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IEEE Transactions on Reliability   

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  • Jinane Harmouche, Claude Delpha, Demba Diallo, Yann Le Bihan. Statistical Approach for Nondestructive Incipient Crack Detection and Characterization Using Kullback-Leibler Divergence. IEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers, 2016, 65 (3), pp.1360-1368. ⟨10.1109/TR.2016.2570549⟩. ⟨hal-01366652⟩