Denis Mencaraglia
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Wide range local resistance imaging on fragile materials by conducting probe atomic force microscopy in intermittent contact modeApplied Physics Letters, 2016, 108, pp.243101. ⟨10.1063/1.4953870⟩
Article dans une revue
cea-01331971v1
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Bulk and surface structural properties of Si$_{1-x-y}$Ge$_x$C$_y$ layers processed on Si(001) by pulsed laser induced epitaxyApplied Surface Science, 1996, 102, pp.28-32
Article dans une revue
in2p3-00000499v1
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