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14 résultats
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triés par
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Robust monitoring of an industrial IT system in presence of structural change2013
Pré-publication, Document de travail
hal-00790206v1
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Polar Gaussian Processes and Experimental Designs in Circular DomainsSIAM/ASA Journal on Uncertainty Quantification, 2016, 4 (1), pp.1014 - 1033. ⟨10.1137/15M1032740⟩
Article dans une revue
emse-01412189v1
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Wafer Spatial Pattern Decomposition and Diagnosis Based on Processing Characteristics15th Annual Conference of the European Network for Business and Industrial Statistics ENBIS-15, Sep 2015, Prague, Czech Republic
Communication dans un congrès
emse-01412221v1
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Implementing statistical methods to improve information system management in a semiconductor industryEuropean Network for Business and Industrial Statistics (ENBIS), Sep 2013, Ankara, Turkey
Communication dans un congrès
hal-02093439v1
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Predicting on circular domains with Gaussian processesPredicting on circular domains with Gaussian processes, Mar 2015, Dortmund, Germany. ⟨10.1002/qre.1651⟩
Communication dans un congrès
emse-01235067v1
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Robust control chart to monitor the information system of semiconductor production plantEuropean Network for Business and Industrial Statistics (ENBIS), Sep 2012, Ljubljana, Slovenia
Communication dans un congrès
hal-02093437v1
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Polar Gaussian Processes and Experimental Designs in Circular Domains2016
Pré-publication, Document de travail
hal-01119942v4
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Response surface approximation for profile monitoring in circular domains14th Annual Conference of the European Network for Business and Industrial Statistics ENBIS-14, Sep 2014, Linz, Austria
Communication dans un congrès
emse-01412227v1
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Spatial risk assessment on circular domains: Application to wafer profile monitoring26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), May 2015, Saratoga Springs, United States. ⟨10.1109/ASMC.2015.7164475⟩
Communication dans un congrès
emse-01338842v1
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Inverse modeling to estimate methane surface emission with optimization and reduced models: application of waste landfill plants13th Annual Conference of the European Network for Business and Industrial, Sep 2013, Ankara, Turkey
Communication dans un congrès
emse-00849417v1
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Analyse de sensibilité en domaine circulaireSFdS 49èmes Journées de Statistique, May 2017, Avignon, France
Communication dans un congrès
emse-01540219v1
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Estimation of Energy Savings through a Kriging Metamodel13th Annual Conference of the European Network for Business and Industrial Statistics (ENBIS-13), Sep 2013, Ankara, Turkey
Communication dans un congrès
emse-00864669v1
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Robust Monitoring of an Industrial IT System in the Presence of Structural ChangeQuality and Reliability Engineering International, 2015, 31 (6), pp.Pages 949-962. ⟨10.1002/qre.1651⟩
Article dans une revue
emse-01235063v1
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Kriging and Design of Experiments on Circular DomainsThe Fourth International Conference on the Interface between Statistics and Engineering 2016 (ICISE2016), Department of Chemical and Managerial Engineering, Manufacturing and Information Sciences, University of Palermo, Jun 2016, Palerme, Italy
Communication dans un congrès
hal-01350664v1
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