Didier Blavette
1
Documents
Présentation
**Didier Blavette,** Maried, three children, born on the 7th of November, 1955
Professor at the University of Rouen, Groupe de Physique des Matériaux (GPM)
**Carrer**
Attaché de Recherche CNRS - 1981 Chargéde Recherche CNRS - 1984
Professor at the University of Rouen – 1990
Exceptional rank Professor – 2003
**Diploma**
DEA Physique du solide 1979
Thèse de troisième cycle (PhD) 1981
Doctorat d’Etat ((Habilitation)1986
**Awards**
JULES GARNIER prize **1988** awarded by the French society for metallurgy (SF2M).
Member of INSTITUT UNIVERSITAIRE DE FRANCE (Junior) – **1992**-1997
CHEVENARD medal awarded by SF2M - **1993**
ESCLANGON prize awarded by the french society of physics (SFP) **1995**
ROCARD prize, SFP, **2000**
**Silver medal awarded by CNRS – 2000**
Member of INSTITUT UNIVERSITAIRE DE FRANCE (senior) – 2007-2012
Chevalier de l’Ordre National du Mérite 2010
fellow award of International Field Emission Society – 2015
**Publications – Communications – scientific production**
Author or co-author of 250 articles
73 invited conferences or keynotes, 58 invited seminars
Patent 95 08607, position sensitive detector for atom probe tomography (B. Deconihout, A. Bostel, D. Blavette)
**Responsabilities**
**President of the French microscopy society 2014-2015, VP 2016**
**Nominated member of the scientific council of the physics institute of CNRS 2015-**
**Director of the graduate school SPMII (engineering, physics, maths, information science) -2012**
**Director of Groupe de Physique des Matériaux (UMR CNRS 6634) 2003-2011**
Direction of Groupement de Recherche (GDR - CNRS) « TransDiff » 2006-2009
Director of the CNRS school « diffusive phase transformation » Porquerolles, 2008
Supervision of the design and development of the tomographic atom probe (1990-1994)
**Member of the Steering Committee of the International Field Emission Society**
Secretary) (1992-1995) Vice-president (1995-96)
Supervisor of 27 PhD theses
Publications
- 1
- 1
- 1
- 1
- 1
Characterization and simulation of SiGe HBT degradation nduced by electromagnetic field stressProceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 2009, Unknown, Unknown Region. pp.751--755, ⟨10.1109/IPFA.2009.5232729⟩
Communication dans un congrès
hal-01928879v1
|