Didier Blavette

Documents

Présentation

**Didier Blavette,** Maried, three children, born on the 7th of November, 1955 Professor at the University of Rouen, Groupe de Physique des Matériaux (GPM) **Carrer** Attaché de Recherche CNRS - 1981 Chargéde Recherche CNRS - 1984 Professor at the University of Rouen – 1990 Exceptional rank Professor – 2003 **Diploma** DEA Physique du solide 1979 Thèse de troisième cycle (PhD) 1981 Doctorat d’Etat ((Habilitation)1986 **Awards** JULES GARNIER prize **1988** awarded by the French society for metallurgy (SF2M). Member of INSTITUT UNIVERSITAIRE DE FRANCE (Junior) – **1992**-1997 CHEVENARD medal awarded by SF2M - **1993** ESCLANGON prize awarded by the french society of physics (SFP) **1995** ROCARD prize, SFP, **2000** **Silver medal awarded by CNRS – 2000** Member of INSTITUT UNIVERSITAIRE DE FRANCE (senior) – 2007-2012 Chevalier de l’Ordre National du Mérite 2010 fellow award of International Field Emission Society – 2015 **Publications – Communications – scientific production** Author or co-author of 250 articles 73 invited conferences or keynotes, 58 invited seminars Patent 95 08607, position sensitive detector for atom probe tomography (B. Deconihout, A. Bostel, D. Blavette) **Responsabilities** **President of the French microscopy society 2014-2015, VP 2016** **Nominated member of the scientific council of the physics institute of CNRS 2015-** **Director of the graduate school SPMII (engineering, physics, maths, information science) -2012** **Director of Groupe de Physique des Matériaux (UMR CNRS 6634) 2003-2011** Direction of Groupement de Recherche (GDR - CNRS) « TransDiff » 2006-2009 Director of the CNRS school « diffusive phase transformation » Porquerolles, 2008 Supervision of the design and development of the tomographic atom probe (1990-1994) **Member of the Steering Committee of the International Field Emission Society** Secretary) (1992-1995) Vice-president (1995-96) Supervisor of 27 PhD theses

Publications

francois-vurpillot

	Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography Enrico Di Russo , Ivan Blum , Ivan Rivalta , Jonathan Houard , Gérald da Costa Journal of Physical Chemistry A, 2020, 124 (52), pp.10977-10988. ⟨10.1021/acs.jpca.0c09259⟩ Article dans une revue hal-03120561v1
	Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom Probe Enrico Di Russo , Pradip Dalapati , Jonathan Houard , Linda Venturi , Ivan Blum Nano Letters, 2020, ⟨10.1021/acs.nanolett.0c03584⟩ Article dans une revue hal-03024946v1
	A Photonic Atom Probe coupling 3D Atomic Scale Analysis with in situ Photoluminescence Spectroscopy Jonathan Houard , Antoine Normand , Enrico Di Russo , Christian Bacchi , P Dalapati Review of Scientific Instruments, 2020, 91, pp.083704. ⟨10.1063/5.0012359⟩ Article dans une revue hal-02902892v1
	Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives J. Barnes , A. Grenier , I. Mouton , S. Barraud , G. Audoit Scripta Materialia, 2018, 148, pp.91 - 97. ⟨10.1016/j.scriptamat.2017.05.012⟩ Article dans une revue hal-01765929v1
	Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography Enrico Di Russo , F. Moyon , N. Gogneau , L. Largeau , E. Giraud Journal of Physical Chemistry C, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩ Article dans une revue hal-01928844v1
	New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint Nicolas Rolland , François Vurpillot , Sébastien Duguay , Baishakhi Mazumder , James Speck Microscopy and Microanalysis, 2017, 23 (02), pp.247 - 254. ⟨10.1017/s1431927617000253⟩ Article dans une revue hal-01766098v1
	Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem Lorenzo Rigutti , L. Mancini , Enrico Di Russo , Ivan Blum , F. Moyon Microscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩ Article dans une revue hal-01954232v1
	Accuracy of analyses of microelectronics nanostructures in atom probe tomography François Vurpillot , Nicolas Rolland , Robert Estivill , Sébastien Duguay , D. Blavette Semiconductor Science and Technology, 2016, 31 (7), pp.074002. ⟨10.1088/0268-1242/31/7/074002⟩ Article dans une revue hal-01928850v1
	Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N Lorenzo Rigutti , L. Mancini , Daniel Hernandez Maldonado , Williams Lefebvre , E. Giraud Journal of Applied Physics, 2016, 119 (10), pp.105704. ⟨10.1063/1.4943612⟩ Article dans une revue hal-01928851v1
	Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers Lorenzo Rigutti , L. Mancini , Williams Lefebvre , Jonathan Houard , Daniel Hernandez Maldonado Semiconductor Science and Technology, 2016, 31 (9), pp.095009. ⟨10.1088/0268-1242/31/9/095009⟩ Article dans une revue hal-01928848v1
	Quantitative investigation of SiGeC layers using atom probe tomography Robert Estivill , Adeline Grenier , Sébastien Duguay , François Vurpillot , Tanguy Terlier Ultramicroscopy, 2015, 150, pp.23--29. ⟨10.1016/j.ultramic.2014.11.020⟩ Article dans une revue hal-01928855v1
	Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation Nicolas Rolland , François Vurpillot , Sébastien Duguay , Didier Blavette European Physical Journal: Applied Physics, 2015, 72 (2), pp.21001. ⟨10.1051/epjap/2015150233⟩ Article dans une revue hal-02107622v1
	A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography Nicolas Rolland , François Vurpillot , Sébastien Duguay , Didier Blavette Microscopy and Microanalysis, 2015, 21 (6), pp.1649-1656. ⟨10.1017/S1431927615015184⟩ Article dans une revue hal-02107013v1
	Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques A. Grenier , Sébastien Duguay , J. P. Barnes , R. Serra , Nicolas Rolland Applied Physics Letters, 2015, 106 (21), pp.213102. ⟨10.1063/1.4921352⟩ Article dans une revue hal-01928856v1
	Quantitative analysis of Si/SiGeC superlattices using atom probe tomography Robert Estivill , Adeline Grenier , Sébastien Duguay , François Vurpillot , Tanguy Terlier Ultramicroscopy, 2015, 159, pp.223-231. ⟨10.1016/j.ultramic.2015.03.014⟩ Article dans une revue hal-02107589v1
	An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials Nicolas Rolland , D. J. Larson , B. P. Geiser , Sébastien Duguay , François Vurpillot Ultramicroscopy, 2015, 159, pp.195--201. ⟨10.1016/j.ultramic.2015.03.010⟩ Article dans une revue hal-01928854v1
	Atomic-scale imaging and analysis of single layer GP zones in a model steel Frédéric Danoix , T. Epicier , François Vurpillot , D. Blavette Journal of Materials Science, 2012, 47 (3), pp.1567-1571. ⟨10.1007/s10853-011-6008-4⟩ Article dans une revue hal-01834903v1
	Atom probe tomography: 3D imaging at the atomic level D. Blavette , François Vurpillot , Bernard Deconihout , A. Menand Advanced Structured Materials, 2011, 10, pp.201--222. ⟨10.1007/978-3-642-17782-8_9⟩ Article dans une revue hal-01928872v1
	Three-dimensional atomic-scale imaging of boron clusters in implanted silicon O. Cojocaru-Mirédin , Emmanuel Cadel , François Vurpillot , Dominique Mangelinck , D. Blavette Scripta Materialia, 2009, 60 (5), pp.285-288. ⟨10.1016/j.scriptamat.2008.10.008⟩ Article dans une revue hal-01953258v1
	Laser-assisted atom probe tomography and nanosciences Didier Blavette , Talaat Al Kassab , Emmanuel Cadel , Alexander Mackel , François Vurpillot International Journal of Materials Research, 2008, 99 (5), pp.454--460. ⟨10.3139/146.101672⟩ Article dans une revue hal-01929148v1
	An improved reconstruction procedure for the correction of local magnification effects in three-dimensional atom-probe F. de Geuser , Williams Lefebvre , Frédéric Danoix , François Vurpillot , B. Forbord Surface and Interface Analysis, 2007, 39 (2-3), pp.268--272. ⟨10.1002/sia.2489⟩ Article dans une revue hal-00408094v1
	Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitter B. Gault , A. Vella , François Vurpillot , A. Menand , D. Blavette Ultramicroscopy, 2007, 107 (9), pp.713--719. ⟨10.1016/j.ultramic.2007.02.004⟩ Article dans une revue hal-01928886v1
	Design of a femtosecond laser assisted tomographic atom probe B. Gault , François Vurpillot , A. Vella , M. Gilbert , A. Menand Review of Scientific Instruments, 2006, 77 (4), ⟨10.1063/1.2194089⟩ Article dans une revue hal-01928897v1
	Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probe François Vurpillot , F. de Geuser , Gérald da Costa , D. Blavette Journal of Microscopy, 2004, 216 (3), pp.234--240. ⟨10.1111/j.0022-2720.2004.01413.x⟩ Article dans une revue hal-01928905v1
	A new step towards the lattice reconstruction in 3DAP François Vurpillot , Ludovic Renaud , D. Blavette Ultramicroscopy, 2003, 95, pp.223--229. ⟨10.1016/S0304-3991(02)00320-0⟩ Article dans une revue hal-01928911v1
	A new approach to the interpretation of atom probe field-ion microscopy images François Vurpillot , A. Bostel , D. Blavette Ultramicroscopy, 2001, 89 (1-3), pp.137--144. ⟨10.1016/S0304-3991(01)00097-3⟩ Article dans une revue hal-01928921v1
	Structural analyses in three-dimensional atom probe: A Fourier transform approach François Vurpillot , Gérald da Costa , A. Menand , D. Blavette Journal of Microscopy, 2001, 203 (3), pp.295--302. ⟨10.1046/j.1365-2818.2001.00923.x⟩ Article dans une revue hal-01928923v1
	A model accounting for spatial overlaps in 3D atom-probe microscopy D. Blavette , François Vurpillot , Philippe Pareige , A. Menand Ultramicroscopy, 2001, 89 (1-3), pp.145--153. ⟨10.1016/S0304-3991(01)00120-6⟩ Article dans une revue hal-01928919v1
	Trajectory overlaps and local magnification in three-dimensional atom probe François Vurpillot , A. Bostel , D. Blavette Applied Physics Letters, 2000, 76 (21), pp.3127--3129. ⟨10.1063/1.126545⟩ Article dans une revue hal-01928929v1
	The spatial resolution of 3D atom probe in the investigation of single-phase materials François Vurpillot , A. Bostel , E. Cadel , D. Blavette Ultramicroscopy, 2000, 84 (3-4), pp.213--224. ⟨10.1016/S0304-3991(00)00035-8⟩ Article dans une revue hal-01928928v1
	The shape of field emitters and the ion trajectories in three- dimensional atom probes François Vurpillot , A. Bostel , D. Blavette Journal of Microscopy, 1999, 196 (3), pp.332--336. ⟨10.1046/j.1365-2818.1999.00637.x⟩ Article dans une revue hal-01928937v1
	Trajectories of field emitted ions in 3D atom-probe François Vurpillot , A. Bostel , A. Menand , D. Blavette European Physical Journal: Applied Physics, 1999, 6 (2), pp.217--221. ⟨10.1051/epjap:1999173⟩ Article dans une revue hal-01928938v1

	Atom probe tomography: An imaging tool at the atomic scale using ltrafast laser pulses Bernard Deconihout , F. Vurpillot , Gérald da Costa , Jonathan Houard , Philippe Pareige CLEO: Applications and Technology, CLEO_AT 2013, 2013, Unknown, Unknown Region Communication dans un congrès hal-01928864v1
	Toward a laser assisted wide-angle tomographic atom-probe Bernard Deconihout , F. Vurpillot , B. Gault , Gérald da Costa , M. Bouet Surface and Interface Analysis, 2007, Unknown, Unknown Region. pp.278--282, ⟨10.1002/sia.2491⟩ Communication dans un congrès hal-01928893v1
	Laser atom probe tomography: Some applications D. Blavette , E. Cadel , Dominique Mangelinck , K. Hoummada , Rodrigue Lardé IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, 2006, Unknown, Unknown Region. pp.61--62, ⟨10.1109/IVNC.2006.335352⟩ Communication dans un congrès hal-01928901v1
	Atom probe tomography study of homogeneous and heterogeneous precipitation of niobium carbides in a model ferritic steel Frédéric Danoix , E. Bémont , Philippe Maugis , F. Vurpillot , D. Blavette IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, 2006, Unknown, Unknown Region. pp.91, ⟨10.1109/IVNC.2006.335372⟩ Communication dans un congrès hal-01928902v1
	The tomographic atom probe: Salient results and recent breakthroughs A. Menand , Bernard Deconihout , P. Pareige , F. Vurpillot , D. Blavette Microscopy and Microanalysis, 2005, Unknown, Unknown Region. pp.96--97, ⟨10.1017/S1431927605501545⟩ Communication dans un congrès hal-01928903v1
	Local magnification in 3DAP Didier Blavette , François Vurpillot , Frederic de Geuser , Emilie Bémont 49th International Field Emission Symposium (IFES), 2004, Graz, Austria Communication dans un congrès hal-01838941v1
	Modeling image distortions in 3DAP F. Vurpillot , A. Cerezo , D. Blavette , D. J. Larson Microscopy and Microanalysis, 2004, Unknown, Unknown Region. pp.384--390, ⟨10.1017/S1431927604040486⟩ Communication dans un congrès hal-01928907v1
	An improved reconstruction procedure for the correction of local magnification effects in 3D Atom Probe Frederic de Geuser , W. Lefebvre , Frédéric Danoix , F. Vurpillot , B. Forbord 49th International Field Emission Symposium (IFES), 2004, Graz, Austria Communication dans un congrès hal-01838942v1
	3D atom probe: Chemical analysis with (near) atomic resolution Frédéric Danoix , F. Vurpillot , Williams Lefebvre , D. Blavette Microscopy and Microanalysis, 2003, Unknown, Unknown Region. pp.568--569 Communication dans un congrès hal-01928912v1

Didier Blavette

Présentation

Publications

Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography

Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom Probe

A Photonic Atom Probe coupling 3D Atomic Scale Analysis with in situ Photoluminescence Spectroscopy

Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives

Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint

Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem

Accuracy of analyses of microelectronics nanostructures in atom probe tomography

Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N

Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers

Quantitative investigation of SiGeC layers using atom probe tomography

Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation

A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography

Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques

Quantitative analysis of Si/SiGeC superlattices using atom probe tomography

An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials

Atomic-scale imaging and analysis of single layer GP zones in a model steel

Atom probe tomography: 3D imaging at the atomic level

Three-dimensional atomic-scale imaging of boron clusters in implanted silicon

Laser-assisted atom probe tomography and nanosciences

An improved reconstruction procedure for the correction of local magnification effects in three-dimensional atom-probe

Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitter

Design of a femtosecond laser assisted tomographic atom probe

Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probe

A new step towards the lattice reconstruction in 3DAP

A new approach to the interpretation of atom probe field-ion microscopy images

Structural analyses in three-dimensional atom probe: A Fourier transform approach

A model accounting for spatial overlaps in 3D atom-probe microscopy

Trajectory overlaps and local magnification in three-dimensional atom probe

The spatial resolution of 3D atom probe in the investigation of single-phase materials

The shape of field emitters and the ion trajectories in three- dimensional atom probes

Trajectories of field emitted ions in 3D atom-probe

Atom probe tomography: An imaging tool at the atomic scale using ltrafast laser pulses

Toward a laser assisted wide-angle tomographic atom-probe

Laser atom probe tomography: Some applications

Atom probe tomography study of homogeneous and heterogeneous precipitation of niobium carbides in a model ferritic steel

The tomographic atom probe: Salient results and recent breakthroughs

Local magnification in 3DAP

Modeling image distortions in 3DAP

An improved reconstruction procedure for the correction of local magnification effects in 3D Atom Probe

3D atom probe: Chemical analysis with (near) atomic resolution