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Theoretical and Experimental Evidences of Sequential Phase Formation during Sub-Nanometric-Thick Film Reactive Diffusion

 Alain Portavoce , Guy Treglia , Boubekeur Lalmi , Christophe Girardeaux , Dominique Mangelinck , et al.
Solid State Phenomena, 2011, 172-174, pp.633-639. ⟨10.4028/www.scientific.net/SSP.172-174.633⟩
Article dans une revue hal-02393995v1

Evolution of early formed NiSi2 during the reaction between Ni(W, Pt) films and Si (001)

 T. Luo , M. Bertoglio , Christophe Girardeaux , Dominique Mangelinck
Micro and Nano Engineering, 2018, 1, pp.49-55. ⟨10.1016/j.mne.2018.10.004⟩
Article dans une revue hal-02044789v1
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Revealing hot tearing mechanism for an additively manufactured high-entropy alloy via selective laser melting

 Z. Sun , X.P. Tan , M. Descoins , Dominique Mangelinck , S.B. Tor , et al.
Scripta Materialia, 2019, 168, pp.129-133. ⟨10.1016/j.scriptamat.2019.04.036⟩
Article dans une revue hal-02403163v1
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Further Insight into Interfacial Interactions in Iron/Liquid Zn-Al System

 David Zapico-Álvarez , Patrick Barges , Céline Musik , Florence Bertrand , Jean-Michel Mataigne , et al.
Metallurgical and Materials Transactions A, 2020, 51 (5), pp.2391-2403. ⟨10.1007/s11661-020-05669-5⟩
Article dans une revue hal-03071195v1

Atom probe tomography of nanoscale electronic materials

 D. J. Larson , T. J. Prosa , D. E. Perea , K. Inoue , Dominique Mangelinck
MRS Bulletin, 2016, 41 (1), pp.30-34. ⟨10.1557/mrs.2015.308⟩
Article dans une revue hal-01435099v1

Thermoelectric power factor of Ge1-xSnx thin films

 A. Portavoce , H. Khelidj , N. Oueldna , S. Amhil , M. Bertoglio , et al.
Materialia, 2020, 14, pp.100873. ⟨10.1016/j.mtla.2020.100873⟩
Article dans une revue hal-03046444v1
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Al–Cu intermetallic coatings processed by sequential metalorganic chemical vapour deposition and post-deposition annealing

 Lyacine Aloui , Thomas Duguet , Fanta Haidara , Marie-Christine Record , Diane Samélor , et al.
Applied Surface Science, 2012, 258 (17), pp.6425-6430. ⟨10.1016/j.apsusc.2012.03.053⟩
Article dans une revue hal-01756334v1
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On the influence of Ni(Pt)Si thin film formation on agglomeration threshold temperature and its impact on 3D imaging technology integration

 M. Grégoire , F. Morris Anak , S. Verdier , K. Dabertrand , S. Guillemin , et al.
Microelectronic Engineering, 2023, 271-272, pp.111937. ⟨10.1016/j.mee.2023.111937⟩
Article dans une revue hal-04285798v1

Formation of C49-TiSi2 in flash memories : a nucleation controlled phenomenon ?

 Dominique Mangelinck , P. Gas , T. Badéche , E. Taing , F. Nemouchi , et al.
Microelectronic Engineering, 2003, 70, pp.220-225. ⟨10.1016/S0167-9317(03)00435-0⟩
Article dans une revue istex hal-01951275v1

Reaction and diffusion at interfaces of micro- and nanostructured materials

 P. Gas , C Girardeaux , D. Mangelinck , A. Portavoce
Materials Science and Engineering: B, 2003, 101 (1-3), pp.43-48. ⟨10.1016/S0921-5107(02)00709-2⟩
Article dans une revue istex hal-02393446v1
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Dewetting of Ni silicide thin film on Si substrate: In-situ experimental study and phase-field modeling

 Jianbao Gao , Annie Malchère , Shenglan Yang , Andrea Campos , Ting Luo , et al.
Acta Materialia, 2022, 223, pp.117491. ⟨10.1016/j.actamat.2021.117491⟩
Article dans une revue hal-03454993v1

First stages of the formation of Ni silicide by atom probe tomography

 K. Hoummada , E. Cadel , Dominique Mangelinck , C. Perrin-Pellegrino , D. Blavette , et al.
Applied Physics Letters, 2006, 89 (18), ⟨10.1063/1.2370501⟩
Article dans une revue hal-01928898v1

Formation of Ni silicide at room temperature studied by laser atom probe tomography: Nucleation and lateral growth

 K. Hoummada , Dominique Mangelinck , E. Cadel , C. Perrin-Pellegrino , D. Blavette , et al.
Microelectronic Engineering, 2007, 84 (11), pp.2517--2522. ⟨10.1016/j.mee.2007.05.051⟩
Article dans une revue istex hal-01928891v1
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Analysis of superconducting silicon epilayers by atom probe tomography: composition and evaporation field

 Khalid Hoummada , Franck Dahlem , Federico Panciera , Etienne Bustarret , C. Marcenat , et al.
European Physical Journal: Applied Physics, 2023, 98, pp.40. ⟨10.1051/epjap/2023230018⟩
Article dans une revue hal-04124377v1

Silicide formation during reaction between Ni ultra-thin films and Si(001) substrates

 J. Fouet , M. Texier , M.-I. Richard , A. Portavoce , Dominique Mangelinck , et al.
Materials Letters, 2014, 116, pp.139-142. ⟨10.1016/j.matlet.2013.10.119⟩
Article dans une revue hal-01331208v1
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Reducing hot tearing by grain boundary segregation engineering in additive manufacturing: example of an AlxCoCrFeNi high-entropy alloy

 Zhongji Sun , Xipeng Tan , Chengcheng Wang , Marion Descoins , Dominique Mangelinck , et al.
Acta Materialia, 2021, 204, pp.116505. ⟨10.1016/j.actamat.2020.116505⟩
Article dans une revue hal-03059610v1

Nanometric-Size Effect upon Diffusion and Reaction in Semiconductors: Experimental and Theoretical Investigations

 Alain Portavoce , Christophe Girardeaux , Guy Treglia , Jean Bernardini , Dominique Mangelinck , et al.
Defect and Diffusion Forum, 2012, 323-325, pp.433-438. ⟨10.4028/www.scientific.net/DDF.323-325.433⟩
Article dans une revue hal-02393973v1
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Mechanisms of Silicide Formation by Reactive Diffusion in Thin Films

 Dominique Mangelinck
Diffusion foundations, 2019, 21, pp.1-28. ⟨10.4028/www.scientific.net/DF.21.1⟩
Article dans une revue hal-02403179v1
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Lateral growth of NiSi at the θ-Ni2Si/Si(100) interface: Experiments and modelling

 Dominique Mangelinck , M. El Kousseifi , K. Hoummada , F. Panciera , T. Epicier
Microelectronic Engineering, 2018, 199, pp.45-51. ⟨10.1016/j.mee.2018.07.014⟩
Article dans une revue hal-01916302v1
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Influence of Si surface preparation on CoSi2 formation and agglomeration

 Andréa Newman , Andrea Campos , David Pujol , Pascal Fornara , Magali Gregoire , et al.
Materials Science in Semiconductor Processing, 2023, 162, pp.107488. ⟨10.1016/j.mssp.2023.107488⟩
Article dans une revue hal-04285750v1
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Impact of Nanosecond Laser Annealing on the Formation of Titanium Silicides

 Laura Esposito , Sebastien Kerdiles , Magali Gregoire , Dominique Mangelinck
2021 20th International Workshop on Junction Technology (IWJT), Jun 2021, Kyoto, France. pp.1-6, ⟨10.23919/IWJT52818.2021.9609410⟩
Communication dans un congrès hal-03454117v1

Combined in situ x-ray scattering and electrical measurements for characterizing phase transformations in nanometric functional films

 Magali Putero , Benjamin Duployer , Ivan Blum , Toufik Ouled-Khachroum , Marie-Vanessa Coulet , et al.
Thin Solid Films, 2013, 541, pp.21-27. ⟨10.1016/j.tsf.2012.11.131⟩
Article dans une revue istex hal-01951266v1
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Atom probe tomographic study of L10 martensite in a Pt-modified NiCoCrAlYTa bond coating

 Xipeng Tan , Carine Perrin-Pellegrino , Khalid Hoummada , Dominique Mangelinck , Aurélie Vande Put , et al.
Corrosion Science, 2013, 76, pp.1-5. ⟨10.1016/j.corsci.2013.07.041⟩
Article dans une revue hal-02141642v1

Phase formation in Al–Fe thin film systems

 Fanta Haidara , Marie-Christine Record , Benjamin Duployer , Dominique Mangelinck
Intermetallics, 2012, 23, pp.143 - 147. ⟨10.1016/j.intermet.2011.11.017⟩
Article dans une revue istex hal-01756352v1

Atom probe tomography of secondary γ′ precipitation in a single crystal Ni-based superalloy after isothermal aging at 1100 °c

 X.P. Tan , Dominique Mangelinck , C. Perrin-Pellegrino , Luc Rougier , Charles-André Gandin , et al.
Journal of Alloys and Compounds, 2014, 611, pp.389-394. ⟨10.1016/j.jallcom.2014.05.132⟩
Article dans une revue hal-01022688v1
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Stability of β″ nano-phases in Al-Mg-Si(-Cu) alloy under high dose ion irradiation

 Camille Flament , Joël Ribis , Jérôme Garnier , Yves Serruys , F. Leprêtre , et al.
Acta Materialia, 2017, 128, pp.64-76. ⟨10.1016/j.actamat.2017.01.044⟩
Article dans une revue hal-01555155v1

Three-dimensional atom mapping of boron in implanted silicon

 O. Cojocaru-Mirédin , E. Cadel , Bernard Deconihout , Dominique Mangelinck , D. Blavette
Ultramicroscopy, 2009, 109 (5), pp.649--653. ⟨10.1016/j.ultramic.2008.09.008⟩
Article dans une revue istex hal-01928878v1

Redistribution of Alloy Elements during Nickel Silicide Formation: Benefit of Atom Probe Tomography

 C. Perrin , K. Hoummada , I. Blum , A. Portavoce , M. Descoins , et al.
Defect and Diffusion Forum, 2011, 309-310, pp.161-166. ⟨10.4028/www.scientific.net/DDF.309-310.161⟩
Article dans une revue hal-02394008v1

Progress in the understanding of Ni silicide formation for advanced MOS structures

 Dominique Mangelinck , K. Hoummada , F. Panciera , M. El Kousseifi , I. Blum , et al.
physica status solidi (a), 2014, 211 (1), pp.152-165. ⟨10.1002/pssa.201300167⟩
Article dans une revue istex hal-01951259v1
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Methods for Gibbs triple junction excess determination: Ti segregation in CoSi2 thin film

 Hannes Zschiesche , Ahmed Charai , Claude Alfonso , Dominique Mangelinck
Journal of Materials Science, 2020, 55 (27), pp.13177-13192. ⟨10.1007/s10853-020-04856-4⟩
Article dans une revue hal-03060639v1
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