, 2015, 31 (6), pp.Pages 949-962. ⟨10.1002/qre.1651⟩
Article dans une revue emse-01235063v1

Kriging and Design of Experiments on Circular Domains

Olivier Roustant , Espéran Padonou
The Fourth International Conference on the Interface between Statistics and Engineering 2016 (ICISE2016), Department of Chemical and Managerial Engineering, Manufacturing and Information Sciences, University of Palermo, Jun 2016, Palerme, Italy
Communication dans un congrès hal-01350664v1