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Didier Blavette

18
Documents

Présentation

**Didier Blavette,** Maried, three children, born on the 7th of November, 1955 Professor at the University of Rouen, Groupe de Physique des Matériaux (GPM) **Carrer** Attaché de Recherche CNRS - 1981 Chargéde Recherche CNRS - 1984 Professor at the University of Rouen – 1990 Exceptional rank Professor – 2003 **Diploma** DEA Physique du solide 1979 Thèse de troisième cycle (PhD) 1981 Doctorat d’Etat ((Habilitation)1986 **Awards** JULES GARNIER prize **1988** awarded by the French society for metallurgy (SF2M). Member of INSTITUT UNIVERSITAIRE DE FRANCE (Junior) – **1992**-1997 CHEVENARD medal awarded by SF2M - **1993** ESCLANGON prize awarded by the french society of physics (SFP) **1995** ROCARD prize, SFP, **2000** **Silver medal awarded by CNRS – 2000** Member of INSTITUT UNIVERSITAIRE DE FRANCE (senior) – 2007-2012 Chevalier de l’Ordre National du Mérite 2010 fellow award of International Field Emission Society – 2015 **Publications – Communications – scientific production** Author or co-author of 250 articles 73 invited conferences or keynotes, 58 invited seminars Patent 95 08607, position sensitive detector for atom probe tomography (B. Deconihout, A. Bostel, D. Blavette) **Responsabilities** **President of the French microscopy society 2014-2015, VP 2016** **Nominated member of the scientific council of the physics institute of CNRS 2015-** **Director of the graduate school SPMII (engineering, physics, maths, information science) -2012** **Director of Groupe de Physique des Matériaux (UMR CNRS 6634) 2003-2011** Direction of Groupement de Recherche (GDR - CNRS) « TransDiff » 2006-2009 Director of the CNRS school « diffusive phase transformation » Porquerolles, 2008 Supervision of the design and development of the tomographic atom probe (1990-1994) **Member of the Steering Committee of the International Field Emission Society** Secretary) (1992-1995) Vice-president (1995-96) Supervisor of 27 PhD theses

Publications

williams-lefebvre

Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

Enrico Di Russo , F. Moyon , N. Gogneau , L. Largeau , E. Giraud
Journal of Physical Chemistry C, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩
Article dans une revue hal-01928844v1

Three-dimensional atomic-scale investigation of ZnO-Mg x Zn 1−x O m-plane heterostructures

Enrico Di Russo , L. Mancini , F. Moyon , Simona Moldovan , Jonathan Houard
Applied Physics Letters, 2017, 111 (3), pp.032108. ⟨10.1063/1.4994659⟩
Article dans une revue hal-01766135v1

Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem

Lorenzo Rigutti , L. Mancini , Enrico Di Russo , Ivan Blum , F. Moyon
Microscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩
Article dans une revue hal-01954232v1

Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers

Lorenzo Rigutti , L. Mancini , Williams Lefebvre , Jonathan Houard , Daniel Hernandez Maldonado
Semiconductor Science and Technology, 2016, 31 (9), pp.095009. ⟨10.1088/0268-1242/31/9/095009⟩
Article dans une revue hal-01928848v1

Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N

Lorenzo Rigutti , L. Mancini , Daniel Hernandez Maldonado , Williams Lefebvre , E. Giraud
Journal of Applied Physics, 2016, 119 (10), pp.105704. ⟨10.1063/1.4943612⟩
Article dans une revue hal-01928851v1

Clustering and nearest neighbour distances in atom-probe tomography

Thomas Philippe , F. de Geuser , Sébastien Duguay , Williams Lefebvre , O. Cojocaru-Mirédin
Ultramicroscopy, 2009, 109, pp.1304-1309. ⟨10.1016/j.ultramic.2009.06.007⟩
Article dans une revue hal-00457542v1
Image document

An improved reconstruction procedure for the correction of local magnification effects in three-dimensional atom-probe

F. de Geuser , Williams Lefebvre , Frédéric Danoix , François Vurpillot , B. Forbord
Surface and Interface Analysis, 2007, 39 (2-3), pp.268--272. ⟨10.1002/sia.2489⟩
Article dans une revue hal-00408094v1

Atom probe tomography II. The precipitation in Al base alloys

F. de Geuser , Williams Lefebvre , P. Auger , Frédéric Danoix , A. Bigot
Advanced Engineering Materials, 2006, 8 (12), pp.1206--1209. ⟨10.1002/adem.200600180⟩
Article dans une revue hal-01928900v1
Image document

3D atom probe study of solute atoms clustering during natural ageing and pre-ageing of an Al-Mg-Si alloy

F. de Geuser , Williams Lefebvre , D. Blavette
Philosophical Magazine Letters, 2006, 86 (4), pp.227--234. ⟨10.1080/09500830600643270⟩
Article dans une revue hal-00408093v1

Atom probe study of phase transformations in a Ti-48 at.% Al alloy

Williams Lefebvre , A. Menand , A. Loiseau , D. Blavette
Materials Science and Engineering: A, 2002, 327 (1), pp.40--46. ⟨10.1016/S0921-5093(01)01890-1⟩
Article dans une revue hal-01928915v1

3D Atom Probe investigation of the early stages of precipitation in an Al-Mg-Si alloy

Frederic de Geuser , Williams Lefebvre , D. Blavette
International Conference on Solid-Solid Phase Transformations in Inorganic Materials (PTM), 2005, Phoenix, United States
Communication dans un congrès hal-01838936v1

3D Atom Probe investigation of the early stages of precipitation in an Al-Mg-Si alloy

F. de Geuser , Williams Lefebvre , D. Blavette
German-French symposium, 2005, Rouen, France
Communication dans un congrès hal-01838934v1

Atom Probe Tomography in Materials Science

D. Blavette , Frederic de Geuser , Williams Lefebvre , E. Bémont
Journées d'automne de la SF2M, 2005, Paris, France
Communication dans un congrès hal-01838933v1

An improved reconstruction procedure for the correction of local magnification effects in 3D Atom Probe

Frederic de Geuser , W. Lefebvre , Frédéric Danoix , F. Vurpillot , B. Forbord
49th International Field Emission Symposium (IFES), 2004, Graz, Austria
Communication dans un congrès hal-01838942v1

Detection of dissociated Al hydrides by APFIM

F. de Geuser , Frédéric Danoix , Williams Lefebvre , D. Blavette
3D Atom Probe Workshop, Oak Ridge National Laboratory, 2003, Oak Ridge, United States
Communication dans un congrès hal-01838943v1

3D atom probe: Chemical analysis with (near) atomic resolution

Frédéric Danoix , F. Vurpillot , Williams Lefebvre , D. Blavette
Microscopy and Microanalysis, 2003, Unknown, Unknown Region. pp.568--569
Communication dans un congrès hal-01928912v1