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Number of documents

169

Dominique DERESMES


Research engineer 

CNRS

IEMN

Pôle Champ Proche (PCP): (Scanning Probe Microscopy Facility)


Journal articles76 documents

  • Thierry Melin, Dominique Deresmes. Single-charge effects in silicon nanocrystals probed by atomic force microscopy: From charge blinking to nanocrystal charging. Journal of Applied Physics, American Institute of Physics, 2021, 130 (6), pp.065103. ⟨10.1063/5.0054744⟩. ⟨hal-03347251⟩
  • Petr Polovodov, Didier Theron, Clément Lenoir, Dominique Deresmes, Sophie Eliet, et al.. Near-field scanning millimeter-wave microscope operating inside a scanning electron microscope: towards quantitative electrical nanocharacterization. Applied Sciences, MDPI, 2021, 11 (6), pp.2788. ⟨10.3390/app11062788⟩. ⟨hal-03320954v2⟩
  • Nemanja Peric, Yannick Lambert, Shalini Singh, Ali Hossain Khan, Nathali Alexandra Franchina Vergel, et al.. Van Hove singularities and trap states in two-dimensional CdSe nanoplatelets. Nano Letters, American Chemical Society, 2021, 21 (4), pp.1702-1708. ⟨10.1021/acs.nanolett.0c04509⟩. ⟨hal-03152599⟩
  • Natalia Turek, S. Godey, Dominique Deresmes, Thierry Melin. Ring charging of a single silicon dangling bond imaged by noncontact atomic force microscopy. Physical Review B, American Physical Society, 2020, 102 (23), ⟨10.1103/PhysRevB.102.235433⟩. ⟨hal-03288778⟩
  • Kevin Robert, Didier Stiévenard, Dominique Deresmes, Camille Douard, Antonella Iadecola, et al.. Novel insights into the charge storage mechanism in pseudocapacitive vanadium nitride thick films for high-performance on-chip micro-supercapacitors. Energy & Environmental Science, Royal Society of Chemistry, 2020, 13 (3), pp.949-957. ⟨10.1039/c9ee03787j⟩. ⟨hal-02553060⟩
  • Damien Eschimese, Patrick Hsia, Francois Vaurette, Dominique Deresmes, De Bettignies, et al.. A Comparative Investigation of Plasmonic Properties between Tunable Nanoobjects and Metallized Nanoprobes for Optical Spectroscopy. Journal of Physical Chemistry C, American Chemical Society, 2019, 123 (46), pp.28392-28400. ⟨10.1021/acs.jpcc.9b09977⟩. ⟨hal-02349635⟩
  • Moussa Biaye, Yorai Amit, Kamil Gradkowski, Natalia Turek, Sylvie Godey, et al.. Doped colloidal InAs nanocrystals in the single ionized dopant limit. Journal of Physical Chemistry C, American Chemical Society, 2019, 123 (23), pp.14803-14812. ⟨10.1021/acs.jpcc.9b02576⟩. ⟨hal-02162600⟩
  • Louis Biadala, Wenbing Peng, Yannick Lambert, Jin Kim, Damien Canneson, et al.. Trap-free heterostructure of PbS nanoplatelets on InP(001) by chemical epitaxy. ACS Nano, American Chemical Society, 2019, 13 (2), pp.1961-1967. ⟨10.1021/acsnano.8b08413⟩. ⟨hal-02054700⟩
  • Ari Bimo Prakoso, Chenjin Lu, C Rusli, Daniele Cortecchia, Cesare Soci, et al.. Voltage transient analysis as a generic tool for solar junction characterization. Journal of Physics D: Applied Physics, IOP Publishing, 2018, 51 (34), ⟨10.1088/1361-6463/aad274⟩. ⟨hal-02331487⟩
  • Brice Gautier, Pascal Chrétien, Khalifa Aguir, Frédéric Houzé, Olivier Schneegans, et al.. Techniques de mesure de grandeurs électriques adaptées aux nano-circuits. Les Techniques de l'Ingenieur, Editions T.I., 2016, Mesures-Analyses / Mesures et tests électroniques pp.R1084 V1. ⟨hal-01432552⟩
  • Moussa Biaye, Ewa Zbydniewska, Thierry Melin, Dominique Deresmes, Guillaume Copie, et al.. Tunneling mechanism and contact mechanics of colloidal nanoparticle assemblies. Nanotechnology, Institute of Physics, 2016, 27 (47), pp.475502. ⟨hal-02049152⟩
  • J. Freixas, E. Eustache, P. Roussel, C. Brillard, Dominique Deresmes, et al.. Sputtered Titanium Nitride: A Bifunctional Material for Li-Ion Microbatteries. Journal of The Electrochemical Society, Electrochemical Society, 2015, 162 (4), pp.A493 - A500. ⟨10.1149/2.0051504jes⟩. ⟨hal-01725993⟩
  • Sophie Barbet, Michka Popoff, Heinrich Diesinger, Dominique Deresmes, Didier Théron, et al.. Cross-talk artefacts in Kelvin probe force microscopy imaging : a comprehensive study. Journal of Applied Physics, American Institute of Physics, 2014, 115, 144313, 11 p. ⟨10.1063/1.4870710⟩. ⟨hal-00981142⟩
  • Heinrich Diesinger, Dominique Deresmes, Thierry Melin. Noise performance of frequency modulation Kelvin force microscopy. Beilstein Journal of Nanotechnology, Karlsruhe Institute of Technology., 2014, 5, pp.1-18. ⟨10.3762/bjnano.5.1⟩. ⟨hal-00950258⟩
  • H. Hamze, Maude Jimenez, Dominique Deresmes, Arnaud Beaurain, Nicolas Nuns, et al.. Influence of processing gases on the properties of cold atmospheric plasma SiOxCy coatings. Applied Surface Science, 2014, Applied Surface Science, 315 (1), pp.531-537. ⟨hal-03055748⟩
  • M. Jimenez, Guillaume Delaplace, N. Nuns, S. Bellayer, D. Deresmes, et al.. Toward the understanding of the interfacial dairy fouling deposition and growth mechanisms at a stainless steel surface : a multiscale approach. Journal of Colloid and Interface Science, Elsevier, 2013, 404, pp.192-200. ⟨10.1016/j.jcis.2013.04.021⟩. ⟨hal-00872007⟩
  • Arnaud Stolz, Ali Soltani, Bassam Abdallah, Joël Charrier, Dominique Deresmes, et al.. Optical properties of aluminum nitride thin films grown by direct-current magnetron sputtering close to epitaxy. Thin Solid Films, Elsevier, 2013, 534, pp.442-445. ⟨10.1016/j.tsf.2013.01.086⟩. ⟨hal-01264133⟩
  • Y. Lambert, D. Zhou, T. Xu, O. Cristini, D. Deresmes, et al.. Progressive multi-layer drop-casting of CdSe nanoparticles for photocurrent down shifing monitoring. Applied Physics Letters, American Institute of Physics, 2013, 103, pp.051102-1-4. ⟨10.1063/1.4816956⟩. ⟨hal-00871996⟩
  • A. Stolz, A. Soltani, B. Abdallah, Joël Charrier, D. Deresmes, et al.. Optical properties of aluminum nitride thin films grown by direct-current magnetron sputtering close to epitaxy. Thin Solid Films, Elsevier, 2013, 534, pp.442-445. ⟨10.1016/j.tsf.2013.01.086⟩. ⟨hal-00819476⟩
  • A. Ferri, S. Saitzek, G. Declercq, J. Costecalde, Denis Remiens, et al.. Ion-beam etching on nanostructured La2Ti2O7 piezoelectric thin films. Journal of the American Ceramic Society, Wiley, 2013, 96, pp.3877-3882. ⟨10.1111/jace.12626⟩. ⟨hal-00918880⟩
  • Ł. Borowik, I. Florea, D. Deresmes, O. Ersen, D. Hourlier, et al.. Surface and Intrinsic Conduction Properties of Au-Catalyzed Si Nanowires. Journal of Physical Chemistry C, American Chemical Society, 2012, 116 (11), pp.6601-6607. ⟨10.1021/jp300816e⟩. ⟨hal-02396336⟩
  • S. Arscott, Emilien Peytavit, Dominique Deresmes, Thomas Dargent, Duong Vu, et al.. A GaAs MEMS for AFM and spin injection. Sensors and Actuators A: Physical , Elsevier, 2012, 179, pp.10-16. ⟨10.1016/j.sna.2012.02.033⟩. ⟨hal-02345727⟩
  • L. Borowik, I. Florea, D. Deresmes, O. Ersen, D. Hourlier, et al.. Surface and intrinsic conduction properties of Au-catalyzed Si nanowires. Journal of Physical Chemistry C, American Chemical Society, 2012, 116, pp.6601-6607. ⟨10.1021/jp300816e⟩. ⟨hal-00787868⟩
  • S.L. Bravina, N.V. Morozovsky, E.A. Eliseev, A.N. Morozovska, J. Costecalde, et al.. Top electrode size effect on hysteresis loops in piezoresponse. Journal of Applied Physics, American Institute of Physics, 2012, 112, pp.052015-1-7. ⟨10.1063/1.4746028⟩. ⟨hal-00788339⟩
  • S.L. Bravina, N.V. Morozovsky, J. Costecalde, Caroline Soyer, Denis Remiens, et al.. Asymmetry of polarization reversal and current-voltage characteristics of Pt/PZT-Film/Pt:Ti/SiO2/Si-substrate structures. Smart Materials Research, Hindawi Publishing Corporation, 2011, 2011, pp.374915-1-5. ⟨10.1155/2011/374915⟩. ⟨hal-00783492⟩
  • M. Boucherit, A. Soltani, E. Monroy, M Rousseau, D. Deresmes, et al.. Investigation of the negative differential resistance reproducibility in AlN/GaN double-barrier resonant tunnelling diodes. Applied Physics Letters, American Institute of Physics, 2011, 99, pp.182109-1-3. ⟨10.1063/1.3659468⟩. ⟨hal-00783409⟩
  • M. Delalande, S. Clavaguera, M. Toure, A. Carella, S. Lenfant, et al.. Chemical functionalization of electrodes for detection of gaseous nerve agents with carbon nanotube field-effect transistors. Chemical Communications, Royal Society of Chemistry, 2011, 47, pp.6048-6050. ⟨10.1039/C1CC11517K⟩. ⟨hal-00597074⟩
  • F.J. Ferrer, E. Moreau, D. Vignaud, D. Deresmes, S. Godey, et al.. Initial stages of graphitization on SiC(000-1), as studied by phase atomic force microscopy. Journal of Applied Physics, American Institute of Physics, 2011, 109, pp.054307-1-6. ⟨10.1063/1.3560896⟩. ⟨hal-00577059⟩
  • Thierry Melin, S. Barbet, H. Diesinger, D. Théron, D. Deresmes. Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy. Review of Scientific Instruments, American Institute of Physics, 2011, 82, pp.036101-1-3. ⟨10.1063/1.3516046⟩. ⟨hal-00579085⟩
  • D. Brunel, D. Troadec, D. Hourlier, D. Deresmes, M. Zdrojek, et al.. Characterization of ion/electron beam induced deposition of electrical contacts at the sub-μm scale. Microelectronic Engineering, Elsevier, 2011, 88, pp.1569-1572. ⟨10.1016/j.mee.2011.03.011⟩. ⟨hal-00603003⟩
  • R. Stiufiuc, L.M.A. Perdigao, B. Grandidier, D. Deresmes, G. Allan, et al.. Above-barrier surface electron resonances induced by a molecular network. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2010, 81, pp.045421-1-5. ⟨10.1103/PhysRevB.81.045421⟩. ⟨hal-00549037⟩
  • Denis Remiens, R.H. Liang, Caroline Soyer, D. Deresmes, D. Troadec, et al.. Analysis of the degradation induced by focused ion Ga3+ beam for the realization of piezoelectric nanostructures. Journal of Applied Physics, American Institute of Physics, 2010, 108, pp.042008-1-6. ⟨10.1063/1.3474963⟩. ⟨hal-00549916⟩
  • L. Borowik, K. Kusiaku, D. Deresmes, D. Theron, H. Diesinger, et al.. Mapping charge transfers between quantum levels using noncontact atomic force microscopy. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2010, 82, pp.073302-1-4. ⟨10.1103/PhysRevB.82.073302⟩. ⟨hal-00549434⟩
  • K. Smaali, S. Lenfant, S. Karpe, M. Oçafrain, P. Blanchard, et al.. High on-off conductance switching ratio in optically-driven self-assembled conjugated molecular systems. ACS Nano, American Chemical Society, 2010, 4, pp.2411-2421. ⟨10.1021/nn100295x⟩. ⟨hal-00548965⟩
  • H. Diesinger, D. Deresmes, J.P. Nys, Thierry Melin. Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuum. Ultramicroscopy, Elsevier, 2010, 110, pp.162-169. ⟨10.1016/j.ultramic.2009.10.016⟩. ⟨hal-00549067⟩
  • Denis Remiens, Caroline Soyer, D. Troadec, D. Deresmes, D. Jenkins, et al.. Integration and optimisation of PZT piezoelectric thin films in micro and nano dimensional structures. Micro and Nanosystems, Bentham Science Publishers, 2009, 1, pp.214-225. ⟨hal-00473719⟩
  • A. Urbieta, K. Schulte, B. Grandidier, D. Deresmes, S.C. Erwin, et al.. (6 x 2) reconstruction of the Ag/Si(111) surface at 77 K. Surface Science, Elsevier, 2009, 603, pp.311-314. ⟨10.1016/j.susc.2008.11.025⟩. ⟨hal-00473063⟩
  • A. Urbieta, K. Schulte, B. Grandidier, D. Deresmes, S.C. Erwin, et al.. (6 x 2) Reconstruction of the Ag/Si(111) surface at 77 K (vol 603, pg 311, 2009) - Corrigendum. Surface Science, Elsevier, 2009, 603, pp.1079-1079. ⟨10.1016/j.susc.2009.02.002⟩. ⟨hal-00473064⟩
  • D. Brunel, D. Deresmes, Thierry Melin. Determination of the electrostatic lever arm of carbon nanotube field effect transistors using Kelvin force microscopy. Applied Physics Letters, American Institute of Physics, 2009, 94, pp.223508-1-3. ⟨10.1063/1.3148364⟩. ⟨hal-00473086⟩
  • R.H. Liang, Denis Remiens, D. Deresmes, Caroline Soyer, D. Troadec, et al.. Enhancement in nanoscale electrical properties of lead zirconic titanate island fabricated by focused ion beam. Journal of Applied Physics, American Institute of Physics, 2009, 105, pp.044101-1-7. ⟨10.1063/1.3073892⟩. ⟨hal-00473718⟩
  • G. Larrieu, D.A. Yarekha, E. Dubois, D. Deresmes, N. Breil, et al.. Issues associated to rare earth silicide integration in ultra thin FD SOI Schottky barrier nMOSFETs. ECS Transactions, Electrochemical Society, Inc., 2009, 19, pp.201-207. ⟨10.1149/1.3117410⟩. ⟨hal-00471998⟩
  • F. Vaurette, R. Leturcq, J.P. Nys, D. Deresmes, B. Grandidier, et al.. Evidence of electron-phonon interaction on transport in n- and p-type silicon nanowires. Applied Physics Letters, American Institute of Physics, 2008, 92, pp.242109-1-3. ⟨10.1063/1.2949072⟩. ⟨hal-00357349⟩
  • G. Allan, S. Barbet, Y. Coffinier, C. Delerue, D. Deresmes, et al.. Fundamental studies in nanosciences at the Institute of Electronics, Microelectronics, and Nanotechnology (IEMN). International Journal of Nanotechnology, Inderscience, 2008, 5, 631-648, Special Issue on Nanotechnology in France. Part I : C'nano Nord-Ouest. ⟨10.1504/IJNT.2008.018686⟩. ⟨hal-00357348⟩
  • Maxime Berthe, R. Stiufiuc, B. Grandidier, D. Deresmes, C. Delerue, et al.. Probing the carrier capture rate of a single quantum level. Science, American Association for the Advancement of Science, 2008, 319, pp.436-438. ⟨10.1126/science.1151186⟩. ⟨hal-00357378⟩
  • Denis Remiens, R.H. Liang, D. Troadec, D. Deresmes, Caroline Soyer, et al.. Piezoelectric response of PZT nanostructures obtained by focused ion beam. Integrated Ferroelectrics, Taylor & Francis, 2008, 100, pp.16-25. ⟨10.1080/10584580802540173⟩. ⟨hal-00800679⟩
  • H. Diesinger, D. Deresmes, J.P. Nys, Thierry Melin. Kelvin force microscopy at the second cantilever resonance : an out-of-vacuum crosstalk compensation setup. Ultramicroscopy, Elsevier, 2008, 108, pp.773-781. ⟨hal-00357370⟩
  • F. Vaurette, J.P. Nys, D. Deresmes, B. Grandidier, D. Stiévenard. Resistivity and surface states density of n and p type silicon nanowires. Journal of Vacuum Science and Technology B, 2008, 26, pp.945-948. ⟨10.1116/1.2908438⟩. ⟨hal-00357381⟩
  • A. Urbieta, B. Grandidier, J.P. Nys, D. Deresmes, D. Stievenard, et al.. Scanning tunnelling spectroscopy of cleaved InAs/GaAs quantum dots at low temperatures. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2008, 77, pp.155313-1-6. ⟨10.1103/PhysRevB.77.155313⟩. ⟨hal-00357382⟩
  • S. Barbet, R. Aubry, M.A. Di Forte-Poisson, J.C. Jacquet, D. Deresmes, et al.. Surface potential of n- and p-type GaN measured by Kelvin force microscopy. Applied Physics Letters, American Institute of Physics, 2008, 93, pp.212107-1-3. ⟨10.1063/1.3028639⟩. ⟨hal-00357781⟩
  • T. Soubiron, R. Stiufiuc, L. Patout, D. Deresmes, B. Grandidier, et al.. Transport limitations and Schottky barrier height in titanium silicide nanowires grown on the Si(111) surface. Applied Physics Letters, American Institute of Physics, 2007, 90 (10), ⟨10.1063/1.2711378⟩. ⟨hal-01790106⟩
  • T. Soubiron, R. Stiufiuc, L. Patout, D. Deresmes, B. Grandidier, et al.. Transport limitations and Schottky barrier height in titanium silicide nanowires grown on the Si(111) surface. Applied Physics Letters, American Institute of Physics, 2007, 90, pp.102112-1-3. ⟨10.1063/1.2711378⟩. ⟨hal-00283155⟩
  • R. Stiufiuc, T. Soubiron, B. Grandidier, D. Deresmes. Electronic and structural properties, of titanium silicide nanostructures formed on Si (111) 7x7 reconstructed surface. Journal of Optoelectronics and Advanced Materials, 2007, 9, pp.SI : 591-594. ⟨hal-00285660⟩
  • S. Barbet, Thierry Melin, Heinrich Diesinger, D. Deresmes, D. Stievenard. Charge-injection mechanisms in semiconductor nanoparticles analyzed from force microscopy experiments. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2006, 73, pp.045318. ⟨10.1103/PhysRevB.73.045318⟩. ⟨hal-00127820⟩
  • Maxime Berthe, A. Urbieta, L. Perdigão, B. Grandidier, D. Deresmes, et al.. Electron transport via local polarons at interface atoms. Physical Review Letters, American Physical Society, 2006, 97, pp.206801/1-4. ⟨hal-00127839⟩
  • H. Diesinger, Thierry Melin, S. Barbet, D. Deresmes, D. Stievenard. Electric force microscopy of individually charged semiconductor nanoparticles. physica status solidi (a), Wiley, 2006, 203, pp.1344-1347. ⟨hal-00127830⟩
  • K. Lambert, L. Wittebrood, I. Moreels, D. Deresmes, B. Grandidier, et al.. Langmuir–Blodgett monolayers of InP quantum dots with short chain ligands. Journal of Colloid and Interface Science, Elsevier, 2006, 15, pp.597. ⟨hal-00127837⟩
  • M. Dubois, L. Perdigao, C. Delerue, G. Allan, B. Grandidier, et al.. Scanning tunneling microscopy and spectroscopy of reconstructed Si(100) surfaces. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2005, 71, pp.165322-1-10. ⟨hal-00126420⟩
  • G. Mahieu, B. Grandidier, D. Deresmes, J.-P. Nys, D. Stievenard, et al.. Direct evidence for shallow acceptor states with nonspherical symmetry in GaAs. Physical Review Letters, American Physical Society, 2005, 94, pp.26407-1-4. ⟨10.1103/PhysRevLett.94.026407⟩. ⟨hal-00126234⟩
  • T. Heim, D. Deresmes, Dominique Vuillaume. Conductivity of DNA probed by conducting-atomic force microscopy : effects of contact electrode, DNA stucture and surface interactions. Journal of Applied Physics, American Institute of Physics, 2004, 96, pp.2927-2936. ⟨10.1063/1.1769606⟩. ⟨hal-00140730⟩
  • T. Heim, Thierry Melin, D. Deresmes, D. Vuillaume. Localization and delocalization of charges injected in DNA. Applied Physics Letters, American Institute of Physics, 2004, 85, pp.2637-2639. ⟨hal-00140732⟩
  • G. Mahieu, D. Deresmes, B. Grandidier, J.P. Nys, D. Stievenard. Atomic-scale observation of dopant atoms in GaAs. PICO : The Omicron NanoTechnology Newsletter, 2004, 8, pp.6-7. ⟨hal-00142060⟩
  • L. Perdigao, D. Deresmes, B. Grandidier, M. Dubois, C. Delerue, et al.. Semiconducting surface reconstruction of p-type Si(100) substrates at 5K. Physical Review Letters, American Physical Society, 2004, 92, pp.216101/1-4. ⟨hal-00141285⟩
  • Thierry Melin, H. Diesinger, D. Deresmes, D. Stievenard. Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : an analytical model for quantitative charge imaging. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2004, 69, pp.035321/1-8. ⟨hal-00141248⟩
  • H. Diesinger, Thierry Melin, D. Deresmes, D. Stievenard, T. Baron. Hysteretic behavior of the charge injection in single silicon nanoparticles. Applied Physics Letters, American Institute of Physics, 2004, 85, pp.3546-3548. ⟨hal-00141252⟩
  • Z. Hens, B. Grandidier, D. Deresmes, G. Allan, C. Delerue, et al.. Evolution of the density of states from a two- to a zero-dimensional semiconductor. EPL - Europhysics Letters, European Physical Society/EDP Sciences/Società Italiana di Fisica/IOP Publishing, 2004, 65, pp.809-815. ⟨hal-00141246⟩
  • Thierry Melin, H. Diesinger, D. Deresmes, D. Stievenard. Probing nanoscale dipole-dipole interactions by electric force microscopy. Physical Review Letters, American Physical Society, 2004, 92, pp.166101-1-4. ⟨hal-00141249⟩
  • Bernard Legrand, D. Deresmes, D. Stievenard. Silicon nanowires with sub 10 nm lateral dimensions : from AFM lithography based fabrication to electrical measurements. Journal of Vacuum Science and Technology, American Vacuum Society (AVS), 2002, 20, pp.862-870. ⟨hal-00148765⟩
  • X. Wallart, C. Priester, D. Deresmes, T. Gehin, F. Mollot. Why do (2x4) GaAs and InAs (001) surfaces exposed to phosphorus have so different strain behavior ?. Applied Physics Letters, American Institute of Physics, 2002, 81, pp.1086-1088. ⟨hal-00148649⟩
  • X. Wallart, C. Priester, D. Deresmes, T. Gehin, F. Mollot. Why do (2x4) GaAs and InAs (001) surfaces exposed to phosphorus have so different strain behavior ?. Applied Physics Letters, American Institute of Physics, 2002, 81, pp.1060-1062. ⟨hal-00018491⟩
  • Thierry Melin, D. Deresmes, D. Stievenard. Charge injection in individual silicon nanoparticles deposited on a conductive substrate. Applied Physics Letters, American Institute of Physics, 2002, 81, pp.5054-5056. ⟨hal-00149665⟩
  • X. Wallart, D. Deresmes, F. Mollot. Relationship between surface reconstruction and morphology of strained Ga1-xInxP layers grown on GaP(001) by Gas Source Molecular Beam Epitaxy. Applied Physics Letters, American Institute of Physics, 2001, 78, pp.2961. ⟨hal-00018480⟩
  • X. Wallart, D. Deresmes, F. Mollot. Growth of strained Ga1-xInxP layers on GaP (001) by gas source molecular beam epitaxy : similarities and differences with the growth of strained arsenides. Journal of Crystal Growth, Elsevier, 2001, 227, pp.255-259. ⟨hal-00152087⟩
  • X. Wallart, D. Deresmes, F. Mollot. Growth of strained GaSub 1-xIn Sub x players on GaP (001) by gas source molecular beam epitaxy similarities and differences with the growth of strained arsenides. Journal of Crystal Growth, Elsevier, 2001, 227-228, pp.255. ⟨hal-00018481⟩
  • X. Wallart, D. Deresmes, F. Mollot. Relationship between surface reconstruction and morphology of strained Ga1-xInxP layers grown on GaP(001) by gas source molecular beam epitaxy. Applied Physics Letters, American Institute of Physics, 2001, 78, pp.2961-2963. ⟨hal-00152078⟩
  • X. Wallart, C. Priester, D. Deresmes, F. Mollot. Interplay between segregation, roughness and local strains in the growth of Ga0.75In0.25P alloy. Applied Physics Letters, American Institute of Physics, 2000, 77, pp.253-255. ⟨hal-00158232⟩
  • X. Wallart, O. Schuler, D. Deresmes, F. Mollot. Composition effect on the growth mode, strain relaxation and critical thickness of tensile Ga1-xInxP layers. Applied Physics Letters, American Institute of Physics, 2000, 76, pp.2080-2082. ⟨hal-00158231⟩

Conference papers81 documents

  • Natalia Turek, Sylvie Godey, Dominique Deresmes, Christophe Krzeminski, Judicaël Jeannoutot, et al.. High resolution nc-AFM and KPFM imaging of dipolar molecule assemblies on Si(111):B by stiff- probe non-contact AFM at low-temperature. Materials Research Society meeting, Nov 2021, Boston, United States. ⟨hal-03456172⟩
  • P Polovodov, Didier Theron, S. Eliet, V Avramovic, C Boyaval, et al.. Operation of near-field scanning millimeter-wave microscopy up to 67 GHz under scanning electron microscopy vision. IEEE MTT International Microwave Symposium, IMS 2020, Jun 2020, Los Angeles (On-line event), United States. pp.95-98, ⟨10.1109/IMS30576.2020.9224090⟩. ⟨hal-03022574⟩
  • Louis Thomas, David Guérin, Dominique Deresmes, Jean-Louis Codron, Xavier Wallart, et al.. Étude par C-AFM de substrats magnétiques fonctionnalisés par des SAMs photo-commutables. SPIC 2019: Troisième congrès national Sciences et Technologies des systèmes pi-conjugués, Oct 2019, Arras, France. ⟨hal-02776445⟩
  • Natalia Turek, Dominique Deresmes, Judicaël Jeannoutot, Younes Makoudi, Frank Palmino, et al.. High resolution imaging of molecular assemblies on Si(111):B by non-contact AFM and Kelvin probe spectroscopy at low temperature. Science et Technologie des Systèmes pi-Conjugués, Oct 2019, Arras 62000, France. ⟨hal-02376865⟩
  • Louis Thomas, David Guerin, Dominique Deresmes, Thierry Melin, Dominique Vuillaume, et al.. Étude par C-AFM de substrats magnétiques fonctionnalisés par des SAMs photo-commutables. Forum des Microscopies à Sonde Locale, Mar 2018, La Rochelle, France. ⟨hal-02774838⟩
  • Natalia Turek, Sylvie Godey, Dominique Deresmes, Thierry Melin, Judicaël Jeannoutot, et al.. High resolution imaging of molecular assemblies on a semiconductor surface by non-contact AFM at low temperature. International Conference on Non-contact Atomic Force Microscopy, Sep 2018, Porvoo, Finland. ⟨hal-02366558⟩
  • P. Polovodov, C. Brillard, O Haenssler, C. Boyaval, Dominique Deresmes, et al.. Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions. 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Aug 2018, Reykjavik, Iceland. pp.1-4, ⟨10.1109/NEMO.2018.8503487⟩. ⟨hal-02155769⟩
  • H. Diesinger, Dominique Deresmes, Thierry Melin. Noise performance of frequency modulation Kelvin force microscopy. 5th International Workshop on Advanced Scanning Probe Microscopy Techniques, ASXMT 2014, 2014, Karlsruhe, Germany. ⟨hal-00951552⟩
  • R. Desfeux, A. Ferri, S. Saitzek, Z. Shao, A. Bayart, et al.. «Nanostructured Lead-Free La₂Ti₂O₇ Piezoelectric Islands Obtained by Ion-Beam Etching». International Conference Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials – PFM 2014, 2014, Ekaterinburg, Russia. ⟨hal-01702958⟩
  • A. Ferri, S. Saitzek, Z. Shao, A. Bayart, G. Declercq, et al.. Ion-beam effect on functional properties of La2Ti2O7 piezoelectric thin films and nanoislands. European Materials Research Society Spring Meeting, E-MRS Spring 2014, Symposium I - Solution processing and properties of functional oxide thin films and nanostructures, 2014, Lille, France. ⟨hal-00964120⟩
  • M. Jimenez, Guillaume Delaplace, N. Nuns, S. Bellayer, D. Deresmes, et al.. Toward a better understanding of the interfacial growth mechanism of dairy fouling at a stainless steel surface : a multiscale approach. 27th Conference of European Colloid and Interface Society, ECIS 2013, 2013, Sofia, Bulgaria. ⟨hal-00878881⟩
  • Lukasz Borowik, Thuat Nguyen-Tran, Dominique Deresmes, Heinrich Diesinger, Pere Roca I Cabarrocas, et al.. Doped semiconductor nanocrystal junctions studied by Kelvin probe and non-contact atomic force microscopy. Materials Research Society Fall Meeting, MRS Fall 2013, Symposium LL : Advances in Scanning Probe Microscopy, 2013, Boston, MA, United States. ⟨hal-00944018⟩
  • R. Desfeux, A. Ferri, S. Saitzek, Z. Shao, A. Bayart, et al.. «Growth and Characterization of New Piezoelectric Nanostructures with Low Environmental Impact». Journées Nanosciences et Nanotechnologies du Nord-Ouest, 2013, Rennes, France. ⟨hal-01727062⟩
  • L. Borowik, D. Deresmes, T. Nguyen-Tran, Pere Roca I Cabarrocas, Thierry Melin. Charge transfers from doped silicon nanocrystals probed by non-contact atomic force microscopy. International Conference on Nanoscience and Technology, ICN+T 2012, 2012, Paris, France. ⟨hal-00797758⟩
  • G. Declercq, A. Ferri, Z. Shao, A. Bayart, S. Saitzek, et al.. Fabrication of La2Ti2O7 nanostructures by focused Ga3+ ion beam and characterization by piezoresponse force microscopy. Joint 21th International Symposium on Applications of Ferroelectrics, ISAF 2012, 11st European Conference on the Applications of Polar Dielectrics, ECAPD 2012, 4th International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in P, 2012, Aveiro, Portugal. pp.1-3, ⟨10.1109/ISAF.2012.6297772⟩. ⟨hal-00801125⟩
  • G. Declercq, A. Ferri, Z. Shao, A. Bayart, S. Saitzek, et al.. Fabrication par FIB de nano-plots piézoélectriques de La2Ti2O7 et caractérisation électrique locale par SPM. 12èmes Journées de Caractérisation Microondes et Matériaux, JCMM 2012, 2012, Chambéry, France. session S6, papier ID22, 1-3. ⟨hal-00806631⟩
  • S. Bravina, N. Morozovsky, Caroline Soyer, J. Costecalde, D. Deresmes, et al.. Asymmetry of polarization reversal and current-voltage characteristics of PZT-film on silicon structures. 12th European Meeting on Ferroelectricity, EMF 2011, 2011, Bordeaux, France. ⟨hal-00807659⟩
  • M. Boucherit, A. Soltani, D. Deresmes, Maxime Berthe, E. Monroy, et al.. Investigation of the negative differential resistance reproducibility in AlN/GaN double barrier resonant tunneling diodes in DC operation. 9th International Conference on Nitride Semiconductors, ICNS-9, 2011, Glasgow, United Kingdom. ⟨hal-00807608⟩
  • A. Ferri, S. Saitzek, S. Zhenmian, R. Desfeux, J. Costecalde, et al.. Fabrication of nanostructured piezoelectric thin films by FIB and nanoscale characterization by piezoresponse force microscopy. European Materials Research Society Spring Meeting, E-MRS Spring 2011, Symposium D : Synthesis, processing and characterization of nanoscale multi functional oxide films III, 2011, Nice, France. ⟨hal-00807666⟩
  • Y. Bourlier, C. Lethien, R. Bernard, P. Roussel, D. Deresmes, et al.. Sol-gel synthesis and thin films development of CuIn(Ga)S2 : an energy solar scavenging device used for wireless autonomous systems. International Photovoltaic Technical Conference, PVTC 2011, " Thin Film & Advanced Solutions 2011 ", 2011, Aix-en-Provence, France. ⟨hal-00591388⟩
  • S.L. Bravina, N.V. Morozovsky, E.A. Eliseev, A.N. Morozovska, J. Costecalde, et al.. Electrode size effect under PFM characterization of PZT-film on silicon structures with micro- and nanometric top electrodes. Joint 20th IEEE International Symposium on Applications of Ferroelectrics and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, ISAF-PFM-2011, 2011, Vancouver, Canada. pp.1-3, ⟨10.1109/ISAF.2011.6014002⟩. ⟨hal-00800402⟩
  • H. Diesinger, D. Deresmes, J.P. Nys, Thierry Melin. Performance en terme de bruit vers bande passante d'un microscope Kelvin mode détection de fréquence (FM-KFM). Forum des Microscopies à Sonde Locale, 2010, Mittelwihr, France. ⟨hal-00574421⟩
  • A. Gokarna, F. Leroy, S. Gong, P. Roussel, D. Deresmes, et al.. Hydrothermal growth of high quality, vertically aligned ZnO nanorods on silicon substrate. 13èmes Journées Nano, Micro et Optoélectronique, JNMO 2010, 2010, Les Issambres, France. ⟨hal-00574122⟩
  • Maxime Berthe, B. Grandidier, G. Mahieu, T. Xu, D. Deresmes, et al.. Resolving dopants in semiconductors by scanning tunneling microscopy. Journées Thématiques du GdR Nanofils Semiconducteurs - Dopage des nanofils semiconducteurs, 2010, Rouen, France. ⟨hal-00808236⟩
  • Denis Remiens, R.H. Liang, Caroline Soyer, D. Troadec, D. Deresmes, et al.. PZT films etched by focused Ga3+ ion beam : studies of ion damage and post annealing treatment effects. International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, PFM 2009, 2009, Aveiro, Portugal. ⟨hal-00575744⟩
  • L. Borowik, K. Kusiaku, D. Theron, H. Diesinger, D. Deresmes, et al.. Charge transfer from doped silicon nanocrystals. 10th Trends in Nanotechnology International Conference, TNT2009, 2009, Barcelona, Spain. ⟨hal-00575400⟩
  • K. Smaali, S. Lenfant, D. Deresmes, S. Godey, D. Vuillaume, et al.. Interrupteur optique réversible constitué d'une monocouche auto-assemblée de molécules azobenzènes. Forum des microscopies à sonde locale, 2009, Hardelot, France. ⟨hal-00574902⟩
  • L. Borowik, K. Kusiaku, D. Deresmes, D. Théron, H. Diesinger, et al.. Kelvin probe force microscopy of charge transfer mechanisms from doped silicon nanocrystals. Materials Research Society Fall Meeting, MRS Fall 2009, Symposium OO : Dynamic Scanning Probes - Imaging, Characterization, and Manipulation, 2009, Boston, MA, United States. ⟨hal-00575344⟩
  • L. Borowik, K. Kusiaku, D. Theron, H. Diesinger, D. Deresmes, et al.. Charge transfer from doped silicon nanocrystals. 12th International Conference on Noncontact Atomic Force Microscopy, NC-AFM 2009, 2009, New Haven, CT, United States. ⟨hal-00575399⟩
  • H. Diesinger, D. Deresmes, J.P. Nys, Thierry Melin. Comportement dynamique de microscopie Kelvin en mode AM sous ultravide. Forum des Microscopies à Sonde Locale, 2009, Hardelot, France. ⟨hal-00575395⟩
  • D. Vuillaume, K. Smaali, S. Lenfant, D. Deresmes, S. Godey, et al.. Propriétés électro-optiques de commutateurs moléculaires à base de dérivés oligothiophène-azobenzène. Vingt-deuxièmes Entretiens France-Québec Jacques Cartier, 'Polymères et oligomères pour l'optoélectronique et ses applications', 2009, Grenoble, France. ⟨hal-00574929⟩
  • L. Borowik, K. Kusiaku, D. Theron, H. Diesinger, D. Deresmes, et al.. Electrostatic properties of doped silicon nanocrystals probed by Kelvin force microscopy. Forum des Microscopies à Sonde Locale, 2009, Hardelot, France. ⟨hal-00575340⟩
  • K. Smaali, S. Lenfant, D. Deresmes, S. Godey, D. Vuillaume, et al.. Interrupteur optique réversible constitué d'une monocouche auto-assemblée de dérivés azobenzènes. Colloque Matériaux et Nanostructures Pi-conjugés, MNPC09, 2009, Arcachon, France. ⟨hal-00574908⟩
  • Thierry Melin, K. Kusiaku, S. Barbet, D. Deresmes, D. Theron, et al.. Kelvin force microscopy for n- and p-type GaN surface characterization. Worskhop on Compound Semiconductor Materials and Devices, WOCSEMMAD'09, 2009, Fort Myers, FL, United States. ⟨hal-00575345⟩
  • K. Smaali, S. Lenfant, D. Deresmes, S. Godey, D. Vuillaume, et al.. High 'on-off' conductance ratio in self-assembled monolayers of azobenzene derivatized oligothiophenes grafted on gold. 10th European Conference on Molecular Electronics, ECME 2009, 2009, Copenhagen, Denmark. ⟨hal-00574930⟩
  • D. Deresmes, J.P. Nys, Maxime Berthe. La plate-forme nanocaractérisation et microscopie en champ proche de l'IEMN. Forum des Microscopies à Sonde Locale, 2009, Hardelot, France. ⟨hal-00575396⟩
  • K. Smaali, S. Lenfant, D. Vuillaume, D. Deresmes, S. Karpe, et al.. Reversible electro-optical switch of self-assembled monolayers of azobenzene-derivatized oligothiophenes grafted on gold. Materials Research Society Spring Meeting, 2009, San Francisco, CA, United States. ⟨hal-00574927⟩
  • Denis Remiens, R. Liang, Caroline Soyer, D. Troadec, D. Deresme, et al.. PZT films etched by focused Ga+ ion beam : study of ion damage. European Materials Research Society Spring Meeting, E-MRS Spring 2009, Symposium H : Synthesis, Processing and Characterization of Nanoscale Multi Functional Oxide Films II, 2009, Strasbourg, France. ⟨hal-00575750⟩
  • S. Lenfant, K. Smali, D. Deresmes, S. Godey, D. Vuillaume, et al.. Self-assembled monolayer of pi-conjugated molecules on gold for electric and photoelectric studies. 4th International Workshop on Electronics Structure and Processes at Molecular-based Interfaces, ESPMI IV, 2008, Princeton, NJ, United States. ⟨hal-00361962⟩
  • K. Smaali, S. Lenfant, D. Deresmes, S. Godey, D. Vuillaume, et al.. Reversible electro-optical switch of self-assembled monolayers of azobenzene-derivatized oligothiophenes grafted on gold. 9th International Conference on Molecular Electronics, Molecular Electronics IX, 2008, Kauai, HI, United States. ⟨hal-00361963⟩
  • K. Smaali, S. Lenfant, D. Deresmes, S. Godey, D. Vuillaume, et al.. Interrupteur optique réversible constitué d'une monocouche auto-assemblée de molécules azobenzènes. 11ème Journées de la Matière Condensée, JMC11, 2008, Strasbourg, France. ⟨hal-00361579⟩
  • H. Diesinger, D. Deresmes, D. Brunel, L. Borovic, D. Hourlier, et al.. Optimisation de la réponse fréquentielle des montages KFM et exemples d'application à des dispositifs à nanotube de carbone. Forum des Microscopies à Sonde Locale, 2008, La Londe les Maures, France. ⟨hal-00376237⟩
  • K. Smaali, S. Lenfant, D. Deresmes, S. Godey, D. Vuillaume, et al.. Reversible electro-optical switch of self-assembled monolayers of azobenzene-derivatized oligothiophenes grafted on gold. 4th International Meeting on Molecular Electronics, ElecMol'08, 2008, _, France. ⟨hal-00361583⟩
  • S. Lenfant, D. Deresmes, D. Vuillaume. Electronic transport through alkylthiol monolayers under mechanical stress measured by Conducting-AFM. 9th European Conference on Molecular Electronics, ECME 2007, 2007, Metz, France. ⟨hal-00285225⟩
  • S. Barbet, D. Deresmes, Thierry Melin, D. Theron, R. Aubry, et al.. Analyse du potentiel de surface du GaN par microscopie à sonde de Kelvin (KFM). 10ème Forum des Microscopies à Sonde Locale, 2007, Troyes, France. ⟨hal-00285285⟩
  • S. Barbet, R. Aubry, D. Deresmes, M.A. Poisson, H. Diesinger, et al.. Kelvin force microscopy on GaN wide gap materials. Materials Research Society Fall Meeting, Symposium B : Nanoscale Phenomena in Functional Materials by Scanning Probe Microscopy, 2007, Boston, MA, United States. ⟨hal-00285289⟩
  • S. Barbet, R. Aubry, D. Deresmes, M.A. Poisson, F. Romero, et al.. Kelvin force microscopy on GaN material and devices. 16th European Workshop on Heterostructure Technology, HeTech'07, 2007, Fréjus, France. ⟨hal-00285314⟩
  • S. Wang, D. Troadec, D. Deresmes, R. Liang, Caroline Soyer, et al.. PZT films etched by focused Ga+ ion beam : study of ion damage and post annealing treatment effects. Proceedings of the 19th International Symposium on Integrated Ferroelectrics, ISIF-19, 2007, Bordeaux, France. ⟨hal-00367386⟩
  • S. Lenfant, D. Deresmes, D. Vuillaume. Caractérisation électronique sous contraintes mécaniques de monocouches auto-assemblées par Conducting-AFM. 10ème Forum des Microscopies à Sonde Locale, 2007, Troyes, France. ⟨hal-00284520⟩
  • S. Lenfant, D. Deresmes, D. Vuillaume. Electronic transport through alkylthiol monolayers under mechanical stress measured by Conducting-AFM. European Materials Research Society Spring Meeting, Symposium K : Nanoscale self-assembly and patterning, 2007, Strasbourg, France. ⟨hal-00285224⟩
  • S. Lenfant, D. Deresmes, D. Vuillaume. Electronic transport through alkylthiol monolayers under mechanical stress measured by Conducting-AFM. Matériaux et Nanostructures Pi-Conjugués, MNPC07, 2007, Le Grau du Roi, France. ⟨hal-00285229⟩
  • H. Diesinger, D. Hourlier, D. Brunel, D. Deresmes, J.P. Nys, et al.. Kelvin force microscopy frequency response optimization and application to nanowire/nanotube devices under polarization. Materials Research Society Fall Meeting, Symposium B : Nanoscale Phenomena in Functional Materials by Scanning Probe Microscopy, 2007, Boston, MA, United States. ⟨hal-00285290⟩
  • Maxime Berthe, A. Urbieta, R. Stiufiuc, B. Grandidier, D. Deresmes, et al.. Running current through a single non resonant quantum state in silicon. European Conference on Surface Science, ECOSS 24, 2006, Paris, France. ⟨hal-00127916⟩
  • S. Lenfant, D. Deresmes, D. Vuillaume. Electronic transport through alkylthiol monolayers under mechanical stress measured by Conducting-AFM. Third Meeting on Molecular Electronics, ElecMol'06, 2006, Grenoble, France. ⟨hal-00163252⟩
  • B. Grandidier, R. Stiufiuc, Maxime Berthe, C. Delerue, D. Deresmes, et al.. Réseau organique, atome artificiel et liaison pendante silicium : apport de la spectroscopie STM. 10èmes Journées de la Matière Condensée, JMC10, 2006, Toulouse, France. ⟨hal-00127920⟩
  • Maxime Berthe, A. Urbieta, R. Stiufiuc, B. Grandidier, D. Deresmes, et al.. Running current through a single non resonant quantum state in silicon. 4th International Conference on Scanning Probe Spectroscopy and 1st International Workshop on Spin-Polarized Scanning Tunneling Microscopy, SPS'06 SPSTM-1, 2006, Hamburg, Germany. ⟨hal-00127890⟩
  • B. Grandidier, G. Mahieu, D. Deresmes, J.P. Nys, D. Stievenard, et al.. Study of titanium silicides nanowires on Si(111) by scanning tunnelling microscopy. GDR Nanoélectronique - Journées Matériaux Semi-conducteurs pour Nanostructures, 2005, Villeneuve d'Ascq, France. ⟨hal-00126446⟩
  • A. Urbieta, B. Grandidier, J.P. Nys, D. Deresmes, D. Stiévenard. Semiconductor surface reconstructions of the Si(100) surface at 5K. 52nd International Symposium and Exhibition of the American Vacuum Society, AVS-52, 2005, Boston, MA, United States. ⟨hal-00126447⟩
  • H. Diesinger, Thierry Melin, S. Barbet, D. Deresmes, D. Stievenard. Electric force microscopy of individually charged semiconductor nanoparticles. Trends in Nanotechnology, TNT 2005, 2005, Oviedo, Spain. ⟨hal-00126431⟩
  • Thierry Melin, H. Diesinger, S. Barbet, D. Deresmes, T. Baron, et al.. Electric force microscopy of individually charged silicon nanoparticles. Materials Research Society 2005 Fall Meeting, 2005, Boston, MA, United States. ⟨hal-00126439⟩
  • B. Grandidier, G. Mahieu, D. Deresmes, J.P. Nys, D. Stievenard, et al.. Acceptor states in GaAs studied by X-STS at 5K. 13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, STM'05, 2005, Sapporo, Japan. ⟨hal-00126437⟩
  • A.S. Rollier, Bernard Legrand, D. Deresmes, M. Lagouge, D. Collard, et al.. Tensile stress determination in silicon nitride membrane by AFM characterization. 2005, pp.828-831. ⟨hal-00125660⟩
  • T. Heim, Thierry Melin, D. Deresmes, D. Vuillaume. Charge transport in DNA. 5th International Symposium on MEMS and Nanotechnology, 2004, Costa Mesa, CA, United States. ⟨hal-00140750⟩
  • Thierry Melin, Heinrich Diesinger, D. Deresmes, T. Baron, S. Barbet, et al.. Electrostatic force microscopy of individuallt charged silicon nanoparticles. MRS Boston Symposium F, 2004, Boston, United States. ⟨hal-00485175⟩
  • T. Heim, D. Deresmes, D. Vuillaume. Charge transport in DNA probed by C-AFM and EFM. Materials Research Society Spring Meeting, 2004, San Francisco, CA, United States. ⟨hal-00140738⟩
  • Z. Hens, B. Grandidier, D. Deresmes, G. Allan, C. Delerue, et al.. Unusual density of states in brick-shaped PbSe nanocrystals. American Physical Society March Meeting, 2003, Austin, TX, United States. ⟨hal-00146641⟩
  • Thierry Melin, H. Diesinger, D. Deresmes, D. Stievenard. Un modèle analytique et quantitatif pour la microscopie à force électrique de nanoparticules chargées sur substrats conducteurs. Forum des microscopies à sonde locale, 2003, Montpellier, France. ⟨hal-00146642⟩
  • Thierry Melin, H. Diesinger, D. Deresmes, D. Stiévenard. Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : quantitative charge measurements and dipole-dipole interactions. 12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands. ⟨hal-00146614⟩
  • Thierry Melin, H. Diesinger, D. Deresmes, D. Stievenard. Electric force microscopy of individually charged semiconductor nanoparticles. Materials Research Society Fall Meeting, 2003, Boston, MA, United States. ⟨hal-00146615⟩
  • T. Heim, D. Deresmes, D. Vuillaume. Charge transport in DNA. Materials Research Society Fall Meeting, 2003, Boston, MA, United States. ⟨hal-00146174⟩
  • H. Diesinger, Thierry Melin, D. Deresmes, D. Stievenard. Injection contrôlée de charges dans des nanoparticules individuelles de silicium. Forum des microscopies à sonde locale, 2003, Montpellier, France. ⟨hal-00146612⟩
  • H. Diesinger, Thierry Melin, D. Deresmes, D. Stiévenard. Controlled charge injection in semiconductor nanoparticles. 12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands. ⟨hal-00146616⟩
  • Thierry Melin, D. Deresmes, D. Stievenard. Controlled charge injection in semiconductor nanoparticles. Proceedings of the 2002 Materials Research Society Fall Meeting, 2002, Boston, MA, United States. ⟨hal-00149956⟩
  • Thierry Melin, D. Deresmes, D. Stievenard. Controlled charge injection in semiconductor nanocrystals. 2002, 2 pp. ⟨hal-00149667⟩
  • Thierry Melin, D. Deresmes, D. Stievenard. Etude par EFM des propriétés de charge d'ilots semiconducteurs de taille nanométrique. Forum des microscopies à sonde locale, 2002, Spa, Belgique. ⟨hal-00149683⟩
  • X. Wallart, C. Priester, D. Deresmes, F. Mollot. Some key features of the Ga1-xInxAs surface reactivity to phosphorus. 2002, pp.107-108. ⟨hal-00148666⟩
  • X. Wallart, C. Priester, D. Deresmes, F. Mollot. Etude de la réactivité des surfaces d'alliages GaInAs (100) à un flux de phosphore. 9èmes Journées Nationales Microélectronique et Optoélectronique, JNMO 2002, 2002, Saint Aygulf, France. ⟨hal-00148676⟩
  • Thierry Melin, D. Deresmes, D. Stievenard. Etude par EFM de la charge/décharge d'îlots semiconducteurs de taille nanométrique. Journées d'utilisateurs nanoscope, 2001, Dijon, France. ⟨hal-00152560⟩
  • X. Wallart, C. Priester, D. Deresmes, F. Mollot. Croissance d'alliages GaInP contraints par épitaxie à jets moléculaires à sources gazeuses. 13ème Séminaire National sur l'Epitaxie par Jets Moléculaires, EJM 2000, 2000, Saint Aygulf, France. ⟨hal-00158441⟩
  • X. Wallart, D. Deresmes, F. Mollot. Growth of strained Ga1-xInxP layers on GaP (001) by gas source molecular beam epitaxy : comparison with the GaInAs/GaAs system. 2000, pp.231-234. ⟨hal-00158442⟩
  • X. Wallart, D. Deresmes, F. Mollot. Growth of strained Ga1-xInxP layers on GaP (001) by gas source molecular beam epitaxy : similarities and differences with the growth of strained arsenides. 2000, pp.255-259. ⟨hal-00158443⟩

Poster communications6 documents

  • Jessy Elias, Xavier Mercier, Alessandro Faccinetto, Nicolas Nuns, Sylvie Godey, et al.. Coupling of ToF-SIMS and AFM for the identification of the chemical species involved in the nucleation process of soot particles in flame combustion. European Aerosol Conference – EAC 2020, Aug 2020, Aachen, Germany. pp.457. ⟨hal-03008218⟩
  • A. Ferri, S. Saitzek, Z. Shao, A. Bayart, G. Declercq, et al.. «Top-down fabrication of lead-free La₂Ti₂O₇ piezoelectric nanostructures». E-MRS 2015 Spring Meeting, 2015, Lille, France. 2015. ⟨hal-01727650⟩
  • A. Ferri, S. Saitzek, Z. Shao, A. Bayart, G. Declercq, et al.. «Impact de faisceaux d’ions Ga+ sur les propriétés piézoélectriques locales de couches minces et de nano-îlots de La₂Ti₂O₇». Journées Nanosciences et Nanotechnologies du Nord-Ouest, Dec 2014, Orléans, France. 2014. ⟨hal-01739750⟩
  • A. Ferri, S. Saitzek, Z. Shao, A. Bayart, G. Declercq, et al.. «Impact des faisceaux d’ions sur les propriétés fonctionnelles de couches minces et de nano-îlots piézoélectriques de La₂Ti₂O₇». Congrès Matériaux 2014, Nov 2014, Montpellier, France. 2014. ⟨hal-01739751⟩
  • A. Ferri, S. Saitzek, A. Bayart, Z. Shao, G. Declercq, et al.. «Impact of Ga+ ion beam irradiation on nanostructured La₂Ti₂O₇ piezoelectric thin films». Colloque national 2014 du GDR OXYFUN, Jun 2014, Autrans, France. 2014. ⟨hal-01739753⟩
  • R. Desfeux, A. Ferri, A. da Costa, S. Saitzek, M-H. Chambrier, et al.. «Nanostructures piézoélectriques fabriquées par faisceau d’ions Ga+ focalisés sur couches minces». Journée d’échange Fédération Chevreul-IEMN –, Mar 2013, Villeneuve d’Ascq, France. 2013. ⟨hal-01739836⟩

Book sections3 documents

  • A. Ferri, Denis Remiens, R. Desfeux, A. da Costa, D. Deresmes, et al.. Evaluation of damages induced by Ga+ - focused ion beam in piezoelectric nanostructures. Zhiming M. Wang. FIB Nanostructures, Springer International Publishing, volume 20, chapter 17, 417-434, 2013, Lecture Notes in Nanoscale Science and Technology, ISBN 978-3-319-02873-6 ; e-ISBN 978-3-319-02874-3. ⟨10.1007/978-3-319-02874-3_17⟩. ⟨hal-00927494⟩
  • Denis Remiens, D. Deresmes, D. Troadec, J. Costecalde. Ga3+ focused ion beam for piezo electric nano structuration fabrication. Goorsky M. Ion implantation, InTech, chapter 13, 315-326, 2012, ISBN 978-953-51-0634-0. ⟨10.5772/34139⟩. ⟨hal-00798990⟩
  • H. Diesinger, D. Deresmes, Thierry Melin. Capacitive crosstalk in AM-mode KPFM. Sadewasser S., Glatzel T. Kelvin probe force microscopy - Measuring and compensating electrostatic forces, Springer, Volume 48, Part 1, Chapter 3, 25-44, 2012, Springer Series in Surface Science, ISBN 978-3-642-22565-9. ⟨10.1007/978-3-642-22566-6_3⟩. ⟨hal-00798961⟩

Patents1 document

  • Thierry Melin, D. Theron, S. Barbet, D. Deresmes, H. Diesinger. Mesure du potentiel de surface d'un matériau. N° de brevet: FR2956484 (A1). 2011. ⟨hal-00616299⟩

Preprints, Working Papers, ...2 documents

  • Thomas Heim, Dominique Deresmes, Dominique Vuillaume. Conductivity of DNA probed by conducting-atomic force microscopy: effects of contact electrode, DNA structure, surface interactions.. 2004. ⟨hal-00001605⟩
  • Thomas Heim, Thierry Melin, Dominique Deresmes, Dominique Vuillaume. Localization and delocalization of charges injected in DNA. 2004. ⟨hal-00002773⟩