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Didier Blavette

8
Documents

Présentation

**Didier Blavette,** Maried, three children, born on the 7th of November, 1955 Professor at the University of Rouen, Groupe de Physique des Matériaux (GPM) **Carrer** Attaché de Recherche CNRS - 1981 Chargéde Recherche CNRS - 1984 Professor at the University of Rouen – 1990 Exceptional rank Professor – 2003 **Diploma** DEA Physique du solide 1979 Thèse de troisième cycle (PhD) 1981 Doctorat d’Etat ((Habilitation)1986 **Awards** JULES GARNIER prize **1988** awarded by the French society for metallurgy (SF2M). Member of INSTITUT UNIVERSITAIRE DE FRANCE (Junior) – **1992**-1997 CHEVENARD medal awarded by SF2M - **1993** ESCLANGON prize awarded by the french society of physics (SFP) **1995** ROCARD prize, SFP, **2000** **Silver medal awarded by CNRS – 2000** Member of INSTITUT UNIVERSITAIRE DE FRANCE (senior) – 2007-2012 Chevalier de l’Ordre National du Mérite 2010 fellow award of International Field Emission Society – 2015 **Publications – Communications – scientific production** Author or co-author of 250 articles 73 invited conferences or keynotes, 58 invited seminars Patent 95 08607, position sensitive detector for atom probe tomography (B. Deconihout, A. Bostel, D. Blavette) **Responsabilities** **President of the French microscopy society 2014-2015, VP 2016** **Nominated member of the scientific council of the physics institute of CNRS 2015-** **Director of the graduate school SPMII (engineering, physics, maths, information science) -2012** **Director of Groupe de Physique des Matériaux (UMR CNRS 6634) 2003-2011** Direction of Groupement de Recherche (GDR - CNRS) « TransDiff » 2006-2009 Director of the CNRS school « diffusive phase transformation » Porquerolles, 2008 Supervision of the design and development of the tomographic atom probe (1990-1994) **Member of the Steering Committee of the International Field Emission Society** Secretary) (1992-1995) Vice-president (1995-96) Supervisor of 27 PhD theses

Publications

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Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography

Enrico Di Russo , Ivan Blum , Ivan Rivalta , Jonathan Houard , Gérald da Costa
Journal of Physical Chemistry A, 2020, 124 (52), pp.10977-10988. ⟨10.1021/acs.jpca.0c09259⟩
Article dans une revue hal-03120561v1
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Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom Probe

Enrico Di Russo , Pradip Dalapati , Jonathan Houard , Linda Venturi , Ivan Blum
Article dans une revue hal-03024946v1

Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodes

Enrico Di Russo , Nikolay Cherkashin , Maxim Korytov , A. Nikolaev , A. Sakharov
Journal of Applied Physics, 2019, 126 (12), pp.124307. ⟨10.1063/1.5113799⟩
Article dans une revue hal-02298940v1

Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

Enrico Di Russo , F. Moyon , N. Gogneau , L. Largeau , E. Giraud
Journal of Physical Chemistry C, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩
Article dans une revue hal-01928844v1
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Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events

Enrico Di Russo , Ivan Blum , Jonathan Houard , M. Gilbert , Gérald da Costa
Ultramicroscopy, 2018, 187, pp.126--134. ⟨10.1016/j.ultramic.2018.02.001⟩
Article dans une revue hal-01928843v1

Three-dimensional atomic-scale investigation of ZnO-Mg x Zn 1−x O m-plane heterostructures

Enrico Di Russo , L. Mancini , F. Moyon , Simona Moldovan , Jonathan Houard
Applied Physics Letters, 2017, 111 (3), pp.032108. ⟨10.1063/1.4994659⟩
Article dans une revue hal-01766135v1

Field-Dependent Measurement of GaAs Composition by Atom Probe Tomography

Enrico Di Russo , Ivan Blum , Jonathan Houard , Gérald da Costa , Didier Blavette
Microscopy and Microanalysis, 2017, 23 (06), pp.1067 - 1075. ⟨10.1017/s1431927617012582⟩
Article dans une revue hal-01766042v1

Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem

Lorenzo Rigutti , L. Mancini , Enrico Di Russo , Ivan Blum , F. Moyon
Microscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩
Article dans une revue hal-01954232v1